Abstract: A fixing device includes a heating section. The heating section includes a heater, a heater holding member, a heat-sensitive body, a cover member, and an urging member. The heater holding member holds the heater. The heat-sensitive body faces the heater. The cover member covers the heat-sensitive body. The urging member urges the cover member in a first direction which is toward the heater from the heat-sensitive body. The urging member extends in a second direction intersecting with the first direction and engages with the heater holding member and the cover member.

Abstract: A fixing device includes a fixing belt and a heating section. The heating section includes a heater and a heater holding member. The heater holding member has a main body portion and a plurality of ridges. The ridges include a plurality of first ridges and a plurality of second ridges. The first ridges are disposed on a central portion of the main body portion in a width direction of the fixing belt. The second ridges are disposed in an area of the main body portion at least partially extending, in the width direction of the fixing belt, from the central portion to each of opposite ends of the main body portion. The first ridges are disposed separated at a first interval. The second ridges are disposed separated at a second interval. The first interval is smaller than the second interval.

Abstract: A measurement auxiliary member is placed on an arrangement surface of a prism. A measurement object is placed on an upper surface of the measurement auxiliary member. The measurement auxiliary member totally reflects the terahertz wave input from a lower surface by the upper surface and outputs the totally-reflected terahertz wave from the lower surface. A main pulse of a terahertz wave totally reflected by the upper surface of the measurement auxiliary member without multiply-reflected inside any optical element on an optical path of the terahertz wave, and a noise pulse of a terahertz wave multiply-reflected inside any optical element on the optical path and reflected on an interface between the prism and the measurement auxiliary member, are temporally separated from each other when detecting a correlation by a terahertz wave detection element.

Abstract: In a fixing device, a heating section is disposed opposite to an inner circumferential surface of a fixing belt. The heating section includes a heater, a heater holding member, a heat sensitive body disposed opposite to the heater on the heater holding member, a covering member disposed opposite to the heater holding member with the heat sensitive body therebetween, and an urging member disposed between the covering member and the heat sensitive body and urging the heat sensitive body in an urging direction. First and second restricting portions of the heater holding member restrict movement of the covering member in a direction opposite to the urging direction. In a state in which first and second engaging portions of the covering member respectively engage with the first and second restricting portions in a slidable manner in the urging direction, the urging member urges the heat sensitive body in the urging direction.

Abstract: A fixing device includes a fixing belt, a pressure member, and a heating section. The heating section faces an inner circumferential surface of the fixing belt. The heating section includes a heater and a heater holding member. The heater heats the fixing belt. The heater holding member holds the heater. The heater holding member has a first side surface, a second side surface, and an inclined slit. The first and second side surfaces are in contact with the inner circumferential surface. The first side surface has the inclined slit. The inclined slit is located in the first side surface in a direction of a rotational axis of the fixing belt. The inclined slit has one end on a side of the pressure member and the other end on an opposite side to the side of the pressure member. The other end is located nearer a middle (center) of the first side surface in the direction of the rotational axis than the one end.

Abstract: A fixing device includes a fixing belt, a pressure member, a first holding member, and a second holding member. The fixing belt is endless and includes a first rim and a second rim. The pressure member presses the fixing belt by being in contact with an outer circumferential surface of the fixing belt and rotates about a rotation axis of the pressure member. The first holding member is attached to the fixing belt and holds the first rim of the fixing belt. The second holding member is attached to the fixing belt and holds the second rim of the fixing belt. The second holding member includes a base portion, a main portion, and a protrusion. The main portion protrudes from the base portion. The protrusion protrudes from the main portion in a direction away from the base portion.

Abstract: A fixing device includes a fixing belt and a heating section. The heating section faces an inner circumferential surface of the fixing belt. The heating section includes a heater, a heater holding member, a reinforcing member, and at least one rotor. The heater heats the fixing belt. The heater holding member holds the heater. The reinforcing member reinforces the heater holding member. The at least one rotor faces the inner circumferential surface of the fixing belt. The at least one rotor is attached to the reinforcing member.

Abstract: A fixing device includes a fixing belt and a heating section. The heating section is disposed opposite to an inner circumferential surface of the fixing belt. The heating section includes a heater, a heater holding member, and a pinching member. The heater heats the fixing belt. The heater holding member holds the heater. The pinching member pinches the heater and the heater holding member to restrict movement of the heater relative to the heater holding member.

Abstract: A fishing rod includes a grip tube 2 on a rear side of a reel seat 1 having a cylindrical shape, and the grip tube 2 is hard. The grip tube 2 includes a first grip portion 20 having a large diameter and forming at a front part of the grip tube 2, a second grip portion 22 having a large diameter and forming at a rear part of the grip tube 2, and a small-diameter portion 21 forming at between the first grip portion 20 and the second grip portion 22. A corner portion 23 is formed at between the first grip portion 20 and the small-diameter portion 21. The small-diameter portion 21 has a concave curved shape decreasing in diameter rearward at the front part of the small-diameter portion 21 which adjacent to the corner portion 23.

Abstract: An optical measurement device includes a light source configured to output a terahertz wave and coaxial light having a wavelength different from the wavelength of the terahertz wave, coaxially with the terahertz wave; an intensity modulation unit configured to perform intensity modulation of at least the terahertz wave of the terahertz wave and the coaxial light in a predetermined modulation frequency; and a light detection unit configured to synchronously detects each of the terahertz wave and the coaxial light which have acted on a measurement subject via the intensity modulation unit based on the modulation frequency.

Abstract: The present disclosure relates to an inspection apparatus and an inspection method, and a program that enable inspection of the performance of an image pickup element. Generation of collimated light and transmission of part of the collimated light through a transmission filter having a light-blocking face provided with circular holes arranged regularly, causes conversion to rays of columnar collimated light arranged regularly. An image including the rays of columnar collimated light arranged regularly, is captured by an image pickup element being inspected. Then, acquisition of the difference between the image captured by the image pickup element being inspected and an ideal image captured by an ideal image pickup element and comparison between the difference and a threshold, result in inspection of the performance of the image pickup element being inspected The present disclosure can be applied to the manufacturing of an image pickup device.

Abstract: In a fixing device, a heating section is disposed opposite to an inner circumferential surface of a fixing belt, and includes a heater, a heater holding member, a reinforcing member extending in a rotation axis of the pressure member, a heat sensitive body disposed on the heater holding member, and an urging member disposed between the reinforcing member and the heat sensitive body. The heater holding member includes an engaging portion engaging with a first end of the reinforcing member. In a state in which the reinforcing member is located opposite to the heater holding member through the reinforcing member turning about the engaging portion as a pivot, the urging member urges the heat sensitive body against the heater and a distance between the heat sensitive body and a second end of the reinforcing member is shorter than a distance between the heat sensitive body and the first end.

Abstract: There is provided a semiconductor manufacturing method capable of coping with an increase in the density of an integrated circuit. A semiconductor manufacturing method according to one aspect of the present invention includes: a step of forming a memory cell, a photodiode that outputs an electrical signal corresponding to an input optical signal, and a signal processing circuit that generates a logic signal based on the electrical signal output from the photodiode and outputs the logic signal to the memory cell, so as to correspond to each chip forming region of a wafer having a plurality of chip forming regions; a step of inputting pump light for checking an operation of the memory cell to the photodiode and inspecting an operation state of the memory cell after the forming step; and a step of performing dicing for each of the chip forming regions after the inspection step.

Abstract: Provided is an optical element including: a main body which is formed of a medium capable of transmitting first light and second light having a wavelength longer than that of the first light, in which the main body includes an incident region into which the first light and the second light are incident, in which a gap which is inclined with respect to the incident region and in which a medium having a refractive index with respect to the first light and the second light lower than that of the main body is disposed is provided inside the main body, and in which a gap width from an interface bordering the main body and the gap is larger than a penetration length of an evanescent wave of the first light at the interface and is smaller than a penetration length of an evanescent wave of the second light at the interface.

Abstract: In a fixing device, a heating section is disposed opposite to an inner circumferential surface of a fixing belt, and includes a heater, a heater holding member, a reinforcing member extending in a rotation axis of the pressure member, a heat sensitive body disposed on the heater holding member, and an urging member disposed between the reinforcing member and the heat sensitive body. The heater holding member includes an engaging portion engaging with a first end of the reinforcing member. In a state in which the reinforcing member is located opposite to the heater holding member through the reinforcing member turning about the engaging portion as a pivot, the urging member urges the heat sensitive body against the heater and a distance between the heat sensitive body and a second end of the reinforcing member is shorter than a distance between the heat sensitive body and the first end.

Abstract: In a fixing device, a heating section is disposed opposite to an inner circumferential surface of a fixing belt. The heating section includes a heater, a heater holding member, a heat sensitive body disposed opposite to the heater on the heater holding member, a covering member disposed opposite to the heater holding member with the heat sensitive body therebetween, and an urging member disposed between the covering member and the heat sensitive body and urging the heat sensitive body in an urging direction. First and second restricting portions of the heater holding member restrict movement of the covering member in a direction opposite to the urging direction. In a state in which first and second engaging portions of the covering member respectively engage with the first and second restricting portions in a slidable manner in the urging direction, the urging member urges the heat sensitive body in the urging direction.

Abstract: A fixing device includes a fixing belt and a heating section. The heating section is disposed opposite to an inner circumferential surface of the fixing belt. The heating section includes a heater, a heater holding member, and a pinching member. The heater heats the fixing belt. The heater holding member holds the heater. The pinching member pinches the heater and the heater holding member to restrict movement of the heater relative to the heater holding member.

Abstract: There is provided a semiconductor wafer suitable for the inspection of an operation state. A wafer is a semiconductor wafer having a plurality of chip forming regions, and includes a memory cell that is formed in each of the chip forming regions and an inspection device that is formed in each of the chip forming regions. The inspection device has a photodiode that receives an input of pump light for checking an operation of the memory cell and outputs an electrical signal corresponding to the pump light and a signal processing circuit that generates a logic signal based on the electrical signal output from the photodiode and outputs the logic signal to the memory cell.

Abstract: A fermentation state monitoring apparatus includes: a terahertz wave generation element that outputs inspection light using a terahertz wave to a fermented food under fermentation in a sealed product container; a terahertz wave detection element that detects return light of the inspection light reflected by the fermented food in the product container; and a determination unit that determines a fermentation progress of the fermented food based on an index value including a reflectance of the return light with respect to the inspection light or an absorption coefficient of the return light with respect to the inspection light.

Abstract: There is provided a semiconductor wafer suitable for the inspection of an operation state. A wafer is a semiconductor wafer having a plurality of chip forming regions, and includes a memory cell that is formed in each of the chip forming regions and an inspection device that is formed outside each of the chip forming regions. The inspection device has a photodiode that receives an input of pump light for checking an operation of the memory cell and outputs an electrical signal corresponding to the pump light and a signal processing circuit that generates a logic signal based on the electrical signal output from the photodiode and outputs the logic signal to the memory cell.