Patents by Inventor Licai Jiang

Licai Jiang has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20130164457
    Abstract: A pulsed laser beam engraves a groove pattern on substrate of material relatively transparent to the laser beam. The grooves of the pattern are filled with a filling material of different density or different electron density. The pattern of grooves filled with material of different density creates a spatial density modulation that forms the basic structure of various optical elements. By adjusting the flux density of the laser beam to exceed a material break-down threshold only in specific locations, the material ablation can be reduced to a diameter smaller than the diameter of the laser beam itself. The grooves fabricated in this manner can be filled with a deformable material under vacuum with subsequent exposure to air pressure or higher pressure. It is also possible to fill the grooves with nanoparticles of different density and secured by heat application or with a coating.
    Type: Application
    Filed: December 27, 2011
    Publication date: June 27, 2013
    Applicant: RIGAKU INNOVATIVE TECHNOLOGIES, INC.
    Inventors: Bodo Ehlers, Licai Jiang
  • Patent number: 8249220
    Abstract: An x-ray optical system includes an x-ray source which emits x-rays, a first optical element which conditions the x-rays to form two beams and at least a second optical element which further conditions at least one of the two beams from the first optical element.
    Type: Grant
    Filed: October 14, 2009
    Date of Patent: August 21, 2012
    Assignee: Rigaku Innovative Technologies, Inc.
    Inventors: Boris Verman, Yuriy Platonov, Licai Jiang
  • Publication number: 20120051518
    Abstract: A X-ray scattering measurement device and measurement method can measure, with high resolution, the intensity of X-rays which have undergone small-angle scattering and diffraction with reflection geometry and can easily and accurately measure a microstructure on the surface of a sample. The X-ray scattering measurement device is suitable for microstructural measurement on the surface of a sample includes an X-ray source that generates an X-ray; a first mirror and a second mirror that continuously reflect the generated X-ray; a sample stage that supports the sample; and a two-dimensional detector that detects the X-ray scattered on the surface of the sample. The first mirror focuses the generated X-ray onto the two-dimensional detector within a plane parallel to the surface of the sample, and the second mirror focuses the X-ray reflected by the first mirror onto the surface of the sample within a plane perpendicular to the surface of the sample.
    Type: Application
    Filed: April 14, 2010
    Publication date: March 1, 2012
    Inventors: Kazuhiko Omote, Boris Verman, Licai Jiang
  • Patent number: 8126117
    Abstract: A multi-beam x-ray system includes an x-ray source which emits x-rays and a housing with a first part and a second part. The second part is moveable relative to the first part and includes a plurality of optics of different performance characteristics. Each optic, through the movement of the second part relative to the first part, is positioned to a working position so that the optic receives the x-rays from the x-ray source and directs the x-rays with the desired performance attributes to a desired location.
    Type: Grant
    Filed: February 3, 2010
    Date of Patent: February 28, 2012
    Assignee: Rigaku Innovative Technologies, Inc.
    Inventors: Boris Verman, Michael Young, Licai Jiang
  • Patent number: 8111807
    Abstract: A sample is supported on a flat rotary specimen stage and irradiated at an incidence angle ? via a divergence slit with an x-ray beam emitted by an x-ray source, the diffraction beam from the sample is received via a divergence slit and the light-receiving slit by an x-ray detector placed at the position of a diffraction angle 2? to generate diffraction beam intensity data, the x-ray incidence angle ? and diffraction angle 2? are fixed at intrinsic values on the sample, the sample is rotated within a plane at designated step angles by the flat rotary specimen stage, the diffraction beam intensity is measured by the x-ray detector in each in-plane rotation step, the variance induced by particle statistics is calculated from the calculated diffraction beam intensities, and the size of the crystallites in the sample is calculated based on the variance induced by the particle statistics.
    Type: Grant
    Filed: September 16, 2009
    Date of Patent: February 7, 2012
    Assignee: Rigaku Corporation
    Inventors: Takashi Ida, Licai Jiang
  • Patent number: 8094780
    Abstract: A two-dimensional x-ray scattering camera includes a source, an optic, a detector, and a pair of collimating blocks. The source emits x-ray beams that are reflected by the optic towards a sample. The detector detects scattering from the sample, the pair of collimating blocks is positioned between the optic and the detector to collimate the beam. A bottom surface of one block is substantially parallel a top surface of the other block, and the blocks are rotatable relative to the beam about a pivot. The system forms a two-dimensional beam that is symmetric about the primary beam axis at the detector position, regardless how the beam is collimated by the collimating blocks. The system therefore eliminates smearing and can be used for anisotropic small angle scattering at high resolution and low Qmin.
    Type: Grant
    Filed: April 5, 2010
    Date of Patent: January 10, 2012
    Assignee: Rigaku Innovative Technologies, Inc.
    Inventor: Licai Jiang
  • Publication number: 20110280530
    Abstract: An x-ray generating system includes a source of x-ray radiation, a waveguide bundle optic for collimating the x-ray radiation produced by the source, a focusing optic for focusing the collimated x-ray radiation to a focal point.
    Type: Application
    Filed: March 18, 2011
    Publication date: November 17, 2011
    Inventors: Boris Verman, Licai Jiang
  • Publication number: 20110268252
    Abstract: An X-ray apparatus that creates a virtual source having a narrow energy bandwidth and enables a high-resolution X-ray diffraction measurement; a method of using the same; and an X-ray irradiation method are provided. An X-ray apparatus 100 includes a spectrometer 105 that focuses a divergent X-ray beam while dispersing it and a selection part 107 that is installed in a condensing position of the condensed X-ray beam for selecting an X-ray beam having a wavelength in a specific range, allowing it to pass through, and creating a virtual source. With this arrangement, it is possible to create a virtual source having a narrow energy bandwidth at a focal point 110 and by means of the virtual source a high-resolution X-ray diffraction measurement is available. By using the X-ray apparatus 100, it is possible to sufficiently separate an X-ray beam having such an extremely narrow energy bandwidth as, for example, K?1 ray from K?2 ray.
    Type: Application
    Filed: June 30, 2010
    Publication date: November 3, 2011
    Applicant: RIGAKU CORPORATION
    Inventors: Tetsuya Ozawa, Ryuji Matsuo, Licai Jiang, Boris Verman, Kazuhiko Omote
  • Publication number: 20110188636
    Abstract: A multi-beam x-ray system includes an x-ray source which emits x-rays and a housing with a first part and a second part. The second part is moveable relative to the first part and includes a plurality of optics of different performance characteristics. Each optic, through the movement of the second part relative to the first part, is positioned to a working position so that the optic receives the x-rays from the x-ray source and directs the x-rays with the desired performance attributes to a desired location.
    Type: Application
    Filed: February 3, 2010
    Publication date: August 4, 2011
    Applicant: Rigaku Innovative Technologies, Inc.
    Inventors: Boris Verman, Michael Young, Licai Jiang
  • Patent number: 7933383
    Abstract: An x-ray generating system includes a source of x-ray radiation, a waveguide bundle optic for collimating the x-ray radiation produced by the source, a focusing optic for focusing the collimated x-ray radiation to a focal point.
    Type: Grant
    Filed: April 10, 2009
    Date of Patent: April 26, 2011
    Assignee: Rigaku Innovative Technologies, Inc.
    Inventors: Boris Verman, Licai Jiang
  • Publication number: 20110085644
    Abstract: An x-ray optical system includes an x-ray source which emits x-rays, a first optical element which conditions the x-rays to form two beams and at least a second optical element which further conditions at least one of the two beams from the first optical element.
    Type: Application
    Filed: October 14, 2009
    Publication date: April 14, 2011
    Applicant: Rigaku Innovative Technology
    Inventors: Boris Verman, Yuriy Platonov, Licai Jiang
  • Publication number: 20110064199
    Abstract: A sample is supported on a flat rotary specimen stage and irradiated at an incidence angle ? via a divergence slit with an x-ray beam emitted by an x-ray source, the diffraction beam from the sample is received via a divergence slit and the light-receiving slit by an x-ray detector placed at the position of a diffraction angle 2? to generate diffraction beam intensity data, the x-ray incidence angle ? and diffraction angle 2? are fixed at intrinsic values on the sample, the sample is rotated within a plane at designated step angles by the flat rotary specimen stage, the diffraction beam intensity is measured by the x-ray detector in each in-plane rotation step, the variance induced by particle statistics is calculated from the calculated diffraction beam intensities, and the size of the crystallites in the sample is calculated based on the variance induced by the particle statistics.
    Type: Application
    Filed: September 16, 2009
    Publication date: March 17, 2011
    Applicant: RIGAKU CORPORATION
    Inventors: Takashi IDA, Licai Jiang
  • Publication number: 20100284516
    Abstract: A two-dimensional x-ray scattering camera includes a source, an optic, a detector, and a pair of collimating blocks. The source emits x-ray beams that are reflected by the optic towards a sample. The detector detects scattering from the sample, the pair of collimating blocks is positioned between the optic and the detector to collimate the beam. A bottom surface of one block is substantially parallel a top surface of the other block, and the blocks are rotatable relative to the beam about a pivot. The system forms a two-dimensional beam that is symmetric about the primary beam axis at the detector position, regardless how the beam is collimated by the collimating blocks. The system therefore eliminates smearing and can be used for anisotropic small angle scattering at high resolution and low Qmin.
    Type: Application
    Filed: April 5, 2010
    Publication date: November 11, 2010
    Applicant: Osmic, Inc.
    Inventor: Licai Jiang
  • Patent number: 7734011
    Abstract: A two-dimensional x-ray scattering camera includes a source, an optic, a detector, and a pair of collimating blocks. The source emits x-ray beams that are reflected by the optic towards a sample. The detector detects scattering from the sample, the pair of collimating blocks is positioned between the optic and the detector to collimate the beam. A bottom surface of one block is substantially parallel a top surface of the other block, and the blocks are rotatable relative to the beam about a pivot. The system forms a two-dimensional beam that is symmetric about the primary beam axis at the detector position, regardless how the beam is collimated by the collimating blocks. The system therefore eliminates smearing and can be used for anisotropic small angle scattering at high resolution and low Qmin.
    Type: Grant
    Filed: November 30, 2007
    Date of Patent: June 8, 2010
    Assignee: Rigaku Innovative Technologies, Inc.
    Inventor: Licai Jiang
  • Patent number: 7720197
    Abstract: An x-ray optical system for producing high intensity x-ray beams. The system includes an optic with a surface formed by revolving a defined contour around a revolving axis that is different than the geometric symmetric axis of the optic. Accordingly, the system may use a source that has a circular emission profile or a large source to provide increased flux to a sample.
    Type: Grant
    Filed: May 30, 2008
    Date of Patent: May 18, 2010
    Assignee: Rigaku Innovative Technologies, Inc.
    Inventor: Licai Jiang
  • Patent number: 7706503
    Abstract: An x-ray optical device delivers an x-ray beam with variable convergence. The convergence or the divergence of the x-ray beams varies over different parts of the reflector. The device may include an adjustable aperture to further select the convergence or divergence. The adjustable aperture selects the convergence angle by selectively occluding a portion of the x-ray beams.
    Type: Grant
    Filed: November 20, 2007
    Date of Patent: April 27, 2010
    Assignee: Rigaku Innovative Technologies, Inc.
    Inventor: Licai Jiang
  • Publication number: 20090296889
    Abstract: An x-ray optical system for producing high intensity x-ray beams. The system includes an optic with a surface formed by revolving a defined contour around a revolving axis that is different than the geometric symmetric axis of the optic. Accordingly, the system may use a source that has a circular emission profile or a large source to provide increased flux to a sample.
    Type: Application
    Filed: May 30, 2008
    Publication date: December 3, 2009
    Inventor: Licai Jiang
  • Publication number: 20090279670
    Abstract: An x-ray generating system includes a source of x-ray radiation, a waveguide bundle optic for collimating the x-ray radiation produced by the source, a focusing optic for focusing the collimated x-ray radiation to a focal point.
    Type: Application
    Filed: April 10, 2009
    Publication date: November 12, 2009
    Inventors: Boris Verman, Licai Jiang
  • Publication number: 20090129552
    Abstract: An x-ray optical device delivers an x-ray beam with variable convergence. The convergence or the divergence of the x-ray beams varies over different parts of the reflector. The device may include an adjustable aperture to further select the convergence or divergence. The adjustable aperture selects the convergence angle by selectively occluding a portion of the x-ray beams.
    Type: Application
    Filed: November 20, 2007
    Publication date: May 21, 2009
    Inventor: Licai Jiang
  • Publication number: 20080069302
    Abstract: A two-dimensional x-ray scattering camera includes a source, an optic, a detector, and a pair of collimating blocks. The source emits x-ray beams that are reflected by the optic towards a sample. The detector detects scattering from the sample, the pair of collimating blocks is positioned between the optic and the detector to collimate the beam. A bottom surface of one block is substantially parallel a top surface of the other block, and the blocks are rotatable relative to the beam about a pivot. The system forms a two-dimensional beam that is symmetric about the primary beam axis at the detector position, regardless how the beam is collimated by the collimating blocks. The system therefore eliminates smearing and can be used for anisotropic small angle scattering at high resolution and low Qmin.
    Type: Application
    Filed: November 30, 2007
    Publication date: March 20, 2008
    Inventor: Licai Jiang