Patents by Inventor Mark A. Swart
Mark A. Swart has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 6271672Abstract: A spring probe for performing tests on an electrical device having a plunger positioned within a barrel and including a spring in the barrel adjacent the plunger to apply a spring force against the plunger. The plunger includes a contact end having an angled surface for contacting the electrical device for applying a side load to the barrel, and a slot in the contact end for dividing the spring force upon contact with the electrical device.Type: GrantFiled: August 26, 1998Date of Patent: August 7, 2001Assignee: Delaware Capital Formation, Inc.Inventors: Mark A. Swart, Charles J. Johnston, Gordon A. Vinther
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Patent number: 6268719Abstract: A scan tester for printed circuit boards capable of testing densely spaced test locations on the circuit board including a desk top robot having a test head positioned over the circuit board and movable in a three-dimensional plane. The test head includes a non-contact energy source such as a source of plasma located at an end of the test head for energizing the test locations of the printed circuit board. The printed circuit board is mounted on a test fixture having a plurality of translator plates and translator pins for contacting a second surface of the printed circuit board to translate test signals to an electronic test analyzer.Type: GrantFiled: February 2, 2000Date of Patent: July 31, 2001Assignee: Delaware Capital Formation, Inc.Inventor: Mark A. Swart
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Patent number: 6259262Abstract: A flying prober having at least one prober head for contacting test sites on a unit under test which is programed for measuring isolations and continuities of test sites through the prober head. The flying prober includes an automatic loading and locating mechanism for securing the unit under test on the prober relative to the prober head and includes an angled frame for supporting the prober heads and the loading and locating mechanism. The prober heads include a camera and a test probe wherein the camera views and verifies contact between the test probe and the test sites.Type: GrantFiled: March 10, 1999Date of Patent: July 10, 2001Assignee: Delware Capital Formation, Inc.Inventor: Mark A. Swart
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Publication number: 20010000947Abstract: A test socket for an integrated circuit package having an upper housing and a lower housing secured to the top and bottom surfaces, respectively, of a load board. The upper housing having a cavity for receipt of the integrated circuit package and including a hole in the base of the upper housing to allow a plurality of solid socket plungers to contact test sites on the integrated circuit package. The socket plungers are positioned within a plurality of channels formed in the lower housing and extend through a plurality of holes in the load board to contact the test sites. A plurality of springs are positioned in the channels of the lower housing below the socket plungers to provide a spring force to bias the socket plungers upwardly toward the integrated circuit package. A nonconductive pushrod is positioned between the spring and a beveled edge of the plunger and a nonconductive cap is positioned above the load board for high frequency test signals.Type: ApplicationFiled: December 22, 2000Publication date: May 10, 2001Applicant: Delaware Capital Formation, Inc.Inventors: Mark A. Swart, Charles J. Johnston, Gordon A. Vinther, Steve B. Sargeant, Roy W. Green
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Patent number: 6204680Abstract: A test socket for an integrated circuit package having an upper housing and a lower housing secured to the top and bottom surfaces, respectively, of a load board. The upper housing having a cavity for receipt of the integrated circuit package and including a hole in the base of the upper housing to allow a plurality of solid socket plungers to contact test sites on the integrated circuit package. The socket plungers are positioned within a plurality of channels formed in the lower housing and extend through a plurality of holes in the load board to contact the test sites. A plurality of springs are positioned in the channels of the lower housing below the socket plungers to provide a spring force to bias the socket plungers upwardly toward the integrated circuit package. A nonconductive pushrod is positioned between the spring and a beveled edge of the plunger and a nonconductive cap is positioned above the load board for high frequency test signals.Type: GrantFiled: August 25, 1998Date of Patent: March 20, 2001Assignee: Delaware Capital Formation, Inc.Inventors: Mark A. Swart, Charles J. Johnston, Gordon A. Vinther, Steve B. Sargeant, Roy W. Green
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Patent number: 6191601Abstract: A test fixture for matched impedance testing of a printed circuit board having a top plate for supporting the printed circuit board having matched impedance circuit traces extending from test site locations on the printed circuit board requiring matched impedance testing. Spring probes extend through holes in the top plate for transmission of test signals from the test sites on the printed circuit board to the matched impedance circuit traces. A TDR meter is wired to the top plate by coaxial connectors attached to the circuit traces to read the test signals.Type: GrantFiled: February 22, 1999Date of Patent: February 20, 2001Assignee: Delaware Capital Formation, Inc.Inventor: Mark A. Swart
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Patent number: 6191600Abstract: A scan test apparatus for continuity testing of bare printed circuit boards having a first shorting layer and a second shorting layer positioned adjacent a unit under test to electrically short the circuit on the unit under test. At least one of the first or second shorting layers includes a row of wipers for generating test signals as the wiper contacts test sites on the unit under test as the unit under test is moved across the wiper. Measurement electronics are electrically connected to the wiper for receipt of the test signals for comparison to stored data and elimination from further testing if the test signals and stored data match.Type: GrantFiled: January 22, 1999Date of Patent: February 20, 2001Assignee: Delaware Capital Formation, Inc.Inventor: Mark A. Swart
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Patent number: 6084421Abstract: A test socket for an integrated circuit package having an upper housing and a lower housing secured to the top and bottom surfaces, respectively, of a load board. The upper housing having a cavity for receipt of the integrated circuit package and including a hole in the base of the upper housing to allow a plurality of solid socket plungers to contact test sites on the integrated circuit package. The socket plungers are positioned within a plurality of channels formed in the lower housing and extend through a plurality of holes in the load board to contact the test sites. A plurality of springs are positioned in the channels of the lower housing below the socket plungers to provide a spring force to bias the socket plungers upwardly toward the integrated circuit package. A ball is positioned between the spring and a beveled edge of the plunger to aid in biasing the plunger.Type: GrantFiled: March 20, 1998Date of Patent: July 4, 2000Assignee: Delaware Capital Formation, Inc.Inventors: Mark A. Swart, Charles J. Johnston, Gordon A. Vinther, Steve B. Sargeant
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Patent number: 6066957Abstract: A test fixture for a printed circuit board having a pattern of test probes and a fixed probe plate and a top plate adapted for movement toward and away from the probe plate. The probe plate and the top plate have selected patterns of holes for passage of the test probes through the probe plate and the top plate for contacting test points on the printed circuit board which is supported at one end of the test fixture. A probe retention plate is positioned below the top plate in an area of the test probes to prevent the test probes from walking out of the probe plate. The fixture further includes a spacer plate including interface probes to convert the fixture between a wired and a wireless text fixture.Type: GrantFiled: March 20, 1998Date of Patent: May 23, 2000Assignee: Delaware Capital Formation, Inc.Inventors: David R. Van Loan, Gary F. St. Onge, Mark A. Swart
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Patent number: 6051978Abstract: A printed circuit board tester for testing matched impedance test sites on a printed circuit board comprising an x-y prober having a first prober head and a second prober head above the printed circuit board connected to a time domain reflectometer by a coaxial test cable. A signal probe is attached to one of the prober heads. The test cable includes a signal wire which is electrically connected to the signal probe and includes a ground shield electrically connected to a ground shield extender positioned around the signal probe. A separate ground probe is connected to the second prober head and includes a ground spring for temporarily contacting the ground shield extender to transmit ground signals to the ground shield of the test cable.Type: GrantFiled: April 27, 1998Date of Patent: April 18, 2000Assignee: Delaware Capital Formation, Inc.Inventor: Mark A. Swart
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Patent number: 6025729Abstract: A test fixture for a printed circuit board having a pattern of test probes and a fixed probe plate and a top plate adapted for movement toward and away from the probe plate. The probe plate and the top plate have selected patterns of holes for passage of the test probes through the probe plate and the top plate for contacting test points on the printed circuit board which is supported at one end of the test fixture. A probe retention sheet is positioned below the probe plate in an area of the test pins so that the test probes that extend through the probe plate also extends through the probe retention sheet, the probe retention sheet includes a preformed pattern of openings which are undersized with respect to an outside diameter of the test probes which extend through the pin retention sheet so that the retention sheet naturally applies a compression force around a circumference of the test probes extending through the sheet at a level sufficient to retain the test probes within the test fixture.Type: GrantFiled: September 11, 1997Date of Patent: February 15, 2000Assignee: Delaware Capital Formation, Inc.Inventors: David Van Loan, Gary F. St. Onge, Mark A. Swart
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Patent number: 5990696Abstract: A printed circuit board tester has a pattern of test probes on a base upon which a translator fixture is mounted. The translator fixture includes a plurality of essentially parallel and vertically spaced apart rigid translator plates having selected patterns of holes containing translator pins for contacting test points on a printed circuit board supported at one end of the translator fixture. The pins translate electrical test signals between test points on the printed circuit board and the test probes on the base of the tester. The fixture includes a retractable shorting plate extending through a top plate of the fixture capable of being pressed into shorting contact with small scale test packs on the printed circuit board, preferably by a pneumatic cylinder position within the fixture. A base receptacle is rigidly secured to a base plate of the fixture for releasably attaching the cylinder within the fixture.Type: GrantFiled: May 12, 1997Date of Patent: November 23, 1999Assignee: Delaware Capital Formation, Inc .Inventor: Mark A. Swart
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Patent number: 5898314Abstract: A translator fixture for a printed circuit board tester has a pattern of test probes on a base upon which the translator fixture is mounted. The translator fixture includes a plurality of essentially parallel and vertically spaced apart rigid translator plates supported in a fixed position in the translator fixture. Selected patterns of holes are aligned in the translator plates for containing and supporting translator pins extending through the translator plates and for positioning the translator pins for contacting test points under pressure on a printed circuit board supported in an essentially horizontal position between the translator plates. The pins translate electrical test signals between the test points on the printed circuit board and the test probes on the base of the tester. The fixture includes a plurality of blind pins positioned in a top plate of the fixture for non-electrically applying a balancing force to the printed circuit board.Type: GrantFiled: February 26, 1996Date of Patent: April 27, 1999Assignee: Delaware Capital Formation, Inc.Inventor: Mark A. Swart
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Patent number: 5865641Abstract: A solid spring electrical connector includes an elongated metal bar of sufficient cross sectional area to carry high electrical current loads. The bar is contained in a barrel with terminals of the bar projecting from opposite ends of the barrel. The bar is an integral piece which includes a spring section extending most of the length of the bar. The spring section is formed by axially spaced-apart, parallel, linear, narrow-profile notches of generally uniform width having alternating open ends facing toward opposite sides of the bar progressively along its length. Each notch extends across a major portion of the diameter of the bar thereby forming a resilient spring section in which the metal between adjacent notches forms the equivalent of long narrow flexible beams with alternating pivot points. In an alternate embodiment, electrical connectors adapted for mounting to printed circuit boards include a plurality of spring contacts in a row along the length of the connector.Type: GrantFiled: September 29, 1995Date of Patent: February 2, 1999Assignee: Delaware Capital FormationInventors: Mark A. Swart, Charles J. Johnston
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Patent number: 5807063Abstract: A printed circuit board loading assembly for loading a printed circuit board from a queueing station to an electronic test analyzer having an adjustable extrusion arm and a gripper assembly located at an end of the extrusion arm for engaging at least one edge of the printed circuit board. A clamping block is positioned along the length of the extrusion arm having a locking lever for adjustably positioning the length of the extrusion arm. A cable extends along the length of the extrusion arm and is connected to the gripper assembly which when tensioned actuates the gripper assembly between an open position and a closed or gripping position.Type: GrantFiled: November 27, 1996Date of Patent: September 15, 1998Assignee: Delaware Capital Formation, Inc.Inventor: Mark A. Swart
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Patent number: 5801544Abstract: A spring-loaded contact probe for performing tests on an electrical device. The probe includes an elongated plunger having an end with a convex surface retained within a barrel. A spring for applying an axial load is positioned within the barrel and a ball sized to translate a portion of the axial force into a side loading force is positioned between the spring and the convex surface of the plunger. The spring has a tightly wound coil adjacent the ball for maintaining the ball against the barrel.Type: GrantFiled: January 16, 1997Date of Patent: September 1, 1998Assignee: Delaware Capital Formation, Inc.Inventors: Mark A. Swart, Gordon A. Vinther
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Patent number: 5798654Abstract: A translator fixture for a grid-type test fixture for testing circuit boards. In regions of the circuit board where test point density exceeds the grid spacing of probes in a grid base the test points are reached by a test module that plugs into the translator fixture and includes a grid pattern of feed-through probes for contacting special tilt pins connected to certain test points in the high density region of the board. Additional test probes, located between the rows and columns of feed-through probes, support special tilt pins for translating the remaining test points in the high density region of the board to contacts on flex circuit-type cables sandwiched on the module and extending to the periphery of the fixture for coupling to contacts on the grid base to communicate with test circuits in the test analyzer.Type: GrantFiled: December 2, 1996Date of Patent: August 25, 1998Assignee: Everett Charles Technologies, Inc.Inventors: David R. Van Loan, Mark A. Swart
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Patent number: 5781023Abstract: A hollow plunger spring probe assembly for performing tests on an electrical device including a probe receptacle for receipt of the hollow plunger. The plunger includes a tip at one end of the plunger for contacting the electrical device and a spring positioned within the opening in the plunger between the tip and a receptacle post having a head portion extending into the plunger through a second end. The post is rigidly attached to the receptacle. The plunger includes an attachment mechanism for releasably attaching the plunger to the head portion of the post.Type: GrantFiled: January 31, 1997Date of Patent: July 14, 1998Assignee: Delware Capital Formation, Inc.Inventors: Mark A. Swart, Gordon A. Vinther, Byron C. Sanderson, Charles J. Johnston
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Patent number: 5772459Abstract: A rotationally actuated compliant electrical connector includes a male connector member having an elongated body with a head at one body end, and a female connector member having a generally hollow body with an internal cavity. The male connector member includes at least one electrical contact disposed within the head adjacent a tip. The head is positioned perpendicular to the male connector member body. The female connector member includes at least one electrical contact disposed within the cavity and adapted to connect with respective electrical contacts of the male connector member when the head of the male connector member is rotatably displaced within the cavity. The male and female connector members are each adapted to accommodate pivoting rotational movement of the head within the cavity to produce electrical connection between respective electrical contacts.Type: GrantFiled: March 15, 1996Date of Patent: June 30, 1998Assignee: Delaware Capital Formation, Inc.Inventor: Mark A. Swart
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Patent number: D400811Type: GrantFiled: November 21, 1997Date of Patent: November 10, 1998Assignee: Delaware Capital Formation, Inc.Inventors: Mark A. Swart, Charles J. Johnston, Gordon A. Vinther