Patents by Inventor Keisuke Nakazawa

Keisuke Nakazawa has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20050093042
    Abstract: A semiconductor device comprises a semiconductor substrate, a plurality of capacitors provided above the semiconductor substrate and including a lower electrode, a ferroelectric film, and an upper electrode, and a polysilazane-based coated insulating film provided on the plurality of capacitors and between the plurality of capacitors and burying a gap between the plurality of capacitors.
    Type: Application
    Filed: September 30, 2004
    Publication date: May 5, 2005
    Inventors: Keisuke Nakazawa, Hiroyuki Kanaya, Atsuko Kawasaki
  • Publication number: 20050070031
    Abstract: There is disclosed a method of manufacturing a semiconductor device, comprising forming an underlying region including an interlevel insulating film on a semiconductor substrate, forming an alumina film on the underlying region, forming a hole in the alumina film, filling the hole with a bottom electrode film, forming a dielectric film on the bottom electrode film, and forming a top electrode film on the dielectric film.
    Type: Application
    Filed: September 30, 2003
    Publication date: March 31, 2005
    Inventors: Keitaro Imai, Koji Yamakawa, Hiroshi Itokawa, Katsuaki Natori, Osamu Arisumi, Keisuke Nakazawa, Bum-ki Moon
  • Publication number: 20050070043
    Abstract: The present invention provides a method for manufacturing a semiconductor device equipped with a capacitor in which a dielectric film is used, wherein a complex oxide is used as a mask material when the dielectric film is etched.
    Type: Application
    Filed: September 30, 2003
    Publication date: March 31, 2005
    Inventors: Koji Yamakawa, Katsuaki Natori, Soichi Yamazaki, Osamu Arisumi, Hiroshi Itokawa, Hiroyuki Kanaya, Kazuhiro Tomioka, Keisuke Nakazawa, Yasuyuki Taniguchi, Uli Egger
  • Publication number: 20050051823
    Abstract: Disclosed is a semiconductor device comprising a semiconductor substrate, and a capacitor provided above the semiconductor substrate and including a film which contains Pb, Sr, Zr, Ti, Ru and O and a dielectric film which contains Pb, Zr, Ti and O and which is provided on the film containing Pb, Sr, Zr, Ti, Ru and O.
    Type: Application
    Filed: April 28, 2004
    Publication date: March 10, 2005
    Inventors: Keisuke Nakazawa, Koji Yamakawa, Katsuaki Natori, Soichi Yamazaki, Hiroshi Itokawa, Hiroyuki Kanaya
  • Patent number: 6780547
    Abstract: In a halftone phase shifting photomask 108, having a pattern of halftone phase shifting film 102 containing at least chromium and fluorine, the halftone phase shifting film is heat-treated at a temperature between 250° C. and 500° C. so that a change of the optical property of the film produced by the application of excimer laser for exposure to the film is decreased.
    Type: Grant
    Filed: April 3, 2001
    Date of Patent: August 24, 2004
    Assignees: Dainippon Printing Co., Ltd., Semiconductor Leading Edge Technologies, Inc.
    Inventors: Toshiaki Motonaga, Norihito Ito, Chiaki Hatsuta, Junji Fujikawa, Naoya Hayashi, Toshio Onodera, Takahiro Matsuo, Toru Ogawa, Keisuke Nakazawa
  • Publication number: 20040155278
    Abstract: An apparatus for manufacturing a semiconductor device is disclosed which comprises a chamber which holds a to-be-processed substrate having a film containing at least one kind of metal element which will become a component of a volatile metal compound, a heater which heats the substrate held in the chamber, and an adsorbent which is provided in the chamber and which adsorbs the volatile metal compound generated from the film by heating the substrate.
    Type: Application
    Filed: April 10, 2003
    Publication date: August 12, 2004
    Inventors: Katsuaki Natori, Keisuke Nakazawa, Koji Yamakawa, Hiroyuki Kanaya, Yoshinori Kumura, Hiroshi Itokawa, Osamu Arisumi
  • Patent number: 6709791
    Abstract: The invention relates to a halftone phase shift photomask whose transmittance and phase angle remain unchanged even when irradiated with an excimer laser used for exposure over an extended period of time, and a blank therefor, and provides a halftone phase shift mask 108 comprising a pattern of halftone phase shift film 102 containing at least chromium and fluorine on a transparent substrate 101, wherein optical characteristic changes upon irradiation with an exposure excimer laser have been reduced by patterning a film irradiated with light 109 having a wavelength substantially absorbed by halftone phase shift film 102.
    Type: Grant
    Filed: April 10, 2001
    Date of Patent: March 23, 2004
    Assignees: Dai Nippon Printing Co., Ltd., Semiconductor Leading Edge Technologies, Inc.
    Inventors: Hiroshi Mohri, Toshiaki Motonaga, Chiaki Hatsuta, Norihito Ito, Naoya Hayashi, Toshio Onodera, Takahiro Matsuo, Toru Ogawa, Keisuke Nakazawa
  • Publication number: 20020015187
    Abstract: In a halftone phase shifting photomask 108, having a pattern of halftone phase shifting film 102 containing at least chromium and fluorine, the halftone phase shifting film is heat-treated at a temperature between 250° C. and 500° C.
    Type: Application
    Filed: April 3, 2001
    Publication date: February 7, 2002
    Inventors: Toshiaki Motonaga, Norihito Ito, Chiaki Hatsuta, Junji Fujikawa, Naoya Hayashi, Toshio Onodera, Takahiro Matsuo, Toru Ogawa, Keisuke Nakazawa