Abstract: Semiconductor device circuits and methods are provided for adjusting core processor performance and energy-efficiency based on usage metrics. Metric detection, performance state selection, and adjustment are done in digital logic hardware without intervening input from system software or firmware, thus greatly speeding the processor performance adjustment. Mapping usage and state information to desired processor power-performance states is also provided in circuitry rather than firmware or power control software. The mapping values may be programmable software or firmware, but detection, selection, and adjustment occur automatically in hardware without intervening input from firmware or software.

Abstract: A performance control technique for a processing system that includes one or more adaptively-clocked processor cores provides improved performance/power characteristics. An outer feedback loop adjusts the power supply voltage(s) provided to the power supply voltage domain(s) powering the core(s), which may be on a per-core basis or include multiple cores per voltage domain. The outer feedback loop operates to ensure that each core is meeting specified performance, while the cores also include an inner feedback loop that adjusts their processor clock or other performance control mechanism to maximize performance under present operating conditions and within a margin of safety. The performance of each core is measured and compared to a target performance. If the target performance is not met for each core in a voltage domain, the voltage is raised for the voltage domain until all cores meet the target performance.

Abstract: A system for identifying a subset of sensors to sample to reduce the frequency of sensor access. The system determines rise times and records values for the sensors in the system. A time criticality of the sensors is determined based on the rise times. The system processes the sensors by first creating sensor subsets based on one or more constraints on the sensors. The system monitors the values of the sensors in a sensor subset and flags a sensor when it makes a determination that, prior to a next scheduled sampling of the sensor subset, the value of a sensor in the monitored sensor subset will exceed a threshold constraint. The system moves those flagged sensors to a second sensor subset which complies with the sensor's constraints.

Abstract: Managing operations associated with one or more voltage changes and one or more frequency changes. A voltage change request and a frequency change request are associated with dynamic voltage and frequency scaling (DVFS) operations. The DVFS operations are transmitted by the processors to be executed by one or more direct current assemblies. A sequence associated with the one or more voltage changes and a sequence associated with the one or more frequency changes are detected by the system. The sequences are dynamically modified to enable insertion of an additional voltage change, whereby the additional voltage change indicates completion of one or more previous voltage change requests. Completion of the voltage change request enables one or more subsequent voltage change requests to be processed. When a voltage change request is not successfully completed one or more future voltage changes are suspended.

Abstract: Monitoring temperature excursions an assembly experiences over a life of the assembly is provided. A determination is made as to whether the assembly has been in service beyond a predetermined end of life objective. Responsive to the assembly failing to be in service beyond the predetermined end of life objective, a new temperature value associated with the assembly is read. A modifier value for a figure of merit (FOM) value is computed and added to a cumulative figure of merit value. The cumulative figure of merit value is compared to a cumulative stress figure of merit budget. Responsive to the cumulative figure of merit value exceeding the cumulative stress figure of merit budget, an identified stress management solution is implemented.

Abstract: A mechanism is provided for unified management of power, performance, and thermals in computer systems. This mechanism incorporates elements to effectively address all aspects of managing computing systems in an integrated manner, instead of independently. The mechanism employs an infrastructure for real-time measurements feedback, an infrastructure for regulating system activity, component operating levels, and environmental control, a dedicated control structure for guaranteed response/preemptive action, and interaction and integration components. The mechanism provides interfaces for user-level interaction. The mechanism also employs methods to address power/thermal concerns at multiple timescales. In addition, the mechanism improves efficiency by adopting an integrated approach, rather than treating different aspects of the power/thermal problem as individual issues to be addressed in a piecemeal fashion.

Abstract: An aspect of the present invention improves the accuracy of measuring processor utilization of multi-threaded cores by providing a calibration facility that derives utilization in the context of the overall dynamic operating state of the core by assigning weights to idle threads and assigning weights to run threads, depending on the status of the core. From previous chip designs it has been established in a Simultaneous Multi Thread (SMT) core that not all idle cycles in a hardware thread can be equally converted into useful work. Competition for core resources reduces the conversion efficiency of one thread's idle cycles when any other thread is running on the same core.

Abstract: Disclosed are systems, methods, and computer program products for managing power states in processors of a data processing system. In one embodiment, the invention is directed to a data processing system having dynamically configurable power-performance states (“pstates”). The data processing system includes a processor configured to operate at multiple states of frequency and voltage. The data processing system also has a power manager module configured to monitor operation of the data processing system. The data processing system further includes a pstates table having a plurality of pstate definitions, wherein each pstate definition includes a voltage value, a frequency value, and at least one unique pointer that indicates a transition from a given pstate to a different pstate.

Abstract: A mechanism is provided for using a power proxy unit combined with on-chip actuators to meet a defined power target value identifying a target power consumption of a component of a data processing system. A power manager in the data processing system identifies a proxy power threshold value, for the defined power target value, identifying a maximum power usage for the component, and a power usage estimate value identifying a current power usage estimate for the component. The power manager sends a set of signals to one or more on-chip actuators in the power proxy unit associated with the component in response to the power usage estimate value being greater than the power proxy threshold value. The one or more on-chip actuators adjusts a set of operational parameters associated with the component in order to meet the defined power target value.

Abstract: The embodiments provide an assigned counter of a first set of counters and stores a value for an activity of a set of activities forming a set of stored values. The value comprises the count multiplied by a weight factor specific to the activity. A power manager manages the first set of counters, receives a set of activities to be monitored for a unit, groups the portion into subsets based on at least one of a frequency of occurrence of each activity and power consumption for each activity, sums the stored values corresponding to each activity in each subset to reach a total value for each subset, multiplies the total value of each subset by factor corresponding to the subset to form a scaled value for each subset, and sums the scaled value of each subset to form a power usage value.

Abstract: A mechanism is provided for internally controlling and enhancing logic built-in self test in a multiple core microprocessor. The control core may use architectural support for scan and external scan communication (XSCOM) to independently test the other cores while adjusting their frequency and/or voltage. A program loaded onto the control core may adjust the frequency and configure the LBIST to run on each of the cores under test. Once LBIST has completed on a core under test, the control core's program may evaluate the results and decide a next test to run for that core. For isolating failing latch positions, the control core may iteratively configure the LBIST mask and sequence registers on the core under test to determine the location of the failing latch. The control core may control the LBIST stump masks to isolate the failure to a particular latch scan ring and then position within that ring.

Abstract: Semiconductor device circuits and methods are provided for adjusting core processor performance based on usage metrics. Metric detection and adjustment are performed in digital logic hardware guided by registers providing maximum and minimum frequency settings, without intervening input from system software or firmware, thus greatly speeding the processor performance adjustment. Power-performance drivers provide applications or the operating system ability to specify maximum and minimum frequency requirements.

Abstract: A mechanism is provided for internally controlling and enhancing advanced test and characterization in a multiple core microprocessor. To decrease the time needed to test a multiple core chip, the mechanism uses micro-architectural support that allows one core, a control core, to run a functional program to test the other cores. Any core on the chip can be designated to be the control core as long as it has already been tested for functionality at one safe frequency and voltage operating point. An external testing device loads a small program into the control core's dedicated memory. The program functionally running on the control core uses micro-architectural support for functional scan and external scan communication to independently test the other cores while adjusting the frequencies and/or voltages of the other cores until failure. The control core may independently test the other cores by starting, stopping, and determining pass/fail results.

Abstract: Semiconductor device circuits and methods are provided for adjusting core processor performance and energy-efficiency based on usage metrics. Metric detection, performance state selection, and adjustment are done in digital logic hardware without intervening input from system software or firmware, thus greatly speeding the processor performance adjustment. Mapping usage and state information to desired processor power-performance states is also provided in circuitry rather than firmware or power control software. The mapping values may be programmable software or firmware, but detection, selection, and adjustment occur automatically in hardware without intervening input from firmware or software.

Abstract: Monitoring temperature excursions an assembly experiences over a life of the assembly is provided. A determination is made as to whether the assembly has been in service beyond a predetermined end of life objective. Responsive to the assembly failing to be in service beyond the predetermined end of life objective, a new temperature value associated with the assembly is read. A modifier value for a figure of merit (FOM) value is computed and added to a cumulative figure of merit value. The cumulative figure of merit value is compared to a cumulative stress figure of merit budget. Responsive to the cumulative figure of merit value exceeding the cumulative stress figure of merit budget, an identified stress management solution is implemented.

Abstract: Mitigating effects of delamination of components in the data processing system is provided. A signal is received from one or more sensors in the data processing system. A determination is made as to whether the signal indicates that one threshold in a plurality of thresholds has been reached or exceeded. Responsive to the signal indicating that one threshold in the plurality of thresholds has been reached or exceeded, a determination is made as to whether the one threshold is a low temperature threshold or a high temperature threshold. Responsive to the one threshold being a low temperature threshold, one of a plurality of actions is initiated to increase a temperature of the data processing system thereby mitigating effects of delamination of the components in the data processing system.

Abstract: A circuit for dynamically monitoring the operation of an integrated circuit under differing temperature, frequency, and voltage (including localized noise and droop), and for detecting early life wear-out mechanisms (e.g., NBTI, hot electrons).

Abstract: A weighted event counting system and method for processor performance measurements provides low latency and low error performance measurement capability. A weighted performance counter accumulates a performance count according to a plurality of event signals provided from functional units in the processor. Differing weights are applied to the event signals in according to the correlation between each event with processor performance. The weights may be provided from programmable registers, so that the weights can be adjusted under program control. The event signals may be combined to reduce the bit-width of the set of event signal, with mutually-exclusive events merged in single fields of the combinatorial result and events having the same weights merged according to a sub-total. The weights are applied to the combinatorial result and used to update a performance count. The performance count can then be used by power management software or hardware to make adjustments in operating parameters of the processor.

Abstract: A system for identifying a subset of sensors to sample to reduce the frequency of sensor access. The system determines rise times and records values for the sensors in the system. A time criticality of the sensors is determined based on the rise times. The system processes the sensors by first creating sensor subsets based on one or more constraints on the sensors. The system monitors the values of the sensors in a sensor subset and flags a sensor when it makes a determination that, prior to a next scheduled sampling of the sensor subset, the value of a sensor in the monitored sensor subset will exceed a threshold constraint. The system moves those flagged sensors to a second sensor subset which complies with the sensor's constraints.

Abstract: A system for identifying a subset of sensors to sample to reduce the frequency of sensor access. The system determines rise times and records values for the sensors in the system. A time criticality of the sensors is determined based on the rise times. The system processes the sensors by first creating sensor subsets based on one or more constraints on the sensors. The system monitors the values of the sensors in a sensor subset and flags a sensor when it makes a determination that, prior to a next scheduled sampling of the sensor subset, the value of a sensor in the monitored sensor subset will exceed a threshold constraint. The system moves those flagged sensors to a second sensor subset which complies with the sensor's constraints.