Abstract: A method and apparatus adapted to calibrate a test probe and oscilloscope system such that digital samples acquired by the system are processed for representing the impedance of a device under test. The method and apparatus calibrates the test probe to characterize transfer parameters of the device under test within a spectral domain. A reference impedance (Zref) is retrieved that is associated with the transfer parameters and the characteristic impedance of an oscilloscope system coupled to the device under test. The transfer parameters of the device under test and the reference impedance (Zref) are processed to effect thereby a representation of the device under test impedance (Zeq) as a function of frequency.

Abstract: A method and apparatus adapted to calibrate a test probe and oscilloscope system such that digital samples acquired by the system are processed for representing an arbitrary impedance loading of the device under test. The method and apparatus calibrates the test probe to characterize transfer parameters of the device under test within a spectral domain. A reflection coefficient (?L) is defined representative of an arbitrary impedance load coupled to the device under test and a response filter is computed to represent the loading of the device under test by the arbitrary impedance. Additional acquired samples are acquired using the response filter to effect thereby a representation of the arbitrary impedance loading of the device under test.

Abstract: A transition-density based data timing measurement method uses an estimated transition density (TD) value for an acquired data signal together with edge crossing times to estimate a data period for the acquired data signal. The estimated data period is used for symbol classification to determine a number of bits between adjacent edge crossings, which results are used to adjust the TD value. The adjusted TD value is then used to re-compute the data period.

Abstract: For a jitter measurement product histograms, trends and spectrums of random and deterministic jitter components are provided on a jitter component basis rather than just on overall jitter. At each stage of the jitter separation histograms, time trends (measurement vs. time), cycle trends (measurement vs. cycle or UI) or spectrums may be provided. Additionally the spectrum for a periodic jitter component may be further separated into sub-spectrums representing correlated sub-sets of the periodic jitter component. Conversion of each sub-spectrum into the time domain provides a characteristic signal that may identify one source of the periodic jitter. From the various plots the contribution of a particular jitter component or a particular combination of jitter components to an eye opening and system performance may be obtained.

Abstract: A method and apparatus adapted to calibrate a test probe and oscilloscope system such that loading effects of the probe are substantially removed from the measurement.

Abstract: A method and apparatus adapted to calibrate a test probe and oscilloscope system such that loading effects of the probe are substantially removed from the measurement.

Abstract: A method for identifying spectral impulses applies a window filter to an acquired waveform to produce a filtered waveform, and performs an FFT function on the filtered waveform to produce a spectrum of bins. An estimating window is located on the spectrum and centered on a target bin. Bins adjacent to the target bin are excluded and the remaining bins are used to form a noise estimate. The estimate is compared to the target bin and if the result exceeds a threshold value, a spectral impulse is identified.

Abstract: A jitter separation apparatus and method, based on spectrum analysis, separates deterministic jitter and random jitter using their spectral properties. Deterministic jitter is periodic and nature and exhibits a spectrum of impulses, whereas random jitter exhibits a broad, flat spectrum. A time domain histogram and a frequency domain histogram of the signal are investigated to obtain jitter components.

Abstract: A test and measurement apparatus and method wherein a software implemented phase lock loop recovers a clock signal associated with the received data signal, the recovered clock signal being used to do TIE measurement, to generate eye diagram and to do mask testing.

Abstract: A method for identifying spectral impulses applies a window filter to an acquired waveform to produce a filtered waveform, and performs an FFT function on the filtered waveform to produce a spectrum of bins. An estimating window is located on the spectrum and centered on a target bin. Bins adjacent to the target bin are excluded and the remaining bins are used to form a noise estimate. The estimate is compared to the target bin and if the result exceeds a threshold value, a spectral impulse is identified.

Abstract: A test and measurement apparatus and method wherein a software implemented phase lock loop recovers a clock signal associated with the received data signal, the recovered clock signal being used to do TIE measurement, to generate eye diagram and to do mask testing.

Abstract: A jitter separation apparatus and method, based on spectrum analysis, separates deterministic jitter and random jitter using their spectral properties. Deterministic jitter is periodic and nature and exhibits a spectrum of impulses, whereas random jitter exhibits a broad, flat spectrum. A time domain histogram and a frequency domain histogram of the signal are investigated to obtain jitter components.