Abstract: There is provided a calibration apparatus for calibrating an electronic device that outputs a demodulation signal in which a modulated component of a signal to be tested or evaluated is demodulated, having a DC component detecting section for detecting a DC component of the demodulation signal, a gain calculating section for calculating a gain in the electronic device based on the DC component of the demodulation signal and a calibrating section for calibrating the electronic device based on the gain in the electronic device.

Abstract: There is provided an electronic device having an operation circuit for outputting an output signal to be tested or evaluated and a demodulator that receives the output signal from the operation circuit to output a demodulation signal in which a phase-modulated or frequency-modulated component of the output signal is demodulated.

Abstract: There is provided a jitter measurement apparatus to measure jitter of a signal under measurement. The jitter measurement apparatus includes a pulse generator that outputs a demodulated signal indicating the jitter of the signal under measurement, by outputting a pulse having a substantially constant pulse width in synchronization with each predetermined edge of the signal under measurement, a DC component detecting section that detects a DC component of the demodulated signal output from the pulse generator, and an adjusting section that adjusts the pulse width of the pulse output from the pulse generator, based on the DC component of the demodulated signal which is detected by the DC component detecting section.

Abstract: There is provided a jitter measuring apparatus for measuring jitter in a signal-under-measurement, having a pulse generator for outputting a pulse signal having a pulse width set in advance corresponding to edges-under-measurement from which the timing jitter is to be measured in the signal-under-measurement, a filter for removing a carrier frequency components of the signal-under-measurement from the pulse signal and a jitter calculator for calculating the jitter in the signal-under-measurement based on the signal outputted out of the filter

Abstract: There is provided a jitter measuring apparatus for measuring jitter in a signal-under-measurement having a first pulse generator for detecting edges of the data-signal-under-measurement to output a first pulse signal having a pulse width set in advance corresponding to the edge, a second pulse generator for detecting boundaries of data sections where data values do not change in the data-signal-under-measurement to output a second pulse signal having a pulse width set in advance corresponding to timing of the detected boundaries of the data sections, a filter for removing carrier frequency components of said data-signal-under-measurement from first and second pulse signals and a jitter calculating section for calculating timing jitter in the data-signal-under-measurement based on the first and second pulse signals.

Abstract: There is provided a jitter measuring apparatus for measuring jitter in a signal-under-measurement, including a pulse generating section having first pulse generating means for detecting edges of the data-signal-under-measurement to output a first pulse signal having a pulse width set in advance corresponding to the edge and second pulse generating means for detecting boundaries of data sections where data values do not change in the data-signal-under-measurement to output a second pulse signal having a pulse width set in advance over the edge timings of the boundaries of the detected data sections and a jitter calculating section for calculating timing jitter in the data-signal-under-measurement based on the first and second pulse signals.

Abstract: A jitter measuring apparatus for measuring timing jitter of a signal-under-test is provided, wherein the jitter measuring apparatus includes a pulse generator for outputting a pulse signal of a predetermined pulse width for an edge of the signal-under-test, whose timing jitter is under test; and a jitter measuring sub-unit for extracting the timing jitter on the basis of a duty ratio of each cycle of the signal output by the pulse generator.

Abstract: There is provided a phase difference detecting apparatus operable to detect the phase difference between a first input signal and a second input signal. The phase detecting apparatus includes: a first divider operable to generate a first divided signal, which is the first input signal divided by two, so that all rising edges of the first input signal correspond to a rising edge and a falling edge of the first divided signal; a second divider operable to generate a second divided signal, which is the second input signal divided by two, so that the first divided signal corresponds to edges; a first phase detector operable to detect a phase difference between a rising edge of the first divided signal and an edge corresponding to the rising edge in the second divided signal; and a second phase detector operable to detect a phase difference between a falling edge of the first divided signal and an edge corresponding to the falling edge in the second divided signal.

Abstract: A jitter measurement apparatus for measuring an intrinsic jitter of a circuit to be tested including a phase detector which outputs a signal according to a phase difference between a supplied first input signal and a supplied second input signal, includes: an input unit for supplying an identical signal to the phase detector as the first input signal and as the second input signal; and a jitter measurement unit for measuring the intrinsic jitter of the circuit to be tested by measuring a jitter of a signal which is generated in an inside of the circuit to be tested according to an signal output from the phase detector.