Patents by Inventor Ken Hamada

Ken Hamada has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 4731792
    Abstract: In a TRS (twin ridge substrate) type semiconductor laser, reflectivity at both facets of the resonator at the oscillation wavelength is selected to be higher than the reflectivity of the semiconductor crystal of the laser device, but smaller than 1, thereby stabilizing the light oscillation with a low S/N ratio.
    Type: Grant
    Filed: December 30, 1986
    Date of Patent: March 15, 1988
    Assignee: Matsushita Electric Industrial Co., Ltd.
    Inventors: Hirokazu Shimizu, Masahiro Kume, Masuru Wada, Kunio Itoh, Ken Hamada, Fumiko Tajiri
  • Patent number: 4716571
    Abstract: A semiconductor substrate having a groove with a dove-tail-shaped cross section is used as a substrate and thereon, several epitaxial layers including an active layer are formed and a current injection region is formed immediately above the groove; the semiconductor laser attains a high power lasing with the fundamental transverse mode.
    Type: Grant
    Filed: July 16, 1986
    Date of Patent: December 29, 1987
    Assignee: Matsushita Electric Industrial Co., Ltd.
    Inventors: Ken Hamada, Masaru Wada, Kunio Itoh
  • Patent number: 4675074
    Abstract: The invention provides a chemical etching method for a semiconductor device, which comprises a step of forming a first layer of Ga.sub.1-x Al.sub.x As (0.ltoreq.x<1) having a surface (100), a step of forming on the first layer a second layer of Ga.sub.1-y Al.sub.y As (0.ltoreq.y<1) having a surface (100), and a step of chemically etching the layers from a level above the second layer and along the direction of <011>. The slope angle of etch face of the second layer depends on the mol fraction y of the second layer, and the slope angle of etch face of the first layer depends on the mol fraction y of the second layer and the mol fraction x of the first layer. These facts are best utilized in the invention so that the etch profile of the first layer may have a desired slope angle.
    Type: Grant
    Filed: July 31, 1985
    Date of Patent: June 23, 1987
    Assignee: Matsushita Electric Industrial Co., Ltd.
    Inventors: Masaru Wada, Hirokazu Shimizu, Takao Shibutani, Kunio Itoh, Ken Hamada, Iwao Teramoto