Abstract: A memory array and a method of writing to a unidirectional non-volatile storage cell are disclosed whereby a user data word is transformed to an internal data word and written to one or more unidirectional data storage cells according to a cell coding scheme. A check word may be generated that corresponds to the internal data word. In some embodiments, the check word may be generated by inverting one or more bits of an intermediate check word. Other embodiments may be described and claimed.

Abstract: Apparatuses and methods for sensing fuse states are disclosed herein. An apparatus may include an array having a plurality of sense lines. A plurality of cells may be coupled to a sense line of the plurality of sense lines. A fuse sense circuit may coupled to the sense line of the plurality of sense lines and configured to receive a sense voltage from a cell of the plurality of cells. The sense voltage may be based, at least in part, on a state of a fuse corresponding to the cell of the plurality of cells. The fuse sense circuit may further be configured to compare the sense voltage to a reference voltage to provide a fuse state control signal indicative of the state of the fuse.

Abstract: Buffers, integrated circuits, apparatuses, and methods for adjusting drive strength of a buffer are disclosed. In an example apparatus, the buffer includes a driver. The driver includes a pull-up circuit coupled to a supply voltage node and an output node, and also includes a pull-down circuit coupled to a reference voltage node and the output node. A drive adjust circuit is coupled to at least one of the pull-up circuit and the pull-down circuit, with the drive adjust circuit configured to receive a feedback signal and, based at least in part on the feedback signal, adjust a current conducted through the at least one of the pull-up and pull-down circuits.

Abstract: Electronic apparatus, systems, and methods can include a delayer having an inverter chain, where each inverter of the chain can be operatively regulated using current generators to control variation of the delay time of the delayer. In various embodiments, current generators can be arranged to provide reference voltages to each inverter stage of an inverter chain. Additional apparatus, systems, and methods are disclosed.

Abstract: A memory array and a method of writing to a unidirectional non-volatile storage cell are disclosed whereby a user data word is transformed to an internal data word and written to one or more unidirectional data storage cells according to a cell coding scheme. A check word may be generated that corresponds to the internal data word. In some embodiments, the check word may be generated by inverting one or more bits of an intermediate check word. Other embodiments may be described and claimed.

Abstract: Electronic apparatus, systems, and methods can include a delayer having an inverter chain, where each inverter of the chain can be operatively regulated using current generators to control variation of the delay time of the delayer. In various embodiments, current generators can be arranged to provide reference voltages to each inverter stage of an inverter chain. Additional apparatus, systems, and methods are disclosed.

Abstract: Methods and apparatuses are disclosed for driving a node to one or more elevated voltages. One example apparatus includes a first driver circuit configured to drive a node to a first voltage, and a second driver circuit configured to drive the node to a pumped voltage after the node reaches a voltage threshold. The apparatus also includes a controller circuit configured to disable the first driver circuit and enable the second driver circuit responsive to the node reaching the voltage threshold.

Abstract: Apparatuses and methods for sensing fuse states are disclosed herein. An apparatus may include an array having a plurality of sense lines. A plurality of cells may be coupled to a sense line of the plurality of sense lines. A fuse sense circuit may coupled to the sense line of the plurality of sense lines and configured to receive a sense voltage from a cell of the plurality of cells. The sense voltage may be based, at least in part, on a state of a fuse corresponding to the cell of the plurality of cells. The fuse sense circuit may further be configured to compare the sense voltage to a reference voltage to provide a fuse state control signal indicative of the state of the fuse.

Abstract: Electronic apparatus, systems, and methods can include a delayer having an inverter chain, where each inverter of the chain can be operatively regulated using current generators to control variation of the delay time of the delayer. In various embodiments, current generators can be arranged to provide reference voltages to each inverter stage of an inverter chain. Additional apparatus, systems, and methods are disclosed.

Abstract: Apparatuses and methods for sensing fuse states are disclosed herein. An apparatus may include an array having a plurality of sense lines. A plurality of cells may be coupled to a sense line of the plurality of sense lines. A fuse sense circuit may coupled to the sense line of the plurality of sense lines and configured to receive a sense voltage from a cell of the plurality of cells. The sense voltage may be based, at least in part, on a state of a fuse corresponding to the cell of the plurality of cells. The fuse sense circuit may further be configured to compare the sense voltage to a reference voltage to provide a fuse state control signal indicative of the state of the fuse.

Abstract: Buffers, integrated circuits, apparatuses, and methods for adjusting drive strength of a buffer are disclosed. In an example apparatus, the buffer includes a driver. The driver includes a pull-up circuit coupled to a supply voltage node and an output node, and also includes a pull-down circuit coupled to a reference voltage node and the output node. A drive adjust circuit is coupled to at least one of the pull-up circuit and the pull-down circuit, with the drive adjust circuit configured to receive a feedback signal and, based at least in part on the feedback signal, adjust a current conducted through the at least one of the pull-up and pull-down circuits.

Abstract: The apparatus described herein may comprise a first set of transistors, including a first transistor and a second transistor, and a second set of transistors, including a third transistor and a fourth transistor. Gates of the first and second transistors may be coupled to a first signal and a second signal, respectively, each indicating whether a corresponding one of a first supply voltage and a second supply voltage reaches a first threshold voltage or a second threshold voltage to power on a first circuit or a second circuit of a memory device. Gates of the third and fourth transistors may be coupled to a first inverted version of the first signal and a second inverted version of the second signal, respectively. An outcome signal of the second set of transistors may indicate a power-on state of the memory device responsive to power states of the first and second signals.

Abstract: Buffers, integrated circuits, apparatuses, and methods for adjusting drive strength of a buffer are disclosed. In an example apparatus, the buffer includes a driver. The driver includes a pull-up circuit coupled to a supply voltage node and an output node, and also includes a pull-down circuit coupled to a reference voltage node and the output node. A drive adjust circuit is coupled to at least one of the pull-up circuit and the pull-down circuit, with the drive adjust circuit configured to receive a feedback signal and, based at least in part on the feedback signal, adjust a current conducted through the at least one of the pull-up and pull-down circuits.

Abstract: The apparatus described herein may comprise a first set of transistors, including a first transistor and a second transistor, and a second set of transistors, including a third transistor and a fourth transistor. Gates of the first and second transistors may be coupled to a first signal and a second signal, respectively, each indicating whether a corresponding one of a first supply voltage and a second supply voltage reaches a first threshold voltage or a second threshold voltage to power on a first circuit or a second circuit of a memory device. Gates of the third and fourth transistors may be coupled to a first inverted version of the first signal and a second inverted version of the second signal, respectively. An outcome signal of the second set of transistors may indicate a power-on state of the memory device responsive to power states of the first and second signals.

Abstract: Apparatuses and methods for sensing fuse states are disclosed herein. An apparatus may include an array having a plurality of sense lines. A plurality of cells may be coupled to a sense line of the plurality of sense lines. A fuse sense circuit may coupled to the sense line of the plurality of sense lines and configured to receive a sense voltage from a cell of the plurality of cells. The sense voltage may be based, at least in part, on a state of a fuse corresponding to the cell of the plurality of cells. The fuse sense circuit may further be configured to compare the sense voltage to a reference voltage to provide a fuse state control signal indicative of the state of the fuse.

Abstract: Subject matter, for example, disclosed herein relates to an embodiment of a process, system, device, or article involving error correction codes. In a particular embodiment, an error-correcting device may comprise an input port to receive an error correcting code (ECC) based, at least in part, on contents of a memory array; a nonlinear computing block to process the ECC to provide a plurality of signals representing a nonlinear portion of an error locator polynomial; and a linear computing block to process the ECC concurrently with processing the ECC to provide a plurality of signals representing the nonlinear portion of the error locator polynomial, to provide a plurality of signals representing a linear portion of the error locator polynomial.

Abstract: The apparatus described herein may comprise a first set of transistors, including a first transistor and a second transistor, and a second set of transistors, including a third transistor and a fourth transistor. Gates of the first and second transistors may be coupled to a first signal and a second signal, respectively, each indicating whether a corresponding one of a first supply voltage and a second supply voltage reaches a first threshold voltage or a second threshold voltage to power on a first circuit or a second circuit of a memory device. Gates of the third and fourth transistors may be coupled to a first inverted version of the first signal and a second inverted version of the second signal, respectively. An outcome signal of the second set of transistors may indicate a power-on state of the memory device responsive to power states of the first and second signals.

Abstract: A memory array and a method of writing to a unidirectional non-volatile storage cell are disclosed whereby a user data word is transformed to an internal data word and written to one or more unidirectional data storage cells according to a cell coding scheme. A check word may be generated that corresponds to the internal data word. In some embodiments, the check word may be generated by inverting one or more bits of an intermediate check word. Other embodiments may be described and claimed.

Abstract: The apparatus described herein may comprise a first set of transistors, including a first transistor and a second transistor, and a second set of transistors, including a third transistor and a fourth transistor. Gates of the first and second transistors may be coupled to a first signal and a second signal, respectively, each indicating whether a corresponding one of a first supply voltage and a second supply voltage reaches a first threshold voltage or a second threshold voltage to power on a first circuit or a second circuit of a memory device. Gates of the third and fourth transistors may be coupled to a first inverted version of the first signal and a second inverted version of the second signal, respectively. An outcome signal of the second set of transistors may indicate a power-on state of the memory device responsive to power states of the first and second signals.

Abstract: Electronic apparatus, systems, and methods can include a delayer having an inverter chain, where each inverter of the chain can be operatively regulated using current generators to control variation of the delay time of the delayer. In various embodiments, current generators can be arranged to provide reference voltages to each inverter stage of an inverter chain. Additional apparatus, systems, and methods are disclosed.