Abstract: Tracking circuitry may be used to determine if commands and/or command sequences include illegal commands and/or illegal command sequences. If the commands and/or command sequences include illegal commands and/or illegal command sequences, the tracking circuitry may activate signals that prevent execution of the commands and/or notice of the detected illegal commands and/or command sequences.

Abstract: Embodiments of the disclosure are drawn to apparatuses, systems, methods for performing operations associated with machine learning. Machine learning operations may include processing a data set, training a machine learning algorithm, and applying a trained algorithm to a data set. Some of the machine learning operations, such as pattern matching operations, may be performed within a memory device.

Abstract: Embodiments of the disclosure are drawn to apparatuses, systems, methods for an internet of things (IoT) system to include edge devices that perform at least some functions without communicating with a cloud computing system. An edge device may include a memory with on-memory pattern matching capabilities. The edge device may perform pattern matching operations on data collected by the edge device or sensors in communication with the edge device. Based on results of the pattern matching operations, the edge device may perform various functions, such as transmitting data to the cloud computing system, activating an alarm, and/or changing a frequency at which data is transmitted.

Abstract: A memory device includes a memory cell array and a set of fuse banks including a common fuse bank storing common bit information corresponding to a plurality of defective memory cells in the memory cell array. The memory device including a plurality of match sub-circuits corresponding to respective defective memory cells of the plurality of defective memory cells. Each match sub-circuit can be configured to provide a determination of whether a memory cell address of a memory cell of the memory cell array matches an address of the respective defective memory cell. The plurality of match sub-circuit can include a shared common bit-processing circuit that is configured to receive common bit-by-bit results of a comparison between a portion of the memory cell address and the common bit information. The common bit-processing circuit can determine whether the common bit information matches the portion of the memory cell address.

Abstract: Embodiments of the disclosure are drawn to apparatuses, systems, methods, and memories that are capable of performing pattern matching operations within a memory device. The pattern matching operations may be performed on data stored within the memory based on a pattern stored in a register. The result of the pattern matching operation may be provided by the memory. The data may be retrieved from a memory array for the pattern matching operation by a read operation, a refresh operation, an error correction operation, and/or a pattern matching operation. The data may be retrieved from incoming data input lines instead of or in addition to the memory array. How the data is stored or retrieved for pattern matching operations may be controlled by a memory controller.

Abstract: Signaling indicative of a command to initialize a plurality of memory dies of a memory device can be received by the memory device. Initialization of a memory die of the memory device can be delayed, at the memory die and based at least in part on fuse states of an array of fuses of the memory die, by an amount of time relative to receipt of the signaling by the memory device. Delaying initialization of memory dies of the memory device in a staggered or asynchronous manner can evenly distribute power consumption of the memory dies so that the likelihood of an associated power spike is reduced or eliminated.

Abstract: Methods, systems, and devices for voltage adjustment based on, for example, pending refresh operations are described. A memory device may periodically perform refresh operations to refresh volatile memory cells and may at times postpone performing one or more refresh operations. A memory device may determine a quantity of pending (e.g., postponed) refresh operations, such as by determining a quantity of refresh intervals that have elapsed without receiving or executing a refresh command, among other methods. A memory device may pre-emptively adjust (or cause to be adjusted) a supply voltage associated with the memory device or memory device component based on the quantity of pending refresh operations to prepare for the current demand associated with the performing the one or more pending refresh operations. For example, the memory device may increase a supply voltage associated with one or more components to prepare for performing multiple pending refresh operations.

Abstract: First signaling indicative of instructions to enter a self-refresh (SREF) mode can be received concurrently by a plurality of memory dies. Responsive to a memory die of the plurality of memory dies entering the SREF mode, self-refreshing of memory banks of the memory die can be delayed, at the memory die and based on fuse states of an array of fuses of the memory die, an amount of time relative to receipt of the signaling by the memory die. Delaying self-refreshing of memory banks of memory dies in a staggered, or asynchronous, manner can evenly distribute power consumption of the memory dies so that the likelihood of an associated power spike is reduced or eliminated.

Abstract: Memory devices, systems including memory devices, and methods of operating memory devices and systems are provided, in which at least a subset of a non-volatile memory array is configured to behave as a volatile memory by erasing or degrading data in the event of a changed power condition such as a power-loss event, a power-off event, or a power-on event. In one embodiment of the present technology, a memory device is provided, comprising a non-volatile memory array, and circuitry configured to store one or more addresses of the non-volatile memory array, to detect a changed power condition of the memory device, and to erase or degrade data at the one or more addresses in response to detecting the changed power condition.

Abstract: Embodiments of the disclosure are drawn to apparatuses and methods for staggering the timing of skipped refresh operations on a memory. Memory cells of memories may need to periodically perform refresh operations. In some instances, auto-refresh operations may be periodically skipped when charge retention characteristics of the memory cells of the memory exceed the auto-refresh frequency. To reduce peak current draw during refresh operations, the skipped refresh operations may be staggered across different portions of the memory. In one example, the skipped refresh operation may be staggered in time among memory dies of the memory to limit a number of memory dies that are performing an auto-refresh operation to a maximum number. In another example, the skipped refresh operation may be staggered in time among memory banks of a single memory array to limit a number of memory banks that are performing an auto-refresh operation to a maximum number.

Abstract: Transistor antifuses are disclosed. An apparatus may include an antifuse that may be configurable either as a short between a first node and a second node or as an open between the first node and the second node. The antifuse may include a selection transistor and an antifuse transistor. A source or drain of the selection transistor may be electrically coupled to the first node. A gate of the selection transistor may be configured to receive a selection voltage. A gate of the antifuse transistor may be electrically coupled the other of the source or drain of the selection transistor. A source or drain of the antifuse transistor may be electrically coupled to the second node. Associated devices, systems, and methods are also disclosed.

Abstract: Apparatuses and methods can be related to placing memory in a computing system. The memory modules can be placed in memory slots to couple the memory modules to the computing system. The memory modules and/or the memory slots can have thermal qualities which can be utilized to determine which of the memory modules are placed on which of the memory slots.

Abstract: Methods of optimizing the placement of memories in a memory device including a substrate and an electrical component, and associated devices and systems, are disclosed herein. A representative method includes first testing the memories to determine at least one parameter for each of the memories indicating an ability of the memory to process signals from the electrical component. The method can further include labeling each memory with a label based on the parameter, the labels including at least a first label and a second label. The first label can indicate that the memories with the first label are better able to process signals from the electrical component than the memories with the second label. The method can further include electrically coupling the memories to the substrate such that the memories with the second label are positioned closer to the electrical component than the memories with the first label.

Abstract: A timing of an execution of a command in a memory device can be affected delay elements. The delay elements of a unit of delay elements can cause variable delays of the command paths. The delay elements can be activated based on settings stored in a fuse array of a memory device. The delay elements can be used to change a timing of current draw of the memory devices.

Abstract: Embodiments of the disclosure are drawn to apparatuses, systems, methods for performing operations associated with machine learning. Machine learning operations may include processing a data set, training a machine learning algorithm, and applying a trained algorithm to a data set. Some of the machine learning operations, such as pattern matching operations, may be performed within a memory device.

Abstract: Memory with partial bank refresh is disclosed herein. In one embodiment, a memory system includes a memory controller and a memory device operably connected to the memory controller. The memory device includes (i) a memory array having a memory bank with a plurality of memory cells arranged in a plurality of memory rows and (ii) circuitry. In some embodiments, the circuitry is configured to disable at least one memory row of the memory bank from receiving refresh commands such that memory cells of the at least one memory row are not refreshed during refresh operations of the memory device. In some embodiments, the memory controller is configured to track memory rows that include utilized memory cells and/or to write data to the memory rows in accordance with a programming sequence of the memory device.

Abstract: Methods, systems, and devices for voltage adjustment based on, for example, pending refresh operations are described. A memory device may periodically perform refresh operations to refresh volatile memory cells and may at times postpone performing one or more refresh operations. A memory device may determine a quantity of pending (e.g., postponed) refresh operations, such as by determining a quantity of refresh intervals that have elapsed without receiving or executing a refresh command, among other methods. A memory device may pre-emptively adjust (or cause to be adjusted) a supply voltage associated with the memory device or memory device component based on the quantity of pending refresh operations to prepare for the current demand associated with the performing the one or more pending refresh operations. For example, the memory device may increase a supply voltage associated with one or more components to prepare for performing multiple pending refresh operations.

Abstract: Fuses can store different delay states to cause execution of a command to be staggered for different memory dies of a memory package. Fuse arrays can be included in the memory package and programmed to cause execution of a command to be delayed by different amounts for different dies. The fuse arrays can be fabricated and then programmed to cause different delays for different dies.

Abstract: Methods, apparatuses, and systems related to voltage management of memory apparatuses/systems are described. The memory device can include circuitry configured to determine an operating frequency of a clock signal for an ongoing or an upcoming memory operation. The memory device may generate a control indicator for increasing a system voltage for higher operating frequencies, for decreasing the system voltage for lower operating frequencies, or a combination thereof.

Abstract: Memory devices and systems with automatic background precondition upon powerup, and associated methods, are disclosed herein. In one embodiment, a memory device includes a memory array having a plurality of memory cells and a fuse array configured to store precondition data. The precondition data can identify a portion of the memory array, specify a predetermined precondition state, or a combination thereof. When the memory device powers on, the memory device can be configured to automatically retrieve the precondition data from the fuse array and/or to write memory cells in the portion of the memory array to the predetermined precondition state before executing an access command.