Abstract: The present disclosure relates to successive approximation register analog-to-digital converters. An example successive approximation register analog-to-digital converter includes a first sampling and holding circuit that samples an analog signal at a first point in time and generates a first input voltage, a second sampling and holding circuit that samples the analog signal at a second point in time and generates a second input voltage, and a first analog-to-digital converter. The first analog-to-digital converter performs a feed forward equalization function by receiving the first input voltage and the second input voltage, sampling the first input voltage and the second input voltage, and outputting a multi-bit digital signal based on a sampling result of the first input voltage and a sampling result of the second input voltage.

Abstract: A receiver for receiving a data signal, comprising, an analog-to-digital converter configured to convert the data signal into digital data, a first-in-first-out buffer configured to determine a frame boundary of the digital data by referring to a comma index to output the digital data in units of data frames according to the determined frame boundary, a decision feedback equalizer configured to process a data frame output from the first-in-first-out buffer through a decision feedback equalization operation, wherein feedback data used in the decision feedback equalization operation of the data frame uses a predetermined fixed pattern, and a comma detector configured to generate the comma index by comparing a determined value of the data frame with the predetermined fixed pattern. The data frame may include a preceding data field in which a message is stored and a subsequent comma field having the same bit value as the fixed pattern.

Abstract: An integrated circuit capable of on-chip jitter tolerance measurement includes a jitter generator circuit to produce a controlled amount of jitter that is injected into at least one clock signal, and a receive circuit to sample an input signal according to the at least one clock signal. The sampled data values output from the receiver are used to evaluate the integrated circuit's jitter tolerance.

Abstract: A neural array may include an array unit, a first processing unit, and a second processing unit. The array unit may include synaptic devices. The first processing unit may input a row input signal to the array unit, and receive a row output signal from the array unit. The second processing unit may input a column input signal to the array unit, and receive a column output signal from the array unit. The array unit may have a first array value and a second array value. When the first processing unit or the second processing unit receives an output signal based on the first array value from the array unit which has selected the first array value and then the array unit selects the second array value, it may input a signal generated based on the output signal to the array unit which has selected the second array value.

Abstract: A receiver device implements enhanced data reception with edge-based clock and data recovery such as with a flash analog-to-digital converter architecture. In an example embodiment, the device implements a first phase adjustment control loop, with for example, a bang-bang phase detector, that detects data transitions for adjusting sampling at an optimal edge time with an edge sampler by adjusting a phase of an edge clock of the sampler. This loop may further adjust sampling in received data intervals for optimal data reception by adjusting the phase of a data clock of a data sampler such a flash ADC. The device may also implement a second phase adjustment control loop with, for example, a baud-rate phase detector, that detects data intervals for further adjusting sampling at an optimal data time with the data sampler.

Abstract: An integrated circuit capable of on-chip jitter tolerance measurement includes a jitter generator circuit to produce a controlled amount of jitter that is injected into at least one clock signal, and a receive circuit to sample an input signal according to the at least one clock signal. The sampled data values output from the receiver are used to evaluate the integrated circuit's jitter tolerance.

Abstract: An integrated circuit capable of on-chip jitter tolerance measurement includes a jitter generator circuit to produce a controlled amount of jitter that is injected into at least one clock signal, and a receive circuit to sample an input signal according to the at least one clock signal. The sampled data values output from the receiver are used to evaluate the integrated circuit's jitter tolerance.

Abstract: A receiver device implements enhanced data reception with edge-based clock and data recovery such as with a flash analog-to-digital converter architecture. In an example embodiment, the device implements a first phase adjustment control loop, with for example, a bang-bang phase detector, that detects data transitions for adjusting sampling at an optimal edge time with an edge sampler by adjusting a phase of an edge clock of the sampler. This loop may further adjust sampling in received data intervals for optimal data reception by adjusting the phase of a data clock of a data sampler such a flash ADC. The device may also implement a second phase adjustment control loop with, for example, a baud-rate phase detector, that detects data intervals for further adjusting sampling at an optimal data time with the data sampler.

Abstract: A receiver device implements enhanced data reception with edge-based clock and data recovery such as with a flash analog-to-digital converter architecture. In an example embodiment, the device implements a first phase adjustment control loop, with for example, a bang-bang phase detector, that detects data transitions for adjusting sampling at an optimal edge time with an edge sampler by adjusting a phase of an edge clock of the sampler. This loop may further adjust sampling in received data intervals for optimal data reception by adjusting the phase of a data clock of a data sampler such a flash ADC. The device may also implement a second phase adjustment control loop with, for example, a baud-rate phase detector, that detects data intervals for further adjusting sampling at an optimal data time with the data sampler.

Abstract: A decision-feedback equalizer (DFE) samples an analog input signal against M references during the same symbol time to produce M speculative samples. Select logic in the DFE, then decodes N bits resolved previously for previous symbol times to select one of the M speculative samples as the present resolved bit. The present resolved bit is then stored as the most recent previously resolved bit in preparation for the next symbol time. The select logic can be can be programmable to accommodate process, environmental, and systematic variations.

Abstract: A neuron device may include an input unit, a synapse unit, and an output unit. The synapse unit can be connected with the input unit and may include one or more synapse modules. Each of the one or more synapse modules may include multiple synapse elements connected in series and may be configured to operate in a time division multiplexing mode. Each synapse element may have specific coefficient information. In each of the one or more synapse modules, one of the multiple synapse elements connected in series may be configured to apply coefficient information to one of the multiple input signals received by the input unit. The output unit may obtain a weighted sum of the multiple input signals and may generate an output signal based on the weighted sum.

Abstract: A circuit module includes a model circuit and a look-up table (LUT). The model circuit generates an output signal based on one or more input signals, and corresponds to a digital circuit. The LUT stores one or more control signals and one or more operation parameters that are to be used to implement the model circuit. The one or more control signals and the one or more operation parameters correspond to an index determined by a combination of the one or more input signals and the output signal.

Abstract: An integrated circuit capable of on-chip jitter tolerance measurement includes a jitter generator circuit to produce a controlled amount of jitter that is injected into at least one clock signal, and a receive circuit to sample an input signal according to the at least one clock signal. The sampled data values output from the receiver are used to evaluate the integrated circuit's jitter tolerance.

Abstract: A receiver device implements enhanced data reception with edge-based clock and data recovery such as with a flash analog-to-digital converter architecture. In an example embodiment, the device implements a first phase adjustment control loop, with for example, a bang-bang phase detector, that detects data transitions for adjusting sampling at an optimal edge time with an edge sampler by adjusting a phase of an edge clock of the sampler. This loop may further adjust sampling in received data intervals for optimal data reception by adjusting the phase of a data clock of a data sampler such a flash ADC. The device may also implement a second phase adjustment control loop with, for example, a baud-rate phase detector, that detects data intervals for further adjusting sampling at an optimal data time with the data sampler.

Abstract: A circuit module includes a model circuit and a look-up table (LUT). The model circuit generates an output signal based on one or more input signals, and corresponds to a digital circuit. The LUT stores one or more control signals and one or more operation parameters that are to be used to implement the model circuit. The one or more control signals and the one or more operation parameters correspond to an index determined by a combination of the one or more input signals and the output signal.

Abstract: A decision-feedback equalizer (DFE) samples an analog input signal against M references during the same symbol time to produce M speculative samples. Select logic in the DFE, then decodes N bits resolved previously for previous symbol times to select one of the M speculative samples as the present resolved bit. The present resolved bit is then stored as the most recent previously resolved bit in preparation for the next symbol time. The select logic can be can be programmable to accommodate process, environmental, and systematic variations.

Abstract: An integrated circuit capable of on-chip jitter tolerance measurement includes a jitter generator circuit to produce a controlled amount of jitter that is injected into at least one clock signal, and a receive circuit to sample an input signal according to the at least one clock signal. The sampled data values output from the receiver are used to evaluate the integrated circuit's jitter tolerance.

Abstract: A receiver device implements enhanced data reception with edge-based clock and data recovery such as with a flash analog-to-digital converter architecture. In an example embodiment, the device implements a first phase adjustment control loop, with for example, a bang-bang phase detector, that detects data transitions for adjusting sampling at an optimal edge time with an edge sampler by adjusting a phase of an edge clock of the sampler. This loop may further adjust sampling in received data intervals for optimal data reception by adjusting the phase of a data clock of a data sampler such a flash ADC. The device may also implement a second phase adjustment control loop with, for example, a baud-rate phase detector, that detects data intervals for further adjusting sampling at an optimal data time with the data sampler.

Abstract: A decision-feedback equalizer (DFE) samples an analog input signal against M references during the same symbol time to produce M speculative samples. Select logic in the DFE then decodes N bits resolved previously for previous symbol times to select one of the M speculative samples as the present resolved bit. The present resolved bit is then stored as the most recent previously resolved bit in preparation for the next symbol time. The select logic can be can be programmable to accommodate process, environmental, and systematic variations.

Abstract: A receiver device implements enhanced data reception with edge-based clock and data recovery such as with a flash analog-to-digital converter architecture. In an example embodiment, the device implements a first phase adjustment control loop, with for example, a bang-bang phase detector, that detects data transitions for adjusting sampling at an optimal edge time with an edge sampler by adjusting a phase of an edge clock of the sampler. This loop may further adjust sampling in received data intervals for optimal data reception by adjusting the phase of a data clock of a data sampler such a flash ADC. The device may also implement a second phase adjustment control loop with, for example, a baud-rate phase detector, that detects data intervals for further adjusting sampling at an optimal data time with the data sampler.