Patents by Inventor Megumi Nakamura

Megumi Nakamura has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8137203
    Abstract: A virtual-space hazard assessment system, for use in a virtual space, having target identifying information that identifies a target that appears in the virtual space. The system includes: a hazard-rating-request receiver for receiving a hazard rating request to rate the degree of hazard of the target; hazard storage for storing a table in which the degree of hazard of the target and the target identifying information are associated with each other; a hazard-degree increasing mechanism for increasing the degree of hazard of the target stored in the table in the hazard storage according to the degree of hazard received by the hazard-rating-request receiver; a hazard-degree decreasing mechanism for decreasing the degree of hazard stored in the table in the hazard storage with the elapse of time; and hazard-information-output instructing mechanism for issuing an instruction to output hazard information stored in the hazard storage.
    Type: Grant
    Filed: March 26, 2009
    Date of Patent: March 20, 2012
    Assignee: International Business Machines Corporation
    Inventors: Megumi Nakamura, Mika Saito
  • Patent number: 8049166
    Abstract: A mass spectrometer system comprises a chamber having an ion emitting unit to emit metal ions in the chamber with a communicating hole; a neutral molecule introduction unit; another gas introduction unit; a controller controlling a temperature of a region where metal ions attach to the neutral molecules; and a mass analyzer for the neutral molecules with the metal ions, wherein plotting an attachment energy of the metal ions attached to the neutral molecules in the chamber along an abscissa and the temperature of the region where the metal ions attach to the neutral molecules along an ordinate, the controller adjusts the temperature of the region so as to fall within a range obtained by excluding a range corresponding to the temperature of the region from 150 to 200° C. from a range surrounded by the temperatures of the region [° C.]=150×attachment energy [eV], 100×attachment energy [eV]?50, and 20° C., and attachment energies [eV]=2.1 and 0.5.
    Type: Grant
    Filed: December 23, 2009
    Date of Patent: November 1, 2011
    Assignee: Canon Anelva Corporation
    Inventors: Yoshiro Shiokawa, Megumi Nakamura, Harumi Maruyama
  • Patent number: 7952069
    Abstract: A mass spectrometer includes an ionization chamber, a temperature control unit which controls the temperature in the ionization chamber to vaporize a sample in at least one of solid and liquid state in the ionization chamber, an introduction unit which introduces the sample into the ionization chamber, an ion supply unit which supplies ions to the ionization chamber to ionize, in the ionization chamber, the sample vaporized in the ionization chamber, and a mass analyzer which measures the mass of the molecules of the ionized sample.
    Type: Grant
    Filed: April 28, 2009
    Date of Patent: May 31, 2011
    Assignee: Canon Anelva Corporation
    Inventors: Yoshiro Shiokawa, Megumi Nakamura, Harumi Maruyama, Aiko Wada
  • Publication number: 20100243884
    Abstract: A mass spectrometer includes an ionization chamber (100) which generates fragment-free ions to be detected from an introduced gas to be detected, and a mass spectrometer chamber (140) including a mass spectrometer (160) which fractionates by mass the ions to be detected that are transported from the ionization chamber and which detects the ions. The mass spectrometer further includes a probe (111) which holds a liquid sample or a solid sample and causes the liquid sample or the solid sample to generate the gas to be detected upon heating by a heating means, and a gas introduction means (170) which introduces a predetermined gas from the probe to the ionization chamber to transport, to the ionization chamber, the gas to be detected that is generated at the probe.
    Type: Application
    Filed: June 4, 2010
    Publication date: September 30, 2010
    Applicant: CANON ANELVA CORPORATION
    Inventors: Yoshiro Shiokawa, Yoshiki Hirano, Megumi Nakamura, Yasuyuki Taneda, Qiang Peng, Harumi Maruyama
  • Publication number: 20100163722
    Abstract: The present invention maintains a stable emission amount from an emitter. In an embodiment of the present invention, a solid sample or a liquid sample is heated to gasify an object to be measured contained in the solid sample or the liquid sample, thereby forming a neutral gaseous molecule, and a metal ion emitted from an emitter having an oxidized surface is attached to the neutral gaseous molecule to ionize the neutral gaseous molecule, which is subjected to mass spectrometry. The solid sample or the liquid sample is a sample that emits a reducing gas by heating. The heating for gasifying the object to be measured is performed at a temperature lower than the vaporization temperature of the solid sample or the liquid sample and not less than the vaporization temperature of the object to be measured, and an oxidizing gas is provided to the emitter.
    Type: Application
    Filed: December 7, 2009
    Publication date: July 1, 2010
    Applicant: CANON ANELVA TECHNIX CORPORATION
    Inventors: Yoshiro Shiokawa, Harumi Maruyama, Yasuyuki Taneda, Megumi Nakamura
  • Publication number: 20100163723
    Abstract: A mass spectrometer system comprises a chamber having an ion emitting unit to emit metal ions in the chamber with a communicating hole; a neutral molecule introduction unit; another gas introduction unit; a controller controlling a temperature of a region where metal ions attach to the neutral molecules; and a mass analyzer for the neutral molecules with the metal ions, wherein plotting an attachment energy of the metal ions attached to the neutral molecules in the chamber along an abscissa and the temperature of the region where the metal ions attach to the neutral molecules along an ordinate, the controller adjusts the temperature of the region so as to fall within a range obtained by excluding a range corresponding to the temperature of the region from 150 to 200° C. from a range surrounded by the temperatures of the region [° C.]=150×attachment energy [eV], 100×attachment energy [eV]?50, and 20° C., and attachment energies [eV]=2.1 and 0.5.
    Type: Application
    Filed: December 23, 2009
    Publication date: July 1, 2010
    Applicant: CANON ANELVA TECHNIX CORPORATION
    Inventors: Yoshiro Shiokawa, Megumi Nakamura, Harumi Maruyama
  • Publication number: 20100042364
    Abstract: A method, apparatus, and article of manufacture are provided for detecting events based upon population density as a function of time and geographic location. Flow of population enables continuous movement to be distinguished from non-continuous movement. Accordingly, various types of events where people are gathering may be determined based upon the population flow and density.
    Type: Application
    Filed: August 15, 2008
    Publication date: February 18, 2010
    Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: Megumi Nakamura, Mika Saito, Shoko Suzuki
  • Publication number: 20090272894
    Abstract: A mass spectrometer includes an ionization chamber, a temperature control unit which controls the temperature in the ionization chamber to vaporize a sample in at least one of solid and liquid state in the ionization chamber, an introduction unit which introduces the sample into the ionization chamber, an ion supply unit which supplies ions to the ionization chamber to ionize, in the ionization chamber, the sample vaporized in the ionization chamber, and a mass analyzer which measures the mass of the molecules of the ionized sample.
    Type: Application
    Filed: April 28, 2009
    Publication date: November 5, 2009
    Applicant: CANON ANELVA TECHNIX CORPORATION
    Inventors: Yoshiro Shiokawa, Megumi Nakamura, Harumi Maruyama, Aiko Wada
  • Publication number: 20090266981
    Abstract: An internal standard material to be added to a specimen containing a material to be measured when measuring the content of the material to be measured by performing mass spectrometry on the specimen includes a hindered phenol compound.
    Type: Application
    Filed: April 14, 2009
    Publication date: October 29, 2009
    Applicant: Canon Anelva Technix Corporation
    Inventors: Yoshiro Shiokawa, Harumi Maruyama, Megumi Nakamura
  • Publication number: 20090266979
    Abstract: An ion attachment mass spectrometer includes an attached ion generation unit which generates attached ions by attaching positively charged metal ions to the molecules of a measurement target substance, and a mass spectrometry unit which performs mass spectrometry of the attached ions. The mass spectrometry unit includes a mass separation chamber to select attached ions having a specific mass number from the attached ions, an ionization chamber to dissociate the attached ions having the specific mass number, and a mass analysis chamber to analyze the dissociated ions.
    Type: Application
    Filed: April 21, 2009
    Publication date: October 29, 2009
    Applicant: CANON ANELVA TECHNIX CORPORATION
    Inventors: Megumi Nakamura, Yoshiro Shiokawa, Yasuyuki Taneda
  • Publication number: 20090247297
    Abstract: A virtual-space hazard assessment system, for use in a virtual space, having target identifying information that identifies a target that appears in the virtual space. The system includes: a hazard-rating-request receiver for receiving a hazard rating request to rate the degree of hazard of the target; hazard storage for storing a table in which the degree of hazard of the target and the target identifying information are associated with each other; a hazard-degree increasing mechanism for increasing the degree of hazard of the target stored in the table in the hazard storage according to the degree of hazard received by the hazard-rating-request receiver; a hazard-degree decreasing mechanism for decreasing the degree of hazard stored in the table in the hazard storage with the elapse of time; and hazard-information-output instructing mechanism for issuing an instruction to output hazard information stored in the hazard storage.
    Type: Application
    Filed: March 26, 2009
    Publication date: October 1, 2009
    Inventors: Megumi Nakamura, Mika Saito
  • Publication number: 20080178257
    Abstract: A system for recording an expected value which a hash value of each of a plurality of the components in this system should take on. The system further records in association with secret information an expected value of integrity information which serves as a condition for permitting access to the secret information. The system includes a register for storing integrity information for certifying the integrity of the components. In the system, a value computed by further inputting to a hash function the expected values which hash values of the components should take on is stored in the register as the integrity information before the components are started. Then, a hash value of a component newly started is computed, and the integrity information of the register is updated on condition that the computed hash value is different from the expected value.
    Type: Application
    Filed: January 20, 2007
    Publication date: July 24, 2008
    Inventors: Takuya Mishina, Seiji Munetoh, Megumi Nakamura, Sachiko Yoshihama
  • Publication number: 20070168677
    Abstract: A computer system with authentication means including a storage device where first conditions, second conditions, and authentication information relating to authentication means are stored; means for acquiring the first conditions and the second conditions when a user requests authentication; and means for selecting at least one of a plurality of authentication means from the storage device based on the acquired first conditions and the second conditions.
    Type: Application
    Filed: December 27, 2006
    Publication date: July 19, 2007
    Applicant: International Business Machines Corporation
    Inventors: Michiharu Kudo, Seiji Munetoh, Megumi Nakamura, Sachiko Yoshihama
  • Patent number: 7202474
    Abstract: An ion attachment mass spectrometry apparatus causing positively charged metal ions to attach to molecules of a gas to be measured in an attachment region to generate attached ions and then performing mass spectrometry on the attached ions by a mass spectrometer, has a metal ion selective disassociation unit for selectively making the metal ions attached to the specific molecules in the attachment region disassociate. By making the metal ions attached to the specific molecules such as H2O disassociate, a state is formed where the metal ions are attached to only the sample gas to be measured and the reliability of measurement of the gas is improved.
    Type: Grant
    Filed: March 22, 2006
    Date of Patent: April 10, 2007
    Assignee: Anelva Corporation
    Inventors: Yoshiki Hirano, Yoshiro Shiokawa, Harumi Maruyama, Megumi Nakamura
  • Publication number: 20060169888
    Abstract: An ion attachment mass spectrometry apparatus causing positively charged metal ions to attach to molecules of a gas to be measured in an attachment region to generate attached ions and then performing mass spectrometry on the attached ions by a mass spectrometer, has a metal ion selective disassociation unit for selectively making the metal ions attached to the specific molecules in the attachment region disassociate. By making the metal ions attached to the specific molecules such as H2O disassociate, a state is formed where the metal ions are attached to only the sample gas to be measured and the reliability of measurement of the gas is improved.
    Type: Application
    Filed: March 22, 2006
    Publication date: August 3, 2006
    Applicant: Anelva Corporation
    Inventors: Yoshiki Hirano, Yoshiro Shiokawa, Harumi Maruyama, Megumi Nakamura
  • Patent number: 7084397
    Abstract: An ion attachment mass spectrometry apparatus causing positively charged metal ions to attach to molecules of a gas to be measured in an attachment region to generate attached ions and then performing mass spectrometry on the attached ions by a mass spectrometer, has a metal ion selective disassociation unit for selectively making the metal ions attached to the specific molecules in the attachment region disassociate. By making the metal ions attached to the specific molecules such as H2O disassociate, a state is formed where the metal ions are attached to only the sample gas to be measured and the reliability of measurement of the gas is improved.
    Type: Grant
    Filed: March 31, 2004
    Date of Patent: August 1, 2006
    Assignee: Anelva Corporation
    Inventors: Yoshiki Hirano, Yoshiro Shiokawa, Harumi Maruyama, Megumi Nakamura
  • Patent number: 7015461
    Abstract: An apparatus for ion attachment mass spectrometry provided with an ion emitter for emitting positively charged metal ions, an ionization chamber for causing attachment of the metal ions to a gas to be detected, a third component gas introduction mechanism for introducing a third component gas into the ionization chamber, and a mass spectrometer for mass separation and detection of the detected gas with the metal ions attached. The third component gas introduction mechanism is provided with three types of third component gases and selectively introduces one type of third component gas from the three types of third component gases. Due to this, the occurrence of interference peaks due to macromers of third component gases with each other, macromers of third component gases and high concentration ingredients, etc. is prevented and accurate mass analysis made possible.
    Type: Grant
    Filed: December 21, 2001
    Date of Patent: March 21, 2006
    Assignee: Anelva Corporation
    Inventors: Yoshiro Shiokawa, Megumi Nakamura, Tohru Sasaki, Toshihiro Fujii
  • Patent number: 7005634
    Abstract: An ionization apparatus according to the present invention has a mechanism for causing metal ions emitted from an ion emitter to attach to an introduced target gas so as to generate ions of the sample gas and emits the ions of the sample gas to a mass spectrometer. The mass spectrometer has a zone in which one or both of an electric field and magnetic field are formed. As the electrode for causing the generation of cleaning plasma in the ionization zone generating the ions of the sample gas, the ion emitter is used. The ion emitter causes the generation of plasma in connection with a hollow vessel and removes deposits on components facing the ionization zone by the plasma. The plasma cleaning process is performed consecutively at a suitable timing after the ionization process. Due to the above configuration, deteriorated performance in ionization can be restored in a short time, a memory effect can be prevented, and accurate mass spectrometry becomes possible.
    Type: Grant
    Filed: March 22, 2002
    Date of Patent: February 28, 2006
    Assignee: Anelva Corporation
    Inventors: Yoshiro Shiokawa, Megumi Nakamura, Tohru Sasaki, Toshihiro Fujii
  • Publication number: 20040251408
    Abstract: An ion attachment mass spectrometry apparatus causing positively charged metal ions to attach to molecules of a gas to be measured in an attachment region to generate attached ions and then performing mass spectrometry on the attached ions by a mass spectrometer, has a metal ion selective disassociation unit for selectively making the metal ions attached to the specific molecules in the attachment region disassociate. By making the metal ions attached to the specific molecules such as H2O disassociate, a state is formed where the metal ions are attached to only the sample gas to be measured and the reliability of measurement of the gas is improved.
    Type: Application
    Filed: March 31, 2004
    Publication date: December 16, 2004
    Applicant: ANELVA Corporation
    Inventors: Yoshiki Hirano, Yoshiro Shiokawa, Harumi Maruyama, Megumi Nakamura
  • Patent number: 6800848
    Abstract: An apparatus for ion attachment mass spectrometry provided with a reaction chamber for causing positively charged metal ions to attach to a gas to be detected; a mass spectrometer for mass separation and detection of the detection gas; an analysis chamber in which the mass spectrometer is placed; differential evacuation chambers for connecting the reaction chamber and analysis chamber; a data processor for receiving and processing the mass signal from the mass spectrometer; and vacuum gauges for measuring the total pressure of the reduced pressure atmosphere of the reduced pressure atmosphere reaction chamber, a differential evacuation chamber, and an analysis chamber. The total pressure signal from the vacuum gauge measured during the measurement is input to one of the data processor, introduction mechanism, and evacuation mechanism.
    Type: Grant
    Filed: June 1, 2001
    Date of Patent: October 5, 2004
    Assignee: Anelva Corporation
    Inventors: Yoshiro Shiokawa, Megumi Nakamura, Tohru Sasaki, Toshihiro Fujii