Patents by Inventor Jun Tamura

Jun Tamura has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8049990
    Abstract: A cleaning tape has a base tape made of a synthetic resin and a cleaning layer formed on a surface of this base tape. The cleaning layer has a binding agent and a large number of spherical particles dispersed in the binding agent in a single particle layer. Such a cleaning tape is capable of removing very small unwanted protrusions and particles on the surface of a target object such as a magnetic hard disk without forming scratches.
    Type: Grant
    Filed: September 30, 2008
    Date of Patent: November 1, 2011
    Assignee: Nihon Micro Coating Co., Ltd.
    Inventors: Yuji Horie, Yasuyuki Yokota, Jun Tamura, Akihiro Sakamoto, Noriyuki Kumasaka
  • Publication number: 20110240224
    Abstract: Disclosed is a substrate processing apparatus capable of suppressing generation of plasma in the space between a moving electrode and an end wall at one side of a cylindrical chamber. The substrate processing apparatus includes a cylindrical chamber to receive a wafer, a shower head movable along a central axis of the chamber inside the chamber, a susceptor opposing the shower head in the chamber, and a flexible bellows connecting the shower head to a cover of the chamber, wherein a high frequency power is applied to a processing space presented between the shower head and the susceptor, processing gas is introduced into the processing space, the shower head and the side wall of the chamber are non-contact to each other, and a bypass member is installed electrically connecting the shower head and the cover or the side wall of the chamber.
    Type: Application
    Filed: March 23, 2011
    Publication date: October 6, 2011
    Applicant: TOKYO ELECTRON LIMITED
    Inventors: Akihiro YOSHIMURA, Tetsuji SATO, Masato HORIGUCHI, Nobuhiro WADA, Makoto KOBAYASHI, Hiroshi TSUJIMOTO, Jun TAMURA, Mamoru NAOI
  • Patent number: 8029333
    Abstract: A device for polishing the peripheral edge part of a semiconductor wafer includes a wafer stage for holding the wafer, a wafer stage unit including devices for rotating the wafer stage, causing the wafer stage to undergo a rotary reciprocating motion within the same plane as the surface of the wafer stage, and moving the wafer stage parallel to the surface, a notch polishing part for polishing the notch on the wafer and a bevel polishing part for polishing the beveled part of the wafer. Pure water is supplied to the wafer to prevent it from becoming dry as it is transported from the notch polishing part to the bevel polishing part.
    Type: Grant
    Filed: October 17, 2007
    Date of Patent: October 4, 2011
    Assignees: EBARA Corporation, NIHON Micro Coating Co., Ltd.
    Inventors: Tamami Takahashi, Kenya Ito, Mitsuhiko Shirakashi, Kazuyuki Inoue, Kenji Yamaguchi, Masaya Seki, Satoru Sato, Jun Watanabe, Kenji Kato, Jun Tamura, Souichi Asakawa
  • Patent number: 8026150
    Abstract: A method of manufacturing a semiconductor device, including an interlayer insulating layer having a dielectric constant of about 1, includes at least one of hydrophobically modifying an interlayer insulating film for insulating lines from each other, before forming air gaps in the interlayer insulating film, and hydrophobically modifying the lines, after forming the air gaps in the interlayer insulating film.
    Type: Grant
    Filed: June 5, 2009
    Date of Patent: September 27, 2011
    Assignee: Tokyo Electron Limited
    Inventors: Reiko Sasahara, Jun Tamura, Shigeru Tahara
  • Patent number: 7994570
    Abstract: A semiconductor device in which current flows in a vertical direction includes a structure that decreases resistance between a source electrode and a drain electrode along with a current path at a position different from a position having highest electric field intensity between the source electrode and the drain electrode.
    Type: Grant
    Filed: April 14, 2009
    Date of Patent: August 9, 2011
    Assignee: Renesas Electronics Corporation
    Inventor: Jun Tamura
  • Publication number: 20110132873
    Abstract: A distance between electrodes can be accurately measured by using a lifter. A substrate processing apparatus includes an upper electrode 120 and a lower electrode 310 facing each other within a processing chamber 102; a lift pin 332 that is protrusible from and retractable below the lower electrode and lifts up a substrate mounted on the lower electrode to be separated from the lower electrode; a lifter 330 that elevates the lift pin up and down; and a controller 400 that elevates the lift pin upward and brings the lift pin into contact with the upper electrode by driving the lifter while the substrate is not mounted on the lower electrode and measures a distance between the electrodes based on a moving distance of the lifter.
    Type: Application
    Filed: December 2, 2010
    Publication date: June 9, 2011
    Applicant: TOKYO ELECTRON LIMITED
    Inventors: Hiroshi Tsujimoto, Makoto Kobayashi, Jun Tamura, Nobuhiro Wada
  • Patent number: 7927187
    Abstract: A circular polishing pad has grooves formed on the surface in a spiral pattern with its center point offset from the center of the pad. The spiral pattern is an Archimedean spiral pattern or a parabolic spiral pattern. A target object is polished by using such a polishing pad without oscillating the platen to which the polishing pad is pasted or the polishing head that holds the target object.
    Type: Grant
    Filed: May 23, 2008
    Date of Patent: April 19, 2011
    Assignee: NIHON Micro Coating Co., Ltd.
    Inventors: Jun Watanabe, Tetsujiro Tada, Takashi Arahata, Jun Tamura, Moriaki Akazawa, Masaru Sakamoto, Takahiko Kawasaki
  • Patent number: 7892694
    Abstract: An electrolytic membrane comprising a porous membrane substrate containing a cross-linked polymer electrolyte having at least a structural component shown by following chemical formula 1: wherein A represents a repeating unit having an aromatic hydrocarbon group substituted by at least a sulfonic acid group, B represents a repeating unit having one of a nitrogen-containing hetero ring compound residue, and the sulfate, hydrochloride or organic sulfonate thereof, C represents a repeating unit having a cross-linked group, and X, Y and Z represent mol fractions of respective repeating units in the chemical formula 1, with 0.34?X?0.985, 0.005?Y?0.49, 0.01?Z?0.495 and Y?X and Z?X, provided that, in the repeating unit A, a ratio of the aromatic hydrocarbon group substituted by at least a sulfonic acid group is 0.3 to 1.0, and the number of the sulfonic acid group in the aromatic hydrocarbon group is 1 to 3.
    Type: Grant
    Filed: December 27, 2006
    Date of Patent: February 22, 2011
    Assignee: Kabushiki Kaisha Toshiba
    Inventors: Yoshihiko Nakano, Hideo Ohta, Kazuhiro Yasuda, Jun Tamura
  • Patent number: 7887940
    Abstract: A proton conductive inorganic material includes oxide particles containing at least one element X selected from the group consisting of W, Mo, Cr, B and V, an oxide carrier carrying the oxide particles and containing at least one element Y selected from the group consisting of Sn, Hf, Ge, Ga, In, Ce and Nb.
    Type: Grant
    Filed: March 27, 2006
    Date of Patent: February 15, 2011
    Assignee: Kabushiki Kaisha Toshiba
    Inventors: Jun Tamura, Yoshihiko Nakano, Hideo Oota
  • Patent number: 7871740
    Abstract: A fuel cell, which can supply stable output even at elevated temperatures and can maintain its power generation performance over a long period of time, can be realized by an electrode for a fuel cell comprising a catalyst layer formed of a catalyst composite and a binder, the catalyst composite comprising a proton-conductive inorganic oxide and an oxidation-reduction catalyst phase supported on the proton-conductive inorganic oxide, the proton-conductive inorganic oxide comprising a catalyst carrier selected from tin(Sn)-doped In2O3, fluorine(F)-doped SnO2, and antimony(Sb)-doped SnO2 and an oxide particle phase chemically bonded to the surface of the catalyst carrier.
    Type: Grant
    Filed: July 17, 2007
    Date of Patent: January 18, 2011
    Assignee: Kabushiki Kaisha Toshiba
    Inventors: Jun Tamura, Yoshihiko Nakano, Wu Mei, Satoshi Mikoshiba
  • Patent number: 7808021
    Abstract: A lateral MOSFET according to the present invention has a trench gate structure having a cross sectional shape spreading toward an open end. The cross sectional shape is T-shape. The T-shaped cross section has a dimensional ratio of a width of a lower trench having a narrow width to a width of an upper trench having a wide width of 1:3, and a dimensional ratio of a depth of the lower trench to a depth of the upper trench of 1:1, the lower trench width having a same central axis as the upper trench width.
    Type: Grant
    Filed: February 25, 2008
    Date of Patent: October 5, 2010
    Assignee: NEC Electronics Corporation
    Inventor: Jun Tamura
  • Publication number: 20100239950
    Abstract: A catalyst layer-supporting substrate includes a substrate and a catalyst layer. The catalyst layer includes a catalyst material and pores. The catalyst layer is formed on the substrate. The catalyst material has a layer or wire shape. A half-value width of a main peak of the catalyst material, as determined from X-ray diffraction spectrum of the catalyst layer, is 1.5° or more. A porosity of the catalyst layer is 30% or more.
    Type: Application
    Filed: March 18, 2010
    Publication date: September 23, 2010
    Inventors: Wu MEI, Jun Tamura, Mutsuki Yamazaki, Yoshihiko Nakano
  • Patent number: 7759019
    Abstract: A cathode includes a diffusion layer, and a porous catalyst layer provided on the diffusion layer. The porous catalyst layer has a thickness not greater than 60 ?m, a porosity of 30 to 70% and a pore diameter distribution including a peak in a range of 20 to 200 nm of a pore diameter. A volume of pores having a diameter of 20 to 200 nm is not less than 50% of a pore volume of the porous catalyst layer. The porous catalyst layer contains a supported catalyst comprising 10 to 30% by weight of a fibrous supported catalyst and 70 to 90% by weight of a granular supported catalyst. The fibrous supported catalyst includes a carbon nanofiber having a herringbone structure or a platelet structure. The granular supported catalyst includes a carbon black having 200 to 600 mL/100 g of a dibutyl phthalate (DBP) absorption value.
    Type: Grant
    Filed: March 9, 2006
    Date of Patent: July 20, 2010
    Assignee: Kabushiki Kaisha Toshiba
    Inventors: Wu Mei, Miho Maruyama, Jun Tamura, Yoshihiro Akasaka, Yoshihiko Nakano
  • Publication number: 20100003566
    Abstract: The present invention aims to provide a fuel cell anode, a membrane electrode assembly and a fuel cell, so as to obtain high electric power. The fuel cell anode has an electrode catalyst layer, and the electrode catalyst layer comprises a supported catalyst comprises electrically conductive carriers and fine catalytic particles supported thereon, a proton-conductive inorganic oxide supporting SiO2 on its surface, and a proton-conductive organic polymer binder. The SiO2 supported on the inorganic oxide prevents the oxide particles from growing, to ensure the high electric power. It is necessary to control the mixing ratios among the supported catalyst, the proton-conductive oxide and the proton-conductive binder in particular ranges.
    Type: Application
    Filed: October 3, 2008
    Publication date: January 7, 2010
    Applicant: KABUSHIKI KAISHA TOSHIBA
    Inventors: Jun Tamura, Yoshihiko Nakano, Yasuhiro Goto
  • Publication number: 20090325021
    Abstract: A cathode for a fuel cell is provided, which includes an electrode catalyst layer. This electrode catalyst layer is constituted by a carried catalyst including a conductive carrier and catalytic fine particles carried on the conductive carrier, by a proton-conductive inorganic oxide containing an oxide carrier and oxide particles carried on a surface of the oxide carrier, and by a proton-conductive organic polymer binder. The carried catalyst is incorporated therein at a weight of WC. Silicon oxide is carried on the surface of the proton-conductive inorganic oxide at a weight ratio of 0.1-0.5 times as much as the weight of the proton-conductive inorganic oxide. The proton-conductive inorganic oxide is incorporated at a weight of WSA+SiO2. The weight ratio (WSA+SiO2/WC) is confined to 0.01-0.25. The proton-conductive organic polymer binder is incorporated at a weight of WP, the weigh ratio (WP/WSA+SiO2) is confined to 0.5-43.
    Type: Application
    Filed: February 17, 2009
    Publication date: December 31, 2009
    Inventors: Jun TAMURA, Yoshihiko Nakano
  • Publication number: 20090305480
    Abstract: A method of manufacturing a semiconductor device, including an interlayer insulating layer having a dielectric constant of about 1, includes at least one of hydrophobically modifying an interlayer insulating film for insulating lines from each other, before forming air gaps in the interlayer insulating film, and hydrophobically modifying the lines, after forming the air gaps in the interlayer insulating film.
    Type: Application
    Filed: June 5, 2009
    Publication date: December 10, 2009
    Applicant: TOKYO ELECTRON LIMITED
    Inventors: Reiko SASAHARA, Jun Tamura, Shigeru Tahara
  • Publication number: 20090256195
    Abstract: A semiconductor device in which current flows in a vertical direction includes a structure that decreases resistance between a source electrode and a drain electrode along with a current path at a position different from a position having highest electric field intensity between the source electrode and the drain electrode.
    Type: Application
    Filed: April 14, 2009
    Publication date: October 15, 2009
    Applicant: NEC ELECTRONICS CORPORATION
    Inventor: Jun TAMURA
  • Publication number: 20090257931
    Abstract: A recovering method is provided, which includes contacting a solid component containing Ru with an aqueous solution to create a Ru compound, and causing the Ru compound to selectively elute in the aqueous solution. The aqueous solution is formed of at least one selected from the group consisting of aqueous solutions A, B, C, D, and E. The aqueous solution A comprises an acid and formic acid, alcohols, aldehydes, a compound having a hemiacetal structure or a compound having an acetal structure. The aqueous solution B comprises an acid and a compound which creates, in the coexistence thereof with the acid, formic acid, alcohols, aldehydes, a compound having a hemiacetal structure or a compound having an acetal structure. The aqueous solution C comprises an acid and sugars. The aqueous solution D comprises formic acid, and the aqueous solution E comprises oxalic acid.
    Type: Application
    Filed: June 24, 2009
    Publication date: October 15, 2009
    Inventors: Yoshihiko Nakano, Jun Tamura, Kazuhiro Yasuda, Mutsuki Yamazaki, Itsuko Mizutani, Yoshiko Hiraoka
  • Patent number: 7572543
    Abstract: A supported catalyst includes an oxide carrier, catalyst particles supported on the oxide carrier, and catalyst layers which locate among the catalyst particles, with interface portions among the oxide carrier, the catalyst particles and the catalyst layers. The catalyst layers have a melting point lower than 1,500° C. and contain an oxide or a composite oxide which includes at least one element selected from the group consisting of Mo, W, Sn and Ru.
    Type: Grant
    Filed: August 30, 2006
    Date of Patent: August 11, 2009
    Assignee: Kabushiki Kaisha Toshiba
    Inventors: Wu Mei, Jun Tamura, Yoshihiko Nakano
  • Publication number: 20090146145
    Abstract: A processing condition inspection method of a damage recovery process for reforming a film having OH groups generated by damages from a predetermined process by using a processing gas includes preparing a substrate having an OH group containing resin film, measuring an initial film thickness of the OH group containing resin film, performing a damage recovery process on the substrate after measuring the initial film thickness, measuring a film thickness of the OH group containing resin film after the damage recovery process, calculating a film thickness difference of the OH group containing resin film before and after the damage recovery process, and determining whether processing conditions of the damage recovery process are appropriate or inappropriate based on the film thickness difference.
    Type: Application
    Filed: December 2, 2008
    Publication date: June 11, 2009
    Applicant: TOKYO ELECTRON LIMITED
    Inventors: Reiko SASAHARA, Jun Tamura, Shigeru Tahara