Patents by Inventor Leonard Hayden

Leonard Hayden has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Probe for testing a device under test
    Publication number: 20080054929
    Abstract: A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.
    Type: Application
    Filed: October 24, 2007
    Publication date: March 6, 2008
    Inventors: K. Gleason, Tim Lesher, Eric Strid, Mike Andrews, John Martin, John Dunklee, Leonard Hayden, Amr Safwat
  • Probe for testing a device under test
    Publication number: 20080048692
    Abstract: A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.
    Type: Application
    Filed: October 24, 2007
    Publication date: February 28, 2008
    Inventors: K. Gleason, Tim Lesher, Eric Strid, Mike Andrews, John Martin, John Dunklee, Leonard Hayden, Amr Safwat
  • Probe station having multiple enclosures
    Publication number: 20080048693
    Abstract: A probe station for probing a test device has a chuck element for supporting the test device. An electrically conductive outer shield enclosure at least partially encloses such chuck element to provide EMI shielding therefor. An electrically conductive inner shield enclosure is interposed between and insulated from the outer shield enclosure and the chuck element, and at least partially encloses the chuck element.
    Type: Application
    Filed: October 24, 2007
    Publication date: February 28, 2008
    Inventors: Ron Peters, Leonard Hayden, Jeffrey Hawkins, R. Dougherty
  • Wafer probe
    Publication number: 20080042677
    Abstract: The present invention relates to a probe for testing of integrated circuits or other microelectronic devices.
    Type: Application
    Filed: October 18, 2007
    Publication date: February 21, 2008
    Inventors: Leonard Hayden, John Martin, Mike Andrews
  • Wafer probe
    Publication number: 20080042678
    Abstract: The present invention relates to a probe for testing of integrated circuits or other microelectronic devices.
    Type: Application
    Filed: October 18, 2007
    Publication date: February 21, 2008
    Inventors: Leonard Hayden, John Martin, Mike Andrews
  • Probe for combined signals
    Publication number: 20080042673
    Abstract: A direct current and a modulation signal are simultaneously applied to contact pads on a device under test, such as a laser diode, with a probe that reduces signal distortion and power dissipation by transmitting a modulated signal through an impedance matching resistor and transmitting of a direct current over a second signal path that avoids the impedance matching resistor.
    Type: Application
    Filed: October 22, 2007
    Publication date: February 21, 2008
    Inventors: Leonard Hayden, Scott Rumbaugh, Mike Andrews
  • Wafer probe
    Publication number: 20080045028
    Abstract: The present invention relates to a probe for testing of integrated circuits or other microelectronic devices.
    Type: Application
    Filed: October 18, 2007
    Publication date: February 21, 2008
    Inventors: Leonard Hayden, John Martin, Mike Andrews
  • Probe for testing a device under test
    Publication number: 20080024149
    Abstract: A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.
    Type: Application
    Filed: September 27, 2007
    Publication date: January 31, 2008
    Inventors: K. Gleason, Tim Lesher, Eric Strid, Mike Andrews, John Martin, John Dunklee, Leonard Hayden, Amr Safwat
  • Line-reflect-reflect match calibration
    Publication number: 20080018343
    Abstract: A method of compensating a calibration for a vector network analyzer includes performing calibrations on at least a pair of ports to determine error terms associated with each port wherein at least one of the error terms is based upon selecting the reactance of the load standard from a set of potential values in a manner such that the reference reactance errors are reduced.
    Type: Application
    Filed: July 18, 2007
    Publication date: January 24, 2008
    Inventor: Leonard Hayden
  • Calibration system
    Publication number: 20070294047
    Abstract: A calibration system for a probe measurement system including a set up wizard.
    Type: Application
    Filed: June 9, 2006
    Publication date: December 20, 2007
    Inventor: Leonard Hayden
  • Shielded probe for high-frequency testing of a device under test
    Patent number: 7304488
    Abstract: A shielded probe for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies. The probe may include a probe tip that extends through a dielectric substrate that supports on a first surface a signal path to test instrumentation and on a second surface a ground path that shields both the signal path and the probe tip.
    Type: Grant
    Filed: December 1, 2006
    Date of Patent: December 4, 2007
    Assignee: Cascade Microtech, Inc.
    Inventors: K. Reed Gleason, Tim Lesher, Eric W. Strid, Mike Andrews, John Martin, John Dunklee, Leonard Hayden, Amr M. E. Safwat
  • Probe for combined signals
    Patent number: 7285969
    Abstract: A direct current and a modulation signal are simultaneously applied to contact pads on a device under test, such as a laser diode, with a probe that reduces signal distortion and power dissipation by transmitting a modulated signal through an impedance matching resistor and transmitting of a direct current over a second signal path that avoids the impedance matching resistor.
    Type: Grant
    Filed: March 5, 2007
    Date of Patent: October 23, 2007
    Assignee: Cascade Microtech, Inc.
    Inventors: Leonard Hayden, Scott Rumbaugh, Mike Andrews
  • Wafer probe
    Publication number: 20070200580
    Abstract: The present invention relates to a probe for testing of integrated circuits or other microelectronic devices.
    Type: Application
    Filed: April 26, 2007
    Publication date: August 30, 2007
    Inventors: Leonard Hayden, John Martin, Mike Andrews
  • Probe station having multiple enclosures
    Patent number: 7250752
    Abstract: A probe station for probing a test device has a chuck element for supporting the test device. An electrically conductive outer shield enclosure at least partially encloses such chuck element to provide EMI shielding therefor. An electrically conductive inner shield enclosure is interposed between and insulated from the outer shield enclosure and the chuck element, and at least partially encloses the chuck element.
    Type: Grant
    Filed: June 9, 2006
    Date of Patent: July 31, 2007
    Assignee: Cascade Microtech, Inc.
    Inventors: Ron A. Peters, Leonard A. Hayden, Jeffrey A. Hawkins, R. Mark Dougherty
  • Probe for combined signals
    Publication number: 20070159196
    Abstract: A direct current and a modulation signal are simultaneously applied to contact pads on a device under test, such as a laser diode, with a probe that reduces signal distortion and power dissipation by transmitting a modulated signal through an impedance matching resistor and transmitting of a direct current over a second signal path that avoids the impedance matching resistor.
    Type: Application
    Filed: March 5, 2007
    Publication date: July 12, 2007
    Inventors: Leonard Hayden, Scott Rumbaugh, Mike Andrews
  • Wafer probe
    Patent number: 7233160
    Abstract: The present invention relates to a probe for testing of integrated circuits or other microelectronic devices.
    Type: Grant
    Filed: November 19, 2001
    Date of Patent: June 19, 2007
    Assignee: Cascade Microtech, Inc.
    Inventors: Leonard Hayden, John Martin, Mike Andrews
  • Probe for combined signals
    Patent number: 7205784
    Abstract: A direct current and a modulation signal are simultaneously applied to contact pads on a device under test, such as a laser diode, with a probe that reduces signal distortion and power dissipation by transmitting a modulated signal through an impedance matching resistor and transmitting of a direct current over a second signal path that avoids the impedance matching resistor.
    Type: Grant
    Filed: May 25, 2006
    Date of Patent: April 17, 2007
    Assignee: Cascade Microtech, Inc.
    Inventors: Leonard Hayden, Scott Rumbaugh, Mike Andrews
  • Probe for testing a device under test
    Publication number: 20070075716
    Abstract: A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.
    Type: Application
    Filed: December 1, 2006
    Publication date: April 5, 2007
    Inventors: K. Gleason, Tim Lesher, Eric Strid, Mike Andrews, John Martin, John Dunklee, Leonard Hayden, Amr Safwat
  • Probe station having multiple enclosures
    Patent number: 7190181
    Abstract: A probe station for probing a test device has a chuck element for supporting the test device. An electrically conductive outer shield enclosure at least partially encloses such chuck element to provide EMI shielding therefor. An electrically conductive inner shield enclosure is interposed between and insulated from the outer shield enclosure and the chuck element, and at least partially encloses the chuck element.
    Type: Grant
    Filed: November 3, 2004
    Date of Patent: March 13, 2007
    Assignee: Cascade Microtech, Inc.
    Inventors: Ron A. Peters, Leonard A. Hayden, Jeffrey A. Hawkins, R. Mark Dougherty
  • Probe for testing a device under test
    Patent number: 7161363
    Abstract: A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.
    Type: Grant
    Filed: May 18, 2004
    Date of Patent: January 9, 2007
    Assignee: Cascade Microtech, Inc.
    Inventors: K. Reed Gleason, Tim Lesher, Eric W. Strid, Mike Andrews, John Martin, John Dunklee, Leonard Hayden, Amr M. E. Safwat