Abstract: Systems or methods of the present disclosure may provide efficient power consumption for programmable logic devices based on reducing guardband voltages. A programmable logic device may include circuit monitors to mimic critical paths of an implemented circuit design and generate timing information based on the critical paths. A controller on the programmable logic device may adjust the voltage guardband based on the timing information.

Abstract: The present disclosure describes programmable logic that may be operated in a turbo processing mode to cause an ongoing operation to be completed faster than a scheduled completion time. With at least some of the remaining time to the scheduled completion time, power savings may be realized by operating the programmable logic into a deep sleep mode, where configuration memory associated with the programmable logic may be set to a suitable voltage level as to not cause data loss at lower or zero voltage levels but otherwise realize power savings relative to an amount of power consumed during average processing operations.

Abstract: Systems or methods of the present disclosure may provide for operating a programmable fabric including multiple programmable elements organized into a number of power domains that utilize a common voltage within the respective power domains. A current sensor senses a current of the programmable fabric. When the sensed current has crossed a threshold, the programmable fabric changes the number of power domains.

Abstract: An integrated circuit device that includes programmable logic circuitry that includes a plurality of regions each configured to operate at different voltage levels. The regions may be separated by level shifters that enable communication between the different voltage level regions. The integrated circuitry may also include software that performs voltage aware placement and routing for a user register-transfer level design, and may direct logic to regions according to voltages defined for the regions.

Abstract: Systems or methods of the present disclosure may provide for gradually adjusting a frequency of a clock signal. When transitioning from a configuration mode to a user mode, a clock of an integrated circuit (e.g., a field-programmable gate array or FPGA) may quickly (e.g., instantaneously) switch from a low configuration mode frequency to a high user mode frequency. This rapid increase in clock frequency may cause an inrush current and corresponding current-resistance voltage (IR) drop. To reduce or avoid the inrush current and IR drop, a frequency of the clock may be gradually ramped up from the configuration mode frequency to the user mode frequency.

Abstract: Systems or methods of the present disclosure may provide for determining a loadline for operation of a programmable logic fabric where the loadline is based at least in part on design configuration details for a design or a configuration rather for generic deployment of the programmable logic device. The loadline may be determined using software modeling for the design or configuration. Additionally or alternatively, the loadline may be determined using runtime testing and sensing of real-world parameters. This determination based on real-world parameters of a deployment of the configuration or design is based on a determination of a step load for the design or configuration.

Abstract: An integrated circuit includes a monitored circuit and a signal analyzer circuit. The signal analyzer circuit includes a logic circuit that determines if a condition signal satisfies a condition to generate an output signal. A first-in-first-out (FIFO) buffer circuit stores opportunistic data indicated by a monitored signal received from the monitored circuit in response to the output signal indicating if the condition signal satisfies the condition. A communication channel transmits the opportunistic data stored in the FIFO buffer circuit outside the integrated circuit.

Abstract: Systems and methods are provided for generating a circuit design for an integrated circuit using a circuit design tool. The circuit design tool determines maximum junction temperatures for circuit blocks in the circuit design for the integrated circuit. The circuit design tool determines defects values for the circuit blocks using the maximum junction temperatures for the circuit blocks. The circuit design tool determines a defects value for the circuit design based on the defects values for the circuit blocks. The circuit design tool determines a maximum junction temperature for the circuit design based on a comparison between the defects value for the circuit design and a target defects value for the circuit design. The circuit design tool can dynamically reconfigure configurable logic circuit blocks to improve the power, the performance, and the thermal profile to achieve an optimal junction temperature per circuit block.

Abstract: An integrated circuit with programmable logic circuitry is provided. The integrated circuit may include quiet regions, toggling regions, or unused regions. An integrated circuit may also include heavily-used metal routing paths, lightly-used metal routing paths, and unused metal routing paths. Circuit design tools may be used to generate multiple configuration images that replace the quiet regions with toggling or unused regions, that swap the heavily-used metal routing paths with lightly-used or unused metal routing paths, or that use random fitter seeds of improve the usage coverage to statistically reduce the always quiet regions on the integrated circuit. The multiple configuration images implement the same design and can be used to reconfigure the integrated circuit upon startup to reduce aging effects and improve circuit performance.

Abstract: An integrated circuit device may include a programmable fabric die having programmable logic fabric and configuration memory that may configure the programmable logic fabric. The integrated circuit device may also include a base die that may provide fabric support circuitry, including memory and/or communication interfaces as well as compute elements that may also be application-specific. The memory in the base die may be directly accessed by the programmable fabric die using a low-latency, high capacity, and high bandwidth interface.

Abstract: An integrated circuit with programmable logic circuitry is provided. The integrated circuit may include quiet regions, toggling regions, or unused regions. An integrated circuit may also include heavily-used metal routing paths, lightly-used metal routing paths, and unused metal routing paths. Circuit design tools may be used to generate multiple configuration images that replace the quiet regions with toggling or unused regions, that swap the heavily-used metal routing paths with lightly-used or unused metal routing paths, or that use random fitter seeds of improve the usage coverage to statistically reduce the always quiet regions on the integrated circuit. The multiple configuration images implement the same design and can be used to reconfigure the integrated circuit upon startup to reduce aging effects and improve circuit performance.

Abstract: An integrated circuit device may include a programmable fabric die having programmable logic fabric and configuration memory that may configure the programmable logic fabric. The integrated circuit device may also include a base die that may provide fabric support circuitry, including memory and/or communication interfaces as well as compute elements that may also be application-specific. The memory in the base die may be directly accessed by the programmable fabric die using a low-latency, high capacity, and high bandwidth interface.

Abstract: Systems and methods are provided for using an integrated circuit design tool to analyze timing requirements of a circuit design for an integrated circuit. A slack is calculated for a timing path in the circuit design that fails to satisfy a timing constraint. The slack is decomposed into multiple categories of delays in the timing path. The categories of delays for the slack may include intrinsic margin, clock skew, logic delay, and fabric interconnect delay. The logic delay may include local interconnect delay and logic circuit delay. The fabric interconnect delay may include delays in interconnect elements that are used to make connections between larger blocks of the logic circuits. Different optimization strategies are provided to solve the timing constraint failure for each of the different categories of slack breakdown. Slack profiles of the entire design in each of the four categories of slack are also provided.

Abstract: Disclosed examples to insert buffers in dataflow graphs include: a backedge filter to remove a backedge between a first node and a second node of a dataflow graph, the first node representing a first operation of the dataflow graph, the second node representing a second operation of the dataflow graph; a latency calculator to determine a critical path latency of a critical path of the dataflow graph that includes the first node and the second node, the critical path having a longer latency to completion relative to a second path that terminates at the second node; a latency comparator to compare the critical path latency to a latency sum of a buffer latency and a second path latency, the second path latency corresponding to the second path; and a buffer allocator to insert one or more buffers in the second path based on the comparison performed by the latency comparator.

Abstract: Configuration data for an integrated circuit may be generated using logic design equipment to implement a logic design on the integrated circuit. The equipment may perform multiple rounds of incremental physical synthesis, incremental timing analysis, and incremental legalization operations. Each round may involve performing multiple different physical synthesis transforms on the design that are individually rejected until transforms that satisfy legality constraints and improve timing for the logic design are found and incorporated into the netlist. The configuration data may then be generated using the netlist. In this way, the logic design may be incrementally altered and verified during the physical synthesis process. This prevents the need for rejecting or accepting an entire batch logic changes to the netlist even when only some of the changes are non-ideal, thus optimizing circuit performance as well as the compile time required to implement the logic design on the integrated circuit.

Abstract: A method for designing a system on a target device includes performing register retiming on an original design for the system to generate a retimed design. The retimed design is verified to determine whether it is structurally correct by performing a plurality of iterations of register retiming on the retimed design, wherein each iteration accounts for the register retiming of registers in the system driven by a different clock.

Abstract: A method for designing a system on a target device includes performing register retiming on an original design to generate a retimed design of the system. Compare points are identified in the original design and the retimed design. Equality constraints are defined for all compare points. Starting from the initial states of the original and retimed circuits, bounded sequential logic simulation is performed for a maximum number of time frames determined as the maximum absolute value of retiming variables computed during structural verification. Whether changed flip-flops in the retimed design have initial states that are correct are determined by comparing signal values at the compare points from the bounded sequential logic simulation.

Abstract: A method for designing a system on a target device includes performing register retiming on an original design for the system to generate a retimed design. Whether the retimed design is structurally correct is verified by performing register retiming on the retimed design.

Abstract: An integrated circuit device may include a programmable fabric die having programmable logic fabric and configuration memory that may configure the programmable logic fabric. The integrated circuit device may also include a base die that may provide fabric support circuitry, including memory and/or communication interfaces as well as compute elements that may also be application-specific. The memory in the base die may be directly accessed by the programmable fabric die using a low-latency, high capacity, and high bandwidth interface.

Abstract: A method for performing a rewind functional verification includes identifying state variables that model a number of registers on each edge of a retiming graph for an original design and a retimed design. Random variables are identified that model retiming labels representing a number and a direction of a register movement relative to a node on a retiming graph for the retimed design. A retiming constraint is identified for each edge on the retiming graph for the retimed design, wherein the retiming constraint reflects a relationship between the state variables and the random variables. A random variable that models a retiming label at a source of an edge is recursively substituted for a random variable that models a retiming label at a sink of the edge when a number of registers on the edge is unchanged after register retiming.