Patents by Inventor John M. Cohn
John M. Cohn has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 6948146Abstract: The invention provides a design and an integrated circuit having a substantially uniform density and electrical characteristics between parts of the IC that are angled at 45 degrees relative to one another. In particular, the invention provides fill tiling patterns oriented substantially uniformly to electrical structures of either orthogonal or 45 degree angle orientation.Type: GrantFiled: January 9, 2003Date of Patent: September 20, 2005Assignee: International Business Machines CorporationInventors: Robert J. Allen, John M. Cohn, Peter A. Habitz, William C. Leipold, Ivan L. Wemple, Paul S. Zuchowski
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Patent number: 6924661Abstract: An integrated circuit structure has at least one voltage island and a pattern of power switches within the voltage island. The pattern determines the number of (and evenly spaces) the power switches according to the size of the serviceable area to which each of the power switches can provide power. The size of the power switches are matched to the current and voltage that will be provided by the power buses. The size of the serviceable area to which each of the power switches can provide power is dependent upon the size of the power switches.Type: GrantFiled: February 10, 2003Date of Patent: August 2, 2005Assignee: International Business Machines CorporationInventors: Patrick H. Buffet, John M. Cohn, Kevin M. Grosselfinger, Susan K. Lichtensteiger, William F. Smith
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Publication number: 20040258294Abstract: In a first aspect, an inventive apparatus for imaging a chip on a wafer includes a combined diamond chip image and kerf image having a plurality of sloped sides. The combined diamond chip image and kerf image includes a diamond chip image comprising a plurality of chip image rows that are parallel to at least one diagonal of the diamond chip image, and includes a kerf image adjacent to the diamond chip image. The kerf image comprises at least one kerf image row that is parallel to the at least one diagonal of the diamond chip image. The apparatus further includes a blocking material extending from the combined diamond chip image and kerf image to at least a periphery of an exposure field of a stepper. In a second aspect the imaging apparatus comprises an n-sided polygon-shaped combined chip image and kerf image. Also provided are inventive methods of manufacturing chips, and wafers manufactured in accordance with the inventive methods.Type: ApplicationFiled: June 20, 2003Publication date: December 23, 2004Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATIONInventors: Robert J. Allen, John M. Cohn, Scott W. Gould, Peter A. Habitz, Juergen Koehl, Gustavo E. Tellez, Ivan L. Wemple, Paul S. Zuchowski
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Patent number: 6825711Abstract: An integrated circuit, method and system providing finer granularity dynamic voltage control without performance loss. The invention provides a means for dynamically changing a voltage level of at least one stage on a critical path for a particular cycle. In this way, optimum voltages can be provided to the stages for the given expectation.Type: GrantFiled: April 30, 2003Date of Patent: November 30, 2004Assignee: International Business Machines CorporationInventors: John M. Cohn, Kenneth J. Goodnow, Scott W. Gould, Douglas W. Stout, Sebastian T. Ventrone
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Publication number: 20040222444Abstract: A multiple supply gate array structure facilitated by the provision of a shared n-well and an isolated n-well is described. The gate array structure allows implementation of a single voltage circuit or a multiple voltage circuit. In addition, the gate array structure allows metal reprogram to provide standard logic functions, or special logic functions such as a buffer function for a signal crossing a voltage island boundary. Other special logic functions may include, for example, a level-shifter function or a fence-hold function.Type: ApplicationFiled: May 7, 2003Publication date: November 11, 2004Applicant: International Business Machines CorporationInventors: John M. Cohn, Kevin M. Grosselfinger, William F. Smith, Paul S. Zuchowski
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Publication number: 20040217805Abstract: An integrated circuit, method and system providing finer granularity dynamic voltage control without performance loss. The invention provides a means for dynamically changing a voltage level of at least one stage on a critical path for a particular cycle. In this way, optimum voltages can be provided to the stages for the given execution.Type: ApplicationFiled: April 30, 2003Publication date: November 4, 2004Applicant: International Business Machines CorporationInventors: John M. Cohn, Kenneth J. Goodnow, Scott W. Gould, Douglas W. Stout, Sebastian T. Ventrone
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Patent number: 6792582Abstract: Both logical and physical construction of voltage islands is disclosed. A semiconductor chip design is partitioned into “bins”, which are areas of the design. In this way, a semiconductor chip design may be “sliced” into various areas and the areas may then be assigned to various voltage levels. Each bin may be thought of as a voltage island. Circuits in the design can be added to or removed from the various bins, thereby increasing or decreasing the speed and power of the circuits: the speed and power increase if a circuit is placed into a bin assigned a higher voltage, and the speed and power decrease if a circuit is placed into a bin having a lower voltage. The size and location of the bins may also be changed. By iterating these steps, the optimum power consumption may be met while still meeting speed constraints and other criteria.Type: GrantFiled: November 15, 2000Date of Patent: September 14, 2004Assignee: International Business Machines CorporationInventors: John M Cohn, Alvar A. Dean, David J. Hathaway, David E. Lackey, Thomas M. Lepsic, Susan K. Lichtensteiger, Scott A. Tetreault, Sebastian T. Ventrone
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Publication number: 20040155681Abstract: An integrated circuit structure has at least one voltage island and a pattern of power switches within the voltage island. The pattern determines the number of (and evenly spaces) the power switches according to the size of the serviceable area to which each of the power switches can provide power. The size of the power switches are matched to the current and voltage that will be provided by the power buses. The size of the serviceable area to which each of the power switches can provide power is dependent upon the size of the power switches.Type: ApplicationFiled: February 10, 2003Publication date: August 12, 2004Applicant: International Business Machines CorporationInventors: Patrick H. Buffet, John M. Cohn, Kevin M. Grosselfinger, Susan K. Lichtensteiger, William F. Smith
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Publication number: 20040139417Abstract: The invention provides a design and an integrated circuit having a substantially uniform density and electrical characteristics between parts of the IC that are angled at 45 degrees relative to one another. In particular, the invention provides fill tiling patterns oriented substantially uniformly to electrical structures of either orthogonal or 45 degree angle orientation.Type: ApplicationFiled: January 9, 2003Publication date: July 15, 2004Applicant: International Business Machines CorporationInventors: Robert J. Allen, John M. Cohn, Peter A. Habitz, William C. Leipold, Ivan L. Wemple, Paul S. Zuchowski
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Patent number: 6751744Abstract: A method for checking integrated circuit designs comprising the steps of calculating a first performance parameter by analyzing the network's sensitivity to a signal applied to the network; comparing the first performance parameter to one or more rules to determine a first pass condition and writing the value of first performance parameter to a netlist file in response to a pass to the first pass condition; followed by calculating a second performance parameter based on a first network model to determine a second pass condition in response to a fail to said first pass condition and writing the second performance parameter to the netlist file in response to a pass to said second pass condition or writing an error flag to the netlist file in response to a fail to said second pass condition is disclosed. The method, at each step, decides if a quick to calculate parameter provides sufficient design margin or if a more accurate but longer to calculate parameter is required.Type: GrantFiled: December 30, 1999Date of Patent: June 15, 2004Assignee: International Business Machines CorporationInventors: Robert J. Allen, John M. Cohn, David J. Hathaway
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Patent number: 6687883Abstract: A method for reducing leakage power of a logic network comprising the steps of: using (observability) don't care information to identify “sleep states” for individual nets; determining based on probabilistic analysis at least one net in which expected power consumption will be reduced by forcing a net to a particular value during at least a portion of a “sleep state”; and forcing the determined net to the determined value determined portion of that “sleep state”.Type: GrantFiled: December 28, 2000Date of Patent: February 3, 2004Assignee: International Business Machines CorporationInventors: John M. Cohn, Alvar A. Dean, David J. Hathaway, Sebastian T. Ventrone
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Publication number: 20030158714Abstract: An electrical wiring structure and method of designing thereof. The method identifies at least one wire pair having a first wire and a second wire. The second wire is already tri-stated or can be tri-stated. The wire pair may have a same-direction switching probability per clock cycle that is no less than a predetermined or user-selected minimum same-direction switching probability. Alternatively, the wire pair may have an opposite-direction switching probability per clock cycle that is no less than a predetermined or user-selected minimum opposite-direction switching probability. The first wire and the second wire satisfy at least one mathematical relationship involving: a spacing between the first wire and the second wire; and a common run length of the first wire and the second wire.Type: ApplicationFiled: February 12, 2001Publication date: August 21, 2003Inventors: John M. Cohn, Alvar A. Dean, Amir H. Farrahi, David J. Hathaway, Thomas M. Lepsic, Jagannathan Narasimhan, Scott A. Tetreault, Sebastian T. Ventrone
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Patent number: 6574779Abstract: A method for hierarchical layout of an electronic design using an electronic computer aided design system, wherein the method includes generating a parameterized pattern library and using an existing netlist and analyze in a pattern recognizer, from which a list of associations between the pattern library and the netlist is created. Renesting then occurs wherein the netlist using the list of associations is used for generating a hierarchical layout of the electronic components in the design.Type: GrantFiled: April 12, 2001Date of Patent: June 3, 2003Assignee: International Business Machines CorporationInventors: Robert J. Allen, John M. Cohn, Steve G. Lovejoy
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Patent number: 6523154Abstract: A method of analyzing supply voltage drops in a power grid for distributing power to an integrated circuit chip during design. The method initially comprises providing a library of circuits for use in designing an integrated circuit chip and determining a supply current requirement and an operating voltage range for each circuit in the circuit library. The method then includes calculating an admittance matrix representing the power grid with a pre-specified array of circuit ports defined by intersection of the power grid and a modeling grid, assigning regions of the power grid to each of the ports, and placing a set of circuits from the circuit library in regions on the power grid.Type: GrantFiled: December 14, 2000Date of Patent: February 18, 2003Assignee: International Business Machines CorporationInventors: John M. Cohn, James Venuto, Ivan L. Wemple, Paul S. Zuchowski
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Patent number: 6523159Abstract: A method and a related program storage product for adding decoupling capacitance in an integrated circuit during the floor planning stage of the integrated circuit design. The invention overlay a power grid on the floor plan and then divides the power grid into regions or macros. For each region or macro, a support decoupling capacitance value required to support a voltage of the power grid and a native capacitance value are determined. Based on those values, a required decoupling capacitance value along with its decoupling capacitance area is determined. The design is then alternated based on the decoupling capacitance area.Type: GrantFiled: January 16, 2001Date of Patent: February 18, 2003Assignee: International Business Machines CorporationInventors: Kerry Bernstein, John M. Cohn, Jose L. P. Neves
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Publication number: 20020194575Abstract: A method for hierarchical layout of an electronic design using an electronic computer aided design system, wherein the method includes generating a parameterized pattern library and using an existing netlist and analyze in a pattern recognizer, from which a list of associations between the pattern library and the netlist is created. Renesting then occurs wherein the netlist using the list of associations is used for generating a hierarchical layout of the electronic components in the design.Type: ApplicationFiled: April 12, 2001Publication date: December 19, 2002Inventors: Robert J. Allen, John M. Cohn, Steve G. Lovejoy
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Patent number: 6490708Abstract: A method of integrated circuit design using the selective replacement of increasingly noise tolerant cells is disclosed. The method involves compiling a library comprising a plurality of design element cells, sorting the library into groups of functionally-equivalent cells, and ordering the cells in each group from one extreme to the other extreme value of a featured parameter for which the integrated circuit is to be tested. Each one of the cells in the library have a known value of another parameter so that the substitution of a library cell for an original cell or another library cell does not affect the overall integrated circuit value for that known parameter. A substitution can thus be made with the knowledge that additional problems involving the known parameter are not being created.Type: GrantFiled: March 19, 2001Date of Patent: December 3, 2002Assignee: International Business Machines CorporationInventors: John M. Cohn, Scott W. Gould, Peter A. Habitz, Jose L. P. Neves, William F. Smith, Larry Wissel, Paul S. Zuchowski
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Patent number: 6473881Abstract: A single pattern-matching algorithm which allows both exact and inexact pattern-matching so that transistor-level design automation tools can reliably perform timing analysis, electrical rules checking, noise analysis, test pattern generation, formal design verification, and the like prior to manufacturing custom logic. The user (circuit designer) specifies which of each of the pattern external nets may be matched inexactly (attached to Vdd, attached to GND, and shorted to other external nets), with the remainder of the pattern external net connections being matched using exact isomorphism constraints. The method described herein achieves a substantial reduction in the number of patterns which circuit designers must generate, and altogether eliminates the need for an exponential number of patterns by providing an inexact pattern matcher to circuit designers.Type: GrantFiled: October 31, 2000Date of Patent: October 29, 2002Assignee: International Business Machines CorporationInventors: Valerie D. Lehner, John M. Cohn, Ulrich A. Finkler
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Publication number: 20020133791Abstract: A method of integrated circuit design using the selective replacement of increasingly noise tolerant cells is disclosed. The method involves compiling a library comprising a plurality of design element cells, sorting the library into groups of functionally-equivalent cells, and ordering the cells in each group from one extreme to the other extreme value of a featured parameter for which the integrated circuit is to be tested. Each one of the cells in the library have a known value of another parameter so that the substitution of a library cell for an original cell or another library cell does not affect the overall integrated circuit value for that known parameter. A substitution can thus be made with the knowledge that additional problems involving the known parameter are not being created.Type: ApplicationFiled: March 19, 2001Publication date: September 19, 2002Applicant: International Business Machines CorporationInventors: John M. Cohn, Scott W. Gould, Peter A. Habitz, Jose L. P. Neves, William F. Smith, Larry Wissel, Paul S. Zuchowski
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Publication number: 20020116440Abstract: A method for reducing leakage power of a logic network comprising the steps of: using (observability) don't care information to identify “sleep states” for individual nets; determining based on probabilistic analysis at least one net in which expected power consumption will be reduced by forcing a net to a particular value during at least a portion of a “sleep state”; and forcing the determined net to the determined value determined portion of that “sleep state”.Type: ApplicationFiled: December 28, 2000Publication date: August 22, 2002Inventors: John M. Cohn, Alvar A. Dean, David J. Hathaway, Sebastian T. Ventrone