Thermogravimetric analyzer
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Description
The broken lines represent the portions of the design that form no part of the claim.
Claims
The ornamental design for a thermogravimetric analyzer, as shown and described.
Referenced Cited
U.S. Patent Documents
D283107 | March 25, 1986 | Collister |
D292979 | December 1, 1987 | Chow |
5322360 | June 21, 1994 | Willis et al. |
D381756 | July 29, 1997 | Ohnuma et al. |
6760679 | July 6, 2004 | Carney et al. |
6846455 | January 25, 2005 | Carney et al. |
D556914 | December 4, 2007 | Okamoto et al. |
D638545 | May 24, 2011 | Okawa et al. |
D689387 | September 10, 2013 | Muraoka et al. |
Patent History
Patent number: D747227
Type: Grant
Filed: Aug 26, 2014
Date of Patent: Jan 12, 2016
Assignee: Hitachi High-Tech Science Corporation (Minato-ku, Tokyo)
Inventor: Hirohito Fujiwara (Tokyo)
Primary Examiner: Antoine D Davis
Application Number: 29/500,547
Type: Grant
Filed: Aug 26, 2014
Date of Patent: Jan 12, 2016
Assignee: Hitachi High-Tech Science Corporation (Minato-ku, Tokyo)
Inventor: Hirohito Fujiwara (Tokyo)
Primary Examiner: Antoine D Davis
Application Number: 29/500,547
Classifications