Abstract: A method of processing data determined from an image-charge/current signal representative of ions of a given charge state (Q) undergoing oscillatory motion of a respective oscillation frequency (f) within an ion analyser apparatus. A data set comprises a measured signal frequency (f0) common to a plurality of a measured image-charge/current signals and a plurality of estimated ion charge values corresponding to respective amplitudes of each one of the plurality of measured image-charge/current signals. An integer charge value ([Q]) is generated corresponding to a said estimated ion charge value rounded to the nearest integer value. Using the integer charge value ([Qi]) a plurality of different candidate image-charge/current signal frequency values (fCandi) are calculating according to said selected measured signal frequency (f0) and according to a corresponding one of one or more different candidate charge states of ion (e.g., protonation) and/or of ion isotope or isotopologue.

Abstract: The present disclosure provides a direct current (DC) transformer error detection apparatus for a pulsating harmonic signal, including a DC and pulsating harmonic current output module and an external detected input module, where the DC and pulsating harmonic current output module outputs a DC and a DC superimposed pulsating harmonic current to an internal sampling circuit and a self-calibrated standard resistor array; and the internal sampling circuit converts the input DC and the input DC superimposed pulsating harmonic current into a voltage signal, and sends the voltage signal to an analog-to-digital (AD) sampling and measurement component through a front-end conditioning circuit and a detected input channel. The DC transformer error detection apparatus can complete self-calibration for measurement of the DC and the pulsating harmonic signal on a test site.

Abstract: An embodiment semiconductor package includes a bare semiconductor chip, a packaged semiconductor chip adjacent the bare semiconductor chip, and a redistribution structure bonded to the bare semiconductor chip and the packaged semiconductor chip. The redistribution structure includes a first redistribution layer having a first thickness; a second redistribution layer having a second thickness; and a third redistribution layer between the first redistribution layer and the second redistribution layer. The third redistribution layer has a third thickness greater than the first thickness and the second thickness. The package further includes an underfill disposed between the bare semiconductor chip and the redistribution structure and a molding compound encapsulating the bare semiconductor chip, the packaged semiconductor chip, and the underfill.

Abstract: Provided are an inspection method, and an inspection system including: at least one ray source; a detector assembly and a conveying device. At least one ray source and the detector assembly may move in a traveling direction relative to the conveying device, so that the to-be-inspected object may enter an inspection region. When viewed along a central axis of the inspection region, at least one ray source may translate between scanning positions, and a translation distance of at least one ray source between two adjacent scanning positions is greater than a spacing between adjacent target spots of each ray source. When at least one ray source is located at one scanning position, at least one ray source and the detector assembly move in the traveling direction and at least one ray source emits X-rays. After moving a predetermined distance, at least one ray source translates to another scanning position.

Abstract: An embodiment semiconductor package includes a bare semiconductor chip, a packaged semiconductor chip adjacent the bare semiconductor chip, and a redistribution structure bonded to the bare semiconductor chip and the packaged semiconductor chip. The redistribution structure includes a first redistribution layer having a first thickness; a second redistribution layer having a second thickness; and a third redistribution layer between the first redistribution layer and the second redistribution layer. The third redistribution layer has a third thickness greater than the first thickness and the second thickness. The package further includes an underfill disposed between the bare semiconductor chip and the redistribution structure and a molding compound encapsulating the bare semiconductor chip, the packaged semiconductor chip, and the underfill.

Abstract: A ray scanning apparatus, including: a conveying device for conveying an object under inspection to pass through a scanning area; a ray source assembly including a plurality of ray source modules arranged around the scanning area on an upper side of the conveying device and fixed in a plane perpendicular to a conveying direction of the object under inspection; and a detector assembly including a plurality of detector sets fixed in a plane perpendicular to the conveying direction of the object under inspection; the detector assembly is located between the ray source assembly and the scanning area in a direction perpendicular to the conveying direction of the object under inspection, the ray source assembly and the detector assembly are arranged to overlap at least partially in the conveying direction of the object under inspection, and the plurality of ray source modules are mounted and detached independently of each other.

Abstract: An inspection system, including: a carrying device; at least one ray source and a detector assembly. When the at least one ray source is located at one of scanning positions relative to the carrying device, the at least one ray source and the detector assembly are lifted or lowered along the rotation axis relative to the carrying device and the at least one ray source emits X-rays. After the at least one ray source and the detector assembly are lifted or lowered a predetermined distance relative to the carrying device, the at least one ray source rotates around the rotation axis relative to the carrying device to another one of scanning positions. The inspection system further reconstructs a three-dimensional scanning image of the object to be inspected based on detection data of the detector assembly.

Abstract: A lumbar pillow that can move with the load bearing of the waist in 3D, comprising the lumbar pillow body, the middle part of the rear end of the lumbar pillow body is provided with a spring central axis mechanism; the spring central axis mechanism comprises the upper bottom plate, the spring and the lower bottom plate, the upper bottom plate is arranged in the middle of the rear end of the lumbar pillow body, the upper bottom plate is provided with a spring, and the other end of the spring is provided with a lower bottom plate; the middle part of the rear end of the lumbar pillow body is provided with a spring central axis mechanism, so that the upper bottom plate will be supported on the backrest of the seat, when the waist leans on the lumbar pillow, the spring will support the lumbar pillow.

Abstract: The invention relates to an electrostatic ion trap having a central axis and a central symmetrical plane perpendicular to the central axis. The electrostatic ion trap comprises an inner electrode group arranged along the central axis and a pair of outer electrode groups arranged on two sides of the central symmetry plane along the central axis. Each outer electrode group comprises a plurality of electrode plates. The plurality of electrode plates are circumferentially distributed around a periphery of the inner electrode group and centered on the central axis. At least two electrode plates in the same outer electrode group are electrically connected. A potential difference is formed when voltages are respectively applied to the inner electrode group and the outer electrode groups, thereby forming a space for trapping ions between the inner electrode group and the outer electrode groups.

Abstract: An inspection system and method, the inspection system includes: a carrying device, at least one ray source, where each ray source includes a separate housing to define a vacuum space and a plurality of target spots enclosed within the housing; and a detector assembly. The at least one ray source and the detector assembly are lifted or lowered along a central axis of the carrying device relative to the carrying device. When viewed along the central axis, the ray source is translatable between scanning positions relative to the carrying device. When the ray source is at one of the scanning positions, the ray source and the detector assembly are lifted or lowered along the central axis, and the ray source emits X-rays; and when the ray source and the detector assembly are lifted or lowered a predetermined distance, the ray source translates to another one of the scanning positions.

Abstract: The invention relates to an electrostatic ion trap having a central axis and a central symmetrical plane perpendicular to the central axis. The electrostatic ion trap comprises an inner electrode group arranged along the central axis and a pair of outer electrode groups arranged on two sides of the central symmetry plane along the central axis. Each outer electrode group comprises a plurality of electrode plates. The plurality of electrode plates are circumferentially distributed around a periphery of the inner electrode group and centered on the central axis. At least two electrode plates in the same outer electrode group are electrically connected. A potential difference is formed when voltages are respectively applied to the inner electrode group and the outer electrode groups, thereby forming a space for trapping ions between the inner electrode group and the outer electrode groups.

Abstract: Various embodiments of a method and apparatus for determining parametric timing yield and bottlenecks are disclosed which take into account correlation between electrical circuit paths through common timing arcs of an integrated circuit chip under design. Monte Carlo samples of timing arc delays are generated and used in computing timing yield and identify yield bottlenecks.

Abstract: Aqueous-based release coating compositions are disclosed. The disclosed aqueous-based release coating compositions are particularly suitable for use with pressure sensitive adhesives. In some embodiments, the aqueous-based release coating compositions include (A) a vinyl-based emulsion copolymer comprising a copolymerizable acid monomer, (B) a silicone-based emulsion comprising a mixture of amine-, polyol-functional siloxane and epoxy-, glycol-functional siloxane, and (C) a polymeric dispersant comprising an acid functional group. In some embodiments, the weight ratio of silicone-based emulsion (B) to polymeric dispersant (C) in the aqueous-based release coating compositions is from 2:1 to 3:1. The disclosed release coating compositions are suitable for use in, inter alia, tape applications.

Abstract: In an aspect for generating a 2-dimensional (2D) building mapping, a computer-implemented method may include one or more processors configured for receiving scanning data in a first file format corresponding to 3-dimensional (3D) aerial Light Detection and Ranging (LiDaR) images. Further, the method may include transforming the first file format to a second file format and transmitting the scanning data to a building semantic segmentation component. Further, the computer-implemented method may include generating semantic segmentation data corresponding to building structures defined by point clusters; generating instance segmentation data corresponding to top surfaces of the building structures; generating building boundary data for each one of the point clusters based on one or more of the semantic segmentation data and the instance segmentation data; and processing the building boundary data to generate a 2D building mapping comprising refined boundary lines for each of the point clusters.

Abstract: An inspection system and method, the system includes: a ray source rotatable between at least two scanning positions around a rotation axis, a rotation angle of the ray source between two adjacent scanning positions being greater than an angle of adjacent target spots of the ray source relative to the rotation axis; a detector assembly; and a conveying device for carrying an object. The ray source and the detector assembly are movable in a traveling direction relative to the conveying device so that the object enters an inspection region. When the ray source is at one of the scanning positions, the ray source and the detector assembly move in the traveling direction and the ray source emits X-rays; and when the ray source and the detector assembly move a predetermined distance in the traveling direction, the ray source rotates around the rotation axis to another one of the scanning positions.

Abstract: An inspection system and method, and the system includes: a ray source; a detector assembly; and a conveying device for carrying an aviation pallet cargo. The ray source and the detector assembly are movable in a traveling direction parallel to the central axis relative to the conveying device so that the aviation pallet cargo enters an inspection region, the ray source is translatable between a plurality of scanning positions, and a translation distance of the ray source between two adjacent scanning positions is greater than a spacing between adjacent target spots of the ray source. When the ray source is located at one of the scanning positions, the ray source and the detector assembly move in the traveling direction and the ray source emits X-rays; and when the ray source and the detector assembly move a predetermined distance in the traveling direction, the ray source translates to another one of the plurality of scanning positions.

Abstract: Techniques for managing proxy virtual machines are disclosed. In some embodiments, a computer system deploys proxy virtual machines on a data center in an intelligent way in order to optimize performance and efficiency for backing up data from and restoring data to the data center, using the topology of the data center to determine how many proxy virtual machines to deploy and on which specific hosts to deploy the proxy virtual machines. Rather than determining the number of proxy virtual machines to deploy based on a maxing out of all of the ports on each proxy virtual machine to handle a planned quantity of backup jobs, the computer system may calculate the number of proxy virtual machines to use based on a rule that ports be left available for un-planned on-demand restore jobs.

Abstract: A method of processing an image-charge/current signal representative of one or more ions undergoing oscillatory motion within an ion analyser apparatus. The method comprising obtaining a recording of the image-charge/current signal generated by the ion analyser apparatus in the time domain. By a signal processing unit, the method comprises determining a value for the period of a periodic signal component within the recorded signal. Then, the method includes truncating the recorded signal to provide a truncated signal having a duration substantially equal to an integer multiple of said period. A step of reconstructing a time-domain signal is done based on a selected one or more frequency-domain harmonic components of the truncated signal. Next, the method determines a magnitude of the reconstructed time-domain signal and therewith calculating a value representative of the charge of a said ion undergoing oscillatory motion within the ion analyser apparatus.

Abstract: A ray scanning apparatus for a luggage conveying system. The apparatus includes: a conveying device for conveying an object under inspection to pass through a scanning area of the ray scanning apparatus; and a plurality of scanning beam planes disposed on a plurality of scanning planes arranging in a conveying direction of the object under inspection, each scanning beam plane includes a ray source module and a detector assembly which are arranged opposite to each other, and the ray source module includes a plurality of ray source points for emitting ray beams, wherein the ray source modules of the plurality of scanning beam planes are arranged on lower, left, and right sides of the scanning area respectively.

Abstract: A method of processing an image-charge/current signal representative of one or more ions undergoing oscillatory motion within an ion analyser apparatus, the method comprising obtaining a recording of the image-charge/current signal generated by the ion analyser apparatus in the time domain. By a signal processing unit, the method includes selecting N (where N is an integer>1) separate values (OPn, where n=1 to N; N?M) of the frequency-domain spectrum of the image-charge/current signal each from amongst a plurality of spectral peaks which include a harmonic peak associated with a target ion. By solving a system of equations: OP n = ? m = 1 N ? n ? m × TP m , for ? n = 1 ? to ? N ; N ? M where ?nm are coefficients and TPm are corrected values of the spectrum, the charge of the target ion is determined based on a magnitude of a corrected value(s) (TPm) associated with that ion.