Abstract: A method for calibrating a coulomb counting based state-of-charge (SOC) estimation of a battery cell includes: determining whether the battery cell is in a specific charge state; calibrating an initial value for use in the coulomb counting based SOC estimation according to an open circuit voltage (OCV)-based SOC of the battery cell if the battery cell is not in the specific charge state; calibrating the initial value according to a predetermined value if the battery cell is in the specific charge state; and applying the calibrated initial value to the coulomb counting based SOC estimation and restarting an integration of the coulomb counting based SOC estimation based on the calibrated initial value.

Abstract: A method for calibrating a coulomb counting based state-of-charge (SOC) estimation of a battery cell includes: determining whether the battery cell is in a specific charge state; calibrating an initial value for use in the coulomb counting based SOC estimation according to an open circuit voltage (OCV)-based SOC of the battery cell if the battery cell is not in the specific charge state; calibrating the initial value according to a predetermined value if the battery cell is in the specific charge state; and applying the calibrated initial value to the coulomb counting based SOC estimation and restarting an integration of the coulomb counting based SOC estimation based on the calibrated initial value.

Abstract: Methods are provided to be able to efficiently and precisely estimate/predict an available capacity of a battery. One method is arranged to estimate/predict the available capacity of the battery according to a first battery percentage result, a second battery percentage result, and a calculated power when the battery is being operated or used within a specific operating range distinct from a normal operating range. Another method is arranged to estimate the available capacity by measuring battery's internal resistance and referencing a precise battery aging model.

Abstract: A method capable of accurately estimating a power percentage of a battery includes: performing a first fuel gauge operation to measure a power percentage of the battery to generate first information; performing a second fuel gauge operation to measure the power percentage of the battery to generate second information, the first fuel gauge operation being different from the second fuel gauge operation; and, dynamically determining one among at least the first percentage and the second percentage as the power percentage of the battery.

Abstract: The present invention provides antisense oligoribonucleotides with sequences that recognize and bind to the c-myc gene or c-myc mRNA, where one or more sugar residues of the oligoribonucleotides are modified by the substitution of DNP at the 2?-O position. The antisense oligoribonucleotides can be used for inhibiting the growth of cells in which the c-myc gene is overexpressed by down-regulation of transcription of c-myc RNA or translation of the c-myc protein. The antisense oligoribonucleotides can also be used for diagnostic purposes to identify the overexpression of the c-myc gene. The nucleotide sequence of the DNP-oligoribonucleotides is complementary to the sequence 578 to 598 in c-myc mRNA and does not contain a G-quartet motif. This DNP-RNA can silence c-myc gene expression both in vitro and in vivo with high efficacy and sequence specificity.

Abstract: A method for re-testing semiconductor device includes following processes: (1) providing a first carrier for accommodating semiconductor devices which have been tested; (2) taking the semiconductor devices out from the first carrier and placing them according to the information of a fist map by a pick-and-place machine, wherein the information of the first map has the coordinates of the positions of the film frame where the semiconductor is to be placed; (3) placing the film frame with the semiconductor devices placed thereon to a testing machine, and re-testing the semiconductor devices according to the information of the first map by the tester; (4) placing the film frame with the semiconductor devices attached thereon to a pick-and-place machine, and taking the semiconductor devices out according to the result of the retesting from the film frame, and placing the semiconductor devices on at least one carriers.