Abstract: The invention relates to a beam manipulation device for a scanning microscope, comprising a main colour splitter for coupling excitation light into an illumination beam path and for separating excitation light from detection light of a detection beam path, said device comprising a scanner, preferably positioned on a pupil plane, for scanning the excitation light. The device is characterised in that: an additional optical section is provided comprising optical elements which influence a beam path; at least one pupil plane and/or at least one intermediate image plane is formed in the additional optical section by the optical elements which influence the beam path; and an adjustable selection device is provided for activating either a first beam segment of the illumination and/or detection beam path, or the additional optical section, wherein the first beam segment of the illumination and/or detection beam path does not contain a pupil plane of the illumination and/or detection beam path.

Abstract: The invention relates to an optical group for detection light of a microscope, in particular a confocal scanning microscope, having an input plane (10) for the passage of detection light to be measured and having a detection beam path arranged downstream of the input plane for guiding the detection light (11) into a detection plane (67), wherein the detection beam path has at least one first beam course (1) having first optical beam-guiding means, in particular first lenses and/or mirrors (20, 30, 34, 36, 58, 60, 66), for guiding the detection light into the detection plane. In the first beam course, the optical group has at least one dispersive device (26) for the spatial spectral splitting of the detection light to be measured and a manipulation device (49) for manipulating the spectrally spatially split detection light.

Abstract: A detection device for a microscope comprises a dispersive element in the beam path of light and a selection element. The selection element separates a beam path of a spectral portion of the light from the beam path of the light. The detector device furthermore comprises a focusing optical unit configured to focus the beam path of the spectral portion of the light onto a sensor. By way of example, the microscope may be a confocal microscope.

Abstract: A functionally integrated laser scanning microscope for scanning a sample with laser illumination, selectably in a confocal, line or wide-field operating mode, comprising a laser light source, an illumination and detection beam path, a detection device and at least one objective, wherein the illumination and detection beam path has optical means for the configuration of the laser illumination, at least one scanner for scanning the sample with the laser illumination, and a beam splitter for separating illumination and detection light, and controllable optical elements for changing the beam guiding depending on the operating mode selected in each case.

Abstract: An arrangement for microscopy, having an illumination optical unit with an illumination objective for illuminating a specimen situated on a specimen carrier in a specimen region of a specimen plane via an illumination beam path. An optical axis of the illumination objective lies in a plane which includes an illumination angle that differs from zero with the normal of a specimen plane, in respect of which the specimen carrier is aligned, and the illumination is implemented in the plane. Further, a detection optical unit with a detection objective is located in a detection beam path. The optical axis of the detection objective includes a detection angle that differs from zero with the normal of the specimen plane. The illumination objective and/or the detection objective comprises an illumination correction element arranged in the beam path and/or a detection correction element.

Abstract: Beam deflection units in light-scanning microscopes are usually arranged in planes that are conjugate to the objective pupil. The scan optics, which is required for generating the conjugate pupil planes, is complicated and not very light efficient. The invention is intended to enable a higher image quality, simpler adjustment and a lower light loss microscope. The optical system comprises a concave mirror (36) for imaging a respective point of the first and second beam deflection units (30A, 30B) onto one another. The concave mirror (36), the first beam deflection unit (30A), and the second beam deflection unit (30B) are arranged such that the illumination beam path is reflected exactly once at the concave mirror (36). A first distortion caused by the concave mirror (36) and a second distortion of the imaging caused by the first and second beam deflection units (30A, 30B) at least partly compensate for one another.

Abstract: A method for evaluating signals of fluorescence scanning microscopy with simultaneous excitation and detection of fluorescence in different focal planes of a sample by means of confocal laser scanning microscopy.

Abstract: A detection device for a microscope comprises a dispersive element in the beam path of light and a selection element. The selection element separates a beam path of a spectral portion of the light from the beam path of the light. The detector device furthermore comprises a focusing optical unit configured to focus the beam path of the spectral portion of the light onto a sensor. By way of example, the microscope may be a confocal microscope.

Abstract: A functionally integrated laser scanning microscope for scanning a sample with laser illumination, selectably in a confocal, line or wide-field operating mode, comprising a laser light source, an illumination and detection beam path, a detection device and at least one objective, wherein the illumination and detection beam path has optical means for the configuration of the laser illumination, at least one scanner for scanning the sample with the laser illumination, and a beam splitter for separating illumination and detection light, and controllable optical elements for changing the beam guiding depending on the operating mode selected in each case.

Abstract: In order to modulate different spectral components of a light beam independently of one another, the light beam is split into a plurality of spectral components which can be modulated at different locations of a spatial light modulator.

Abstract: A detection device for a microscope comprises a dispersive element in the beam path of light and a selection element. The selection element separates a beam path of a spectral portion of the light from the beam path of the light. The detector device furthermore comprises a focusing optical unit configured to focus the beam path of the spectral portion of the light onto a sensor. By way of example, the microscope may be a confocal microscope.

Abstract: An optical observation device having a pupil and at least one adjustable low magnification and one adjustable high magnification is provided, wherein the low magnification is linked to a large pupil diameter (DPmax) and the high magnification is linked to a small pupil diameter (DPmin). A stop apparatus is arranged in a pupil plane or as close as possible to a pupil plane, said stop apparatus having a region diameter which delimits a central transmissive region and having a partly transmissive region that surrounds the central transmissive region outside of the region diameter. The region diameter is smaller than the small pupil diameter (DPmin).

Abstract: An optical transmission system configured to image a selected region of a sample arranged in a first medium in an object plane on or in a sample carrier, which includes plane-parallel plate, from the object plane into an intermediate image plane in a second medium. The plane-parallel plate is located between the optical transmission system and the sample during the imaging. The object plane and the intermediate image plane form an angle between 0° and 90° with an optical axis of the transmission system. The optical transmission system is positioned relative to region of the sample such that the sample is located within the focal length of the lens of the optical transmission system closest to the sample. The intermediate image plane and the object plane are located on the same side of the optical transmission system, and the intermediate image is a virtual image.

Abstract: A laser-scanning microscope having an illumination-beam path and a detection-beam path and a microscope objective. A component for generating a plurality of scanning beams from at least one illumination beam is located in the illumination-beam path. A wedge-shaped, light-transmitting first component part provided in the illumination beam path generates spatially offset partial beams, the scanning beams being generated at the first component part by multiple reflections at an at least partially partially-reflecting surface. The microscope has a one-dimensional scanner for moving the scanning beams over a sample in the illumination beam path. The scanning beams have at least partially relative to one another a non-zero angle upstream of the objective in the illumination direction. The scanning beams can intersect at least partially in the objective pupil of the microscope objective.

Abstract: A method for evaluating signals of fluorescence scanning microscopy with simultaneous excitation and detection of fluorescence in different focal planes of a sample by means of confocal laser scanning microscopy.

Abstract: A laser scanning microscope for the acquisition of object images according to varied observation criteria. The microscope includes an illumination and detection unit, an illumination and a detection beam, a microscope objective, a scanning device with a scanning optical component and several scanners, with switching mirrors, each mirror with two switching positions, provided in the illumination and detection beams. Each switching position is assigned to one of several different, optically separate beam paths and each beam path defines a separate operating mode. A concave mirror for imaging a first scanner into at least one more scanner and vice versa is arranged in at least one of the beam paths.

Abstract: A system for microscopic applications, including a rotating structural element that acts as a beam splitter and has reflecting and transmitting structures, and which is disposed in an intermediate image plane of the beam path conjugated with the object field, and by which the structure is imaged onto an object in the object plane. The fluorescent light reflected by the object, or caused by the illumination, strikes the structural element as well as an image processing module. The beam reflected and transmitted by the structural element is guided through the image processing module. The structural element is set at an angle to the vertical of the beam path. An optical adapter, which tilts the microscopic intermediate image onto the plane of the structural element acting as beam splitter, is disposed at the interface between the microscope and the image processing module.

Abstract: A detection device (113) for a microscope comprises a dispersive element (211) in the beam path (290) of light and a selection element (212). The selection element (212) separates a beam path (291) of a spectral portion of the light from the beam path (290) of the light. The detector device (113) furthermore comprises a focusing optical unit (213) configured to focus the beam path (291) of the spectral portion of the light onto a sensor (214). By way of example, the microscope may be a confocal microscope.

Abstract: Beam deflection units in light-scanning microscopes are usually arranged in planes that are conjugate to the objective pupil. The scan optics, which is required for generating the conjugate pupil planes, is complicated and not very light efficient. The invention is intended to enable a higher image quality, simpler adjustment and a lower light loss microscope. The optical system comprises a concave mirror (36) for imaging a respective point of the first and second beam deflection units (30A, 30B) onto one another. The concave mirror (36), the first beam deflection unit (30A), and the second beam deflection unit (30B) are arranged such that the illumination beam path is reflected exactly once at the concave mirror (36). A first distortion caused by the concave mirror (36) and a second distortion of the imaging caused by the first and second beam deflection units (30A, 30B) at least partly compensate for one another.

Abstract: A laser-scanning microscope having an illumination-beam path and a detection-beam path and a microscope objective. A component for generating a plurality of scanning beams from at least one illumination beam is located in the illumination-beam path. A wedge-shaped, light-transmitting first component part provided in the illumination beam path generates spatially offset partial beams, the scanning beams being generated at the first component part by multiple reflections at an at least partially partially-reflecting surface. The microscope has a one-dimensional scanner for moving the scanning beams over a sample in the illumination beam path. The scanning beams have at least partially relative to one another a non-zero angle upstream of the objective in the illumination direction. The scanning beams can intersect at least partially in the objective pupil of the microscope objective.