Abstract: One embodiment disclosed relates to a method of status generation for a node of a high-availability cluster. A heartbeat signal is sent from the node through a network to the cluster. In addition, a current status of the node is determined, and the status is sent out through a specialized interface to a next node. Another embodiment disclosed relates to a method of cluster-wide management performed per node. A heartbeat input received from the previous node is checked. Furthermore, an up/down status input received from the previous node and a degraded status input received from the previous node are also checked. Another embodiment disclosed relates to a system for of a high-availability cluster. The system includes a general inter-node communication network that is configured to carry signals including heartbeat signals from the nodes. In addition, a separate inter-node communication channel is included for communicating node status signals.

Abstract: One embodiment disclosed relates to a method of communicating status from a node of a cluster of computer systems. A first status signal is received from a computational node, and a default status signal is generated. The first status signal and the default status signal are used to generate a second status signal. Another embodiment disclosed relates to a method of communicating node status within a cluster of computer systems. A first signal indicative of the status of a current node is generated. A second signal indicative of the status of a preceding node is received. The first signal is transmitted to a next node if the current node is present in the cluster, and the second signal is transmitted to the next node if the current node has been removed from the cluster.

Abstract: A computer system comprising an operating system, a first component that comprises a first test module, a second component that comprises a second test module, and an interconnect coupling the first component and the second component is provided. The first test module is configured to provide a first test pattern to the second test module on the interconnect in response to a first signal from the operating system.

Abstract: A computer system that includes a processor, a first bus coupled to the processor, a memory controller coupled to the first bus, a memory coupled to the memory controller, a first input/output (I/O) controller coupled to the first bus, and a test module coupled to the first I/O controller is provided. The test module is configured to cause tests to be performed on the memory using the first bus.

Abstract: A method and corresponding apparatus for detecting and rejecting high impedance failures in chip interconnects use monitoring circuitry on a chip to provide accurate and pro-active prediction of interconnect failures. The apparatus may include a resistance continuity monitoring circuit (RCMC), and a signal path connecting a representative set of pins to the RCMC. The RCMC measures the resistance of a connection of the representative set of pins with a circuit board during system operation and outputs a measured resistance data. The apparatus further includes additional analog-to-digital (A/D) hardware to perform an analog to digital conversion of the measured resistance data. Additional on-chip circuitry and/or microcode may be used to perform an algorithm on the digital resistance data to generate an interconnect status signal. For example, the method may output a failure signal when the measured resistance data exceeds a threshold resistance value.

Abstract: A computer system that includes a processor, a memory controller coupled to the processor, a memory coupled to the memory controller, a first input/output (I/O) controller coupled to the memory controller, a first expansion slot coupled to the first I/O controller, and a test module card coupled to the first expansion slot wherein the test module card is configured to cause tests to be performed on the memory using direct memory access (DMA) is provided.

Abstract: A computer system comprising a processor configured to cause an operating system to be booted, a test module, and a component coupled to the test module and configured to receive a clock input is provided. The test module is configured to cause the clock input to be provided to the component at a first frequency, and the test module is configured to cause a first test to be performed on the component subsequent to the clock input being provided to the component at the first frequency and the operating system being booted.

Abstract: One embodiment disclosed relates to a method of executing program code on a target microprocessor with multiple CPU cores thereon. One of the CPU cores is selected for testing, and inter-core context switching is performed. Parallel execution occurs of diagnostic code on the selected CPU core and the program code on remaining CPU cores. Another embodiment disclosed relates to a microprocessor having a plurality of CPU cores integrated on the microprocessor chip. Inter-core communications circuitry is coupled to each of the CPU cores and configured to perform context switching between the CPU cores.

Abstract: A computer system comprising a first processor that is configured to cause an operating system to be booted, a test module, a component coupled to the test module, and a power supply coupled to the test module and the component is provided. The test module is configured to provide a first signal to the power supply to cause a first voltage to be provided to the component, and the test module is configured to cause a first test to be performed on the component subsequent to the first voltage being provided to the component and the operating system being booted.

Abstract: A computer system comprising a system module, a test module, a first cell, and a second cell is provided. The system module is configured to cause the test module to test the first cell subsequent to the second cell being allocated to a first instance of an operating system.

Abstract: One embodiment disclosed relates to a method of compiling a program to be executed on a target central processing unit (CPU). The method includes opportunistically scheduling diagnostic testing of CPU registers. The method may include use of a predetermined level of aggressiveness for the scheduling of the register diagnostic testing. The scheduled diagnostic testing may include writing known data to a register, reading data from the register, and comparing the known data with the data that was read. If the comparison indicates a difference, then a jump may occur to a fault handler routine.

Abstract: One embodiment disclosed relates to a method of compiling a program to be executed on a target microprocessor with multiple execution units of a same type. The method includes selecting one of the execution units for testing and scheduling the parallel execution of program code and diagnostics code. The diagnostic code is scheduled to be executed on the selected execution unit. The program code is scheduled to be executed on remaining execution units of the same type.

Abstract: One embodiment disclosed relates to a method of providing dynamic power redundancy for a system. A number of power supply units, n, that are presently in an up state is tracked. In addition, a number of power supply units, N, that are presently needed to supply power to the system is dynamically determined. If a margin of safety corresponding to a difference between n and N reaches a minimum acceptable level, then action is taken to increase the margin of safety.

Abstract: One embodiment disclosed relates to a method of providing dynamic temperature-adjusted power redundancy for a system. Tracking is performed of the number of power supply units, n, that are presently in an up state. The temperature in which the power supply units are operating is measured, and a temperature-adjusted number of power supply units, N, which are presently needed to supply power to the system, is dynamically determined.

Abstract: An example memory quality assuring system is provided. The system may include a memory mapping logic configured to facilitate accessing memory locations and redirecting memory accessing operations. The system may also include a memory quality assurance logic configured to logically replace a first memory location with a second memory location, to initiate testing logically isolated memory locations, and to selectively logically remove tested memory locations based on the testing. It is emphasized that this abstract is provided to comply with the rules requiring an abstract that will allow a searcher or other reader to quickly ascertain the subject matter of the application. It is submitted with the understanding that it will not be employed to interpret or limit the scope or meaning of the claims 37 CFR 1.72(b).

Abstract: An example memory scrubbing logic is provided. The logic may be operably connectable to a main memory and a processor. The memory access logic may include a memory for mirroring a main memory location and a logic for scrubbing the main memory location.

Abstract: One embodiment disclosed relates to a method of compiling a program to be executed on a target microprocessor. A cycle is identified during which a functional unit would otherwise be idle. A diagnostic operation is opportunistically scheduled for execution on the functional unit during that cycle, and a comparison is scheduled to compare a result from executing the diagnostic operation with a corresponding predetermined result.

Abstract: One embodiment disclosed relates to a method of compiling a program to be executed on a target microprocessor with multiple functional units of a same type. The method includes opportunistically scheduling a redundant operation on one of the functional units that would otherwise be idle during a cycle.

Abstract: One embodiment disclosed relates to a method of providing CPU functional testing. Operations are executed on multiple functional units of a same type in the CPU. The outputs of the multiple functional units are automatically compared. The results of the comparison are checked only for redundant operations. Another embodiment disclosed relates to a microprocessor with built-in functional testing capability. The microprocessor includes multiple functional units of a same type and registers that receive outputs from the multiple functional units. In addition, comparator circuitry is built-in that also receives the outputs from the multiple functional units and compares the outputs to provide functional testing.

Abstract: An example memory error ranking system is provided. The system may include an error detector logic that detects memory errors and a ranking logic that ranks the quality of a memory location based on memory errors detected by the error detector logic.