Abstract: A memory management system and method of managing output data resulting from a memory device storing raw data and error correction coding (ECC) bits are described. The system includes a controller to receive a read command and control a memory device based on the read command, the memory device to store raw data and error correction coding (ECC) bits and output the raw data and the ECC bits corresponding with memory addresses specified in the read command, and an ECC decoder to output an error vector associated with the memory addresses based on the raw data and the ECC bits corresponding with the memory addresses output by the memory device, the error vector associated with the memory addresses indicating errors in the raw data corresponding with the memory addresses. The system also includes a multiplexer (MUX) to output the error vector based on a selection indicated in the read command.

Abstract: Keys are generated at a memory device with a period of time elapsing between generation of each key. A request is received from a memory controller for the most recently generated key. The memory device communicates the first key to the memory controller. Access to nonvolatile memory on the memory device is locked. An unlock command with a second key is received from the memory controller. The memory device determines that the second key matches the first key and unlocks access to the nonvolatile memory in response.

Abstract: A memory management system and method of managing output data resulting from a memory device storing raw data and error correction coding (ECC) bits are described. The system includes a controller to receive a read command and control a memory device based on the read command, the memory device to store raw data and error correction coding (ECC) bits and output the raw data and the ECC bits corresponding with memory addresses specified in the read command, and an ECC decoder to output an error vector associated with the memory addresses based on the raw data and the ECC bits corresponding with the memory addresses output by the memory device, the error vector associated with the memory addresses indicating errors in the raw data corresponding with the memory addresses. The system also includes a multiplexer (MUX) to output the error vector based on a selection indicated in the read command.

Abstract: An aspect includes determining a configuration change to at least one memory device of a memory system. A band switch enable command is sent from a memory controller to the at least one memory device indicating the configuration change. One or more internal circuits of the at least one memory device are set into a quiescent mode based on receiving the band enable command. One or more of a voltage and a frequency of the at least one memory device are adjusted to implement the configuration change. A band switch disable command is sent from the memory controller to the at least one memory device based on completing the adjusting. The one or more internal circuits are enabled to operate using the adjustment based on receiving the band switch disable command from the memory controller.

Abstract: Classifying memory errors may include accessing data from a location within a memory array of a memory device. The memory array may include at least one bit field to store memory error classification information. One or more memory errors in the data may be determined. One or more memory errors may further be classified. In response to the classifying, memory error classification information may be stored as one or more bit values within the bit field.

Abstract: A correctable memory error may be identified at a first address within a memory device. Based on at least the identifying, a first correctable memory error count may be updated from a first quantity to a second quantity. The second quantity may be determined to exceed or not exceed a threshold. In response to the determining, the first correctable memory error count of the second quantity may be: converted to a third quantity and reported to a host device accordingly, reported to a host device, or not reported to a host device.

Abstract: An endurance parameter value of a non-volatile memory included in a non-volatile dual in-line memory module (NVDIMM) can be monitored and compared against a warning threshold value. In response to the endurance parameter exceeding the warning threshold value, a system alert can be generated, within a host system of the NVDIMM, to inform a system user that the NVDIMM is approaching its end-of-life. If the endurance parameter exceeds a replacement threshold value greater than the warning threshold value, an upgrade process can be initiated. The upgrade process can include copying data from the first non-volatile memory to a volatile memory of the NVDIMM and copying, in response to the first non-volatile memory being replaced with a second non-volatile memory, the data from the volatile memory to the second non-volatile memory.

Abstract: An endurance parameter value of a non-volatile memory included in a non-volatile dual in-line memory module (NVDIMM) can be monitored and compared against a warning threshold value. In response to the endurance parameter exceeding the warning threshold value, a system alert can be generated, within a host system of the NVDIMM, to inform a system user that the NVDIMM is approaching its end-of-life. If the endurance parameter exceeds a replacement threshold value greater than the warning threshold value, an upgrade process can be initiated. The upgrade process can include copying data from the first non-volatile memory to a volatile memory of the NVDIMM and copying, in response to the first non-volatile memory being replaced with a second non-volatile memory, the data from the volatile memory to the second non-volatile memory.

Abstract: An endurance parameter value of a non-volatile memory included in a non-volatile dual in-line memory module (NVDIMM) can be monitored and compared against a warning threshold value. In response to the endurance parameter exceeding the warning threshold value, a system alert can be generated, within a host system of the NVDIMM, to inform a system user that the NVDIMM is approaching its end-of-life. If the endurance parameter exceeds a replacement threshold value greater than the warning threshold value, an upgrade process can be initiated. The upgrade process can include copying data from the first non-volatile memory to a volatile memory of the NVDIMM and copying, in response to the first non-volatile memory being replaced with a second non-volatile memory, the data from the volatile memory to the second non-volatile memory.

Abstract: Embodiments of the present disclosure provide an approach for monitoring the health and predicting the failure of dynamic random-access memory (DRAM) devices with embedded error-correcting code (ECC). Additional registers are embedded on the DRAM device to store information about the DRAM, such as the number and location of soft errors detected by the device. When the DRAM device detects a soft error, it will update the information stored in the additional registers. A controller compares the information stored in the additional registers to associated thresholds. In some embodiments, after comparing the information to the associated thresholds, the controller may determine whether to schedule a repair action. In other embodiments, the controller may determine whether to alert the memory controller that the DRAM may be failing.

Abstract: Embodiments disclosed herein generally relate to techniques for routing data through one or more cascaded memory modules. Each memory module can include a plurality of data buffers. Each data buffer includes a plurality of ports for routing data to and/or from other memory modules. In one embodiment, the data buffer is configured to route write data to DRAM devices on a first memory module or route write data to a data buffer of at least one downstream memory module. The data buffer is also configured to receive read data from a DRAM device of the first memory module or receive read data from a downstream memory module.

Abstract: Classifying memory errors may include accessing data from a location within a memory array of a memory device. The memory array may include at least one bit field to store memory error classification information. One or more memory errors in the data may be determined. One or more memory errors may further be classified. In response to the classifying, memory error classification information may be stored as one or more bit values within the bit field.

Abstract: Embodiments of the present disclosure provide an approach for monitoring the health and predicting the failure of dynamic random-access memory (DRAM) devices with embedded error-correcting code (ECC). Additional registers are embedded on the DRAM device to store information about the DRAM, such as the number and location of soft errors detected by the device. When the DRAM device detects a soft error, it will update the information stored in the additional registers. A controller compares the information stored in the additional registers to associated thresholds. In some embodiments, after comparing the information to the associated thresholds, the controller may determine whether to schedule a repair action. In other embodiments, the controller may determine whether to alert the memory controller that the DRAM may be failing.

Abstract: Embodiments described herein include a quadrature phase corrector (QPC) which includes multiple differential amplifies for correcting the phase of one or more clock signals. In one embodiment, the differential amplifiers are arranged in an input stage, cross-coupled stage, and ring stage. The input stage receives and buffers the input clock signal (or signals). The cross-coupled stage includes one or more latches that force one clock signal high and another low which causes the QPC to oscillate. The ring stage outputs four clock signals with adjusted phases relative to the input clock signals. In one example, the ring stage outputs a quadrature clock signal that includes four clock signals phase shifted by 90 degrees.

Abstract: A correctable memory error may be identified at a first address within a memory device. Based on at least the identifying, a first correctable memory error count may be updated from a first quantity to a second quantity. The second quantity may be determined to exceed or not exceed a threshold. In response to the determining, the first correctable memory error count of the second quantity may be: converted to a third quantity and reported to a host device accordingly, reported to a host device, or not reported to a host device.

Abstract: Keys are generated at a memory device with a period of time elapsing between generation of each key. A request is received from a memory controller for the most recently generated key. The memory device communicates the first key to the memory controller. Access to nonvolatile memory on the memory device is locked. An unlock command with a second key is received from the memory controller. The memory device determines that the second key matches the first key and unlocks access to the nonvolatile memory in response.

Abstract: Keys are generated at a memory device with a period of time elapsing between generation of each key. A request is received from a memory controller for the most recently generated key. The memory device communicates the first key to the memory controller. Access to nonvolatile memory on the memory device is locked. An unlock command with a second key is received from the memory controller. The memory device determines that the second key matches the first key and unlocks access to the nonvolatile memory in response.

Abstract: Embodiments herein describe DRAM that includes storage circuitry coupled between complementary bit lines which are in turn coupled to the same sense amplifier. The storage circuitry includes a transistor and a storage capacitor coupled in series. The gate of the transistor is coupled to a word line which selectively couples the storage capacitor to one of the complementary bit lines. Because the capacitor is coupled to both of the bit lines, when reading the data stored on the capacitor, the charge on the capacitor causes current to flow from one of the bit lines into the other bit line which causes a voltage difference between the complementary bit lines. Put differently, both ends of the capacitor are electrically coupled to bit lines thereby generating a larger voltage difference between the bit lines when reading data from the storage capacitors.

Abstract: Techniques are disclosed for dynamic random access memory (DRAM) cell. The DRAM cell comprises a first bit line and a first complementary bit line, a storage capacitor having a first node coupled with the first complementary bit line, and a transistor selectable by a word line to couple a second node of the storage capacitor to the first bit line, wherein a voltage potential across the first bit line and the first complementary bit line when the transistor is selected is indicative of a bit of data.

Abstract: An endurance parameter value of a non-volatile memory included in a non-volatile dual in-line memory module (NVDIMM) can be monitored and compared against a warning threshold value. In response to the endurance parameter exceeding the warning threshold value, a system alert can be generated, within a host system of the NVDIMM, to inform a system user that the NVDIMM is approaching its end-of-life. If the endurance parameter exceeds a replacement threshold value greater than the warning threshold value, an upgrade process can be initiated. The upgrade process can include copying data from the first non-volatile memory to a volatile memory of the NVDIMM and copying, in response to the first non-volatile memory being replaced with a second non-volatile memory, the data from the volatile memory to the second non-volatile memory.