Abstract: A depth decoding system and a method for rectifying a ground-truth image are introduced. The depth decoder system includes a projector, a camera, a processor and a decoder. The projector is configured to project a structural light pattern to a first reference plane and a second reference plane. The camera is configured to capture a first ground-truth image from the first reference plane and capture a second ground-truth image from the second reference plane. The processor is configured to perform a rectification operation to the first ground-truth image and the second ground-truth image to generate a rectified ground-truth image. The decoder is configured to generate a depth result according to the rectified ground-truth image.

Abstract: A method for performing auto-exposure (AE) control in a depth sensing system includes: capturing a first reference image and a second reference image of a scene based on different illumination conditions; calculating a plurality of first block means with respect to first blocks of the first reference frame and calculating a plurality of second block means with respect to second blocks of the second reference frame; calculating a plurality of block mean differences according to the first block means and the second block means; determining a plurality of first region of interest (ROI) blocks from the first blocks and a plurality of a second ROI blocks from the second blocks; and performing an AE control over the depth sensing system according to blocks means of the first ROI blocks and blocks means of the second ROI blocks.

Abstract: A method for performing auto-exposure (AE) control in a depth sensing system includes: capturing a first reference image and a second reference image of a scene based on different illumination conditions; calculating a plurality of first block means with respect to first blocks of the first reference frame and calculating a plurality of second block means with respect to second blocks of the second reference frame; calculating a plurality of block mean differences according to the first block means and the second block means; determining a plurality of first region of interest (ROI) blocks from the first blocks and a plurality of a second ROI blocks from the second blocks; and performing an AE control over the depth sensing system according to blocks means of the first ROI blocks and blocks means of the second ROI blocks.

Abstract: A semiconductor device includes: a fin structure disposed on a substrate; a gate feature that traverses the fin structure to overlay a central portion of the fin structure; a pair of source/drain features, along the fin structure, that are disposed at respective sides of the gate feature; and a plurality of contact structures that are formed of tungsten, wherein a gate electrode of the gate feature and the pair of source/drain features are each directly coupled to a respective one of the plurality of contact structures.

Abstract: A depth decoding system and a method for rectifying a ground-truth image are introduced. The depth decoder system includes a projector, a camera, a processor and a decoder. The projector is configured to project a structural light pattern to a first reference plane and a second reference plane. The camera is configured to capture a first ground-truth image from the first reference plane and capture a second ground-truth image from the second reference plane. The processor is configured to perform a rectification operation to the first ground-truth image and the second ground-truth image to generate a rectified ground-truth image. The decoder is configured to generate a depth result according to the rectified ground-truth image.

Abstract: A method for semiconductor manufacturing is disclosed. The method includes receiving a device having a first surface through which a first metal or an oxide of the first metal is exposed. The method further includes depositing a dielectric film having Si, N, C, and O over the first surface such that the dielectric film has a higher concentration of N and C in a first portion of the dielectric film near the first surface than in a second portion of the dielectric film further away from the first surface than the first portion. The method further includes forming a conductive feature over the dielectric film. The dielectric film electrically insulates the conductive feature from the first metal or the oxide of the first metal.

Abstract: A method for semiconductor manufacturing is disclosed. The method includes receiving a device having a first surface through which a first metal or an oxide of the first metal is exposed. The method further includes depositing a dielectric film having Si, N, C, and O over the first surface such that the dielectric film has a higher concentration of N and C in a first portion of the dielectric film near the first surface than in a second portion of the dielectric film further away from the first surface than the first portion. The method further includes forming a conductive feature over the dielectric film. The dielectric film electrically insulates the conductive feature from the first metal or the oxide of the first metal.

Abstract: A semiconductor device includes: a fin structure disposed on a substrate; a gate feature that traverses the fin structure to overlay a central portion of the fin structure; a pair of source/drain features, along the fin structure, that are disposed at respective sides of the gate feature; and a plurality of contact structures that are formed of tungsten, wherein a gate electrode of the gate feature and the pair of source/drain features are each directly coupled to a respective one of the plurality of contact structures.

Abstract: A feeding system with numerically adjustable pneumatic cylinder speeds includes: a frame; an X-axis pneumatic cylinder; a Z-axis pneumatic cylinder; a feeding table connected to the pneumatic cylinders in order to be driven into motion in the X- and Z-axis directions; an X-axis detection module; a Z-axis detection module; a microcomputer; and a display screen electrically connected to the microcomputer. The microcomputer uses each detection module to determine the time interval between the instant at which the piston rod of the corresponding pneumatic cylinder passes the corresponding starting point and a subsequent instant at which the same piston rod passes the corresponding endpoint. The time intervals thus determined are defined as a duration of X-axis forward movement and a duration of Z-axis forward movement respectively. Both durations are displayed on the display screen.

Abstract: An auto-exposure (AE) control system, includes a camera configured to capture an input image, a region of interest (ROI) determination circuit configured to determine a ROI of the input image, a depth decoder and an AE controller. The depth decoder is configured to generate a depth map of the input image and determine a decode rate value according to the depth map of the input image and the ROI of the input image. The AE controller includes an exposure adjustment circuit which is configured to receive a decode rate value and the detection result and sequentially adjust a plurality of the exposure parameters according to the variation of the decode rate value. A step size for adjusting the plurality of the exposure parameters is determined according to the variation of the decode rate value and the detection result.

Abstract: A semiconductor device includes: a fin structure disposed on a substrate; a gate feature that traverses the fin structure to overlay a central portion of the fin structure; a pair of source/drain features, along the fin structure, that are disposed at respective sides of the gate feature; and a plurality of contact structures that are formed of tungsten, wherein a gate electrode of the gate feature and the pair of source/drain features are each directly coupled to a respective one of the plurality of contact structures.

Abstract: A method of detecting whether a surveillance camera is abnormal or abnormal includes: obtaining a plurality of video frames from a video captured by the surveillance camera; sequentially comparing each of the plurality of video frames with a reference video frame; determining that the surveillance camera is abnormal when a sequence of video frame detection results indicates that not all of the plurality of video frames are normal video frames; issuing a maintenance notification of the surveillance camera when it is determined that the surveillance camera is abnormal with the particular one of the plurality of abnormal properties, thereby facilitating a maintenance procedure to be performed on the surveillance camera to remove the particular one of the plurality of abnormal properties.

Abstract: A feeding system with numerically adjustable pneumatic cylinder speeds includes: a frame; an X-axis pneumatic cylinder; a Z-axis pneumatic cylinder; a feeding table connected to the pneumatic cylinders in order to be driven into motion in the X- and Z-axis directions; an X-axis detection module; a Z-axis detection module; a microcomputer; and a display screen electrically connected to the microcomputer. The microcomputer uses each detection module to determine the time interval between the instant at which the piston rod of the corresponding pneumatic cylinder passes the corresponding starting point and a subsequent instant at which the same piston rod passes the corresponding endpoint. The time intervals thus determined are defined as a duration of X-axis forward movement and a duration of Z-axis forward movement respectively. Both durations are displayed on the display screen.

Abstract: A method for semiconductor manufacturing is disclosed. The method includes receiving a device having a first surface through which a first metal or an oxide of the first metal is exposed. The method further includes depositing a dielectric film having Si, N, C, and O over the first surface such that the dielectric film has a higher concentration of N and C in a first portion of the dielectric film near the first surface than in a second portion of the dielectric film further away from the first surface than the first portion. The method further includes forming a conductive feature over the dielectric film. The dielectric film electrically insulates the conductive feature from the first metal or the oxide of the first metal.

Abstract: A semiconductor structure includes a substrate, a plurality of image sensing devices formed in the substrate, at least a passivation layer formed on the substrate, a plurality of first metal patterns formed on the passivation layer, a plurality of gaps formed between the first metal patterns, an insulating layer lining the gaps, and a plurality of light-guiding structures respectively formed in the gaps. The light-guiding structures respectively include an anchor portion and a body portion, and bottom surfaces of the anchor portions being lower than top surfaces of the first metal patterns.

Abstract: A method of detecting whether a surveillance camera is abnormal or abnormal includes: obtaining a plurality of video frames from a video captured by the surveillance camera; sequentially comparing each of the plurality of video frames with a reference video frame; determining that the surveillance camera is abnormal when a sequence of video frame detection results indicates that not all of the plurality of video frames are normal video frames; issuing a maintenance notification of the surveillance camera when it is determined that the surveillance camera is abnormal with the particular one of the plurality of abnormal properties, thereby facilitating a maintenance procedure to be performed on the surveillance camera to remove the particular one of the plurality of abnormal properties.

Abstract: A method for semiconductor manufacturing is disclosed. The method includes receiving a device having a first surface through which a first metal or an oxide of the first metal is exposed. The method further includes depositing a dielectric film having Si, N, C, and O over the first surface such that the dielectric film has a higher concentration of N and C in a first portion of the dielectric film near the first surface than in a second portion of the dielectric film further away from the first surface than the first portion. The method further includes forming a conductive feature over the dielectric film. The dielectric film electrically insulates the conductive feature from the first metal or the oxide of the first metal.

Abstract: A wafer processing apparatus includes at least one pedestal, at least one ultraviolet (UV) light source, and a window. The pedestal is configured to support a wafer. The UV light source is configured to generate UV radiation to the wafer. The window is present between the pedestal and the UV light source. The UV radiation is capable of passing through the window, and the window is a convex lens, a concave lens, or combinations thereof.

Abstract: An emergency stop device for a band saw includes a brake member moveable between a standby position and an active position where the brake member firmly urges and stops a running wheel of the band saw, around which a band saw blade is looped. The brake member is held by a retainer at the standby position when the emergency stop device is inactive. When the emergency stop device is started, the retainer is separated apart from the brake member for enabling the brake member to move by an actuation of a spring member from the standby position to the active position so as to stop the cutting motion of the band saw blade.

Abstract: A method for managing a transmission order in a network includes the steps of: providing an upstream host and a plurality of downstream hosts; performing a order of a plurality of data transmission events between the upstream host and the plurality of the downstream hosts; performing a first data transmission event by the upstream host to receive first data from a first downstream host; monitoring whether the upstream host receives any priority instructions from any other downstream hosts; and if a first priority instruction is received from a second downstream host during the first data transmission event, stopping the first data transmission event and performing a second data transmission event by the upstream host to receive second data from the second downstream host.