Abstract: A compact testing system for sockets is presented having a removable and easily replaceable DUT PCB electrically connected with the electrical testing components of the system. The DUT PCB includes a socket to receive a DUT having electrical contacts. In one or more arrangements, the system includes a housing forming a hollow interior and a motherboard. The motherboard has electrical contacts connected to the test circuitry. In one or more arrangements, the system includes a receiver in a top surface of the housing to receive and hold the DUT PCB. When the DUT is held within the socket the DUT is electrically connected to the electrical contacts of the DUT PCB. When the second circuit board is held within the receiver assembly, the DUT PCB is electrically connected with the DUT, thereby electrically connecting the test circuitry with the DUT for testing.

Abstract: A testing system for test sockets is presented having a removable device under test printed circuit board (DUT PCB) that electrically connects with the electrical testing components of the system. A top stiffener is attached to the lower surface of the DUT PCB and is locked in place by engagement members of a locking mechanism, that is operated by an actuating mechanism, that includes a rack and pinion arrangement that converts rotational movement of the pinions to lateral movement of the racks thereby locking the stiffener connected to the DUT PCB to the socket plate so as to facilitate testing. The upper surface of the DUT PCB has an infinite top plane that is uninterrupted and can be of any size and shape. The system is also modular and can be formed of any number of modules depending on the pin count density required.

Abstract: A method of use of the testing system having an electrical interconnect attached to an electrical interconnect testing device, a device under test aligned with the electrical interconnect, and an environmental chamber. The method comprising positioning the environmental chamber such that the device under test is operably contained within the environmental chamber, setting the environmental chamber to a first temperature, pressing down on the device under test with a plurality of different levels of force, or to a plurality of different positions, and taking at least one measurement of at least one electrical property while the device under test is pressed down. In various arrangements, the method of use further including the steps of adjusting the temperature within the environmental chamber to a second temperature and repeating the steps of pressing down on the device under test and taking at least one measurement of at least one electrical property.

Abstract: A testing system for test sockets is presented having a removable device under test printed circuit board (DUT PCB) that electrically connects with the electrical testing components of the system. A top stiffener is attached to the lower surface of the DUT PCB and is locked in place by engagement members of a locking mechanism, that is operated by an actuating mechanism, that includes a rack and pinion arrangement that converts rotational movement of the pinions to lateral movement of the racks thereby locking the stiffener connected to the DUT PCB to the socket plate so as to facilitate testing. The upper surface of the DUT PCB has an infinite top plane that is uninterrupted and can be of any size and shape. The system is also modular and can be formed of any number of modules depending on the pin count density required.

Abstract: A testing system for electrical interconnects having a removable device under test printed circuit board (DUT PCB) that electrically connects with the electrical testing components of the system. A removable top plate is placed on top of the DUT PCB and is locked in place by a plurality of locking posts that selectively connect to cam surfaces in the top plate that pull the top plate down sandwiching the DUT PCB between the top plate and the electrical testing components of the system. An actuator is also presented that presses the device under test into the electrical interconnect at increments where tests are performed on one, some or all of the contact points of the electrical interconnect. This information is then analyzed and graphed to assist with determine the optimum force and/or height to use during actual use.

Abstract: A rim strike assembly includes a strike body, strike jaw, retaining clutch, locking cam, locking clutch, and a solenoid. The strike jaw, retaining clutch, locking cam, and locking clutch are pivotably coupled to the strike body. The strike body and strike jaw define a latch cavity to receive a latch of a door. The strike jaw includes a jaw follower. The strike jaw is pivotable between a release position and a closed position. The retaining clutch engages the jaw follower and includes a retaining follower. The locking cam includes a retaining notch and a locking notch. The retaining follower engages the retaining notch. The locking clutch includes a locking follower that engages the locking notch of the locking cam. The solenoid includes a plunger coupled to the locking clutch such that movement of the plunger rotates the locking clutch from a locked position to an unlocked position.

Abstract: A testing system for test sockets is presented having a removable device under test printed circuit board (DUT PCB) that electrically connects with the electrical testing components of the system. A top stiffener is attached to the lower surface of the DUT PCB and is locked in place by engagement members of a locking mechanism, that is operated by an actuating mechanism, that includes a rack and pinion arrangement that converts rotational movement of the pinions to lateral movement of the racks thereby locking the stiffener connected to the DUT PCB to the socket plate so as to facilitate testing. The upper surface of the DUT PCB has an infinite top plane that is uninterrupted and can be of any size and shape. The system is also modular and can be formed of any number of modules depending on the pin count density required.

Abstract: A testing system for electrical interconnects having a removable device under test printed circuit board (DUT PCB) that electrically connects with the electrical testing components of the system. A removable top plate is placed on top of the DUT PCB and is locked in place by a plurality of locking posts that selectively connect to cam surfaces in the top plate that pull the top plate down sandwiching the DUT PCB between the top plate and the electrical testing components of the system. An actuator is also presented that presses the device under test into the electrical interconnect at increments where tests are performed on one, some or all of the contact points of the electrical interconnect. This information is then analyzed and graphed to assist with determine the optimum force and/or height to use during actual use.

Abstract: A testing system for test sockets is presented having a removable device under test printed circuit board (DUT PCB) that electrically connects with the electrical testing components of the system. A top stiffener is attached to the lower surface of the DUT PCB and is locked in place by engagement members of a locking mechanism, that is operated by an actuating mechanism, that includes a rack and pinion arrangement that converts rotational movement of the pinions to lateral movement of the racks thereby locking the stiffener connected to the DUT PCB to the socket plate so as to facilitate testing. The upper surface of the DUT PCB has an infinite top plane that is uninterrupted and can be of any size and shape. The system is also modular and can be formed of any number of modules depending on the pin count density required.

Abstract: A testing system for electrical interconnects having a removable device under test printed circuit board (DUT PCB) that electrically connects with the electrical testing components of the system. A removable top plate is placed on top of the DUT PCB and is locked in place by a plurality of locking posts that selectively connect to cam surfaces in the top plate that pull the top plate down sandwiching the DUT PCB between the top plate and the electrical testing components of the system. An actuator is also presented that presses the device under test into the electrical interconnect at increments where tests are performed on one, some or all of the contact points of the electrical interconnect. This information is then analyzed and graphed to assist with determine the optimum force and/or height to use during actual use.

Abstract: A rim strike assembly includes a strike body, strike jaw, retaining clutch, locking cam, locking clutch, and a solenoid. The strike jaw, retaining clutch, locking cam, and locking clutch are pivotably coupled to the strike body. The strike body and strike jaw define a latch cavity to receive a latch of a door. The strike jaw includes a jaw follower. The strike jaw is pivotable between a release position and a closed position. The retaining clutch engages the jaw follower and includes a retaining follower. The locking cam includes a retaining notch and a locking notch. The retaining follower engages the retaining notch. The locking clutch includes a locking follower that engages the locking notch of the locking cam. The solenoid includes a plunger coupled to the locking clutch such that movement of the plunger rotates the locking clutch from a locked position to an unlocked position.

Abstract: A rim strike assembly includes a strike body, strike jaw, retaining clutch, locking cam, locking clutch, and a solenoid. The strike jaw, retaining clutch, locking cam, and locking clutch are pivotably coupled to the strike body. The strike body and strike jaw define a latch cavity to receive a latch of a door. The strike jaw includes a jaw follower. The strike jaw is pivotable between a release position and a closed position. The retaining clutch engages the jaw follower and includes a retaining follower. The locking cam includes a retaining notch and a locking notch. The retaining follower engages the retaining notch. The locking clutch includes a locking follower that engages the locking notch of the locking cam. The solenoid includes a plunger coupled to the locking clutch such that movement of the plunger rotates the locking clutch from a locked position to an unlocked position.

Abstract: A testing system for test sockets is presented having a removable device under test printed circuit board (DUT PCB) that electrically connects with the electrical testing components of the system. A top stiffener is attached to the lower surface of the DUT PCB and is locked in place by engagement members of a locking mechanism, that is operated by an actuating mechanism, that includes a rack and pinion arrangement that converts rotational movement of the pinions to lateral movement of the racks thereby locking the stiffener connected to the DUT PCB to the socket plate so as to facilitate testing. The upper surface of the DUT PCB has an infinite top plane that is uninterrupted and can be of any size and shape. The system is also modular and can be formed of any number of modules depending on the pin count density required.

Abstract: A testing system for electrical interconnects having a removable device under test printed circuit board (DUT PCB) that electrically connects with the electrical testing components of the system. A removable top plate is placed on top of the DUT PCB and is locked in place by a plurality of locking posts that selectively connect to cam surfaces in the top plate that pull the top plate down sandwiching the DUT PCB between the top plate and the electrical testing components of the system. An actuator is also presented that presses the device under test into the electrical interconnect at increments where tests are performed on one, some or all of the contact points of the electrical interconnect. This information is then analyzed and graphed to assist with determine the optimum force and/or height to use during actual use.

Abstract: An improved package device simulator for the testing of testing sockets, the package device simulator being formed of a first layer of non-conductive rigid substrate with a second layer formed of a plurality of electrically conductive traces being added thereto. A third layer of non-conductive rigid substrate is adhered to the first layer with the second layer being sealed there between. The third layer having a plurality of openings therein, wherein the openings align with and expose a portion of the electrically conductive traces of the second layer. Conductive binding material and contact balls are added to the openings and the chip is cured thereby fusing the contact balls with the exposed portions of the traces. Next, the exposed surfaces are coated with a hardening conductive material, such as layers of Nickel and/or Gold. In this way an improved package device simulator is formed that is durable, easier to manufacture and less expensive than a solid metallic package device simulator.

Abstract: A testing system for electrical interconnects having a removable device under test printed circuit board (DUT PCB) that electrically connects with the electrical testing components of the system. A removable top plate is placed on top of the DUT PCB and is locked in place by a plurality of locking posts that selectively connect to cam surfaces in the top plate that pull the top plate down sandwiching the DUT PCB between the top plate and the electrical testing components of the system. An actuator is also presented that presses the device under test into the electrical interconnect at increments where tests are performed on one, some or all of the contact points of the electrical interconnect. This information is then analyzed and graphed to assist with determine the optimum force and/or height to use during actual use.

Abstract: A testing system for semiconductor chips having a removable device under test printed circuit board (DUT PCB) that electrically connects with the electrical testing components of the system. A removable top plate is placed on top of the DUT PCB and is locked in place by a plurality of locking posts that selectively connect to cam surfaces in the top plate that pull the top plate down sandwiching the DUT PCB between the top plate and the electrical testing components of the system. The DUT PCB is quickly and easily removed and replaced by moving the locking posts between an engaged position and a disengaged position. In this way, a single testing system can be used to test a great variety of semiconductor chips thereby reducing capital equipment costs and space needed in cleanrooms.