Abstract: In an image processing apparatus, in a case where setting values indicate to create scan data by using digital halftoning and requires execution of a prescribed process using a result of character recognition, a controller outputs an instruction to create multiple-value scan data having a pixel value represented by two or more bits. The controller executes the character recognition on the multiple-value scan data. The controller converts the multiple-value scan data into converted scan data by using digital halftoning, and executes the prescribed process on the converted scan data. In a case where the setting values indicate to create scan data by using a method different from the digital halftoning, and requires execution of the prescribed process, the controller outputs an instruction to create setting-based scan data. The controller executes the character recognition on the setting-based scan data. The controller executes the prescribed process on the setting-based scan data.

Abstract: An image forming apparatus includes a high-voltage power supply board utilized for electrophotographic image formation, wherein a converter that generates high voltage is arranged on the high-voltage power supply board, and a drive coil and a high-voltage generation coil in the converter are insulated from each other, a first hardware processor that generates a control signal to control the drive coil is provided, the first hardware processor generates the control signal suitably adjusted in accordance with each of various alternating waveforms, and high voltage having various alternating waveforms is output from one output terminal of the converter of the high-voltage power supply board.

Abstract: In time-series data indicating light emission of plasma when plasma processing is carried out on a sample by generating the plasma, an analysis apparatus creates combinations of a plurality of light emission wavelengths of elements and a plurality of time intervals within a plasma processing interval and calculates, for each of the combinations of the wavelengths and the time intervals, a correlation between an average value of light emission intensity and the number of times the plasma processing is carried out on the samples for each of the combinations of the wavelengths and the time intervals that have been created. Thereafter, the data analysis apparatus selects, as a combination of the wavelength and the time interval used to observe or control the plasma processing, a combination of a wavelength of light emitting from a specific element and a specific time interval having a maximum correlation.

Abstract: An image-reading apparatus includes an image-reader and a controller. The controller is configured to perform: controlling the image-reader to execute: (a1) reading a first set of original documents; and (a2) generating read data sets indicating images on the original documents in the first set; transmitting the read data sets generated by the (a2) generating to an information-processing apparatus; counting a remaining period until a specific time, the specific time being a time when a first period elapses from a predetermined time after completing the (a2) reading; transmitting the counted remaining period to the information-processing apparatus; controlling, in response to receiving a specific signal before the specific time, the image-reader to execute: (e1) reading a second set of original documents; and (e2) generating read data sets indicating images on the original documents in the second set; and transmitting the read data sets generated by the (e2) generating to the information-processing apparatus.

Abstract: In time-series data indicating light emission of plasma when plasma processing is carried out on a sample by generating the plasma, an analysis apparatus creates combinations of a plurality of light emission wavelengths of elements and a plurality of time intervals within a plasma processing interval and calculates, for each of the combinations of the wavelengths and the time intervals, a correlation between an average value of light emission intensity and the number of times the plasma processing is carried out on the samples for each of the combinations of the wavelengths and the time intervals that have been created. Thereafter, the data analysis apparatus selects, as a combination of the wavelength and the time interval used to observe or control the plasma processing, a combination of a wavelength of light emitting from a specific element and a specific time interval having a maximum correlation.

Abstract: In a case where values received indicate a first color scale representing first number of colors and indicate the specific image process, a processor of an information processing apparatus receives first scan data in the first color scale from the scanner, and performs a specific image process on the first scan data. In a case where the values indicate a second color scale representing second number of colors and does not indicate the specific image process, the processor receives and outputs the second scan data. In a case where the values indicate the second color scale and the specific image process, the processor receives third scan data in the third color scale representing third number of colors larger than the second number. The processor performs the specific image process on the third scan data, and converts the processed third scan data to forth scan data in the second color scale.

Abstract: A plasma processing apparatus, plasma processing method, and plasma processing analysis method in which a suitable combination of wavelength, time interval, and etching condition parameter for control to change etching conditions is determined among wavelengths, time intervals, and changeable parameters for spectroscopic measurement data in order to ensure stable etching conditions. Specifically, a regression equation which represents the correlation between emission intensity and etching result at a wavelength and a time interval is obtained for each of two or more combinations of wavelength, time interval, and etching condition parameter. Furthermore, for each of the combinations, the amount of change is calculated from the regression equation when the value set for the etching condition parameter is changed.

Abstract: In an information processing apparatus, a processor determines, on the basis of a setting value, at least one image process to be performed on the first scan data. The processor performs a clipping process on first scan data to generate second scan data including original scan data and not including outer scan data. The processor performs an edge correction process on the second scan data to generate third scan data by correcting edge data of the original scan data. The processor performs a characteristic acquisition process on the third scan data to acquire characteristic information indicating a characteristic of the third scan data. The processor performs a specific process on the second scan data by using the characteristic information in a case where both the clipping process and the characteristic acquisition process are determined to be performed and the edge correction process is determined not to be performed.

Abstract: In an image processing apparatus, in a case where setting values indicate to create scan data by using digital halftoning and requires execution of a prescribed process using a result of character recognition, a controller outputs an instruction to create multiple-value scan data having a pixel value represented by two or more bits. The controller executes the character recognition on the multiple-value scan data. The controller converts the multiple-value scan data into converted scan data by using digital halftoning, and executes the prescribed process on the converted scan data. In a case where the setting values indicate to create scan data by using a method different from the digital halftoning, and requires execution of the prescribed process, the controller outputs an instruction to create setting-based scan data. The controller executes the character recognition on the setting-based scan data. The controller executes the prescribed process on the setting-based scan data.

Abstract: An image-reading apparatus includes an image-reader and a controller. The controller is configured to perform: controlling the image-reader to execute: (a1) reading a first set of original documents; and (a2) generating read data sets indicating images on the original documents in the first set; transmitting the read data sets generated by the (a2) generating to an information-processing apparatus; counting a remaining period until a specific time, the specific time being a time when a first period elapses from a predetermined time after completing the (a2) reading; transmitting the counted remaining period to the information-processing apparatus; controlling, in response to receiving a specific signal before the specific time, the image-reader to execute: (e1) reading a second set of original documents; and (e2) generating read data sets indicating images on the original documents in the second set; and transmitting the read data sets generated by the (e2) generating to the information-processing apparatus.

Abstract: There is provided a method of analyzing data obtained from an etching apparatus for micromachining a wafer using plasma. This method includes the following steps: acquiring the plasma light-emission data indicating light-emission intensities at a plurality of different wavelengths and times, the plasma light-emission data being measured under a plurality of different etching processing conditions, and being obtained at the time of the etching processing, evaluating the relationship between changes in the etching processing conditions and changes in the light-emission intensities at the plurality of different wavelengths and times with respect to the wavelengths and times of the plasma light-emission data, and identifying the wavelength and the time of the plasma light-emission data based on the evaluation result, the wavelength and the time being to be used for the adjustment of the etching processing condition.

Abstract: A plasma processing apparatus, plasma processing method, and plasma processing analysis method in which a suitable combination of wavelength, time interval, and etching condition parameter for control to change etching conditions is determined among wavelengths, time intervals, and changeable parameters for spectroscopic measurement data in order to ensure stable etching conditions. Specifically, a regression equation which represents the correlation between emission intensity and etching result at a wavelength and a time interval is obtained for each of two or more combinations of wavelength, time interval, and etching condition parameter. Furthermore, for each of the combinations, the amount of change is calculated from the regression equation when the value set for the etching condition parameter is changed.

Abstract: A scanning system includes a scanner, an information processing apparatus, and a processor. The processor receives an input via a user interface and determines each of a plurality of image processes to be performed on scan data. In a case where first and second image processes are determined to be performed, the processor instructs the scanner to output the scan data to the information processing apparatus, and instructs the information processing apparatus to perform the first and second image processes. In a case where the first image process is determined not to be performed and the second image process is to be determined to be, the processor instructs the scanner to perform the second image process on the scan data to generate information, and instructs the scanner to output the generated information to the information processing apparatus.

Abstract: There is provided a method of analyzing data obtained from an etching apparatus for micromachining a wafer using plasma. This method includes the following steps: acquiring the plasma light-emission data indicating light-emission intensities at a plurality of different wavelengths and times, the plasma light-emission data being measured under a plurality of different etching processing conditions, and being obtained at the time of the etching processing, evaluating the relationship between changes in the etching processing conditions and changes in the light-emission intensities at the plurality of different wavelengths and times with respect to the wavelengths and times of the plasma light-emission data, and identifying the wavelength and the time of the plasma light-emission data based on the evaluation result, the wavelength and the time being to be used for the adjustment of the etching processing condition.

Abstract: In an information processing apparatus, a processor determines, on the basis of a setting value, at least one image process to be performed on the first scan data. The processor performs a clipping process on first scan data to generate second scan data including original scan data and not including outer scan data. The processor performs an edge correction process on the second scan data to generate third scan data by correcting edge data of the original scan data. The processor performs a characteristic acquisition process on the third scan data to acquire characteristic information indicating a characteristic of the third scan data. The processor performs a specific process on the second scan data by using the characteristic information in a case where both the clipping process and the characteristic acquisition process are determined to be performed and the edge correction process is determined not to be performed.

Abstract: In a case where values received indicate a first color scale representing first number of colors and indicate the specific image process, a processor of an information processing apparatus receives first scan data in the first color scale from the scanner, and performs a specific image process on the first scan data. In a case where the values indicate a second color scale representing second number of colors and does not indicate the specific image process, the processor receives and outputs the second scan data. In a case where the values indicate the second color scale and the specific image process, the processor receives third scan data in the third color scale representing third number of colors larger than the second number. The processor performs the specific image process on the third scan data, and converts the processed third scan data to forth scan data in the second color scale.

Abstract: A scanning system includes a scanner, an information processing apparatus, and a processor. The processor receives an input via a user interface and determines each of a plurality of image processes to be performed on scan data. In a case where first and second image processes are determined to be performed, the processor instructs the scanner to output the scan data to the information processing apparatus, and instructs the information processing apparatus to perform the first and second image processes. In a case where the first image process is determined not to be performed and the second image process is to be determined to be, the processor instructs the scanner to perform the second image process on the scan data to generate information, and instructs the scanner to output the generated information to the information processing apparatus.

Abstract: An image forming apparatus includes: a fixer that includes a first heater group including first heaters and a second heater group including second heaters; a first power cord that supplies AC power to the first heater group; a second power cord that supplies AC power to the second heater group; first switches that switch a power supply state to the first heaters; second switches that switch a power supply state to the second heaters; and a hardware processor that independently controls the lightings of the first and second heater groups by controlling the first and second switches based on an array pattern for turning on or off the first and second heaters, wherein the array pattern includes an on period and an off period whose lengths are both a half wave cycle of an AC power supply, and is set to satisfy a flicker regulation value.

Abstract: An image forming apparatus includes: a fixer that includes a first heater group including first heaters and a second heater group including second heaters; a first power cord that supplies AC power to the first heater group; a second power cord that supplies AC power to the second heater group; first switches that switch a power supply state to the first heaters; second switches that switch a power supply state to the second heaters; and a hardware processor that independently controls the lightings of the first and second heater groups by controlling the first and second switches based on an array pattern for turning on or off the first and second heaters, wherein the array pattern includes an on period and an off period whose lengths are both a half wave cycle of an AC power supply, and is set to satisfy a flicker regulation value.

Abstract: An image forming apparatus includes halogen lamp heaters, an AC power supply, a temperature detection unit and a control unit. The heaters have a same light distribution and heat a fixing member of an image fixing unit. The detection unit detects a temperature of the fixing member. The control unit determines a combination of the heaters based on output of the detection unit and applies a drive voltage of a half-wave of an AC waveform of the AC power supply to a heater of the heaters. The half-wave is selected based on an application pattern having a duty cycle of a predetermined value or more. The heaters include at least one heater which generates a heat amount being a minimum heat amount required for fixing or less when turned on with the application pattern having the duty cycle of the predetermined value.