Patents by Inventor Lei Lian

Lei Lian has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20250046906
    Abstract: A battery self-heating device, comprising: a bridge arm converter, an energy storage element, an inductor and a controller. The controller is configured to control, in a preset state, the connection and disconnection of the bridge arm converter, such that a first power battery and a second power battery are respectively charged/discharged by means of the inductor, and each form a freewheeling circuit by means of the energy storage element, so as to realize the continuous heating of the first power battery and the second power battery.
    Type: Application
    Filed: October 22, 2024
    Publication date: February 6, 2025
    Inventors: Yubo LIAN, Heping LING, Lei YAN, Gan SONG, Wen GAO
  • Publication number: 20240385048
    Abstract: A method and apparatus for determining the temperature of a substrate within a processing chamber are described herein. The methods and apparatus described herein utilize an etalon assembly and a heterodyning effect to determine a first temperature of a substrate. The first temperature of the substrate is determined without physically contacting the substrate. A separate temperature sensor also measures a second temperature of the substrate and/or the substrate support at a similar location. The first temperature and the second temperature are utilized to calibrate one of the temperature sensors disposed within the substrate support, a model of the processes performed within the processing chamber, or to adjust a process parameter of the process performed within the processing chamber.
    Type: Application
    Filed: July 30, 2024
    Publication date: November 21, 2024
    Inventors: Bruce E. ADAMS, Samuel C. HOWELLS, Alvaro GARCIA, Barry P. CRAVER, Tony Jefferson GNANAPRAKASA, Lei LIAN
  • Publication number: 20240379469
    Abstract: Disclosed herein is a method for determining the endpoint of an etch operation used for forming high aspect ratio features and/or over low open area (<1%) on a substrate in a processing chamber. The method begins by obtaining a reference emission curve. An etch operation is performed on a patterned substrate. A plasma optical emission intensity is measured for each of the etch cycles. A differential curve between the reference emission and the plasma optical emissions is calculated. And endpoint is determined for the etch operation on the first substrate based on an inflection point detection or other unique features through pattern recognition in the differential curve for stopping the etch of the first substrate.
    Type: Application
    Filed: July 22, 2024
    Publication date: November 14, 2024
    Inventors: Lei LIAN, Quentin WALKER, Zefang WANG, Shinichi KOSEKI
  • Publication number: 20240327359
    Abstract: The invention relates to the technical field of pesticides, and in particular to a type of 3-isoxazolidinone compound, as well as a preparation method, a herbicidal composition and an application thereof. The 3-isoxazolidinone compound is as shown in Formula I: wherein, Q1 and Q2 each independently represent O or S; R1 and R2 each independently represent alkyl. The present compounds have superior crop safety while maintaining comparable or even better herbicidal activity, thus they are more selective in crops. Moreover, the compounds of the present invention have better anti-volatility to avoid drift.
    Type: Application
    Filed: August 2, 2022
    Publication date: October 3, 2024
    Inventors: Lei LIAN, Rongbao HUA, Xuegang PENG
  • Patent number: 12084435
    Abstract: The present disclosure provides an herbicidal compound according to Formula I, which is a pyridine ring-substituted pyridazinol compound, as well as derivatives of the compound, an herbicidal composition comprising the compound, preparation methods thereof, and applications thereof.
    Type: Grant
    Filed: September 13, 2018
    Date of Patent: September 10, 2024
    Assignee: Qingdao Kingagroot Chemical Compound Co., Ltd.
    Inventors: Lei Lian, Yurong Zheng, Rongbao Hua, Jianfeng Wang, Xuegang Peng, Qi Cui
  • Patent number: 12078547
    Abstract: A method and apparatus for determining the temperature of a substrate within a processing chamber are described herein. The methods and apparatus described herein utilize an etalon assembly and a heterodyning effect to determine a first temperature of a substrate. The first temperature of the substrate is determined without physically contacting the substrate. A separate temperature sensor also measures a second temperature of the substrate and/or the substrate support at a similar location. The first temperature and the second temperature are utilized to calibrate one of the temperature sensors disposed within the substrate support, a model of the processes performed within the processing chamber, or to adjust a process parameter of the process performed within the processing chamber.
    Type: Grant
    Filed: September 28, 2021
    Date of Patent: September 3, 2024
    Assignee: Applied Materials, Inc.
    Inventors: Bruce E. Adams, Samuel C. Howells, Alvaro Garcia, Barry P. Craver, Tony Jefferson Gnanaprakasa, Lei Lian
  • Patent number: 12066639
    Abstract: Implementations disclosed describe a collimator assembly having a collimator housing that includes an interface configured to optically couple to a process chamber that has a target surface, and a port to receive an optical fiber to deliver, to an enclosure formed by the collimator housing, a first (second) plurality of spectral components of light belonging to a first (second) range of wavelengths, and an achromatic lens located, at least partially, within the enclosure formed by the collimator housing, the achromatic lens to direct the first (second) plurality of spectral components of light onto the target surface to illuminate a first (second) region on the target surface, wherein the second region is substantially the same as the first region.
    Type: Grant
    Filed: June 27, 2023
    Date of Patent: August 20, 2024
    Assignee: Applied Materials, Inc.
    Inventors: Pengyu Han, John Anthony O'Malley, Michael N. Grimbergen, Lei Lian, Upendra Ummethala, Michael Kutney
  • Patent number: 12049450
    Abstract: The invention relates to the field of pesticide technology, and in particular a type of pyridyloxy carboxylate derivative, preparation method, herbicidal composition and application thereof. The pyridyloxy carboxylate derivative is represented by formula I, wherein, A, B each independently represent halogen, or alkyl or cycloalkyl with or without halogen; C represents hydrogen, halogen, alkyl or haloalkyl; Q represents halogen, cyano, cyanoalkyl, hydroxyalkyl, amino, nitro, formyl, alkyl with or without halogen or the like; M represents -alkyl-R, R represents unsubstituted or substituted heterocyclyl, aryl or heteroaryl; Y represents O or S; X represents nitro or NR1R2. The compound has excellent herbicidal activity and higher crop safety, especially good selectivity for key crops such as rice and soybean.
    Type: Grant
    Filed: December 27, 2018
    Date of Patent: July 30, 2024
    Assignee: Qingdao Kingagroot Chemical Compound Co., Ltd.
    Inventors: Lei Lian, Xuegang Peng, Rongbao Hua, Jingyuan Zhang, Qi Cui
  • Patent number: 12046522
    Abstract: Disclosed herein is a method for determining the endpoint of an etch operation used for forming high aspect ratio features and/or over low open area (<1%) on a substrate in a processing chamber. The method begins by obtaining a reference emission curve. An etch operation is performed on a patterned substrate. A plasma optical emission intensity is measured for each of the etch cycles. A differential curve between the reference emission and the plasma optical emissions is calculated. And endpoint is determined for the etch operation on the first substrate based on an inflection point detection or other unique features through pattern recognition in the differential curve for stopping the etch of the first substrate.
    Type: Grant
    Filed: February 18, 2022
    Date of Patent: July 23, 2024
    Assignee: Applied Materials, Inc.
    Inventors: Lei Lian, Quentin Walker, Zefang Wang, Shinichi Koseki
  • Publication number: 20240230462
    Abstract: An endpoint detection system for enhanced spectral data collection is provided. An optical bundle is coupled to a light source. The optical bundle includes an emitting optical fiber and a receiving optical fiber disposed at a pairing angle relative to the emitting optical fiber. The optical bundle is coupled to a collimator assembly that receives a light beam of incident light from the emitting optical fiber and directs spectral components of the light beam to first and second portions of a substrate surface. The collimator collects reflected spectral components produced by the spectral components directed to the substrate surface. The collimator assembly transmits the reflected spectral components to the receiving fiber, which transmits the reflected spectral components to a light detection component. A processing device coupled to the light detection component determines a reflectance of the substrate surface based on the reflected spectral components.
    Type: Application
    Filed: March 25, 2024
    Publication date: July 11, 2024
    Inventors: Pengyu Han, Lei Lian
  • Patent number: 12024500
    Abstract: The present disclosure provides an herbicidal compound according to Formula I, which is a five-membered ring-substituted pyridazinol compound, as well as derivatives of the compound, an herbicidal composition comprising the compound, preparation methods thereof, and applications thereof.
    Type: Grant
    Filed: September 13, 2018
    Date of Patent: July 2, 2024
    Assignee: Qingdao Kingagroot Chemical Compound Co., Ltd.
    Inventors: Lei Lian, Yurong Zheng, Rongbao Hua, Jianfeng Wang, Xuegang Peng, Qi Cui
  • Patent number: 11965798
    Abstract: An endpoint detection system for enhanced spectral data collection is provided. An optical bundle is coupled to a light source configured to generate incident light. The optical bundle includes two or more sets of optical fibers that each include an emitting optical fiber and a receiving optical fiber. The receiving optical fibers are disposed within the optical bundle at a pairing angle relative to a respective emitting optical fiber. The optical bundle is also coupled to a collimator assembly that includes an achromatic lens. The achromatic lens receives a first light beam of incident light from a first emitting optical fiber and directs spectral components of the first light beam to a first and second portion of a surface of a substrate. The first portion of the substrate surface is substantially the same as the second portion. The achromatic lens collects reflected spectral components that are produced by the spectral components directed to the first and second portions of the substrate surface.
    Type: Grant
    Filed: June 10, 2021
    Date of Patent: April 23, 2024
    Assignee: Applied Materials, Inc.
    Inventors: Pengyu Han, Lei Lian
  • Patent number: 11901203
    Abstract: Methods and systems for detection of an endpoint of a substrate process are provided. A set of machine learning models are trained to provide a metrology measurement value associated with a particular type of metrology measurement for a substrate based on spectral data collected for the substrate. A respective machine learning model is selected to be applied to future spectral data collected during a future substrate process for a future substrate in view of a performance rating associated with the particular type of metrology measurement. Current spectral data is collected during a current process for a current substrate and provided as input to the respective machine learning model. An indication of a respective metrology measurement value corresponding to the current substrate is extracted from one or more outputs of the trained machine learning model.
    Type: Grant
    Filed: June 10, 2021
    Date of Patent: February 13, 2024
    Assignee: Applied Materials, Inc.
    Inventors: Pengyu Han, Lei Lian, Shu Yu Chen, Todd Egan, Wan Hsueh Lai, Chao-Hsien Lee, Pin Ham Lu, Zhengping Yao, Barry Craver
  • Publication number: 20230341699
    Abstract: Implementations disclosed describe a collimator assembly having a collimator housing that includes an interface configured to optically couple to a process chamber that has a target surface, and a port to receive an optical fiber to deliver, to an enclosure formed by the collimator housing, a first (second) plurality of spectral components of light belonging to a first (second) range of wavelengths, and an achromatic lens located, at least partially, within the enclosure formed by the collimator housing, the achromatic lens to direct the first (second) plurality of spectral components of light onto the target surface to illuminate a first (second) region on the target surface, wherein the second region is substantially the same as the first region.
    Type: Application
    Filed: June 27, 2023
    Publication date: October 26, 2023
    Inventors: Pengyu Han, John John O’Malley, Michael N. Grimbergen, Lei Lian, Upendra Ummethala, Michael Kutney
  • Publication number: 20230305531
    Abstract: A cool cluster comprises one or more transfer chambers; a plurality of process chambers connected to the one or more transfer chambers; and a computing device of the tool cluster. The computing device is to receive first measurements generated by sensors of a first process chamber during or after a process is performed within the first process chamber; determine that the first process chamber is due for maintenance based on processing the first measurements using a first trained machine learning model; after maintenance has been performed on the first process chamber, receive second measurements generated by the sensors during or after a seasoning process is performed within the first process chamber; and determine that the first process chamber is ready to be brought back into service based on processing the second measurements using a second trained machine learning model.
    Type: Application
    Filed: May 30, 2023
    Publication date: September 28, 2023
    Inventors: Priyadarshi Panda, Lei Lian, Pengyu Han, Todd J. Egan, Prashant Aji, Eli Mor, Alex J. Tom, Leonard Michael Tedeschi
  • Publication number: 20230268235
    Abstract: Disclosed herein is a method for determining the endpoint of an etch operation used for forming high aspect ratio features and/or over low open area (<1%) on a substrate in a processing chamber. The method begins by obtaining a reference emission curve. An etch operation is performed on a patterned substrate. A plasma optical emission intensity is measured for each of the etch cycles. A differential curve between the reference emission and the plasma optical emissions is calculated. And endpoint is determined for the etch operation on the first substrate based on an inflection point detection or other unique features through pattern recognition in the differential curve for stopping the etch of the first substrate.
    Type: Application
    Filed: February 18, 2022
    Publication date: August 24, 2023
    Inventors: Lei LIAN, Quentin WALKER, Zefang WANG, Shinichi KOSEKI
  • Patent number: 11735401
    Abstract: Embodiments disclosed herein include optical sensor systems and methods of using such systems. In an embodiment, the optical sensor system comprises a housing and an optical path through the housing. In an embodiment, the optical path comprises a first end and a second end. In an embodiment a reflector is at the first end of the optical path, and a lens is between the reflector and the second end of the optical path. In an embodiment, the optical sensor further comprises an opening through the housing between the lens and the reflector.
    Type: Grant
    Filed: September 3, 2021
    Date of Patent: August 22, 2023
    Assignee: Applied Materials, Inc.
    Inventors: Chuang-Chia Lin, Upendra Ummethala, Steven E. Babayan, Lei Lian
  • Patent number: 11719952
    Abstract: Implementations disclosed describe a collimator assembly having a collimator housing that includes an interface configured to optically couple to a process chamber that has a target surface, and a port to receive an optical fiber to deliver, to an enclosure formed by the collimator housing, a first (second) plurality of spectral components of light belonging to a first (second) range of wavelengths, and an achromatic lens located, at least partially, within the enclosure formed by the collimator housing, the achromatic lens to direct the first (second) plurality of spectral components of light onto the target surface to illuminate a first (second) region on the target surface, wherein the second region is substantially the same as the first region.
    Type: Grant
    Filed: August 11, 2020
    Date of Patent: August 8, 2023
    Assignee: Applied Materials, Inc.
    Inventors: Pengyu Han, John Anthony O'Malley, Michael N. Grimbergen, Lei Lian, Upendra Ummethala, Michael Kutney
  • Patent number: 11709477
    Abstract: A substrate processing system comprises one or more transfer chambers; a plurality of process chambers connected to the one or more transfer chambers; and a computing device connected to each of the plurality of process chambers. The computing device is to receive first measurements generated by sensors of a first process chamber during or after a process is performed within the first process chamber; determine that the first process chamber is due for maintenance based on processing the first measurements using a first trained machine learning model; after maintenance has been performed on the first process chamber, receive second measurements generated by the sensors during or after a seasoning process is performed within the first process chamber; and determine that the first process chamber is ready to be brought back into service based on processing the second measurements using a second trained machine learning model.
    Type: Grant
    Filed: January 6, 2021
    Date of Patent: July 25, 2023
    Assignee: Applied Materials, Inc.
    Inventors: Priyadarshi Panda, Lei Lian, Pengyu Han, Todd J. Egan, Prashant Aji, Eli Mor, Alex J. Tom, Leonard Michael Tedeschi
  • Patent number: 11661413
    Abstract: Disclosed are a pyrazole compound or a salt thereof, a preparation method therefor, a herbicidal composition and use thereof. The pyrazole compound or a salt thereof has a structure as shown in formula (I): wherein, R represents wherein, R?, R?, and R?? represent hydrogen, C1-C4 alkyl, C1-C4 halogenated alkyl, C1-C4 alkoxy or halogen, R?, R?, and R?? may be the same or different; R1 represents C1-C3 alkyl; R2 represents hydrogen or C1-C4 alkyl; R3 represents hydrogen or C1-C6 alkyl, optionally substituted phenyl, optionally substituted pyridyl, optionally substituted alkenyl, optionally substituted alkynyl, C1-C6 alkyl carbonyl, C1-C6 alkoxyl carbonyl, C1-C6 alkyl carbonyl methyl, etc. A compound having a pyrazole structure not only has excellent herbicidal effect on barnyard grass, but also is safe to rice in post-emergence application. More surprisingly, it also has good control efficacy on barnyard grass resistant to major herbicides, such as penoxsulam, quinclorac, cyhalofop-butyl, propanil, etc.
    Type: Grant
    Filed: March 4, 2016
    Date of Patent: May 30, 2023
    Assignee: QINGDAO KINGAGROOT CHEMICAL COMPOUNDS CO., LTD.
    Inventors: Lei Lian, Yurong Zheng, Song Li, Xuegang Peng, Tao Jin, Qi Cui