Abstract: A light-scanning microscope including a scan optics for generating a pupil plane conjugate to the pupil plane of the microscope objective, and a variably adjustable beam deflection unit in the conjugate pupil plane. An intermediate image lies between the microscope objective and the scan optics. The scan optics image a second intermediate image (Zb2) into the first intermediate image via the beam deflection unit, wherein the second intermediate image is spatially curved. The deflection unit is not arranged in a collimated section of the beam path, but is instead arranged in a convergent section. Then, in terms of the optical properties and quality thereof, the scan optics needs rather to correspond merely to an eyepiece instead of a conventional scanner objective.

Abstract: A functionally integrated laser scanning microscope for scanning a sample with laser illumination, selectably in a confocal, line or wide-field operating mode, comprising a laser light source, an illumination and detection beam path, a detection device and at least one objective, wherein the illumination and detection beam path has optical means for the configuration of the laser illumination, at least one scanner for scanning the sample with the laser illumination, and a beam splitter for separating illumination and detection light, and controllable optical elements for changing the beam guiding depending on the operating mode selected in each case.

Abstract: An image correction method is provided in which, in order to capture images, a scanning beam is guided over an object plane by a beam-directing element, and at detection times a brightness value of a detection signal of an object location scanned at the respective detection time is detected in the object plane, wherein actual positions of the beam-directing element and the positions of the object locations which are associated with the actual positions are known at every detection time. A pixel array with known positions of each pixel of the pixel array is defined in the object plane, a number of pixels adjacent to the object location is acquired, and the brightness value which is detected at an object location is assigned proportionally to the adjacent pixels of the object location as brightness value portions. Also provided is a microscope designed to carry out the image correction method.

Abstract: In order to modulate different spectral components of a light beam independently of one another, the light beam is split into a plurality of spectral components which can be modulated at different locations of a spatial light modulator.

Abstract: Scanning fluorescence microscopes with an observation beam path from a measurement volume to an image plane. A beam combiner is provided for coupling an illumination system and a diaphragm arranged in the image plane for slow composition of the image because of the sequential scanning and subject the sample to loading as a result of inefficient use of the excitation light. The microscope simultaneously detects fluorescence from different focal planes in each case quasi-confocally. The observation beam path between the beam combiner and the image plane has a first diffractive optics for splitting light beams into beam bundles along different orders of diffraction, imparting to the light beams a spherical phase that is different from the other orders of diffraction. A second diffractive optics is provided for the compensation of chromatic aberrations of the split beam bundles, and a collecting optics is provided for focusing split beam bundles into the image plane.

Abstract: A family of microscopes with illumination systems directing a sheet of light having an approximately planar extension in an illumination axis of an illumination beam path and in a transverse axis orthogonally oriented to the illumination axis. the illumination device, emits illumination light and has two illumination beam paths. A first illumination beam path illuminates the sample region from a first direction on the illumination axis and a second illumination beam path illuminates the sample region from a second opposing direction on the illumination axis. A switching element alternately switches the illumination light between the first illumination beam path and the second illumination beam path, or shifts the light sheet in a direction of the detection axis for adjusting or both.

Abstract: An optical transmission system configured to image a selected region of a sample arranged in a first medium in an object plane on or in a sample carrier, which includes plane-parallel plate, from the object plane into an intermediate image plane in a second medium. The plane-parallel plate is located between the optical transmission system and the sample during the imaging. The object plane and the intermediate image plane form an angle between 0° and 90° with an optical axis of the transmission system. The optical transmission system is positioned relative to region of the sample such that the sample is located within the focal length of the lens of the optical transmission system closest to the sample. The intermediate image plane and the object plane are located on the same side of the optical transmission system, and the intermediate image is a virtual image.

Abstract: A laser scanning microscope for the acquisition of object images according to varied observation criteria. The microscope includes an illumination and detection unit, an illumination and a detection beam, a microscope objective, a scanning device with a scanning optical component and several scanners, with switching mirrors, each mirror with two switching positions, provided in the illumination and detection beams. Each switching position is assigned to one of several different, optically separate beam paths and each beam path defines a separate operating mode. A concave mirror for imaging a first scanner into at least one more scanner and vice versa is arranged in at least one of the beam paths.

Abstract: A microscope including an illumination device providing a light sheet illuminating a sample region, said sheet having a planar extension along an illumination axis of an illumination beam path and a transverse axis lying normal to the illumination axis. A detection device detects light emitted from the sample region on a detection axis the illumination axis and detection axis as well as the transverse axis and the detection axis being oriented relative each other at an angle unequal zero. The detection device has a detection lens system arranged in the detection beam path and splitting means for splitting the detection beam path into two beam sub-paths. A dichroic beam splitter in the infinity region of the surface detectors is about 3 mm thick. Wobble plate(s) disposed orthogonal to each other relative to the detection axis arranged in one of the two beam sub-paths so measured values can be automatically superimposed.

Abstract: A family of microscopes with illumination systems directing a sheet of light having an approximately planar extension in an illumination axis of an illumination beam path and in a transverse axis orthogonally oriented to the illumination axis. the illumination device, emits illumination light and has two illumination beam paths. A first illumination beam path illuminates the sample region from a first direction on the illumination axis and a second illumination beam path illuminates the sample region from a second opposing direction on the illumination axis. A switching element alternately switches the illumination light between the first illumination beam path and the second illumination beam path, or shifts the light sheet in a direction of the detection axis for adjusting or both.

Abstract: A system for microscopic applications, including a rotating structural element that acts as a beam splitter and has reflecting and transmitting structures, and which is disposed in an intermediate image plane of the beam path conjugated with the object field, and by which the structure is imaged onto an object in the object plane. The fluorescent light reflected by the object, or caused by the illumination, strikes the structural element as well as an image processing module. The beam reflected and transmitted by the structural element is guided through the image processing module. The structural element is set at an angle to the vertical of the beam path. An optical adapter, which tilts the microscopic intermediate image onto the plane of the structural element acting as beam splitter, is disposed at the interface between the microscope and the image processing module.

Abstract: A family of microscopes with illumination systems directing a sheet of light having an approximately planar extension in an illumination axis of an illumination beam path and in a transverse axis orthogonally oriented to the illumination axis. The microscopes have detection devices used to detect light that is emitted by a sample region. The detection devices including a detection lens system disposed in the detection beam path and an optical detection element spaced from a front lens of the detection lens system and independently adjustable thereof. The optical detection element continuously varies the size of a detection image field and/or continuously displaces a focal plane of detection in the P-region.

Abstract: The invention relates to a microscope illumination that includes a laser light source that emits a light beam, beam-guiding optical elements for generating an illumination beam path that includes pupil and field planes, and a homogenizing arrangement for forming a luminous field having a homogenized intensity and configured to be directed onto a sample.

Abstract: A family of microscopes include an illumination device which produces a planar light sheet along an illumination axis of an illumination beam path and a transverse axis normal to the illumination axis. A detection device detects light emitted from the sample region along an axis of detection of a detection beam path. The illumination and detection axes as well as the transverse axis and the axis of detection being oriented relative each other at an angle unequal to zero. A light sheet generator also produces rotationally symmetrical light and includes structure and control for rapidly scanning the sample region along the transverse axis. The illumination device includes a second light sheet generator having a first astigmatically active optical element with at least one astigmatic lens for producing a static sheet of light. Selection elements used to select either the first or the second light sheet or both together to produce the sheet of light.

Abstract: A family of microscopes include an illumination device which produces a planar light sheet along an illumination axis of an illumination beam path and a transverse axis normal to the illumination axis. A detection device detects light emitted from the sample region along an axis of detection of a detection beam path. The illumination and detection axes as well as the transverse axis and the axis of detection being oriented relative each other at an angle unequal to zero. A light sheet generator also produces rotationally symmetrical light and includes structure and control for rapidly scanning the sample region along the transverse axis. The illumination device includes a second light sheet generator having a first astigmatically active optical element with at least one astigmatic lens for producing a static sheet of light. Selection elements used to select either the first or the second light sheet or both together to produce the sheet of light.

Abstract: A microscope including an illumination device providing a light sheet illuminating a sample region, said sheet having a planar extension along an illumination axis of an illumination beam path and a transverse axis lying normal to the illumination axis. A detection device detects light emitted from the sample region on a detection axis the illumination axis and detection axis as well as the transverse axis and the detection axis being oriented relative each other at an angle unequal zero. The detection device has a detection lens system arranged in the detection beam path and splitting means for splitting the detection beam path into two beam sub-paths. A dichroic beam splitter in the infinity region of the surface detectors is about 3 mm thick. Wobble plate(s) disposed orthogonal to each other relative to the detection axis arranged in one of the two beam sub-paths so measured values can be automatically superimposed.

Abstract: A family of microscopes with illumination systems directing a sheet of light having an approximately planar extension in an illumination axis of an illumination beam path and in a transverse axis orthogonally oriented to the illumination axis. The microscopes have detection devices used to detect light that is emitted by a sample region. The detection devices including a detection lens system disposed in the detection beam path and an optical detection element spaced from a front lens of the detection lens system and independently adjustable thereof. The optical detection element continuously varies the size of a detection image field and/or continuously displaces a focal plane of detection in the P-region.

Abstract: A method and arrangement for collimated microscopic imaging, including a first illumination of a sample in at least one region for exciting fluorescence, and a spatially resolving detection of the sample light by detector elements, the detection being associated with the region, wherein by means of a second illumination a sub-division of the region into separate fluorescent partial regions occurs, which are associated with the detector elements. The separation of the partial regions is carried out by the spatial separation of the fluorescent regions by means of intermediate regions having reduced fluorescence or no fluorescence, and/or by means of different spectral properties of the fluorescence from the partial regions.

Abstract: A method and arrangement for collimated microscopic imaging, including a first illumination of a sample in at least one region for exciting fluorescence, and a spatially resolving detection of the sample light by detector elements, the detection being associated with the region, wherein by means of a second illumination a sub-division of the region into separate fluorescent partial regions occurs, which are associated with the detector elements. The separation of the partial regions is carried out by the spatial separation of the fluorescent regions by means of intermediate regions having reduced fluorescence or no fluorescence, and/or by means of different spectral properties of the fluorescence from the partial regions.

Abstract: The invention is directed to an optical arrangement with a light source for emitting a light bundle and with optical elements for transforming this light bundle into the shape of a light sheet, particularly suitable for illuminating individual planes of a three-dimensional specimen in selective plane illumination microscopy (SPIM). According to the invention, means are provided for varying the cross section of the light sheet, for varying the length of the light sheet and/or for influencing the direction in which individual beam components extending within the light sheet are directed to the specimen substance. This makes it possible to adapt the geometry of the light sheet to the illumination requirements for observing one and the same specimen plane with a plurality of different objectives and, if required, to reduce shadows occurring within the observed specimen plane as a result of the illumination.