Abstract: Phase interpolator and a delay circuit for the phase interpolator. The phase interpolator includes a variable delay circuit to rotate phase of an input clock to generate a phase rotated signal. The phase interpolator also includes a delay locked loop coupled to the variable delay circuit to generate a plurality of phase shifted outputs. The delay locked loop includes a plurality of delay elements. Each delay element includes a multiplexer and a delay cell coupled to the multiplexer. The multiplexer is configurable using a first control signal to output one of the phase rotated signal and a phase shifted output of the plurality of phase shifted outputs. The delay cell delays one of the phase rotated signal and the phase shifted output to generate another phase shifted output of the plurality of phase shifted outputs.

Abstract: A phase-locked loop includes a loop filter and a voltage controlled oscillator (VCO). The VCO includes multiple transistors, each transistor having a smaller transconductance (gm) than if a single transistor were used while maintaining the same loop bandwidth and drain-to-source current through the transistor. As a result of a smaller transconductance in the VCO, a larger resistor can be used in the loop filter without increasing the noise. With a larger resistor, a smaller capacitor can be used in the loop filter as well. Alternatively, the transconductance can be reduced by a certain factor and the resistance value can be increased by the same factor to maintain a constant loop bandwidth but with a reduction in the amplitude of the noise. Thus, a smaller loop filter capacitor can be achieved albeit with the same noise level, or a lower noise level with the same size capacitor for the loop filter.

Abstract: A method of operating a phase locked loop (FIG. 5) for a wireless receiver is disclosed. The method includes receiving a reference signal (503) having a first and a second plurality of cycles and receiving a feedback signal (512) having the first and the second plurality of cycles. The feedback signal is compared (504) to the reference signal. A plurality of phase errors is produced for each cycle of (UP, FIG. 10A) the first plurality of cycles in response to the step of comparing.

Abstract: In an apparatus and method for monitoring defects in wafers, a monitoring circuit is fabricated on an area of each one of the wafers. The monitoring circuit includes representative devices that replicate similar devices located in a die area of the wafers. Defects if present in the representative devices contribute to a generation of a noise, thereby causing an imbalance in a differential signal measurable across selected ones of the representative devices. A digitizing circuit that uses a common mode voltage as a reference to measure the imbalance digitizes the differential signal to a digital signal, the digital signal being indicative of the noise generated by the defects. The digital signal is stored over a configurable time interval to form a digital bit stream. The digital bit stream is compared to a reference to determine whether the defeats are within an allowable range.

Abstract: A method of operating a phase locked loop (FIG. 5) for a wireless receiver is disclosed. The method includes receiving a reference signal (503) having a first and a second plurality of cycles and receiving a feedback signal (512) having the first and the second plurality of cycles. The feedback signal is compared (504) to the reference signal. A plurality of phase errors is produced for each cycle of (UP, FIG. 10A) the first plurality of cycles in response to the step of comparing.

Abstract: In an apparatus and method for monitoring defects in wafers, a monitoring circuit is fabricated on an area of each one of the wafers. The monitoring circuit includes representative devices that replicate similar devices located in a die area of the wafers. Defects if present in the representative devices contribute to a generation of a noise, thereby causing an imbalance in a differential signal measurable across selected ones of the representative devices. A digitizing circuit that uses a common mode voltage as a reference to measure the imbalance digitizes the differential signal to a digital signal, the digital signal being indicative of the noise generated by the defects. The digital signal is stored over a configurable time interval to form a digital bit stream. The digital bit stream is compared to a reference to determine whether the defeats are within an allowable range.

Abstract: In an apparatus and method for monitoring defects in wafers, a monitoring circuit is fabricated on an area of each one of the wafers. The monitoring circuit includes representative devices that replicate similar devices located in a die area of the wafers. Defects if present in the representative devices contribute to a generation of a noise, thereby causing an imbalance in a differential signal measurable across selected ones of the representative devices. A digitizing circuit that uses a common mode voltage as a reference to measure the imbalance digitizes the differential signal to a digital signal, the digital signal being indicative of the noise generated by the defects. The digital signal is stored over a configurable time interval to form a digital bit stream. The digital bit stream is compared to a reference to determine whether the defects are within an allowable range.

Abstract: A nonlinearity calibration system and method for a frequency modulation (FM) transmitter. A nonlinearity calibration system for a FM transmitter includes a digitally controlled oscillator (DCO) with a variable capacitor array. The DCO receives a calibrated fine code for tuning the variable capacitor array to modulate a digitally encoded audio signal transmitted by the FM transmitter to a modulation frequency. The nonlinearity calibration system also includes a nonlinearity estimator for generating an approximation of an integral nonlinearity associated with processing of a fine code to tune the variable capacitor array. The nonlinearity calibration system further includes a subtractor for subtracting the approximation of the integral nonlinearity from the fine code to generate the calibrated fine code.

Abstract: In an apparatus and method for monitoring defects in wafers, a monitoring circuit is fabricated on an area of each one of the wafers. The monitoring circuit includes representative devices that replicate similar devices located in a die area of the wafers. Defects if present in the representative devices contribute to a generation of a noise, thereby causing an imbalance in a differential signal measurable across selected ones of the representative devices. A digitizing circuit that uses a common mode voltage as a reference to measure the imbalance digitizes the differential signal to a digital signal, the digital signal being indicative of the noise generated by the defects. The digital signal is stored over a configurable time interval to form a digital bit stream. The digital bit stream is compared to a reference to determine whether the defects are within an allowable range.

Abstract: Circuits and apparatus to implement digital phase locked loops are disclosed.

Abstract: A method of operating a phase locked loop (FIG. 5) for a wireless receiver is disclosed. The method includes receiving a reference signal (503) having a first and a second plurality of cycles and receiving a feedback signal (512) having the first and the second plurality of cycles. The feedback signal is compared (504) to the reference signal. A plurality of phase errors is produced for each cycle of (UP, FIG. 10A) the first plurality of cycles in response to the step of comparing.

Abstract: An analog-to-digital converter 16 includes first and second analog-to-digital converters 22 and 24 both of which receive an input signal. The first analog-to-digital converter 22 is configured to be centered around a first signal level point while the second analog-to-digital converter 24 is configured to be centered around a second signal level point. A decoder 26 receives inputs from the two analog-to-digital converters 22 and 24 and selects between the first analog-to-digital converter 22 output and the second analog-to-digital converter 24 output.

Abstract: An apparatus for correcting for the finite gain of an amplifier assembly in a pipelined analog to digital converter (ADC) is disclosed in which an input signal to an amplifier module of one stage of the pipelined ADC is sampled and provided to the input of an amplifier of a subsequent stage as a feed-forward error correction signal. The feed-forward correction signal is subtracted in the next stage from the output residue signal of the previous stage input to the second subsequent stage amplifier in order to remove part of the output signal from the first stage that includes the finite gain of the amplifier.

Abstract: An apparatus for correcting for the finite gain of an amplifier assembly in a pipelined analog to digital converter (ADC) is disclosed in which an input signal to an amplifier module of one stage of the pipelined ADC is sampled and provided to the input of an amplifier of a subsequent stage as a feed-forward error correction signal. The feed-forward correction signal is subtracted in the next stage from the output residue signal of the previous stage input to the second subsequent stage amplifier in order to remove part of the output signal from the first stage that includes the finite gain of the amplifier.

Abstract: An electronic circuit for converting an analog differential signal into a corresponding digital signal includes 2n voltage comparators each having a first input terminal, a second input terminal and an output terminal. A first network of 2n resistive elements is provided to which a first analog signal of the differential signal is applied, the first network having a plurality of first network nodes each coupled to the first input terminal of a corresponding one of the comparators and wherein one of the first network nodes is a first middle node coupled to the first analog signal. A second network of 2n resistive elements is provided to which a second analog signal of the differential signal is applied, the second network having a plurality of second network nodes each coupled to the second input terminal of the corresponding one of the comparators and wherein one of the second network nodes is a second middle node coupled to the second analog signal.

Abstract: A method and circuit for improving the aperture distortion in parallel A/D converters by reducing the delay mismatch in the sample-and-hold portion of A/D converter circuit. The technique involves generating two complementary clocks, Q and {overscore (Q)}, from a single master clock and then gating these two clocks, in a random fashion, with the original master clock in order to significantly reduce the delay mismatch in the circuit. This approach involves the random selection of gated switches from dual banks each containing a plurality of parallel switches, thereby compensating for aperture error by converting any systematic aperture mismatch between the sampling clocks into random noise spread over the frequency band. High speed A/D converters incorporating the techniques of this invention will provide superior performance in digital audio, digital video, and many other digital applications.

Abstract: A folding circuit is provided for outputting a periodic function representative of an analog input signal. The circuit includes at least two preamplifiers and a third differential amplifier circuit coupled to the preamplifier circuits for providing a bias current such that the flow of current is regulated through one of the preamplifier circuits at any given time, thereby providing a periodic function representative of an analog input signal.

Abstract: An exemplary electronic circuit of the present include first and second buffers 34 and 38, which are preferably unity gain buffers. A first switch 36 (e.g., a NMOS transistor or a CMOS transmission gate) is coupled between the output of the first buffer 34 and the first terminal of a capacitor 40. The input of the second buffer 38 is also coupled to the first terminal of the capacitor 40. A second switch 42 is coupled between the second terminal of the capacitor 40 and a first voltage node Va and a third switch 44 is coupled between the second terminal of the capacitor 40 and a second voltage node Vb. This circuit can be used as an integrator in a number of applications.

Abstract: A fast acting polarity detector uses a “very fast” polarity detector in tandem with a “precise” polarity detector to increase the maximum speed achievable from an A/D converter that employs a 1-bit folding front end. The fast polarity detector is a coarse polarity detector that immediately controls the 1-bit folder. The precise polarity detector operates more slowly, but more accurately. When the output of the precise polarity detector becomes available, it overrides the output of the fast polarity detector. This process does not limit the speed of the A/D conversion even though the precise polarity detector is slower to operate since the signal levels are small.

Abstract: A method and circuit for improving the aperture distortion in parallel A/D converters by reducing the delay mismatch in the sample-and-hold portion of A/D converter circuit. The technique involves generating two complementary clocks, Q and {overscore (Q)}, from a single master clock and then gating these two clocks, in a random fashion, with the original master clock in order to significantly reduce the delay mismatch in the circuit. This approach involves the random selection of gated switches from dual banks each containing a plurality of parallel switches, thereby compensating for aperture error by converting any systematic aperture mismatch between the sampling clocks into random noise spread over the frequency band. High speed A/D converters incorporating the techniques of this invention will provide superior performance in digital audio, digital video, and many other digital applications.