Patents by Inventor Matthew L. Miller

Matthew L. Miller has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7968469
    Abstract: A method for processing a workpiece in a plasma reactor chamber includes coupling RF power at a first VHF frequency f1 to a plasma via one of the electrodes of the chamber, and providing a center ground return path for RF current passing directly between the ceiling electrode and the workpiece support electrode for the frequency f1. The method further includes providing a variable height edge ground annular element and providing a ground return path through the edge ground annular element for the frequency f1. The method controls the uniformity of plasma ion density distribution by controlling the distance between the variable height edge ground annular element and one of: (a) height of ceiling electrode or (b) height of workpiece support electrode.
    Type: Grant
    Filed: April 11, 2007
    Date of Patent: June 28, 2011
    Assignee: Applied Materials, Inc.
    Inventors: Kenneth S. Collins, Hiroji Hanawa, Kartik Ramaswamy, Douglas A. Buchberger, Jr., Shahid Rauf, Kallol Bera, Lawrence Wong, Walter R. Merry, Matthew L. Miller, Steven C. Shannon, Andrew Nguyen, James P. Cruse, James Carducci, Troy S. Detrick, Subhash Deshmukh, Jennifer Y. Sun
  • Patent number: 7967944
    Abstract: A workpiece is processed in a plasma reactor chamber using stabilization RF power delivered into the chamber, by determining changes in load impedance from RF parameters sensed at an RF source or bias power generator and resolving the changes in load impedance into first and second components thereof, and changing the power level of the stabilization RF power as a function one of the components of changes in load impedance.
    Type: Grant
    Filed: May 29, 2008
    Date of Patent: June 28, 2011
    Assignee: Applied Materials, Inc.
    Inventors: Steven C. Shannon, Kartik Ramaswamy, Daniel J. Hoffman, Matthew L. Miller, Kenneth S. Collins
  • Patent number: 7955986
    Abstract: A plasma reactor includes a vacuum enclosure including a side wall and a ceiling defining a vacuum chamber, and a workpiece support within the chamber and facing the ceiling for supporting a planar workpiece, the workpiece support and the ceiling together defining a processing region between the workpiece support and the ceiling. Process gas inlets furnish a process gas into the chamber. A plasma source power electrode is connected to an RF power generator for capacitively coupling plasma source power into the chamber for maintaining a plasma within the chamber. The reactor further includes at least a first overhead solenoidal electromagnet adjacent the ceiling, the overhead solenoidal electromagnet, the ceiling, the side wall and the workpiece support being located along a common axis of symmetry.
    Type: Grant
    Filed: February 23, 2006
    Date of Patent: June 7, 2011
    Assignee: Applied Materials, Inc.
    Inventors: Daniel J. Hoffman, Matthew L. Miller, Jang Gyoo Yang, Heeyeop Chae, Michael Barnes, Tetsuya Ishikawa, Yan Ye
  • Publication number: 20110062085
    Abstract: A method for the removal of soluble metal ion contamination from fluids is disclosed. The method includes passing the contaminated fluid through a filter medium comprising a reducing metal and a filter aid, such as diatomaceous earth, and collecting a filtrate with lower concentration of soluble metal ion contamination. The reducing metal can have a reduction potential of from ?0.50 volt to ?3.10 volt and can be capable of reducing the soluble metal ions to insoluble metal, which can then be entrapped in the filter medium or otherwise separated.
    Type: Application
    Filed: September 15, 2009
    Publication date: March 17, 2011
    Applicant: Halliburton Energy Services, Inc.
    Inventors: Jay P. Deville, Matthew L. Miller, Stephen W. Almond, Douglas J. Harrison
  • Patent number: 7884025
    Abstract: In a plasma reactor chamber a ceiling electrode and a workpiece support electrode, respective RF power sources of respective VHF frequencies f1 and f2 are coupled to either respective ones of the electrodes or to a common one of the electrodes, where f1 is sufficiently high to produce a center-high non-uniform plasma ion distribution and f2 is sufficiently low to produce a center-low non-uniform plasma ion distribution. Respective center ground return paths are provided for RF current passing directly between the ceiling electrode and the workpiece support electrode for the frequencies f1 and f2, and an edge ground return path is provided for each of the frequencies f1 and f2. The impedance of at least one of the ground return paths is adjusted so as to control the uniformity of the plasma ion density distribution.
    Type: Grant
    Filed: April 11, 2007
    Date of Patent: February 8, 2011
    Assignee: Applied Materials, Inc.
    Inventors: Kenneth S. Collins, Hiroji Hanawa, Kartik Ramaswamy, Douglas A. Buchberger, Jr., Shahid Rauf, Kallol Bera, Lawrence Wong, Walter R. Merry, Matthew L. Miller, Steven C. Shannon, Andrew Nguyen, James P. Cruse, James Carducci, Troy S. Detrick, Subhash Deshmukh, Jennifer Y. Sun
  • Patent number: 7879731
    Abstract: A method is provided for processing a workpiece in a plasma reactor chamber having electrodes including at least a ceiling electrode and a workpiece support electrode. The method includes coupling respective RF power sources of respective VHF frequencies f1 and f2 to either (a) respective ones of the electrodes or (b) a common one of the electrodes, where f1 is sufficiently high to produce a center-high non-uniform plasma ion distribution and f2 is sufficiently low to produce a center-low non-uniform plasma ion distribution. The method further includes adjusting a ratio of an RF parameter at the f1 frequency to the RF parameter at the f2 frequency so as to control plasma ion density distribution, the RF parameter being any one of RF power, RF voltage or RF current.
    Type: Grant
    Filed: April 11, 2007
    Date of Patent: February 1, 2011
    Assignee: Applied Materials, Inc.
    Inventors: Kenneth S. Collins, Hiroji Hanawa, Kartik Ramaswamy, Douglas A. Buchberger, Jr., Shahid Rauf, Kallol Bera, Lawrence Wong, Walter R. Merry, Matthew L. Miller, Steven C. Shannon, Andrew Nguyen, James P. Cruse, James Carducci, Troy S. Detrick, Subhash Deshmukh, Jennifer Y. Sun
  • Patent number: 7780866
    Abstract: A method for processing a workpiece in a plasma reactor. The method comprises constraining plasma in the chamber away from the floor of the pumping annulus, providing an annular baffle while compensating for asymmetry of gas flow attributable to the pumping port, and providing a gas flow equalizer below the baffle having an eccentrically shaped opening. The method further includes modifying the radial distribution of plasma ion density and providing a magnetic plasma steering field having an edge high plasma ion density distribution tendency. The method further comprises locating the baffle at a sufficient distance below the workpiece to provide an edge low plasma ion density distribution tendency that compensates the edge high plasma ion density distribution tendency of the magnetic plasma steering field.
    Type: Grant
    Filed: May 21, 2007
    Date of Patent: August 24, 2010
    Assignee: Applied Materials, Inc.
    Inventors: Matthew L. Miller, Daniel J. Hoffman, Steven C. Shannon, Michael Kutney, James Carducci, Andrew Nguyen
  • Patent number: 7777599
    Abstract: Methods and apparatus for controlling characteristics of a plasma, such as the spatial distribution of RF power and plasma uniformity, are provided herein. In some embodiments, an apparatus for controlling characteristics of a plasma includes a resonator for use in conjunction with a plasma reactor, the resonator including a source resonator for receiving an RF signal having a first frequency; a return path resonator disposed substantially coaxially with, and at least partially within, the source resonator; and an outer conductor having the source resonator and the return path resonator disposed substantially coaxially with, and at least partially within, the outer conductor, the outer conductor for providing an RF ground connection.
    Type: Grant
    Filed: November 2, 2007
    Date of Patent: August 17, 2010
    Assignee: Applied Materials, Inc.
    Inventors: Steven C. Shannon, Daniel J. Hoffman, Matthew L. Miller, Olga Regelman, Kenneth S. Collins, Kartik Ramaswamy, Kallol Bera
  • Publication number: 20100172568
    Abstract: A detector and method for automatically detecting signet ring cells in an image of a biopsy tissue sample, includes finding in the image, points about which cell membranes appear in radial symmetry; selecting as candidate points, at least ones of the points that have an adjacent nuclei with a predetermined shape feature; and applying a convolutional neural network to the candidate points to determine which of the candidate points are signet ring cells.
    Type: Application
    Filed: July 2, 2009
    Publication date: July 8, 2010
    Applicant: NEC LABORATORIES AMERICA, INC.
    Inventors: Christopher Malon, Matthew L. Miller, Eric Cosatto
  • Publication number: 20100098882
    Abstract: Apparatus and methods for processing a substrate and processing a process chamber are provided. In one embodiment, an apparatus is provided for processing a substrate including a power source, a switch box coupled to the power source and the switch box having a switch interchangeable between a first position and a second position, a first match box coupled to the switch box, a plasma generator coupled to the first match box, a second match box coupled to the switch box, and a remote plasma source coupled to the second match box.
    Type: Application
    Filed: October 19, 2009
    Publication date: April 22, 2010
    Applicant: APPLIED MATERIALS, INC.
    Inventors: Dmitry Lubomirsky, Jang Gyoo Yang, Qiwei Liang, Matthew L. Miller, James Santosa, Xinglong Chen, Paul F. Smith
  • Publication number: 20100065213
    Abstract: A plasma processing chamber having a lowered flow equalizer and a lower chamber liner. In an etching process, the processing gases may be unevenly drawn from the processing chamber which may cause an uneven etching of the substrate. By equalizing the flow of the processing gases evacuated from the chamber, a more uniform etching may occur. By electrically coupling the flow equalizer to the chamber liners, the RF return path from the flow equalizer may run along the chamber liners and hence, reduce the amount of plasma drawn below the substrate during processing.
    Type: Application
    Filed: November 23, 2009
    Publication date: March 18, 2010
    Inventors: James D. Carducci, Kin Pong Lo, Kallol Bera, Michael C. Kutney, Matthew L. Miller
  • Publication number: 20100013572
    Abstract: Apparatus and methods are provided for a power matching apparatus for use with a processing chamber. In one aspect of the invention, a power matching apparatus is provided including a first RF power input coupled to a first adjustable capacitor, a second RF power input coupled to a second adjustable capacitor, a power junction coupled to the first adjustable capacitor and the second adjustable capacitor, a receiver circuit coupled to the power junction, a high voltage filter coupled to the power junction and the high voltage filter has a high voltage output, a voltage/current detector coupled to the power junction and a RF power output connected to the voltage/current detector.
    Type: Application
    Filed: July 21, 2009
    Publication date: January 21, 2010
    Applicant: APPLIED MATERIALS, INC.
    Inventors: STEVEN C. SHANNON, JANG GYOO YANG, MATTHEW L. MILLER, KARTIK RAMASWAMY, JAMES P. CRUSE
  • Publication number: 20100004915
    Abstract: An epithelial detector and method for automatically identifying epithelial portions of a tissue sample, includes: staining the tissue sample with at least two dyes; applying a color transformation to a color image of the tissue sample to obtain one or more color channels; and applying a trained convolutional neural network to the color channels to obtain a decision for position in the tissue as to whether it is inside or outside an epithelial layer. Also, a method for training the convolutional neural network.
    Type: Application
    Filed: July 2, 2009
    Publication date: January 7, 2010
    Applicant: NEC LABORATORIES AMERICA, INC.
    Inventors: Matthew L. Miller, Christopher Malon
  • Publication number: 20100002920
    Abstract: A method and system for detecting and counting mitotic figures in an image of a biopsy sample stained with at least one dye, includes color filtering the image in a computer process to identify pixels in the image that have a color which is indicative a mitotic figure; extracting the mitotic pixels in the image that are connected to one another in a computer process, thereby producing blobs of mitotic pixels; shape-filtering and clustering the blobs of mitotic pixels in a computer process to produce mitotic figure candidates; extracting sub-images of mitotic figures by cropping the biopsy sample image at the location of the blobs; extracting two sets of features from the mitotic figure candidates in two separate computer processes; determining which of the mitotic figure candidates are mitotic figures in a computer classification process based on the extracted sets of features; and counting the number of mitotic figures per square unit of biopsy sample tissue.
    Type: Application
    Filed: July 2, 2009
    Publication date: January 7, 2010
    Applicant: NEC Laboratories America, Inc.
    Inventors: Eric Cosatto, Harold Christopher Burger, Matthew L. Miller
  • Publication number: 20090294275
    Abstract: A method of processing a workpiece in a plasma reactor chamber in which plasma RF source and bias power is delivered into the chamber, by sensing fluctuations in a plasma parameter such as load impedance or reflected power at one of the generators, and modulating the output of the other generator to minimize the fluctuation.
    Type: Application
    Filed: May 29, 2008
    Publication date: December 3, 2009
    Applicant: Applied Materials, Inc.
    Inventors: Steven C. Shannon, Kartik Ramaswamy, Daniel J. Hoffman, Matthew L. Miller, Kenneth S. Collins
  • Publication number: 20090297007
    Abstract: An automated method and system for analyzing a digital image of a biopsy to determine whether the biopsy is normal or abnormal, i.e., exhibits some type of disease such as, but not limited to, cancer. In the method and system, a classifier is trained to recognize well formed nuclei outlines from imperfect nuclei outlines in digital biopsy images. The trained classifier may then be used to filter nuclei outlines from one or more digital biopsy images to be analyzed, to obtain the well formed nuclei outlines. The well formed nuclei outlines may then be used to obtain statistics on the size or area of the nuclei for use in determining whether the biopsy is normal or abnormal.
    Type: Application
    Filed: June 2, 2008
    Publication date: December 3, 2009
    Applicant: NEC Laboratories America, Inc.
    Inventors: Eric Cosatto, Hans-Peter Graf, Matthew L. Miller
  • Publication number: 20090297404
    Abstract: A plasma reactor, having source and bias RF power generators of different frequencies, is provided with a controller responsive to fluctuations in plasma load impedance measured at one of the generators to modulate the output of the other generator to compensate for the fluctuations.
    Type: Application
    Filed: May 29, 2008
    Publication date: December 3, 2009
    Applicant: Applied Materials, Inc.
    Inventors: STEVEN C. SHANNON, Kartik Ramaswamy, Daniel J. Hoffman, Matthew L. Miller, Kenneth S. Collins
  • Publication number: 20090295296
    Abstract: A workpiece is processed in a plasma reactor chamber using stabilization RF power delivered into the chamber, by determining changes in load impedance from RF parameters sensed at an RF source or bias power generator and resolving the changes in load impedance into first and second components thereof, and changing the power level of the stabilization RF power as a function one of the components of changes in load impedance.
    Type: Application
    Filed: May 29, 2008
    Publication date: December 3, 2009
    Applicant: Applied Materials, Inc.
    Inventors: Steven C. Shannon, Kartik Ramaswamy, Daniel J. Hoffman, Matthew L. Miller, Kenneth S. Collins
  • Publication number: 20090298287
    Abstract: A method is provided in plasma processing of a workpiece for stabilizing the plasma against engineered transients in applied RF power, by modulating an unmatched low power RF generator in synchronism with the transient.
    Type: Application
    Filed: May 29, 2008
    Publication date: December 3, 2009
    Applicant: Applied Materials, Inc.
    Inventors: Steven C. Shannon, Kartik Ramaswamy, Daniel J. Hoffman, Matthew L. Miller, Kenneth S. Collins
  • Publication number: 20090294061
    Abstract: A plasma reactor for processing a workpiece such as a semiconductor wafer using predetermined transients of plasma bias power or plasma source power has unmatched low power RF generators synchronized to the transients to minimize transient-induced changes in plasma characteristics.
    Type: Application
    Filed: May 29, 2008
    Publication date: December 3, 2009
    Applicant: Applied Materials, Inc.
    Inventors: Steven C. Shannon, Kartik Ramaswamy, Daniel J. Hoffman, Matthew L. Miller, Kenneth S. Collins