Abstract: Methods, systems, and devices for command triggered power gating for a memory device are described. Row logic circuitry for a memory array may be powered up (on) or powered down (off) independent of at least some other components of a memory device. The row logic circuitry may be on when a bank of the memory array is an active state but may be off when the bank is in a stand-by or power-down state. Additionally or alternatively, error correction circuitry for a memory array may be powered up (on) or powered down (off) independent of at least some other components of a memory device. The error correction circuitry may be on during an access portion of an access sequence but may otherwise be off.

Abstract: The present invention enables confirmation that a mold magnetically adhered by a magnetic clamping device has been magnetically adhered by a sufficient adhesion force so as not to be pulled off from the magnetic clamping device by a mold opening force of a mold handling device. A controller 7 carries out magnetization of a magnetic clamping device 10 such that a magnetic adhesion force weaker than that in normal magnetization is generated in a state where molds M1, M2 are bound together, and carries out a test to determine whether separation of the molds M1, M2 would occur when platens 2, 3 are separated. The controller issues a warning regarding lack of guaranteed adhesion force to an operator when separation is detected, and carries out normal magnetization of the magnetic clamping device 10 when separation is not detected.

Abstract: Charge transfer between gate terminals of sub-threshold current reduction circuit (SCRC) transistors and related apparatuses and methods are disclosed. An apparatus includes a first output terminal electrically connected to a pull-up gate terminal of at least one pull-up SCRC transistor and a second output terminal electrically connected to a pull-down gate terminal of at least one pull-down SCRC transistor. The apparatus also includes a first resistive path between a first input terminal and the first output terminal and a second resistive path between the second input terminal and the second output terminal. The apparatus further includes a charge transfer gate electrically connected between the first resistive path and the second resistive path.

Abstract: Methods, systems, and devices for generating memory array control signals are described. A timing component may be configured to generate signals for operating a memory array. The timing component may include first logic that indicates when input signals are different, second logic that indicates when at least one of the input signals has a particular state, and third logic that indicates when the input signals have the same state. The output of the second logic and third logic may be controllable by other input signals. An output of the timing component may be set by one of the input signals and reset by the other input signals using the first logic, second logic, and third logic.

Abstract: A memory mat architecture is presented where a column decoder is disposed within the memory array. The location of the column decoder reduces a distance between the column decoder and a target memory cell and thus reduces a distance that a column select signal travels from the column decoder to the target memory cell. A single predecoder is disposed in a bank controller for the memory array. The column decoder may be disposed in the middle of the memory array or offset from the middle near the far edge of the memory array opposite the bank controller. The location of the column decoder enables a reduced array access time to obtain data from the target memory cell.

Abstract: Devices for generating a delay output signal are disclosed. A device may include a first delay circuit and a second delay circuit coupled in series between a first node and a second node in a delay path for the device, and having a third node therebetween. The device may also include a third circuit coupled to the third node and configured to charge the third node responsive to detecting a signal has passed through the first node and the third node. Associated semiconductor devices and methods are also disclosed.

Abstract: Sub-threshold current reduction circuit (SCRC) switches and related apparatuses and methods are disclosed. An apparatus includes a first set of SCRC switches and a second set of SCRC switches electrically connected between power supply lines and power reception lines. The first set of SCRC switches is configured to electrically connect the power supply lines to the power reception lines in the first operational mode and the second operational mode. The second set of SCRC switches is configured to electrically connect the power supply lines to the power reception lines in the first operational mode and electrically isolate the power supply lines from the power reception lines in the second operational mode. Activation of the first set of SCRC switches is staggered in time with activation of the second set of SCRC switches. The second set of SCRC switches is spaced among the first set of SCRC switches.

Abstract: A memory mat architecture is presented where a column decoder is disposed within the memory array. The location of the column decoder reduces a distance between the column decoder and a target memory cell and thus reduces a distance that a column select signal travels from the column decoder to the target memory cell. A single predecoder is disposed in a bank controller for the memory array. The column decoder may be disposed in the middle of the memory array or offset from the middle near the far edge of the memory array opposite the bank controller. The location of the column decoder enables a reduced array access time to obtain data from the target memory cell.

Abstract: Charge transfer between gate terminals of sub-threshold current reduction circuit (SCRC) transistors and related apparatuses and methods is disclosed. An apparatus includes a pull-up SCRC transistor, a pull-down SCRC transistor, and a charge transfer circuit. The pull-up SCRC transistor includes a pull-up gate terminal. The pull-down SCRC transistor includes a pull-down gate terminal. The charge transfer circuit is electrically connected between the pull-up gate terminal and the pull-down gate terminal. The charge transfer circuit is configured to transfer charge between the pull-up gate terminal and the pull-down gate terminal.

Abstract: Methods, systems, and devices for temperature-based access timing for a memory device are described. In some memory devices, accessing memory cells may be associated with different operations that are variously dependent on a temperature of the memory device. For example, some operations associated with accessing a memory cell may have a longer duration and others a shorter duration depending on the temperature of the memory device. In accordance with examples as disclosed herein, a memory device may be configured for performing some portions of an access operation according to a duration that is proportional to a temperature of the memory device, and performing other portions of the access operation according to a duration that is inversely proportional to a temperature of the memory device.

Abstract: Methods, apparatuses, and systems related to a memory device are described. The memory device may include local latching circuits each having a retention circuit and a driving circuit. The retention circuit may be configured to provide local storage of broadcasted information for a down-stream circuit. The driving circuit may be configured to connect a first voltage and a second voltage to the retention circuit at different times across the broadcast and the local storage.

Abstract: Apparatuses and methods related to power domain boundary protection in memory. A number of embodiments can include using a voltage detector to monitor a floating power supply voltage used to power a number of logic components while a memory device operates in a reduced power mode, and responsive to the voltage detector detecting that the floating power supply voltage reaches a threshold value while the memory device is in the reduced power mode, providing a control signal to protection logic to prevent a floating output signal driven from one or more of the logic components from being provided across a power domain boundary to one or more of a different number of logic components.

Abstract: Provided is a clamp system with enhanced functionality achieved by detecting the behavior of an object to be clamped, using a stroke-end position detector that has been used for switching stroke operations. A clamp device 1 has an output member 12 which executes a stroke movement causing a change in the distance by which a coil 15 is inserted into a hole 14 having a bottom. A converter 23 outputs a measurement value of the inductance of the coil 15. The inductance of the coil 15 when a work W has been clamped by the output member 12 is stored in a work clamp point memory 22e, and a clamp area indicating a variation range permitted with respect to a work clamp point is set in a clamp area memory. During processing of the work, a control unit 2 measures the inductance of the coil 15, determines whether the work clamp point is within the range of the clamp area, and, if the range is exceeded, issues a signal indicating an emergency stop.

Abstract: Methods, systems, and devices for generating memory array control signals are described. A timing component may be configured to generate signals for operating a memory array. The timing component may include first logic that indicates when input signals are different, second logic that indicates when at least one of the input signals has a particular state, and third logic that indicates when the input signals have the same state. The output of the second logic and third logic may be controllable by other input signals. An output of the timing component may be set by one of the input signals and reset by the other input signals using the first logic, second logic, and third logic.

Abstract: Methods, systems, and devices for command triggered power gating for a memory device are described. Row logic circuitry for a memory array may be powered up (on) or powered down (off) independent of at least some other components of a memory device. For example, the row logic circuitry may be on when a bank of the memory array is an active state but may be off when the bank is in a stand-by or power-down state. Additionally or alternatively, error correction circuitry for a memory array may be powered up (on) or powered down (off) independent of at least some other components of a memory device. For example, the error correction circuitry may be on during an access portion of an access sequence but may otherwise be off.

Abstract: Methods, systems, and devices for generating memory array control signals are described. A timing component may be configured to generate signals for operating a memory array. The timing component may include first logic that indicates when input signals are different, second logic that indicates when at least one of the input signals has a particular state, and third logic that indicates when the input signals have the same state. The output of the second logic and third logic may be controllable by other input signals. An output of the timing component may he set by one of the input signals and reset by the other input signals using the first logic, second logic, and third logic.

Abstract: Apparatuses and methods related to power domain boundary protection in memory. A number of embodiments can include using a voltage detector to monitor a floating power supply voltage used to power a number of logic components while a memory device operates in a reduced power mode, and responsive to the voltage detector detecting that the floating power supply voltage reaches a threshold value while the memory device is in the reduced power mode, providing a control signal to protection logic to prevent a floating output signal driven from one or more of the logic components from being provided across a power domain boundary to one or more of a different number of logic components.

Abstract: Methods, systems, and devices for delay calibration oscillators for a memory device are described. In some examples, a memory device may include a delay chain operable (e.g., for a calibration operation) in a ring oscillator configuration that includes a pulse generator. The pulse generator may be configured to output a pulse signal responsive to a transition of an input signal. By generating a pulse signal in a feedback loop of a ring oscillator, the ring oscillator may support a cycle that does not rely on both a first transition propagation pass (e.g., a rising edge propagation) and a responsive, opposite transition propagation pass (e.g., a falling edge propagation) through the delay chain, which may support a ring oscillator cycle time (e.g., period) that more closely represents aspects of the delay chain that are meant to be calibrated.

Abstract: Methods, systems, and devices for temperature-based access timing for a memory device are described. In some memory devices, accessing memory cells may be associated with different operations that are variously dependent on a temperature of the memory device. For example, some operations associated with accessing a memory cell may have a longer duration and others a shorter duration depending on the temperature of the memory device. In accordance with examples as disclosed herein, a memory device may be configured for performing some portions of an access operation according to a duration that is proportional to a temperature of the memory device, and performing other portions of the access operation according to a duration that is inversely proportional to a temperature of the memory device.

Abstract: Latch circuitry configured to latch data for use in the memory device. The latch circuitry includes latch cells each configured to store a bit of the data. The latch circuitry also includes a data line coupled to a first side of the latch cells and a data false line coupled to a second side of the latch cells. The latch circuitry also includes a write driver that includes an input configured to receive the data to be stored in the latch cells and a pair of inverters coupled to the input and configured to output a data signal to a first side of the latch cells. The latch circuitry also includes an inverter coupled to the input and configured to generate a data false signal to a second side of the latch cells. The data used to generate the data false signal is not passed through the pair of inverters.