Patents by Inventor Megumi Nakamura
Megumi Nakamura has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20240099155Abstract: A memory includes: a magnet including a first and second portions adjacent in a first direction. The first portion has a first dimension in a second direction at a first position at which a dimension of the magnet in the second direction is maximum, the second direction perpendicular to the first direction, the second portion has a second dimension in the second direction at a second position at which a dimension of the magnet in the second direction is minimum, the second dimension smaller than the first dimension, the first portion is continuous to the second portion via a third position between the first and second positions, a curve corresponding to an outer of the magnet extends between the first and third positions, and the curve passes through a side closer to the central axis of the magnet than a straight line connecting the first and second positions.Type: ApplicationFiled: September 11, 2023Publication date: March 21, 2024Applicant: Kioxia CorporationInventors: Masahiro KOIKE, Michael Arnaud QUINSAT, Nobuyuki UMETSU, Tsutomu NAKANISHI, Agung SETIADI, Megumi YAKABE, Shigeyuki HIRAYAMA, Masaki KADO, Yasuaki OOTERA, Shiho NAKAMURA, Susumu HASHIMOTO, Tsuyoshi KONDO
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Publication number: 20240019346Abstract: In order to enable use of novel immunostaining for a pathological diagnosis and research, the invention provides a sample exchange chamber including: a container 2 into which a substrate on which a sample is placed can be introduced; a specific solution inlet 3, which is a staining mechanism that stains the sample; a cleaning liquid inlet 4, which is a cleaning mechanism that cleans the sample; an evacuation port 5, which is an evacuation mechanism that evacuates the container; a drain port 6; and a sterilization mechanism 7 that sterilizes the sample and inside of the container.Type: ApplicationFiled: November 30, 2020Publication date: January 18, 2024Inventors: Takashi TAKAKI, Yoshihiro NAGASE, Dedong KANG, Kazuho HONDA, Mari SAKAUE, Megumi NAKAMURA
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Patent number: 11742178Abstract: The invention provides an ion milling device capable of cross-sectional milling on an all-solid-state battery while reducing an occurrence of a short circuit due to a redeposition film.Type: GrantFiled: August 23, 2019Date of Patent: August 29, 2023Assignee: Hitachi High-Tech CorporationInventors: Hitoshi Kamoshida, Hisayuki Takasu, Atsushi Kamino, Shota Aida, Megumi Nakamura
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Publication number: 20230183316Abstract: The present disclosure includes a pharmaceutical composition for treating a cancer in an HLA-A*02:07, HLA-A*03:01, HLA-B*15:01, or HLA-B*27:05-positive subject comprising a WT1-derived cancer antigen peptide or a peptide conjugate containing the peptide.Type: ApplicationFiled: May 11, 2021Publication date: June 15, 2023Applicants: SUMITOMO PHARMA CO., LTD., INTERNATIONAL INSTITUTE OF CANCER IMMUNOLOGY, INC.Inventors: Masashi GOTO, Natsuko SUGINOBE, Megumi NAKAMURA
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Publication number: 20220319802Abstract: A performance of a sample holder 1 used in a charged particle beam device is improved. A shield plate 2 is connected to a sample stand 7. A sample stand 7 is provided with a pressing member 5 that can move in a direction perpendicular to the shield plate 2 in a state in which the pressing member is attached to the sample stand 7, and has a bar shape. A sample supporting member 4 connected to the pressing member 5 is provided at a position facing the shield plate 2. A spring 6 is provided along an outer circumference of the pressing member 5 and is connected to the sample supporting member 4 and the sample stand 7.Type: ApplicationFiled: September 25, 2019Publication date: October 6, 2022Inventors: Megumi NAKAMURA, Hisayuki TAKASU, Kento HORINOUCHI
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Publication number: 20220293391Abstract: The invention provides an ion milling device capable of cross-sectional milling on an all-solid-state battery while reducing an occurrence of a short circuit due to a redeposition film.Type: ApplicationFiled: August 23, 2019Publication date: September 15, 2022Inventors: Hitoshi KAMOSHIDA, Hisayuki TAKASU, Atsushi KAMINO, Shota AIDA, Megumi NAKAMURA
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Publication number: 20190156947Abstract: Techniques and system configurations to enable the automated collection and evaluation of clinical data within an automated insights information system are disclosed herein. In an example, the information system is adapted to continuously monitor clinical systems for new patient data, process patient data into a standardized and structured format, selectively run algorithms to classify and characterize data, and stores the results of algorithms (such as findings, predictions, and recommendations) that can be used as input to other algorithms, or sent to clinical systems and presented to end users. In a specific example, a method performed in a computing system may include: requesting and obtaining a first and second set of clinical data, analyzing the first and second set of clinical data with respective algorithms, identifying a clinical finding, and generating output from the computing system based on the identified clinical finding.Type: ApplicationFiled: November 22, 2017Publication date: May 23, 2019Inventors: Eve Megumi Nakamura, Osama Masoud, Oliver Schreck
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Publication number: 20180140691Abstract: The invention relates to a combination use of a WT1 antigen peptide or a pharmaceutically acceptable salt thereof and an immunomodulator for treating or preventing cancer.Type: ApplicationFiled: May 19, 2016Publication date: May 24, 2018Applicants: Sumitomo Dainippon Pharma Co., Ltd., International Institute of Cancer Immunology, Inc.Inventors: Hideo TAKASU, Megumi NAKAMURA, Masashi GOTO, Natsuko SUGINOBE
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Patent number: 9697998Abstract: A mass spectrometer includes: an ionization unit configured to ionize an analyte gas; a filter unit configured to allow passage of only a target ion which is a component of the analyte gas ionized in the ionization unit and which has a specific mass-to-charge ratio; and an ion detection unit configured to detect an ion detection value based on the target ion having passed through the filter unit, wherein the ion detection unit includes a Faraday electrode which includes an electrode portion disposed along a centerline of the filter unit and a bottom electrode provided at a position downstream of the electrode portion in a flow of the target ion, the electrode portion and the bottom electrode being connected to each other, a secondary electron multiplier provided to face the electrode portion with the centerline located therebetween, and a blocking portion connected to the bottom electrode.Type: GrantFiled: December 28, 2015Date of Patent: July 4, 2017Assignee: CANON ANELVA CORPORATIONInventors: Megumi Nakamura, Yoshiyuki Takizawa, Masayuki Sugiyama, Yuji Shimada, Hiroki Mita
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Publication number: 20160240364Abstract: A mass spectrometer includes: an ionization unit configured to ionize an analyte gas; a filter unit configured to allow passage of only a target ion which is a component of the analyte gas ionized in the ionization unit and which has a specific mass-to-charge ratio; and an ion detection unit configured to detect an ion detection value based on the target ion having passed through the filter unit, wherein the ion detection unit includes a Faraday electrode which includes an electrode portion disposed along a centerline of the filter unit and a bottom electrode provided at a position downstream of the electrode portion in a flow of the target ion, the electrode portion and the bottom electrode being connected to each other, a secondary electron multiplier provided to face the electrode portion with the centerline located therebetween, and a blocking portion connected to the bottom electrode.Type: ApplicationFiled: December 28, 2015Publication date: August 18, 2016Inventors: Megumi Nakamura, Yoshiyuki Takizawa, Masayuki Sugiyama, Yuji Shimada, Hiroki Mita
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Patent number: 9373491Abstract: An object of the present invention is to provide a mass spectrometer having a simple structure and being capable of precisely measuring a total pressure and performing mass spectrometry with high precision. A mass spectrometer according to one embodiment includes a quadrupole configured to selectively pass therethrough an ion of a target gas having a predetermined mass-to-charge ratio among components of a measurement gas ionized by an ion source, an ion detector configured to detect an ion current value based on the ion of the target gas that passes through the quadrupole, a total pressure measurer configured to detect a photoelectric current value based on vacuum ultraviolet light generated when the ion source ionizes the measurement gas, and an arithmetic unit configured to calculate a partial pressure of the target gas by using the photoelectric current value and the ion current value.Type: GrantFiled: May 27, 2015Date of Patent: June 21, 2016Assignee: CANON ANELVA CORPORATIONInventors: Megumi Nakamura, Masayuki Sugiyama, Lei Chen, Yoshiyuki Takizawa
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Publication number: 20150262807Abstract: An object of the present invention is to provide a mass spectrometer having a simple structure and being capable of precisely measuring a total pressure and performing mass spectrometry with high precision. A mass spectrometer according to one embodiment includes a quadrupole configured to selectively pass therethrough an ion of a target gas having a predetermined mass-to-charge ratio among components of a measurement gas ionized by an ion source, an ion detector configured to detect an ion current value based on the ion of the target gas that passes through the quadrupole, a total pressure measurer configured to detect a photoelectric current value based on vacuum ultraviolet light generated when the ion source ionizes the measurement gas, and an arithmetic unit configured to calculate a partial pressure of the target gas by using the photoelectric current value and the ion current value.Type: ApplicationFiled: May 27, 2015Publication date: September 17, 2015Inventors: Megumi NAKAMURA, Masayuki SUGIYAMA, Lei CHEN, Yoshiyuki TAKIZAWA
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Patent number: 8436295Abstract: The present invention provides a device for measuring a mean free path capable of measuring directly the mean free path of a charged particle, a vacuum gauge, and a method for measuring a mean free path. The device for measuring a mean free path according to one embodiment of the invention includes an ion source for generating an ion, a collector (24a) for detecting the number of first charged particles being charged particles having a first flight distance L1 that is a flight distance of zero or more from the ion source, and a collector (24b) for detecting the number of second charged particles having a second flight distance longer than the first flight distance. The control part of the device calculates the mean free path from a ratio between the numbers of the first and second charged particles.Type: GrantFiled: March 15, 2012Date of Patent: May 7, 2013Assignee: Canon Anelva CorporationInventors: Yoshiro Shiokawa, Megumi Nakamura, Qiang Peng
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Patent number: 8410415Abstract: The present disclosure provides an ion detector for improving the effect of electric field for pulling in an ion to be detected to a first-stage electrode of a secondary electron multiplier (SEM), and improving the effect of a stray light reduction. In one example embodiment, an ion detector includes a SEM, and a lead-in electrode for pulling in an ion to a first-stage electrode side of the SEM. At least one of the area of the lead-in electrode and a potential difference between the lead-in electrode and neighboring electrodes of the lead-in electrode, the neighboring electrode being an electrode not of the SEM, is set so that the light amount of internal-stray light generated inside the detector entering the first-stage electrode is not more than that of external-stray light generated outside the detector entering the first-stage electrode, when an ion is introduced into the detector.Type: GrantFiled: October 21, 2011Date of Patent: April 2, 2013Assignee: Canon Anelva CorporationInventors: Megumi Nakamura, Yoshiro Shiokawa, Qiang Peng
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Patent number: 8386211Abstract: A method, apparatus, and article of manufacture are provided for detecting events based upon population density as a function of time and geographic location. Flow of population enables continuous movement to be distinguished from non-continuous movement. Accordingly, various types of events where people are gathering may be determined based upon the population flow and density.Type: GrantFiled: August 15, 2008Date of Patent: February 26, 2013Assignee: International Business Machines CorporationInventors: Megumi Nakamura, Mika Saito, Shoko Suzuki
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Patent number: 8324568Abstract: A mass spectrometer includes an ionization chamber (100) which generates fragment-free ions to be detected from an introduced gas to be detected, and a mass spectrometer chamber (140) including a mass spectrometer (160) which fractionates by mass the ions to be detected that are transported from the ionization chamber and which detects the ions. The mass spectrometer further includes a probe (111) which holds a liquid sample or a solid sample and causes the liquid sample or the solid sample to generate the gas to be detected upon heating by a heating means, and a gas introduction means (170) which introduces a predetermined gas from the probe to the ionization chamber to transport, to the ionization chamber, the gas to be detected that is generated at the probe.Type: GrantFiled: June 4, 2010Date of Patent: December 4, 2012Assignee: Canon Anelva CorporationInventors: Yoshiro Shiokawa, Yoshiki Hirano, Megumi Nakamura, Yasuyuki Taneda, Qiang Peng, Harumi Maruyama
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Patent number: 8309917Abstract: The present invention maintains a stable emission amount from an emitter. In an embodiment of the present invention, a solid sample or a liquid sample is heated to gasify an object to be measured contained in the solid sample or the liquid sample, thereby forming a neutral gaseous molecule, and a metal ion emitted from an emitter having an oxidized surface is attached to the neutral gaseous molecule to ionize the neutral gaseous molecule, which is subjected to mass spectrometry. The solid sample or the liquid sample is a sample that emits a reducing gas by heating. The heating for gasifying the object to be measured is performed at a temperature lower than the vaporization temperature of the solid sample or the liquid sample and not less than the vaporization temperature of the object to be measured, and an oxidizing gas is provided to the emitter.Type: GrantFiled: December 7, 2009Date of Patent: November 13, 2012Assignee: Canon Anelva CorporationInventors: Yoshiro Shiokawa, Harumi Maruyama, Yasuyuki Taneda, Megumi Nakamura
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Publication number: 20120235034Abstract: The present invention provides a device for measuring a mean free path capable of measuring directly the mean free path of a charged particle, a vacuum gauge, and a method for measuring a mean free path. The device for measuring a mean free path according to one embodiment of the invention includes an ion source for generating an ion, a collector (24a) for detecting the number of first charged particles being charged particles having a first flight distance L1 that is a flight distance of zero or more from the ion source, and a collector (24b) for detecting the number of second charged particles having a second flight distance longer than the first flight distance. The control part of the device calculates the mean free path from a ratio between the numbers of the first and second charged particles.Type: ApplicationFiled: March 15, 2012Publication date: September 20, 2012Applicant: CANON ANELVA CORPORATIONInventors: Yoshiro Shiokawa, Megumi Nakamura, Qiang Peng
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Publication number: 20120097847Abstract: The present disclosure provides an ion detector for improving the effect of electric field for pulling in an ion to be detected to a first-stage electrode of a secondary electron multiplier (SEM), and improving the effect of a stray light reduction. In one example embodiment, an ion detector includes a SEM, and a lead-in electrode for pulling in an ion to a first-stage electrode side of the SEM. At least one of the area of the lead-in electrode and a potential difference between the lead-in electrode and neighboring electrodes of the lead-in electrode, the neighboring electrode being an electrode not of the SEM, is set so that the light amount of internal-stray light generated inside the detector entering the first-stage electrode is not more than that of external-stray light generated outside the detector entering the first-stage electrode, when an ion is introduced into the detector.Type: ApplicationFiled: October 21, 2011Publication date: April 26, 2012Applicant: CANON ANELVA CORPORATIONInventors: Megumi Nakamura, Yoshiro Shiokawa, Qiang Peng
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Patent number: 8164051Abstract: An internal standard material to be added to a specimen containing a material to be measured when measuring the content of the material to be measured by performing mass spectrometry on the specimen includes a hindered phenol compound.Type: GrantFiled: April 14, 2009Date of Patent: April 24, 2012Assignee: Canon Anelva CorporationInventors: Yoshiro Shiokawa, Harumi Maruyama, Megumi Nakamura