Abstract: A data processing system 2 is used to perform processing operations to generate a result value. The processing circuitry which generates the result value has an error resistant portion 32 and an error prone portion 30. The probability of an error in operation of the error prone portion for a given set of operating parameters (clk, V) is greater than the probability of an error for that same set of operating parameters within the error resistant portion. Error detection circuitry 38 detects any errors arising in the error prone portion. Parameter control circuitry 40 responds to detected errors to adjust the set of operating parameters to maintain a non-zero error rate in the errors detected by the error detection circuitry. Errors within the one or more bits generated by the error prone portion are not corrected as the apparatus is tolerant to errors occurring within such bit values of the result value.

Abstract: An integrated circuit is provided with domino logic including a speculative node and a checker node. Precharged circuitry precharges both the speculative node and the checker node. Logic circuitry provides a discharge path for the speculative node and the checker node in dependence upon input signal values. Evaluation control circuitry first couples the speculative node to the logic circuitry and then subsequently couples the checker node to the logic circuitry such that these can be discharged if the input signals to the logic circuitry have appropriate values. Error detection circuitry detects an error when the speculative node and the checker node are not one of both discharged or both undischarged.

Abstract: An apparatus and method are provided for detecting an approaching error condition within a data processing apparatus. The data processing apparatus includes a second sequential storage structure which is arranged to latch the output signal generated by combinatorial circuitry dependent on a second clock signal. The second sequential storage structure has a main storage element to latch a value of the output signal for provision to subsequent combinatorial circuitry, and transition detection circuitry for detecting a change of the value of the output signal latched by the main storage element during a predetermined timing window, said change indicating an approaching error condition whilst the value stored in the main storage element is still correct. The second sequential storage structure can be operated in either a first mode of operation or a second mode of operation.

Abstract: An instruction processing pipeline 6 is provided. This has error detection and error recovery circuitry 20 associated with one or more of the pipeline stages. If an error is detected within a signal value within that pipeline stage, then it can be repaired. Part of the error recovery may be to flush upstream program instructions from the instruction pipeline 6. When multi-threading, only those instructions from a thread including an instruction which has been lost as a consequence of the error recovery need to be flushed from the instruction pipeline 6. Instruction can also be selected for flushing in dependence upon characteristics such as privileged level, number of dependent instructions etc.

Abstract: An integrated circuit is provided with domino logic including a speculative node and a checker node. Precharged circuitry precharges both the speculative node and the checker node. Logic circuitry provides a discharge path for the speculative node and the checker node in dependence upon input signal values. Evaluation control circuitry first couples the speculative node to the logic circuitry and then subsequently couples the checker node to the logic circuitry such that these can be discharged if the input signals to the logic circuitry have appropriate values. Error detection circuitry detects an error when the speculative node and the checker node are not one of both discharged or both undischarged.

Abstract: An integrated circuit is provided with domino logic including a speculative node and a checker node. Precharged circuitry precharges both the speculative node and the checker node. Logic circuitry provides a discharge path for the speculative node and the checker node in dependence upon input signal values. Evaluation control circuitry first couples the speculative node to the logic circuitry and then subsequently couples the checker node to the logic circuitry such that these can be discharged if the input signals to the logic circuitry have appropriate values. Error detection circuitry detects an error when the speculative node and the checker node are not one of both discharged or both undischarged.

Abstract: An electronic device is described which receives data from a transmitting device via a communications channel. The electronic device comprises digital processing circuitry arranged to process the data received via the communications channel to generate output data, error detection circuitry arranged to detect errors in the output data, and monitoring circuitry arranged to monitor the quality of digital processing conducted by the digital processing circuitry and generate digital performance data indicative of the monitored quality of digital processing. The electronic device also comprises control circuitry responsive to error information comprising errors detected by the error detection circuitry and the performance data generated by the monitoring circuitry to modify the operation of one or both of the transmitting device and the electronic device.

Abstract: A data processing apparatus is provided comprising processing circuitry for executing multiple program threads. At least one storage unit is shared between the multiple program threads and comprises multiple entries, each entry for storing a storage item either associated with a high priority program thread or a lower priority program thread. A history storage for retaining a history field for each of a plurality of blocks of the storage unit is also provided. On detection of a high priority storage item being evicted from the storage unit as a result of allocation to that entry of a lower priority storage item, the history field for the block containing that entry is populated with an indication of the evicted high priority storage item.

Abstract: To prevent short path errors from occurring in systems having error detection and recovery mechanisms, functional elements are combined to form compound functional units comprising at least two evaluation stages, each evaluation stage including at least one functional element. At least one functional element includes error detection/recovery circuitry. The flow of input values to the first evaluation stage in the compound functional unit is controlled so that the input values are changed at most every second clock cycle.

Abstract: An integrated circuit 2 is provided with a plurality of pipeline stages 10. These pipeline stages 10 have speculative processing control circuitry 12 which permits speculative processing in downstream pipeline stages and triggers a first error recovery operation (partial pipeline flushing) if such speculative processing is determined to be based upon an error. The pipeline stage 10 further includes speculative error detecting circuitry 14 which generates a prediction nc regarding whether or not the processing circuitry 18 will produce an error. This prediction is used to trigger a second error recovery operation (partial pipeline stall). This second error recovery operation has a lower performance penalty than the first error recovery operation.

Abstract: A data processing system comprising a memory array having a plurality of memory cells and read circuitry for reading a logic value stored in one of the plurality of memory cells. The read circuitry is operable perform two substantially simultaneous reads of the stored logic value. A voltage controller is provided and is operable to selectively vary a level of a supply voltage to the memory array. Detection circuitry is provided for detecting, in dependence upon the two substantially simultaneous reads, when the supply voltage level causes the read result to be unreliable.

Abstract: A memory circuit includes a memory cell, a pair of conducting lines operable to signal the logic state of the memory cell and read circuitry operable to perform a read operation by detecting a voltage level of at least one of the pair of conducting lines. The memory circuit includes a pull-down circuit having an on configuration in which it is operable to pull-down a voltage level of at least one of the pair of conducting lines so as to affect the read operation and an off-configuration in which the pull-down circuit cannot affect the read operation. Control circuitry is configured to control whether the pull-down circuit is in the on configuration or the off configuration. The memory circuit can be incorporated in a data processing apparatus and a method of operating a memory circuit is provided in which a pull-down circuit is controlled to be in an on configuration or in an off configuration.

Abstract: Interface circuitry is provided for coupling between a memory device and processing circuitry, the processing circuitry issuing a plurality of access signals relating to accesses to be performed in the memory device. The interface circuitry comprises write address latch circuitry for storing a write address signal, and write address decoder circuitry that is responsive to a set first enable signal to decode the write address signal provided from the write address latch circuitry. Further, read address latch circuitry is provided for storing a read address signal issued by the processing circuitry, and read address decoder circuitry is responsive to a set second enable signal for decoding the read address signal provided from the read address latch circuitry. Decoder select latch circuitry is responsive to an access type indication signal from the processing circuitry to generate the first and second enable signals in dependence on that access type indication signal.

Abstract: The application discloses a means of setting tuning limits for operational parameters in a processing stage within a data processing apparatus for processing a signal.

Abstract: An integrated circuit (2) is provided with error detection circuitry (10,12) and error repair circuitry (14). Error tolerance circuitry (16) is responsive to a control parameter to selectively disable the error repair circuitry (14). The control parameter is dependent on the processing performed within the circuit. For example, the control parameter may be generated in dependence upon the program instruction being executed, the output signal value which is in error, the previous behaviour of the circuit or in other ways.

Abstract: An integrated circuit 2 is provided with domino logic including a speculative node 22 and a checker node 24. Precharged circuitry 36 precharges both the speculative node and the checker node. Logic circuitry 26 provides a discharge path for the speculative node and the checker node in dependence upon input signal values. Evaluation control circuitry 28, 30 first couples the speculative node to the logic circuitry and then subsequently couples the checker node to the logic circuitry such that these can be discharged if the input signals to the logic circuitry 26 have appropriate values. Error detection circuitry 32 detects an error when the speculative node and the checker node are not one of both discharged or both undischarged.

Abstract: Interface circuitry is provided for coupling between a memory device and processing circuitry, the processing circuitry issuing a plurality of access signals relating to accesses to be performed in the memory device. The interface circuitry comprises write address latch circuitry for storing a write address signal, and write address decoder circuitry that is responsive to a set first enable signal to decode the write address signal provided from the write address latch circuitry. Further, read address latch circuitry is provided for storing a read address signal issued by the processing circuitry, and read address decoder circuitry is responsive to a set second enable signal for decoding the read address signal provided from the read address latch circuitry. Decoder select latch circuitry is responsive to an access type indication signal from the processing circuitry to generate the first and second enable signals in dependence on that access type indication signal.

Abstract: An integrated circuit includes processing pipeline stages formed of an input register, processing circuit and an output register. The output register employs speculative sampling and uses a subsequent speculation period during which any change in its input is detected and used to indicate a speculation error. In order to reduce the chances of a race condition giving rise to a false positive detection of a speculation error due to a too rapid signal propagation through the processing circuitry a transparent latch is disposed at the approximate midpoint, measured in terms of propagation delay, within the processing circuitry. This transparent latch is non-transmissive during the speculation period of the output register so as to prevent any new signal propagating from the input register during the speculation period from reaching the output register.

Abstract: Transition detection circuitry for detecting during multiple clock cycles, transitions occurring within a detection period in each of said multiple clock cycles at a plurality of nodes within a circuit is disclosed. The transition detection circuitry comprises: a clock signal generator for generating a detection clock signal from a clock signal clocking a sampling element within said circuit, said detection clock signal defining said detection period; a plurality of transition detectors for detecting transitions at respective ones of said plurality of nodes during said detection period, each of said plurality of transition detectors being clocked by said detection clock signal; and combining circuitry for combining said detected transitions output by said plurality of transition detectors to generate a composite transition detection signal.

Abstract: An integrated circuit 2 has a specified range of runtime-variable operating parameters. Data processing circuits 4 within the integrated circuit 2 have associated error detection and error repair mechanisms 6. When operating within a narrow typical-case range of runtime-variable operating parameters the data processing circuits 4 operate correctly and substantially without error. When operating outside of this typical-case range but inside the specified range of permitted values for the run-time variable operating parameters, then the error detection and error repair circuit 6 operate to repair the errors which occur.