Patents by Inventor Kinyip Phoa

Kinyip Phoa has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10158034
    Abstract: An embodiment includes an apparatus comprising: a first photovoltaic cell; a first through silicon via (TSV) included in the first photovoltaic cell and passing through at least a portion of a doped silicon substrate, the first TSV comprising (a)(i) a first sidewall, which is doped oppositely to the doped silicon substrate, and (a)(ii) a first contact substantially filling the first TSV; and a second TSV included in the first photovoltaic cell and passing through at least another portion of the doped silicon substrate, the second TSV comprising (b)(i) a second sidewall, which comprises the doped silicon substrate, and (b)(ii) a second contact substantially filling the second TSV; wherein the first and second contacts each include a conductive material that is substantially transparent. Other embodiments are described herein.
    Type: Grant
    Filed: June 27, 2014
    Date of Patent: December 18, 2018
    Assignee: Intel Corporation
    Inventors: Kinyip Phoa, Nidhi Nidhi, Chia-Hong Jan, Walid M. Hafez, Yi Wei Chen
  • Publication number: 20180151474
    Abstract: Techniques are disclosed for providing on-chip capacitance using through-body-vias (TBVs). In accordance with some embodiments, a TBV may be formed within a semiconductor layer, and a dielectric layer may be formed between the TBV and the surrounding semiconductor layer. The TBV may serve as one electrode (e.g., anode) of a TBV capacitor, and the dielectric layer may serve as the dielectric body of that TBV capacitor. In some embodiments, the semiconductor layer serves as the other electrode (e.g., cathode) of the TBV capacitor. To that end, in some embodiments, the entire semiconductor layer may comprise a low-resistivity material, whereas in some other embodiments, low-resistivity region(s) may be provided just along the sidewalls local to the TBV, for example, by selective doping in those location(s). In other embodiments, a conductive layer formed between the dielectric layer and the semiconductor layer serves as the other electrode (e.g., cathode) of the TBV capacitor.
    Type: Application
    Filed: June 22, 2015
    Publication date: May 31, 2018
    Applicant: INTEL CORPORATION
    Inventors: YI WEI CHEN, KINYIP PHOA, NIDHI NIDHI, JUI-YEN LIN, KUN-HUAN SHIH, XIAODONG YANG, WALID M. HAFEZ, CURTIS TSAI
  • Publication number: 20180130902
    Abstract: A vertical transistor is described that uses a through silicon via as a gate. In one example, the structure includes a substrate, a via in the substrate, the via being filled with a conductive material and having a dielectric liner, a deep well coupled to the via, a drain area coupled to the deep well having a drain contact, a source area between the drain area and the via having a source contact, and a gate contact over the via.
    Type: Application
    Filed: June 19, 2015
    Publication date: May 10, 2018
    Inventors: Xiaodong YANG, Jui-Yen LIN, Kinyip PHOA, Nidhi NIDHI, Yi Wei CHEN, Kun-Huan SHIH, Walid M. HAFEZ, Curtis TSAI
  • Publication number: 20170155004
    Abstract: An embodiment includes an apparatus comprising: a first photovoltaic cell; a first through silicon via (TSV) included in the first photovoltaic cell and passing through at least a portion of a doped silicon substrate, the first TSV comprising (a)(i) a first sidewall, which is doped oppositely to the doped silicon substrate, and (a)(ii) a first contact substantially filling the first TSV; and a second TSV included in the first photovoltaic cell and passing through at least another portion of the doped silicon substrate, the second TSV comprising (b)(i) a second sidewall, which comprises the doped silicon substrate, and (b)(ii) a second contact substantially filling the second TSV; wherein the first and second contacts each include a conductive material that is substantially transparent. Other embodiments are described herein.
    Type: Application
    Filed: June 27, 2014
    Publication date: June 1, 2017
    Inventors: KINYIP PHOA, NIDHI NIDHI, CHIA-HONG JAN, WALID M. HAFEZ, YI WEI CHEN
  • Publication number: 20170025533
    Abstract: High voltage transistors spanning multiple non-planar semiconductor bodies, such as fins or nanowires, are monolithically integrated with non-planar transistors utilizing an individual non-planar semiconductor body. The non-planar FETs may be utilized for low voltage CMOS logic circuitry within an IC, while high voltage transistors may be utilized for high voltage circuitry within the IC. A gate stack may be disposed over a high voltage channel region separating a pair of fins with each of the fins serving as part of a source/drain for the high voltage device. The high voltage channel region may be a planar length of substrate recessed relative to the fins. A high voltage gate stack may use an isolation dielectric that surrounds the fins as a thick gate dielectric. A high voltage transistor may include a pair of doped wells formed into the substrate that are separated by the high voltage gate stack with one or more fin encompassed within each well.
    Type: Application
    Filed: June 20, 2014
    Publication date: January 26, 2017
    Inventors: Kinyip Phoa, Nidhi Nidhi, Chia-Hong Jan, Ting Chang