Abstract: A semiconductor memory device includes a cell matrix having a number of cells, a multiplicity of column decoders for selectively activating the cells in response to code signals containing column address information for the cells, wherein each column decoder contains a pre-driving unit for providing a state output signal transiting between a power supply voltage and a source voltage in response to the code signals and a driving unit for outputting a column selection signal to activate a corresponding cell in response to the state output signal, wherein the pre-driving unit and the driving unit include at least one PMOS transistor and at least one NMOS transistor receiving a pumping voltage and a back-bias voltage, respectively, through their bulk, the pumping voltage having a voltage level higher than that of the power supply voltage and the back-bias voltage having a voltage level lower than that of a ground voltage.

Abstract: A power-up circuit includes a power-up signal generating section connected to an external source terminal, configured to generate a power-up signal when the external source reaches a predetermined target level, and to selectively interrupt a path from the external source terminal in response to a selection signal. A pulse generating section generates a pulse with a predetermined pulse width to control an initializing operation with reference to an activation time of the power-up signal. A power-up controlling section provides the power-up signal generating section with the selection signal, variable by the pulse, when the power-up signal is active.

Abstract: A power supply control circuit and a control method secure an accurate operation of a GIO in a burst data transmission having a high compression rate. The power supply control circuit of a semiconductor memory device includes: a counter which is reset in response to a read command signal or a write command signal to count an input clock and then, to output a counting completion signal; and a power supply enable signal generator enabled in response to the read command signal or the write command signal and disabled in response to the counting completion signal, for generating a power supply enable signal.

Abstract: A semiconductor memory device includes a cell matrix having a number of cells, a multiplicity of column decoders for selectively activating the cells in response to code signals containing column address information for the cells, wherein each column decoder contains a pre-driving unit for providing a state output signal transiting between a power supply voltage and a source voltage in response to the code signals and a driving unit for outputting a column selection signal to activate a corresponding cell in response to the state output signal, wherein the pre-driving unit and the driving unit include at least one PMOS transistor and at least one NMOS transistor receiving a pumping voltage and a back-bias voltage, respectively, through their bulk, the pumping voltage having a voltage level higher than that of the power supply voltage and the back-bias voltage having a voltage level lower than that of a ground voltage.

Abstract: A semiconductor memory device includes a cell matrix having a number of cells, a multiplicity of column decoders for selectively activating the cells in response to code signals containing column address information for the cells, wherein each column decoder contains a pre-driving unit for providing a state output signal transiting between a power supply voltage and a source voltage in response to the code signals and a driving unit for outputting a column selection signal to activate a corresponding cell in response to the state output signal, wherein the pre-driving unit and the driving unit include at least one PMOS transistor and at least one NMOS transistor receiving a pumping voltage and a back-bias voltage, respectively, through their bulk, the pumping voltage having a voltage level higher than that of the power supply voltage and the back-bias voltage having a voltage level lower than that of a ground voltage.

Abstract: A voltage generator includes: a pumping voltage detecting section configured to detect a level of a pumping voltage in accordance with a reference voltage, that activates a pumping enable signal when the detected level of the pumping voltage is higher than a first voltage, while activating a power source voltage drive signal when the detected level of the pumping voltage is lower than the first voltage. A pumping section generates the pumping voltage through a pumping operation when the pumping enable signal is active. A power source voltage driving section generates the pumping voltage at a level of an external power source voltage when the power source voltage drive signal is active.

Abstract: A synchronous dynamic random access memory (SDRAM) integrated circuit (IC) configured to receive an external Reset signal for resetting the IC includes a low voltage MOS input buffer configured to generate a buffered reset signal RST from the external Reset signal. The SDRAM IC further includes a reset circuit is configured to generate an internal reset signal Reset_En from (a) the RST signal, (b) a clock enable signal CKE which indicates a time when the SDRAM is ready to receive an external command, and (c) a mode register programming signal MRSP which indicates a time when a mode register is to be loaded with data. The reset circuit activates the Reset_En signal in response to the external Reset signal becoming active to thereby start an internal reset interval during which one or more circuit blocks in the SDRAM IC are powered down.

Abstract: The present invention provides a power supply control circuit and a control method thereof, capable of securing an accurate operation of a GIO in a burst data transmission having a high compression rate. The power supply control circuit of a semiconductor memory device includes: a counter which is reset in response to a read command signal or a write command signal to count an input clock and then, to output a counting completion signal; and a power supply enable signal generator enabled in response to the read command signal or the write command signal and disabled in response to the counting completion signal, for generating a power supply enable signal.

Abstract: The present invention provides a power supply control circuit and a control method thereof, capable of securing an accurate operation of a GIO in a burst data transmission having a high compression rate. The power supply control circuit of a semiconductor memory device includes: a counter which is reset in response to a read command signal or a write command signal to count an input clock and then, to output a counting completion signal; and a power supply enable signal generator enabled in response to the read command signal or the write command signal and disabled in response to the counting completion signal, for generating a power supply enable signal.

Abstract: A synchronous dynamic random access memory (SDRAM) integrated circuit (IC) configured to receive an external Reset signal for resetting the IC includes an input buffer configured to generate a buffered reset signal RST from the external Reset signal. The SDRAM IC further includes a reset circuit is configured to generate an internal reset signal Reset_En from (a) the RST signal, (b) a clock enable signal CKE which indicates a time when the SDRAM is ready to receive an external command, and (c) a mode register programming signal MRSP which indicates a time when a mode register is to be loaded with data.

Abstract: There is provided a multi-port memory device, which is capable of preventing a first high data fail phenomenon at an initial operation in a current sensing type global data bus transmission/reception structure without causing a problem in a low data transmission. In the multi-port memory device having a data transmission/reception block (bank, port, global data bus connection block, etc.) which exchanges data with the global data bus in a current sensing type data transmission/reception structure, an initialization switch is used to discharge each global data bus line and an initialization signal generator controls the initialization switch. A first high data fail at the initial operation is caused by a high precharge level of the global data bus. According to the present invention, it is possible to lower a high precharge level without causing a problem in data transmission.

Abstract: A refresh circuit for individually performing a refresh operation to a plurality of banks included in a semiconductor memory device, includes: a perbank counter for generating a refresh bank address according to a refresh pulse signal and a perbank command; a perbank multiplexer for selectively outputting one of the refresh bank address and a data access bank address in response to the perbank command; and an internal command state machine for generating a refresh command in response to the refresh pulse signal and the perbank command.

Abstract: A voltage generator includes: a pumping voltage detecting section configured to detect a level of a pumping voltage in accordance with a reference voltage, that activates a pumping enable signal when the detected level of the pumping voltage is higher than a first voltage, while activating a power source voltage drive signal when the detected level of the pumping voltage is lower than the first voltage. A pumping section generates the pumping voltage through a pumping operation when the pumping enable signal is active. A power source voltage driving section generates the pumping voltage at a level of an external power source voltage when the power source voltage drive signal is active.

Abstract: A semiconductor memory device is divided into a core region where memory cells are formed and a peripheral region where an input/output line circuit is formed. The input/output line circuit of the semiconductor memory device is operable without affecting other external devices and being affected by noise from other external devices along with improved power dissipation. The semiconductor memory device includes: a core voltage generator for supplying a core voltage to the core region as a driving voltage; an internal voltage generator for supplying an internal voltage to the peripheral region as a driving voltage; and a line voltage generator for supplying a line voltage to the input/output line circuit as a driving voltage. In this manner, a stable supply of the driving voltage is achieved.

Abstract: A semiconductor memory device includes a cell matrix having a number of cells, a multiplicity of column decoders for selectively activating the cells in response to code signals containing column address information for the cells, wherein each column decoder contains a pre-driving unit for providing a state output signal transiting between a power supply voltage and a source voltage in response to the code signals and a driving unit for outputting a column selection signal to activate a corresponding cell in response to the state output signal, wherein the pre-driving unit and the driving unit include at least one PMOS transistor and at least one NMOS transistor receiving a pumping voltage and a back-bias voltage, respectively, through their bulk, the pumping voltage having a voltage level higher than that of the power supply voltage and the back-bias voltage having a voltage level lower than that of a ground voltage.

Abstract: A synchronous dynamic random access memory (SDRAM) integrated circuit (IC) configured to receive an external Reset signal for resetting the IC includes an input buffer configured to generate a buffered reset signal RST from the external Reset signal. The SDRAM IC further includes a reset circuit is configured to generate an internal reset signal Reset_En from (a) the RST signal, (b) a clock enable signal CKE which indicates a time when the SDRAM is ready to receive an external command, and (c) a mode register programming signal MRSP which indicates a time when a mode register is to be loaded with data.

Abstract: A refresh circuit for individually performing a refresh operation to a plurality of banks included in a semiconductor memory device, includes: a perbank counter for generating a refresh bank address according to a refresh pulse signal and a perpank command; a perbank multiplexer for selectively outputting one of the refresh bank address and a data access bank address in response to the perbank command; and an internal command state machine for generating a refresh command in response to the refresh pulse signal and the perbank command.

Abstract: The multi-port memory device includes a plurality of ports supporting serial I/O interface, and the plurality of ports includes a transmission pad and a reception pad. The multi-port memory device includes: a memory core; a control block for generating an internal command signal, an internal address and a control signal, which correspond to the command and are necessary for an operation of the memory core, using commands and addresses inputted to the plurality of ports packet form; and a mode selection block for combining signals applied to plurality of mode selection pads and generating a test mode flag signal, in which I/O data assigned to the transmission pad and the reception pad in a test mode in response to the test mode flag signal are exchanged with the memory core through the ports.

Abstract: The present invention provides a power supply control circuit and a control method thereof, capable of securing an accurate operation of a GIO in a burst data transmission having a high compression rate. The power supply control circuit of a semiconductor memory device includes: a counter which is reset in response to a read command signal or a write command signal to count an input clock and then, to output a counting completion signal; and a power supply enable signal generator enabled in response to the read command signal or the write command signal and disabled in response to the counting completion signal, for generating a power supply enable signal.

Abstract: A multi-port memory device can avoid failure of the first high data during initial operation so that reliability and operation characteristic of the memory device can be improved. The multi-port memory device comprises a global data bus having a multiplicity of bus lines, a plurality of banks having a current sensing type transceiving structure for exchanging data with the global data bus, one or more ports having a current sensing type transceiving structure for exchanging data with the global data bus, a plurality of switches, each arranged between the corresponding bank and the bus lines of the global data bus for selectively connecting one of a redundant column and normal columns of the corresponding bank to the global data bus, and a controlling unit for restricting the turn-on period of the switches to the substantial operation period of the corresponding bank.