Abstract: A semiconductor memory device includes a semiconductor circuit substrate having a chip pad forming region. A pair of data lines are formed on the semiconductor circuit substrate at one side of the chip pad region. The pair of data lines extend along a direction that the chip pad region of the semiconductor circuit substrate extends. The pair of data lines are arranged to be adjacent to each other and receive a pair of differential data signals. A power supply line is formed on the semiconductor circuit substrate at the other side of the chip pad region. The power supply line extends along the direction that the chip pad region of the semiconductor circuit substrate extends, and the power supply line receives power.

Abstract: A semiconductor device includes a characteristic code storage unit configured to store signal transfer characteristic information input through a given pad and output a control code corresponding to the signal transfer characteristic information, and a characteristic reflection unit configured to reflect the signal transfer characteristic information in an input signal input through the given pad, in response to the control code, and to output the reflected input signal.

Abstract: A duty cycle correction circuit includes a clock adjustment unit configured to adjust a duty ratio of an input clock signal in response to a duty control signal and generate an output clock signal, a tracking type setting unit configured to generate an tracking type selection signal for setting a first or second tracking type based on a duty locking state of the output clock signal, and a control signal generation unit configured to generate the duty control signal, into which the first or second tracking type is incorporated, in response to the tracking type selection signal and the output clock signal.

Abstract: A duty cycle correction circuit includes a clock adjustment unit configured to adjust a duty ratio of an input clock signal in response to a duty control signal and generate an output clock signal, a tracking type setting unit configured to generate an tracking type selection signal for setting a first or second tracking type based on a duty locking state of the output clock signal, and a control signal generation unit configured to generate the duty control signal, into which the first or second tracking type is incorporated, in response to the tracking type selection signal and the output clock signal.

Abstract: A semiconductor device includes a periodic signal generating circuit for generating a periodic signal having a set period regardless of changes in temperature in response to a first trimming signal as a default value and controlling the set period of the periodic signal based on the temperature in response to a second trimming signal, and an internal circuit to perform a set operation in response to the periodic signal.

Abstract: A duty cycle correction circuit includes a clock adjustment unit configured to adjust a duty ratio of an input clock signal in response to a duty control signal and generate an output clock signal, a tracking type setting unit configured to generate an tracking type selection signal for setting a first or second tracking type based on a duty locking state of the output clock signal, and a control signal generation unit configured to generate the duty control signal, into which the first or second tracking type is incorporated, in response to the tracking type selection signal and the output clock signal.

Abstract: A semiconductor memory device includes a semiconductor circuit substrate having a chip pad forming region. A pair of data lines are formed on the semiconductor circuit substrate at one side of the chip pad region. The pair of data lines extend along a direction that the chip pad region of the semiconductor circuit substrate extends. The pair of data lines are arranged to be adjacent to each other and receive a pair of differential data signals. A power supply line is formed on the semiconductor circuit substrate at the other side of the chip pad region. The power supply line extends along the direction that the chip pad region of the semiconductor circuit substrate extends, and the power supply line receives power.

Abstract: A semiconductor memory device includes a semiconductor circuit substrate having a chip pad forming region. A pair of data lines are formed on the semiconductor circuit substrate at one side of the chip pad region. The pair of data lines extend along a direction that the chip pad region of the semiconductor circuit substrate extends. The pair of data lines are arranged to be adjacent to each other and receive a pair of differential data signals. A power supply line is formed on the semiconductor circuit substrate at the other side of the chip pad region. The power supply line extends along the direction that the chip pad region of the semiconductor circuit substrate extends, and the power supply line receives power.

Abstract: A phase mixing circuit includes a first mixing unit configured to mix phases of first and second clocks at a predetermined ratio, and generate a first mixed signal; a second mixing unit configured to mix phases of an inverted signal of the first clock and an inverted signal of the second clock at the predetermined ratio, and generate a second mixed signal; and an output unit configured to generate an output signal based on of the first and second mixed signals.

Abstract: A semiconductor memory device includes a semiconductor circuit substrate having a chip pad forming region. A pair of data lines are formed on the semiconductor circuit substrate at one side of the chip pad region. The pair of data lines extend along a direction that the chip pad region of the semiconductor circuit substrate extends. The pair of data lines are arranged to be adjacent to each other and receive a pair of differential data signals. A power supply line is formed on the semiconductor circuit substrate at the other side of the chip pad region. The power supply line extends along the direction that the chip pad region of the semiconductor circuit substrate extends, and the power supply line receives power.

Abstract: A delay circuit includes a clock delay line, a command delay line, a delay line control block, and a shared shift register block. The clock delay line delays an input clock and generates a delayed clock. The command delay line delays a command signal and generates a delayed command signal. The delay line control block generates a control signal according to a result of comparing phases of a feedback clock which is generated as the delayed clock is delayed by a modeled delay value and the input clock. The shared shift register block sets delay amounts of the clock delay line and the command delay line to be substantially the same with each other, in response to the control signal.

Abstract: A clock generation circuit includes a delay line, a delay modeling block, a phase detection block, a multi-update signal generation block, and a delay line. The delay line delays an input clock and generates a delayed clock. The delay modeling block delays the delayed clock by a modeled delay value and generates a feedback clock. The phase detection block compares phases of the input clock and the feedback clock and generates phase information, and quantizes a phase difference between the input clock and the feedback clock and generates phase codes. The multi-update signal generation block generates a multi-update signal in response to the phase codes. The delay line control block changes a delay amount of the delay line in response to the multi-update signal and the phase information.

Abstract: An on-die termination circuit includes a reference period signal generation circuit that generates a reference period signal according to a level of a reference voltage, a first period signal generation circuit that generates a first period signal according to a voltage level of a pad, a period comparison circuit that compares a period of the first period signal with a period of the reference period signal and count a plurality of driving signals, and a driver circuit that drives the pad in response to the plurality of driving signals.

Abstract: A reset signal generation apparatus includes a reset signal generation unit and a reset signal expansion unit. The reset signal generation unit enables a reset signal and an enable signal in response to a reset input signal, and disables the reset signal in response to a pulse width extension signal. The reset signal expansion unit generates the pulse width extension signal that is enabled for a predetermined time, in response to the enable signal.

Abstract: A duty cycle correction circuit includes a clock adjustment unit configured to adjust a duty ratio of an input clock signal in response to a duty control signal and generate an output clock signal, a tracking type setting unit configured to generate an tracking type selection signal for setting a first or second tracking type based on a duty locking state of the output clock signal, and a control signal generation unit configured to generate the duty control signal, into which the first or second tracking type is incorporated, in response to the tracking type selection signal and the output clock signal.

Abstract: A clock generation circuit includes a delay line, which delays an input clock and generates a delayed clock, a delay modeling unit, which delays the delayed clock by a modeled delay value and generates a feedback clock, a phase detection unit, which compares phases of the input clock and the feedback clock and generates a phase detection signal, a filter unit, which receives the phase detection signal and generates phase information, generates an update signal when a difference between the numbers of phase detection signals with a first and a second level generated is greater than or equal to a threshold value, and generates the update signal after a lapse of a predetermined time when the difference is less than the threshold value, and a delay line control unit, which sets a delay value of the delay line in response to the update signal and the phase information.

Abstract: A phase locked loop includes a phase detector configured to compare a phase of an input clock with a phase of a feedback clock to produce a phase comparison result, an initial frequency value provider configured to detect a frequency of the input clock and provide a frequency detection result, a controller configured to generate a frequency control signal based on the phase comparison result and the frequency detection result, and an oscillator configured to generate an output clock in response to the frequency control signal.

Abstract: A semiconductor device includes a characteristic code storage unit configured to store signal transfer characteristic information input through a given pad and output a control code corresponding to the signal transfer characteristic information, and a characteristic reflection unit configured to reflect the signal transfer characteristic information in an input signal input through the given pad, in response to the control code, and to output the reflected input signal.

Abstract: A system for transmitting data includes a plurality of data lines configured to transmit the data and a transmitting chip configured to output the data to the data lines and perform a crosstalk prevention operation in response to a data pattern of the data to be transmitted through the data lines and array information of the data lines to prevent crosstalk from occurring in the data lines.

Abstract: A clock generation circuit includes a delay line, a delay modeling block, a phase detection block, a multi-update signal generation block, and a delay line. The delay line delays an input clock and generates a delayed clock. The delay modeling block delays the delayed clock by a modeled delay value and generates a feedback clock. The phase detection block compares phases of the input clock and the feedback clock and generates phase information, and quantizes a phase difference between the input clock and the feedback clock and generates phase codes. The multi-update signal generation block generates a multi-update signal in response to the phase codes. The delay line control block changes a delay amount of the delay line in response to the multi-update signal and the phase information.