Abstract: A classification system includes: one or more processors; and memory including instructions that, when executed by the one or more processors, cause the one or more processors to: calculate reference Shapley values for features of a data sample based on a first classification model; and train a second classification model though multi-task distillation to: predict Shapley values for the features of the data sample based on the reference Shapley values and a distillation loss; and predict a class label for the data sample based on the predicted Shapley values and a ground truth class label for the data sample.

Abstract: A method and a system are presented for controlling a performance of a fusion model. The method includes obtaining a first set and a second set of candidate models for a first and second neural networks, respectively. Each of the first and second set of candidate models is pre-trained with a first source and a second source, respectively. For each possible pairing of one candidate model from the first neural network and one candidate model from the second neural network, a model distance Dm is determined. A subset of possible pairings of one first candidate model and one second candidate model is selected based on the model distance Dm between them. Using the subset of possible parings, the first neural network and the second neural network are combined to generate two branches for a fusion model neural network.

Abstract: A system and method for classification. In some embodiments, the method includes forming a first training dataset and a second training dataset from a labeled input dataset; training a first classifier with the first training dataset; training a variational auto encoder with the second training dataset, the variational auto encoder comprising an encoder and a decoder; generating a third dataset, by feeding pseudorandom vectors into the decoder; labeling the third dataset, using the first classifier, to form a third training dataset; forming a fourth training dataset based on the third dataset; and training a second classifier with the fourth training dataset.

Abstract: According to some embodiments, a system includes: a memory, an encoder; a decoder, wherein the system is operable to: receive, at the encoder, an input video; divide, by the encoder, the input video into a plurality of video patches; select, by the encoder, codes corresponding to the plurality of video patches of the input video, from a codebook comprising the codes; determine, by the encoder, an assigned code matrix comprising the codes corresponding to the plurality of video patches of the input video; receive, by the decoder, the assigned code matrix from the encoder; and generate, by the decoder, a reconstructed video based on the assigned code matrix.

Abstract: A system includes a memory; and a processor configured to train a first machine learning model based on the first dataset labeling; provide the second dataset to the trained first machine learning model to generate an updated second dataset including an updated second dataset labeling, determine a first difference between the updated second dataset labeling and the second dataset labeling; train a second machine learning model based on the updated second dataset labeling if the first difference is greater than a first threshold value; provide the first dataset to the trained second machine learning model to generate an updated first dataset including an updated first dataset labeling, determine a second difference between the updated first dataset labeling and the first dataset labeling; and train the first machine learning model based on the updated first dataset labeling if the second difference is greater than a second threshold value.

Abstract: A method for detecting a fault includes: receiving a plurality of time-series sensor data obtained in one or more manufacturing processes of an electronic device; arranging the plurality of time-series sensor data in a two-dimensional (2D) data array; providing the 2D data array to a convolutional neural network model; identifying a pattern in the 2D data array that correlates to a fault condition using the convolutional neural network model; providing a fault indicator of the fault condition in the one or more manufacturing processes of the electronic device; and determining that the electronic device includes a fault based on the fault indicator. The 2D data array has a dimension of an input data to the convolutional neural network model.

Abstract: A system for manufacturing defect classification is presented. The system includes a first neural network receiving a first data as input and generating a first output, a second neural network receiving a second data as input and generating a second output, wherein first neural network and the second neural network are trained independently from each other, and a fusion neural network receiving the first output and the second output and generating a classification. The first data and the second data do not have to be aligned. Hence, the system and method of this disclosure allows various type of data that are collected during manufacturing to be used in defect classification.

Abstract: A system and method for classifying products. A processor generates first and second instances of a first classifier, and trains the instances based on an input dataset. A second classifier is trained based on the input, where the second classifier is configured to learn a representation of a latent space associated with the input. A first supplemental dataset is generated in the latent space, where the first supplemental dataset is an unlabeled dataset. A first prediction is generated for labeling the first supplemental dataset based on the first instance of the first classifier, and a second prediction is generated for labeling the first supplemental dataset based on the second instance of the first classifier. Labeling annotations are generated for the first supplemental dataset based on the first prediction and the second prediction. A third classifier is trained based on at least the input dataset and the annotated first supplemental dataset.

Abstract: A system and method for defect detection. In some embodiments, the method includes: identifying, by a first neural network, a suspicious area in a first image; selecting, from among a set of defect-free reference images, by a second neural network, a defect-free reference image corresponding to the first image; identifying, by a third neural network, in the defect-free reference image, a reference region corresponding to the suspicious area; and determining, by a fourth neural network, a measure of similarity between the suspicious area and the reference region.

Abstract: A system including: a memory, an encoder, a decoder, and a processor, the processor being connected to the memory, the encoder, and the decoder. The system is configured to: receive, at the encoder, an input image, divide, by the encoder, the input image into a plurality of image patches, select, by the encoder, codes corresponding to the plurality of image patches of the input image, from a codebook including the codes. The system is further configured to determine, by the encoder, an assigned code matrix including the codes corresponding to the plurality of image patches of the input image, receive, by the decoder, the assigned code matrix from the encoder. The system is further configured to generate, by the decoder, a reconstructed image based on the assigned code matrix.

Abstract: A system and method for defect detection. The method may include training, with a first set of images, a first neural network including a first student neural network, and a first teacher neural network. The training of the first neural network may include introducing defects into a first subset of the first set of images, and training the first student neural network with the first set of images. The training of the first student neural network may include using a first cost function, that: for an image of the first set and not of the first subset, rewards similarity between a feature map of the first student neural network and a feature map of the first teacher neural network, and for an image of the first subset, rewards dissimilarity between a feature map of the first student neural network and a feature map of the first teacher neural network.

Abstract: A method for detecting a fault includes: receiving a plurality of time-series sensor data obtained in one or more manufacturing processes of an electronic device; arranging the plurality of time-series sensor data in a two-dimensional (2D) data array; providing the 2D data array to a convolutional neural network model; identifying a pattern in the 2D data array that correlates to a fault condition using the convolutional neural network model; providing a fault indicator of the fault condition in the one or more manufacturing processes of the electronic device; and determining that the electronic device includes a fault based on the fault indicator. The 2D data array has a dimension of an input data to the convolutional neural network model.

Abstract: A system and method for classifying products. A processor generates first and second instances of a first classifier, and trains the instances based on an input dataset. A second classifier is trained based on the input, where the second classifier is configured to learn a representation of a latent space associated with the input. A first supplemental dataset is generated in the latent space, where the first supplemental dataset is an unlabeled dataset. A first prediction is generated for labeling the first supplemental dataset based on the first instance of the first classifier, and a second prediction is generated for labeling the first supplemental dataset based on the second instance of the first classifier. Labeling annotations are generated for the first supplemental dataset based on the first prediction and the second prediction. A third classifier is trained based on at least the input dataset and the annotated first supplemental dataset.

Abstract: A system for manufacturing defect classification is presented. The system includes a first neural network receiving a first data as input and generating a first output, a second neural network receiving a second data as input and generating a second output, wherein first neural network and the second neural network are trained independently from each other, and a fusion neural network receiving the first output and the second output and generating a classification. The first data and the second data do not have to be aligned. Hence, the system and method of this disclosure allows various type of data that are collected during manufacturing to be used in defect classification.

Abstract: A system includes a memory; and a processor configured to train a first machine learning model based on the first dataset labeling; provide the second dataset to the trained first machine learning model to generate an updated second dataset including an updated second dataset labeling, determine a first difference between the updated second dataset labeling and the second dataset labeling; train a second machine learning model based on the updated second dataset labeling if the first difference is greater than a first threshold value; provide the first dataset to the trained second machine learning model to generate an updated first dataset including an updated first dataset labeling, determine a second difference between the updated first dataset labeling and the first dataset labeling; and train the first machine learning model based on the updated first dataset labeling if the second difference is greater than a second threshold value.

Abstract: A system includes a memory; and a processor configured to train a first machine learning model based on the first dataset labeling; provide the second dataset to the trained first machine learning model to generate an updated second dataset including an updated second dataset labeling, determine a first difference between the updated second dataset labeling and the second dataset labeling; train a second machine learning model based on the updated second dataset labeling if the first difference is greater than a first threshold value; provide the first dataset to the trained second machine learning model to generate an updated first dataset including an updated first dataset labeling, determine a second difference between the updated first dataset labeling and the first dataset labeling; and train the first machine learning model based on the updated first dataset labeling if the second difference is greater than a second threshold value.

Abstract: Systems and methods for making predictions relating to products manufactured via a manufacturing process. A processor receives a plurality of input vectors associated with a plurality of output values and a plurality of time intervals. The processor clusters the plurality of input vectors based on the time intervals associated with the input vectors. The processor trains a machine learning model for each time interval of the plurality of time intervals, where the training of the machine learning model is based on the input vectors associated with the time interval, and the output values associated with the input vectors. The processor further trains a classifier for selecting one of the plurality of time intervals for input data received for a product. In one embodiment, the machine learning model associated with the time interval selected by the classifier is invoked to predict an output based on the input data.

Abstract: Systems and methods for classifying products are disclosed. A first data sample having a first portion and a second portion is identified from a training dataset. A first mask is generated based on the first data sample, where the first mask is associated with the first portion of the first data sample. A second data sample is generated based on a noise input. The first mask is applied to the second data sample for outputting a third portion of the second data sample. The third portion of the second data sample is combined with the second portion of the first data sample for generating a first combined data sample. Confidence and classification of the first combined data sample are predicted. The first combined data sample is added to the training dataset in response to predicting the confidence and the classification.

Abstract: A method of training a system for making predictions relating to products manufactured via a manufacturing process includes receiving a plurality of input vectors and a plurality of defect values corresponding to the plurality of input vectors, identifying a plurality of first cluster labels corresponding to the plurality of input vectors based on the defect values, training a cluster classifier based on the input vectors and the corresponding first cluster labels, reassigning the input vectors to a plurality of second cluster labels based on outputs of the cluster classifier, retraining the cluster classifier based on the input vectors and the second cluster labels, and training a plurality of machine learning models corresponding to the second cluster labels.

Abstract: Systems and method for classifying manufacturing defects are disclosed. A first machine learning model is trained with a training dataset, and a data sample that satisfies a criterion is identified from the training dataset. A second machine learning model is trained to learn features of the data sample. When an input dataset that includes first and second product data is received, the second machine learning model is invoked for predicting confidence of the first and second product data based on the learned features of the data sample. In response to predicting the confidence of the first and second product data, the first product data is removed from the dataset, and the first machine learning model is invoked for generating a classification based the second product data.