Abstract: An acquisition apparatus for a test and measurement instrument including a splitter configured to split an input signal into a plurality of split signals, a plurality of oscillators, each oscillator configured to generate a periodic signal, a plurality of combiners, each combiner configured to combine an associated plurality of the periodic signals into an associated signal combination where at least one of the signal combinations is substantially non-periodic. The apparatus also includes a plurality of mixers, each mixer configured to mix an associated split signal and an associated signal combination into an associated mixed signal, a first digitizer configured to digitize an associated split signal, and a plurality of second digitizers, each second digitizer configured to digitize an associated mixed signal.

Abstract: A method and apparatus adapted to calibrate signal path of a signal analysis system such that loading effects of additional probes are substantially removed from the measurement. A signal under test from a device under test is coupled to a test probe and used with selectable impedance loads in the test probe to acquires sets of samples for characterizing transfer parameters of the device under test and compute open circuit voltages at the test probe. Other probes are coupled to the device under test and a set of measurement samples are acquired via the test probe. An equalization filter in either the frequency or time domain is computed from the open circuit voltage and measurement samples for reducing signal errors attributable to the measurement loading of the device under test by the test probe and other probes.

Abstract: A method and apparatus adapted to calibrate a signal path of a signal analysis system such that digital samples acquired by the system are processed for representing an arbitrary impedance loading of the device under test. The method and apparatus calibrates the signal path to characterize transfer parameters of the device under test within a spectral domain. A reflection coefficient (?L) is defined representative of an arbitrary impedance load coupled to the device under test and an equalization filter is computed to represent the loading of the device under test by the arbitrary impedance. Additional digital samples are acquired using the equalization filter to effect thereby a representation of the arbitrary impedance loading of the device under test.

Abstract: A method and apparatus adapted to calibrate a signal path of a signal analysis system such that digital samples of a signal under test acquired by the system are processed for representing the impedance of a device under test. The method and apparatus calibrates the signal path to characterize transfer parameters of the device under test within a spectral domain. A reference impedance (Zref) is retrieved that is associated with the signal analysis system. The transfer parameters of the device under test and the reference impedance (Zref) are processed to effect thereby a representation of the device under test impedance (Zeq) as a function of frequency.

Abstract: A transition-density based data timing measurement method uses an estimated transition density (TD) value for an acquired data signal together with edge crossing times to estimate a data period for the acquired data signal. The estimated data period is used for symbol classification to determine a number of bits between adjacent edge crossings, which results are used to adjust the TD value. The adjusted TD value is then used to re-compute the data period.

Abstract: A method of measuring transport delay and jitter with a realtime oscilloscope using cross-correlation acquires waveforms from two test points in a system under test. Clock recovery is run on both waveforms to obtain respective rates and offsets. A time offset between the two waveforms is computed. The jitter from the two test points is filtered and a mean-removed cross-correlation coefficient is computed from the filtered jitters. A fractional delay is computed using interpolation based on LMS error, and the respective computational components are summed to compute a transport delay between the two test points. The transport delay may be used to adjust clock edges from one waveform for comparison with data transition edges of the other waveform to measure jitter.

Abstract: A realtime spectrum trigger system on a realtime oscilloscope considers both the magnitude and phase of an input signal having a periodic component so that successive acquisitions of the input signal are time aligned. A user inputs a frequency, threshold and phase for triggering on the periodic component. Input signal samples are filtered by quadrature filters according to the frequency input to produce quadrature signal components. The square of the magnitude of the input signal is computed from the quadrature signal components, as well as the phase ratio and sign, for comparison with calculated values. When enabled by the magnitude of the input signal, a phase crossing determinator compares the phase ratio and sign with calculated values to determine the phase crossing to generate a trigger, resulting in successive acquisitions of the input signal being in time alignment.

Abstract: A method and apparatus adapted to calibrate a signal path of a signal analysis system such that loading effects of the system are substantially removed from measurements of a device under test. A signal under test from the device under test is coupled to a test probe in the signal path and used with selectable impedance loads in the test probe to characterize transfer parameters of the device under test. An equalization filter in either the frequency or time domain is computed from the device under test transfer parameters for reducing in signal error attributable to the measurement loading of the device under test.

Abstract: A method and apparatus adapted to calibrate signal path of a signal analysis system such that loading effects of additional probes are substantially removed from the measurement. A signal under test from a device under test is coupled to a test probe and used with selectable impedance loads in the test probe to acquires sets of samples for characterizing transfer parameters of the device under test and compute open circuit voltages at the test probe. Other probes are coupled to the device under test and a set of measurement samples are acquired via the test probe. An equalization filter in either the frequency or time domain is computed from the open circuit voltage and measurement samples for reducing signal errors attributable to the measurement loading of the device under test by the test probe and other probes.

Abstract: A method and apparatus adapted to calibrate a signal path of a signal analysis system such that digital samples of a signal under test acquired by the system are processed for representing the impedance of a device under test. The method and apparatus calibrates the signal path to characterize transfer parameters of the device under test within a spectral domain. A reference impedance (Zref) is retrieved that is associated with the signal analysis system. The transfer parameters of the device under test and the reference impedance (Zref) are processed to effect thereby a representation of the device under test impedance (Zeq) as a function of frequency.

Abstract: A method and apparatus adapted to calibrate a signal path of a signal analysis system such that digital samples acquired by the system are processed for representing an arbitrary impedance loading of the device under test. The method and apparatus calibrates the signal path to characterize transfer parameters of the device under test within a spectral domain. A reflection coefficient (FL) is defined representative of an arbitrary impedance load coupled to the device under test and an equalization filter is computed to represent the loading of the device under test by the arbitrary impedance. Additional digital samples are acquired using the equalization filter to effect thereby a representation of the arbitrary impedance loading of the device under test.

Abstract: A method of de-embedding test probes coupled to an oscilloscope system to compensate for the loading of the test probes on a device under test. The method includes connecting each test probe individually to the device under test and calibrating each test probes to characterize transfer parameters of the device under test within a spectral domain. The open voltage of the device under test is calculated for each test probe. The test probes are connected to the device under test ans measurement samples are acquired by each of the test probes in the time domain and converted to the spectral domain. An equalization filter is computed for each of the test probes to compensate for loading of the device under test caused by the test probes using the spectral domain open voltage and measurement samples for each of the test probes.

Abstract: A method and apparatus adapted to calibrate a test probe and oscilloscope system such that loading effects of the probe are substantially removed from the measurement. A signal under test from a device under test is coupled to the test probe and used with selectable impedance loads in the test probe to characterize transfer parameters of the device under test. A trigger signal synchronized to the signal under test is coupled to the oscilloscope system to trigger the oscilloscope. An equalization filter in either the frequency or time domain is computed from the device under test transfer parameters for reducing in signal error attributable to the measurement loading of the device under test.

Abstract: A method and apparatus adapted to calibrate a test probe and oscilloscope system such that digital samples acquired by the system are processed for representing an arbitrary impedance loading of the device under test. The method and apparatus calibrates the test probe to characterize transfer parameters of the device under test within a spectral domain. A reflection coefficient (L) is defined representative of an arbitrary impedance load coupled to the device under test and an equalization filter is computed to represent the loading of the device under test by the arbitrary impedance. Additional acquired samples are acquired using the equalization filter to effect thereby a representation of the arbitrary impedance loading of the device under test.

Abstract: An enhancement filter for an oscilloscope is disclosed wherein the enhancement filter may be initially calibrated for one or more channels and/or for one or more attenuation settings such as 50 mV per division, 100 mV per division, and/or 200 mV per division, for example. In one embodiment, a desired filter response is selected to have a modified Gaussian type filter function having an at least approximately linear phase response, wherein the transfer function of the desired filter response comprises a step response that is be stored in the oscilloscope to be used as a part of calibration system of the oscilloscope.

Abstract: A method and apparatus adapted to calibrate a test probe and oscilloscope system such that loading effects of the probe are substantially removed from the measurement. A signal under test from a device under test is coupled to the test probe and used with selectable impedance loads in the test probe to characterize transfer parameters of the device under test. An equalization filter in either the frequency or time domain is computed from the device under test transfer parameters for reducing in signal error attributable to the measurement loading of the device under test.

Abstract: A method and apparatus adapted to calibrate a test probe and oscilloscope system such that digital samples of a signal under test acquired by the system are processed for representing the impedance of a device under test. The method and apparatus calibrates the test probe to characterize transfer parameters of the device under test within a spectral domain. A reference impedance (Zref) is retrieved that is associated with the transfer parameters and the characteristic impedance of an oscilloscope system coupled to the device under test. The transfer parameters of the device under test and the reference impedance (Zref) are processed to effect thereby a representation of the device under test impedance (Zeq) as a function of frequency.

Abstract: An acquisition apparatus for a test and measurement instrument includes an input to receive an input signal, a splitter to split the input signal into split signals, frequency shifters to frequency shift a sub-band of an associated split signal to within a digitizing bandwidth, digitizers to digitize one of the frequency shifted split signals or one of the split signals, digital frequency shifters to frequency shift an associated digitized frequency shifted split signal into a digitized split signal, filters to filter an associated digitized split signal, and a combiner to combine the filtered digitized split signals into a recombined signal, wherein each sub-band overlaps at least one other sub-band.

Abstract: An enhancement filter for an oscilloscope is disclosed wherein the enhacement filter may be initially calibrated for one or more channels and/or for one or more attenuation settings such as 50 mV per division, 100 mV per division, and/or 200 mV per division, for example.

Abstract: A method and apparatus adapted to calibrate a test probe and oscilloscope system such that digital samples acquired by the system are processed for representing an arbitrary impedance loading of the device under test. The method and apparatus calibrates the test probe to characterize transfer parameters of the device under test within a spectral domain. A reflection coefficient (?L) is defined representative of an arbitrary impedance load coupled to the device under test and an equalization filter is computed to represent the loading of the device under test by the arbitrary impedance. Additional acquired samples are acquired using the equalization filter to effect thereby a representation of the arbitrary impedance loading of the device under test.