Abstract: An electronic magnetometer and a method for measuring a magnetic field are provided. A Gunn diode with magnetic shielding and a Gunn diode without magnetic shielding generate different induced high-frequency oscillating currents in various environments. The high-frequency oscillating current of the Gunn diode with magnetic shielding and the high-frequency oscillating current of the Gunn diode without magnetic shielding are processed by circuits and subsequently compared. The difference of frequencies in the two currents is proportional to the magnitude of magnetic field, and the magnitude of magnetic field is obtained.

Abstract: A method of testing a printed circuit board (PCB) with an in-circuit test (ICT) probe having an improved probe-to-via contact is provided. The ICT probe includes a tip attached to a spindle; a housing having a cavity, a portion of the spindle insertable into the cavity; and a heating element wrapped helically around the spindle, the heating element coupled to the housing. The probe is contacted with a surface of a flux layer of a test via of the PCB, said contact compressing the heating element and recessing the insertable portion of the spindle into the cavity. The tip of the probe is heated with the heating element to a temperature capable of at least partially melting the flux layer, the tip at least partially penetrating the flux layer to contact a surface of a solder plugging the test via.

Abstract: Systems and methods for providing a multi regime plasma wafer processing are described. The systems and methods have three states. During a first one of the states, an etching operation is performed. In a second one of the states, a power level of a kilohertz radio frequency signal is greater than zero to increase directionality of ions that are incident on a bottom surface of a stack layer. In a third one of the states, there is a reduction in a loss of mask on top of the stack layer and deposition may be performed.

Abstract: An imaging lens including a first lens element, an aperture stop, a second lens element, a third lens element, a fourth lens element and a fifth lens element arranged in sequence from an object side to an image side along an optical axis is provided. Each of the first to the fifth lens elements has an object-side surface and an image-side surface. The first lens element has positive refractive power. The second lens element has refractive power. The third lens element has positive refractive power. The object-side surface of the third lens element has a concave portion in a vicinity of the optical axis. The fourth lens element has negative refractive power. The image-side surface of the fourth lens element has a convex portion in the vicinity of the optical axis. The fifth lens element has refractive power.

Abstract: A test system for testing devices is disclosed. The test system includes a scanning microscope module and a test module. The scanning microscope module, when testing a device under test (DUT), is configured to perturb the DUT with a laser at a test (pixel) location. The test module includes a tester unit, a reference failure log containing prior failing compare vectors of interest, and a comparator unit which includes a software comparator. The tester unit is configured to perform a test run at the test location of the DUT with a test pattern. If the test run fails testing, the tester unit is configured to compare using the comparator unit to determine if failing test vectors of the test run matches a desired failure signature, and to generate a comparator trigger pulse if failing test vectors match the prior failure signature. The trigger pulse indicates that the test location of the DUT is a failed location.

Abstract: A processing device includes a mounting base, a cutter holder, and a brake. The brake includes a driving member, a resisting member, and an elastic member. The driving member includes a main body and a driving shaft movably placed in the main body. The driving shaft is driven to move in a straight line by the main body. One end of the driving shaft is movably coupled to the cutter holder, and another end of the driving shaft is coupled to the resisting member. The elastic member is positioned between the main body and the resisting member. The driving shaft is configured to move toward one side of the driving member adjacent to the elastic member under an elastic restoring force of the elastic member, whereby the cutter holder moves with the driving shaft toward one end of the driving member adjacent to the elastic member.

Abstract: Methods of making carbon nanostructures are disclosed with including examples having heat treatment of a mixture having a fibrous organic reagent and a catalyst in the presence of a reducing agent for a time sufficient to produce a quantity of carbon nanostructures which may be nanotubes or other related structures. The reducing agent may be hydrogen, nitrogen or ammonia.

Abstract: A method of generating a question data set from a knowledge base including a plurality of statements includes generating at least one question template based on a structure of selected statements of the plurality of statements, generating a seed question for each selected statement based on the at least one question template with a processor, generating at least one first extension question with a search engine by processing each of the seed questions through the search engine, and storing at least one of the at least one first extension questions and the seed questions in a memory as the question data set.

Abstract: A method of testing a printed circuit board (PCB) with an in-circuit test (ICT) probe having an improved probe-to-via contact is provided. The ICT probe includes a tip attached to a spindle; a housing having a cavity, a portion of the spindle insertable into the cavity; and a heating element wrapped helically around the spindle, the heating element coupled to the housing. The probe is contacted with a surface of a flux layer of a test via of the PCB, said contact compressing the heating element and recessing the insertable portion of the spindle into the cavity. The tip of the probe is heated with the heating element to a temperature capable of at least partially melting the flux layer, the tip at least partially penetrating the flux layer to contact a surface of a solder plugging the test via.

Abstract: A method for processing a substrate in a processing chamber, comprising forming a deposition over the substrate is provided. A silicon containing gas is flowed into the processing chamber. A COS containing gas is flowed into the processing chamber. A plasma is formed from the silicon containing gas and the COS containing gas in the processing chamber, wherein the plasma provides the deposition over the substrate.

Abstract: Systems and methods for achieving a pre-determined factor associated with the edge region within the plasma chamber is described. One of the methods includes providing an RF signal to a main electrode within the plasma chamber. The RF signal is generated based on a frequency of operation of a first RF generator. The method further includes providing another RF signal to an edge electrode within the plasma chamber. The other RF signal is generated based on the frequency of operation of the first RF generator. The method includes receiving a first measurement of a variable, receiving a second measurement of the variable, and modifying a phase of the other RF signal based on the first measurement and the second measurement. The method includes changing a magnitude of a variable associated with a second RF generator to achieve the pre-determined factor.

Abstract: A first electrostatic discharge measurement is received from a first sensor. The first sensor utilizes a wireless network to send the first measurement from a first stage of the assembly line of electronic components susceptible to electrostatic discharge damage. A second electrostatic discharge measurement is received from a second sensor. The second sensor utilizes the wireless network to send the second measurement from a second stage of the assembly line. An electrostatic discharge history is updated for the first assembly stage based on the first electrostatic discharge measurement. The electrostatic discharge history is updated for the second assembly stage based on the second electrostatic discharge measurement. A potential electrostatic danger condition is determined based on the electrostatic discharge history.

Abstract: Disclosed are a method for searching a cross-regional power supply area based on a common information model (CIM) and a system thereof. In the method, a hash function is first created according to a size of a power grid in which a power source is located; identification numbers of all devices in the power grid are mapped to a discrete hash table according to the hash function, and a collision is solved by using separate chaining; and a hash topological graph of the power grid is formed by using the discrete hash table; and a power supply area of a designated device is searched by using the hash topological graph. According to the present invention, devices in a power supply area are located rapidly and accurately by creating a discrete hash table for all device resources, so that the amount of computation is greatly reduced, and the efficiency of searching the power supply area is significantly improved.

Abstract: A first electrostatic discharge measurement is received from a first sensor. The first sensor utilizes a wireless network to send the first measurement from a first stage of the assembly line of electronic components susceptible to electrostatic discharge damage. A second electrostatic discharge measurement is received from a second sensor. The second sensor utilizes the wireless network to send the second measurement from a second stage of the assembly line. An electrostatic discharge history is updated for the first assembly stage based on the first electrostatic discharge measurement. The electrostatic discharge history is updated for the second assembly stage based on the second electrostatic discharge measurement.

Abstract: Data synchronization includes establishing a plurality of target data tables based on a source data table in which data to be synchronized is stored, determining a current target data table from the plurality of target data tables, synchronizing the source data table and the current target data table, and directing an application server to access the current target data table upon successful completion of synchronization.

Abstract: The present invention discloses a dual-band-material conveying device which comprises a material distributing device (4), a feeding device (5) and a conveying line (6). The material distributing device (4) comprises an adjusting plate (44), two limiting pillars (41) and a material distributing pillar (43). The adjusting plate (44) is mounted on the conveying line (6) through a mounting pillar (45), the adjusting plate (44) is provided with an adjusting groove (42) in which the two limiting pillars (41) and the material distributing pillar (43) are mounted. The conveying line (6) is provided with a pit, and the feeding device (5) is mounted in the pit. The feeding device (5) comprises a movable feeding device body (51), a fixed feeding device body (53) and two guide frames (54). The movable feeding device body (51) and the fixed feeding device body (53) are mounted between the two guide frames (54).

Abstract: A device for calculating trapping parameters by measuring short-circuit current decay under a reverse bias voltage, including: a vacuum chamber, an experiment table, a lower electrode, a shielding layer, an upper electrode, a direct current charging module, a switch, a short-circuit measuring system, and a computer. The experiment table, the lower electrode, the shielding layer, the test sample, and the upper electrode are disposed from the bottom up in that order inside the vacuum chamber. The upper electrode is connected to the direct current charging module via the switch. The upper electrode and the lower electrode are electrically connected via the short-circuit measuring system. The short circuit or the detrapping current measuring circuit is selectively electrically connected under the control of the selective switch. The reverse bias voltage source and the microammeter are connected in series.

Abstract: A actuator and a pump using the actuator are provided. The actuator is used to drive a pump body. The actuator includes a base, a transmission assembly and a motor received in the base. The motor includes a stator, a rotor, and a driving shaft. The driving shaft is connected to the transmission assembly. The base includes a mounting bracket. The mounting bracket is partly embedded in the motor. The actuator has good integrality and a compact structure.

Abstract: A method for speech recognition of partial proper names is described which includes natural language processing (NLP), partial name candidate generation, speech recognition and post processing. Natural language processing techniques including shallow and deep parsing are applied to long proper names to identify syntactic units (for example, noun phrases). The syntactic units form a basis for generating a candidate list of partial names for each original full name. A partial name is part of the original name, with some words omitted, or word order changed, or even word substitution. After candidate partial names are generated, their phonetic transcriptions are incorporated into a model for a speech recognizer to recognize the partial names in a speech recognition system.

Abstract: An imaging lens including a first lens element, an aperture stop, a second lens element, a third lens element, a fourth lens element and a fifth lens element arranged in sequence from an object side to an image side along an optical axis is provided. Each of the first to the fifth lens elements has an object-side surface and an image-side surface. The first lens element has positive refractive power. The second lens element has refractive power. The third lens element has positive refractive power. The object-side surface of the third lens element has a concave portion in a vicinity of the optical axis. The fourth lens element has negative refractive power. The image-side surface of the fourth lens element has a convex portion in the vicinity of the optical axis. The fifth lens element has refractive power.