Abstract: A data transfer apparatus in a semiconductor memory device includes a DQ pad, a DQS pad, a DQ driver for transferring the data signal to the DQ pad according to a driver select signal, and a DQS driver for transferring data strobe signal to the DQS pad according to the driver select signal. Any one of the DQ driver and the DQS driver is activated by the driver select signal, and the driver select signal is generated by one of EMRS control code, MRS control code and test mode code.

Abstract: A digital-to-analogue converting circuit includes a driver leg having a plurality of resistance elements between a power supply voltage terminal and a ground voltage terminal, wherein at least one of the plurality of resistance elements is a variable resistor, and a code level changing unit for outputting a level-changed code to a control terminal of the variable resistor based on an activation of a digital code, wherein the level-changed code is produced by converting a level of the digital code.

Abstract: A semiconductor memory device is able to inactivate an on-die termination circuit without an additional pin. The semiconductor memory device includes a control signal generator, a resistance control unit, and a resistance supply unit. The control signal generator generates an initializing signal and driving clocks in response to a plurality of control signals. The resistance control unit, initialized by the initializing signal, generates a termination-off signal in response to the driving clocks. The resistance supply unit supplies termination resistance in response to the termination-off signal and a mode register setting value. The plurality of control signals are inputted through input pins not connected to the resistance supply unit.

Abstract: A semiconductor integrated circuit can include a first voltage pad, a second voltage pad, and a voltage stabilizing unit that is connected between the first voltage pad and the second voltage pad. The first voltage pad can be connected to a first internal circuit, and the second voltage pad can be connected to a second internal circuit.

Abstract: A digital-to-analogue converting circuit includes a driver leg having a plurality of resistance elements between a power supply voltage terminal and a ground voltage terminal, wherein at least one of the plurality of resistance elements is a variable resistor, and a code level changing unit for outputting a level-changed code to a control terminal of the variable resistor based on an activation of a digital code, wherein the level-changed code is produced by converting a level of the digital code.

Abstract: A data transfer apparatus in a semiconductor memory device includes a DQ pad, a DQS pad, a DQ driver for transferring the data signal to the DQ pad according to a driver select signal, and a DQS driver for transferring data strobe signal to the DQS pad according to the driver select signal. Any one of the DQ driver and the DQS driver is activated by the driver select signal, and the driver select signal is generated by one of EMRS control code, MRS control code and test mode code.

Abstract: Provided is directed to a circuit for controlling data and a data strobe driver in a semiconductor memory device, including: a first delay unit for outputting a data signal with a variable delay; a DQ driver for outputting a data signal according to the data signal passed through the first delay unit and a driver select signal; a second delay unit for outputting a data strobe signal with a variable delay; and a DQS driver for outputting the data strobe signal passed through the second delay unit by being driven according to the driver select signal.

Abstract: An apparatus for generating a reference voltage of a semiconductor integrated circuit includes a resistance control unit that adjusts at least one an adjustment code such that at least one set of resistors, which have resistances determined according to the at least one adjustment code have predetermined resistances, a voltage level control unit that generates a selection code for selecting the level of a final reference voltage under external control and outputs the generated selection code, and a reference voltage generating unit that converts a power supply voltage according to the adjustment code and the selection code and outputs the final reference voltage.

Abstract: A semiconductor integrated circuit includes a first clock pin controller that receives a mirror function signal and a test mode signal to generate a first input buffer control signal in response to the mirror function signal in a normal mode. A second clock pin controller receives the mirror function signal and the test mode signal to generate a second input buffer control signal, which is an inverted signal of the first input buffer control signal, in response to the mirror function signal in the normal mode. An input buffer unit generates output signals of first and second pins in response to the first input buffer control signal and the second input buffer control signal, respectively.

Abstract: A semiconductor memory device is able to inactivate an on-die termination circuit without an additional pin. The semiconductor memory device includes a control signal generator, a resistance control unit, and a resistance supply unit. The control signal generator generates an initializing signal and driving clocks in response to a plurality of control signals. The resistance control unit, initialized by the initializing signal, generates a termination-off signal in response to the driving clocks. The resistance supply unit supplies termination resistance in response to the termination-off signal and a mode register setting value. The plurality of control signals are inputted through input pins not connected to the resistance supply unit.

Abstract: An apparatus for generating a reference voltage of a semiconductor integrated circuit includes a resistance control unit that adjusts at least one an adjustment code such that at least one set of resistors, which have resistances determined according to the at least one adjustment code have predetermined resistances, a voltage level control unit that generates a selection code for selecting the level of a final reference voltage under external control and outputs the generated selection code, and a reference voltage generating unit that converts a power supply voltage according to the adjustment code and the selection code and outputs the final reference voltage.

Abstract: Disclosed is an internal voltage generator, which includes a detecting means for detecting a level of an internal voltage, an oscillator for generating a driving pulse signal in response to an output signal of the detecting means, a first driving unit for outputting a first pulse signal after receiving the driving pulse signal, a second driving unit for outputting a second pulse signal after receiving the driving pulse signal, and a pumping unit for changing a potential level of the internal voltage after selectively receiving one of the first pulse signal and the second pulse signal.

Abstract: A semiconductor memory device having a register for stably generating an internal power supply voltage, including: a pumping circuit unit for generating the internal power supply voltage and adjusting a voltage level of the internal power supply voltage in response to a control signal; and a decoding unit for generating the control signal based on a plurality of address signals of the register.

Abstract: A semiconductor device for use in a semiconductor memory device for pumping a supplying voltage according to a data access mode and an auto-refresh mode, including: a voltage level detecting means for generating a voltage level detect signal by detecting a voltage level of the supplying voltage; an auto-refresh signal detecting means for generating an auto-refresh detect signal in response to an auto-refresh signal; and a voltage pumping means for pumping the supplying voltage in response to the voltage level detect signal at the data access mode or in response to the auto-refresh detect signal at the auto-refresh mode.

Abstract: A semiconductor memory device is capable of testifying over-driving quantity depending on position. A semiconductor memory device includes a plurality of in-bank over-drivers for temporarily applying a high voltage to a normal power that is supplied to a memory array cell within a bank; a plurality of out-bank over-drivers arranged outside the bank for temporarily applying the high voltage to the normal power that is supplied to the bank; a plurality of PERI over-drivers arranged at the peripheral area for temporarily applying the high voltage to the normal power; a mode register set for receiving a signal to select one of the over-drivers; and a decoder activated in response to a test mode signal for decoding the set value of the MRS to selectively drive the over-driver arranged at a desired position and having desired driving power among the in-bank and out-bank over-drivers and the PERI over-drivers.

Abstract: A semiconductor memory device having a register for stably generating an internal power supply voltage, including: a pumping circuit unit for generating the internal power supply voltage and adjusting a voltage level of the internal power supply voltage in response to a control signal; and a decoding unit for generating the control signal based on a plurality of address signals of the register.

Abstract: Disclosed is an input stage circuit of a semiconductor device which is effective for preventing a reference voltage fluctuation. The input stage circuit of the semiconductor memory device includes: a reference voltage input pin connected to an external reference voltage terminal, wherein the reference voltage is used for determining a digital value; a reference voltage line for applying the reference voltage from the reference voltage input pin; a first drive voltage line for applying a first drive voltage into the semiconductor device; a second drive voltage line for applying a second drive voltage into the semiconductor device; a first coupler for coupling the reference voltage line with the first drive voltage line; and a second coupler for coupling the reference voltage line with the second drive voltage line.

Abstract: A semiconductor memory device is capable of testifying over-driving quantity depending on position. A semiconductor memory device includes a plurality of in-bank over-drivers for temporarily applying a high voltage to a normal power that is supplied to a memory array cell within a bank; a plurality of out-bank over-drivers arranged outside the bank for temporarily applying the high voltage to the normal power that is supplied to the bank; a plurality of PERI over-drivers arranged at the peripheral area for temporarily applying the high voltage to the normal power; a mode register set for receiving a signal to select one of the over-drivers; and a decoder activated in response to a test mode signal for decoding the set value of the MRS to selectively drive the over-driver arranged at a desired position and having desired driving power among the in-bank and out-bank over-drivers and the PERI over-drivers.

Abstract: A high voltage supply circuit and method of supplying a high voltage are disclosed. A second pumping voltage-generating unit, in addition to a primary pumping voltage-generating unit for generating a pumping voltage, is provided. The second pumping voltage-generating unit is operated for a certain time simultaneously with the primary voltage-generating unit when a normal operating mode is switched to an auto-refresh operating mode where current consumption is abruptly increased in order to raise the pumping voltage higher than a target voltage. Therefore, the resulting pumping voltage is prevented from being lower than the target voltage even if the operating mode where current consumption is abruptly increased is entered, and the reliability of the circuit is therefore increased.

Abstract: A semiconductor device for use in a semiconductor memory device for pumping a supplying voltage according to a data access mode and an auto-refresh mode, including: a voltage level detecting means for generating a voltage level detect signal by detecting a voltage level of the supplying voltage; an auto-refresh signal detecting means for generating an auto-refresh detect signal in response to an auto-refresh signal; and a voltage pumping means for pumping the supplying voltage in response to the voltage level detect signal at the data access mode or in response to the auto-refresh detect signal at the auto-refresh mode.