Abstract: An example memory sub-system comprises: a memory device; and a processing device, operatively coupled with the memory device. The processing device is configured to: receive a first host data item; store the first host data item in a first page of a first logical unit of a memory device, wherein the first page is associated with a fault tolerant stripe; receive a second host data item; store the second host data item in a second page of the first logical unit of the memory device, wherein the second page is associated with the fault tolerant stripe, and wherein the second page is separated from the first page by one or more wordlines including a dummy wordline storing no host data; and store, in a third page of a second logical unit of the memory device, redundancy metadata associated with the fault tolerant stripe.

Abstract: Memory devices might be configured to perform methods including reading a first page of memory cells and flag data wherein the flag data indicates whether a second page of memory cells adjacent to the first page is programmed, and determining from the flag data whether to re-read the first page of memory cells with an adjusted read voltage; performing a sense operation on memory cells coupled to first data lines of a first array of memory cells and memory cells coupled to data lines of a second array of memory cells, and determining a program indication of memory cells coupled to second data lines from the sense operation performed on the memory cells coupled to the data lines of the second array of memory cells; and/or programming memory cells coupled to first data lines in a first array of memory cells, and programming memory cells coupled to second data lines in the first array of memory cells while programming memory cells coupled to data lines in a second array of memory cells with flag data indicative o

Abstract: An example method for determining likelihood of erroneous data bits stored in memory cells may include sensing a first plurality of memory cells based on a first sense thresholds. Responsive to sensing the first plurality of cells, a first set of probabilistic information may be associated with the first plurality of memory cells. A second plurality of memory cells may be sensed based on a second sense threshold. Responsive to sensing the second plurality of memory cells, a second set of probabilistic information may be associated with the second plurality of memory cells. An error correction operation may be performed on the first and second pluralities of memory cells based, at least in part, on the first and second values.

Abstract: Systems, devices, and methods related to reset read are described. A reset read may be employed to initiate a transition of a portion of memory array into a first state or maintain a portion of memory array in a first state, such as a transient state. A reset read may provide a highly-parallelized, energy-efficient option to ensure memory blocks are in the first state. Various modes of reset read may be configured according to different input.

Abstract: Systems, devices, and methods related to reset read are described. A reset read may be employed to initiate a transition of a portion of memory array into a first state or maintain a portion of memory array in a first state, such as a transient state. A reset read may provide a highly-parallelized, energy-efficient option to ensure memory blocks are in the first state. Various modes of reset read may be configured according to different input.

Abstract: An apparatus is described. The apparatus includes a three dimensional storage cell array structure. The apparatus also includes a staircase structure having alternating conductive and dielectric layers, wherein respective word lines are formed in the conductive layers. The word lines are connected to respective storage cells within the three dimensional storage cell array structure. The apparatus also includes upper word lines above the staircase structure that are connected to first vias that connect to respective steps of the staircase structure. The upper word lines are also connected to second vias that run vertically off a side of the staircase structure other than a side opposite the three dimensional storage cell array structure. The second vias are connected to respective word line driver transistors that are disposed beneath the staircase structure.

Abstract: The method comprises: the reverse transcription of the template RNA, the amplification and high-throughput sequencing of the cDNAs obtained in this way, the mapping of the sequenced cDNAs/reads to the reference genome using computerized alignment methods, a computerized evaluation of the mapping results with regard to the reverse transcription event pattern (the RT signature) at the nucleotide positions and feeding the digitalised data of the RT signatures into a computerized machine learning based classification system. Reverse transcription is carried out in parallel reaction batches with different reverse transcriptases and/or under different reaction conditions. The evaluation of the mapping results with regard to the RT signature is carried out using the events ‘arrest’ and/or ‘readthrough with mismatch’ and/or ‘readthrough with sequence gap(s)’. RT signature data obtained using the parallel reaction batches are fed into the classification system.

Abstract: Methods of operating a memory include boosting a channel voltage of a memory cell selected for programming to a particular voltage level for a particular programming pulse, boosting the channel voltage of the memory cell selected for programming to a second voltage level, greater than the particular voltage level, for a subsequent programming pulse, and boosting the channel voltage of the memory cell selected for programming to a third voltage level, greater than the second voltage level, for a next subsequent programming pulse.

Abstract: Memory devices might be configured to perform methods including reading a first page of memory cells and flag data wherein the flag data indicates whether a second page of memory cells adjacent to the first page is programmed, and determining from the flag data whether to re-read the first page of memory cells with an adjusted read voltage; performing a sense operation on memory cells coupled to first data lines of a first array of memory cells and memory cells coupled to data lines of a second array of memory cells, and determining a program indication of memory cells coupled to second data lines from the sense operation performed on the memory cells coupled to the data lines of the second array of memory cells; and/or programming memory cells coupled to first data lines in a first array of memory cells, and programming memory cells coupled to second data lines in the first array of memory cells while programming memory cells coupled to data lines in a second array of memory cells with flag data indicative o

Abstract: Methods of operating a memory include boosting a channel voltage of a memory cell selected for programming to a particular voltage level for a particular programming pulse, boosting the channel voltage of the memory cell selected for programming to a second voltage level, greater than the particular voltage level, for a subsequent programming pulse, and boosting the channel voltage of the memory cell selected for programming to a third voltage level, greater than the second voltage level, for a next subsequent programming pulse.

Abstract: Methods for programming sense flags may include programming memory cells coupled to first data lines in a main memory array, and programming memory cells coupled to second data lines in the main memory array while programming memory cells coupled to data lines in a flag memory array with flag data indicative of the memory cells coupled to the second data lines being programmed. Methods for sensing flags may include performing a sense operation on memory cells coupled to first data lines of a main memory array and memory cells coupled to data lines of a flag memory array, and determining a program indication of memory cells coupled to second data lines of the main memory array from the sense operation performed on the memory cells coupled to the data lines of the flag memory array.

Abstract: Methods and apparatuses for generating probabilistic information for error correction using current integration are disclosed. An example method comprises sensing a first plurality of memory cells based on a first sense threshold, responsive to sensing the first plurality of cells, associating a first set of probabilistic information with the first plurality of memory cells, sensing a second plurality of memory cells based on a second sense threshold, responsive to sensing the second plurality of memory cells, associating a second set of probabilistic information with the second plurality of memory cells, and performing an error correction operation on the first and second pluralities of memory cells based, at least in part, on the first and second values.

Abstract: Methods and apparatuses for determining likelihood of erroneous data bits stored in a plurality of memory cells. A sense circuit to perform a coarse sense operation to detect first memory cells of the plurality of memory cells that stored charge sufficiently above a transition voltage threshold where the first memory cells are unlikely to be erroneous. The sense circuit further performs a fine sense operation to sense second memory cells of the plurality of memory cells having stored charge near the transition voltage between adjacent logic states. The first memory cells remain unsensed during the fine sense operation. The second memory cells detected during the fine sense operation may have an increased likelihood of being erroneous. Responsive to a number of sensed second memory cells near the transition voltage exceeding a threshold, additional sensing operations are performed by the sense circuit.

Abstract: Methods and apparatuses for determining likelihood of erroneous data bits stored in a plurality of memory cells. A sense circuit to perform a coarse sense operation to detect first memory cells of the plurality of memory cells that stored charge sufficiently above a transition voltage threshold where the first memory cells are unlikely to be erroneous. The sense circuit further performs a fine sense operation to sense second memory cells of the plurality of memory cells having stored charge near the transition voltage between adjacent logic states. The first memory cells remain unsensed during the fine sense operation. The second memory cells detected during the fine sense operation may have an increased likelihood of being erroneous. Responsive to a number of sensed second memory cells near the transition voltage exceeding a threshold, additional sensing operations are performed by the sense circuit.

Abstract: Systems, devices, and methods related to reset read are described. A reset read may be employed to initiate a transition of a portion of memory array into a first state or maintain a portion of memory array in a first state, such as a transient state. A reset read may provide a highly-parallelized, energy-efficient option to ensure memory blocks are in the first state. Various modes of reset read may be configured according to different input.

Abstract: In one embodiment, an apparatus comprises a NAND flash memory device comprising a memory device controller and a memory NAND flash memory array, the NAND flash memory device to program data into a plurality of NAND flash memory cells coupled to a wordline in a single program sequence, wherein the plurality of NAND flash memory cells are coupled to a first plurality of bitlines and a second plurality of bitlines; couple the first plurality of bitlines to a fixed bias voltage in response to a first read command; apply a read voltage to the wordline coupled to the plurality of NAND flash memory cells; and sense, via the second plurality of bitlines, data stored in NAND flash memory cells coupled to the wordline, wherein at least some bitlines of the second plurality of bitlines are each in between and directly adjacent to two respective bitlines coupled to the fixed bias voltage.

Abstract: Methods for programming sense flags may include programming memory cells coupled to first data lines in a main memory array, and programming memory cells coupled to second data lines in the main memory array while programming memory cells coupled to data lines in a flag memory array with flag data indicative of the memory cells coupled to the second data lines being programmed. Methods for sensing flags may include performing a sense operation on memory cells coupled to first data lines of a main memory array and memory cells coupled to data lines of a flag memory array, and determining a program indication of memory cells coupled to second data lines of the main memory array from the sense operation performed on the memory cells coupled to the data lines of the flag memory array.

Abstract: An apparatus is described. The apparatus includes a three dimensional storage cell array structure. The apparatus also includes a staircase structure having alternating conductive and dielectric layers, wherein respective word lines are formed in the conductive layers. The word lines are connected to respective storage cells within the three dimensional storage cell array structure. The apparatus also includes upper word lines above the staircase structure that are connected to first vias that connect to respective steps of the staircase structure. The upper word lines are also connected to second vias that run vertically off a side of the staircase structure other than a side opposite the three dimensional storage cell array structure. The second vias are connected to respective word line driver transistors that are disposed beneath the staircase structure.

Abstract: In a memory device, odd bit lines of a flag memory cell array are connected with a short circuit to a dynamic data cache. Even bit lines of the flag memory cell array are disconnected from the dynamic data cache. When an even page of a main memory cell array is read, the odd flag memory cells, comprising flag data, are read at the same time so that it can be determined whether the odd page of the main memory cell array has been programmed. If the flag data indicates that the odd page has not been programmed, threshold voltage windows can be adjusted to determine the states of the sensed even memory cell page.

Abstract: Apparatuses and methods for threshold voltage (Vt) distribution determination are described. A number of apparatuses can include sense circuitry configured to determine a first current on a source line of an array of memory cells, the first current corresponding to a first quantity of memory cells of a group of memory cells that conducts in response to a first sensing voltage applied to an access line and determine a second current on the source line, the second current corresponding to a second quantity of memory cells of the group that conducts in response to a second sensing voltage applied to the access line. The number of apparatuses can include a controller configured to determine at least a portion of a Vt distribution corresponding to the group of memory cells based, at least in part, on the first current and the second current.