Abstract: A system to improve miscorrection rates in error control code may include an error control decoder with a safe decoding mode that processes at least two data packets. The system may also include a buffer to receive the processed at least two data packets from the error control decoder. The error control decoder may apply a logic OR operation to the uncorrectable error signal related to the processing of the at least two data packets to produce a global uncorrectable error signal. The system may further include a recipient to receive the at least two data packets and the global uncorrectable error signal.

Abstract: A system to improve error correction may include a fast decoder to process data packets until the fast decoder finds an uncorrectable error in a data packet at which point a request for at least two data packets is generated. The system may also include a slow decoder to possibly correct the uncorrectable error in a data packet based upon the at least two data packets.

Abstract: A system to improve memory failure management may include memory, and an error control decoder to determine failures in the memory. The system may also include an agent that may monitor failures in the memory. The system may further include a table where the error control decoder may record the failures, and where the agent can read and write to.

Abstract: A memory device including a memory array storing data, a variable delay controller, a passive variable delay circuit and an output driver. The variable delay controller periodically receives delay commands from a first source external to the memory device during operation of the memory device, and outputs delay instruction bits responsive to the received delay commands. The passive variable delay circuit receives a clock from a second source external to the memory device, receives the delay instruction bits from the variable delay controller, generates a delayed clock having a time relation to the received clock as determined by the delay instruction bits, and outputting the delayed clock. The output driver receives the data from the memory array and the delayed clock, and outputs the data at a time responsive to the delayed clock.

Abstract: A method of correcting defects in a storage array of a microprocessor, such as a cache memory, by operating the microprocessor to carry out a functional test procedure which utilizes cache memory, collecting fault data in a trace array during the functional test procedure, identifying a location of the defect in the cache memory using the fault data, and repairing the defect by setting a fuse to reroute access requests for the location to a redundant array. The fault data may include an error syndrome and a failing address. The functional test procedure creates random cache access sequences that cause varying loads of traffic in the cache memory using a test pattern based on a random seed. The functional test procedure may be carried out after completion of a nonfunctional, built-in self test of the microprocessor which sets some of the fuses.

Abstract: A memory controller, memory device, and method for dynamic supply voltage scaling in a memory system are provided. The method includes receiving a request for a supply voltage change at the memory controller in the memory system, the supply voltage powering the memory device. The method further includes waiting for any current access of the memory device to complete, and disabling a clock between the memory controller and the memory device. The method also includes changing the supply voltage responsive to the request, and enabling the clock.

Abstract: A memory system, memory interface device and method for a non-power-of-two burst length are provided. The memory system includes a plurality of memory devices with non-power-of-two burst length logic and a memory interface device including non-power-of-two burst length generation logic. The non-power-of-two burst length generation logic extends a burst length from a power-of-two value to insert an error-detecting code in a burst on data lines between the memory interface device and the plurality of memory devices.

Abstract: Methods, systems, and computer program products are provided for dynamic selective memory mirroring in solid state devices. An amount of memory is reserved. Sections of the memory to select for mirroring in the reserved memory are dynamically determined. The selected sections of the memory contain critical areas. The selected sections of the memory are mirrored in the reserved memory.

Abstract: A system for using complex branch execution hardware and a hardware based Multiplex (MUX) to multiplex a fetch address of a future branch and a branch fetch address to one index hash value used to index a branch target prediction table for execution by a processor core, to reduce branch mis-prediction by preloading.

Abstract: A method of correcting defects in a storage array of a microprocessor, such as a cache memory, by operating the microprocessor to carry out a functional test procedure which utilizes cache memory, collecting fault data in a trace array during the functional test procedure, identifying a location of the defect in the cache memory using the fault data, and repairing the defect by setting a fuse to reroute access requests for the location to a redundant array. The fault data may include an error syndrome and a failing address. The functional test procedure creates random cache access sequences that cause varying loads of traffic in the cache memory using a test pattern based on a random seed. The functional test procedure may be carried out after completion of a nonfunctional, built-in self test of the microprocessor which sets some of the fuses.

Abstract: A method of correcting defects in a storage array of a microprocessor, such as a cache memory, by operating the microprocessor to carry out a functional test procedure which utilizes cache memory, collecting fault data in a trace array during the functional test procedure, identifying a location of the defect in the cache memory using the fault data, and repairing the defect by setting a fuse to reroute access requests for the location to a redundant array. The fault data may include an error syndrome and a failing address. The functional test procedure creates random cache access sequences that cause varying loads of traffic in the cache memory using a test pattern based on a random seed. The functional test procedure may be carried out after completion of a nonfunctional, built-in self test of the microprocessor which sets some of the fuses.

Abstract: A method of correcting defects in a storage array of a microprocessor, such as a cache memory, by operating the microprocessor to carry out a functional test procedure which utilizes cache memory, collecting fault data in a trace array during the functional test procedure, identifying a location of the defect in the cache memory using the fault data, and repairing the defect by setting a fuse to reroute access requests for the location to a redundant array. The fault data may include an error syndrome and a failing address. The functional test procedure creates random cache access sequences that cause varying loads of traffic in the cache memory using a test pattern based on a random seed. The functional test procedure may be carried out after completion of a nonfunctional, built-in self test of the microprocessor which sets some of the fuses.

Abstract: The present invention provides systems and methods to realize the potential benefit of portable storage devices by taking advantage of standard PCs including an optical disk drive capable of reading an optical disk, such as a CD or a DVD, cost effective optical disks, and the Internet.