Abstract: The present invention is a package-in-package system, comprising: providing a bottom internal stacking module incorporating a semiconductor die and a package substrate, attaching an internal stiffening module with a die receptacle on the bottom internal stacking module, and attaching a top internal stacking module incorporating a semiconductor die and a package substrate upside-down on the internal stiffening module.

Abstract: An integrated circuit package system comprising: providing a package substrate; attaching an integrated circuit over the package substrate; and attaching a side substrate adjacent the integrated circuit over the package substrate.

Abstract: Methods for fabricating flip-chips are disclosed. In an exemplary method, a flip-chip is mounted, active-surface downward, onto a substrate such that a back-side of the flip-chip is facing upward and electrical connections are made between the chip and an upward-facing surface of the substrate. An adhesive is applied to selected regions not occupied by the flip-chip. A heat-spreader is applied to contact the applied adhesive without contacting the back-side of the flip-chip, leaving a gap between the heat-spreader and the back-side of the flip-chip. The heat-spreader defines at least one through-hole that, when the heat-spreader is placed, is within a perimeter of the flip-chip. The adhesive is cured, and a thermal-insulating material (TIM) is applied through the at least one through-hole so as to fill the gap with the TIM. The methods substantially reduce the probability of die damage that otherwise occurs during attachment of heat-spreaders.

Abstract: An integrated circuit mount system includes an integrated circuit, a solder mask for the integrated circuit, and a solder mask pad on the substrate with the solder mask.

Abstract: A flip chip interconnect has a tapering interconnect structure, and the area of contact of the interconnect structure with the site on the substrate metallization is less than the area of contact of the interconnect structure with the die pad. A solder mask has an opening over the interconnect site, and the solder mask makes contact with the interconnect structure, or is in close proximity to the interconnect structure, at the margin of the opening. The flip chip interconnect is provided with an underfill. During the underfill process, the contact (or near proximity) of the solder mask with the interconnect structure interferes with flow of the underfill material toward the substrate adjacent the site, resulting in formation of a void left unfilled by the underfill, adjacent the contact of the interconnect structure with the site on the substrate metallization. The void can help provide relief from strain induced by changes in temperature of the system.

Abstract: A flip chip interconnect has a tapering interconnect structure, and the area of contact of the interconnect structure with the site on the substrate metallization is less than the area of contact of the interconnect structure with the die pad. Also, a bond-on-lead or bond-on-narrow pad or bond on a small area of a contact pad interconnection includes such tapering flip chip interconnects. Also, methods for making the interconnect structure include providing a die having interconnect pads, providing a substrate having interconnect sites on a patterned conductive layer, providing a bump on a die pad, providing a fusible electrically conductive material either at the interconnect site or on the bump, mating the bump to the interconnect site, and heating to melt the fusible material.