Abstract: A correlated double sampling circuit includes a delta-sigma modulator, a selection circuit, and an accumulation circuit. The delta-sigma modulator is configured to receive an input signal, delta-sigma modulate the input signal, and output a modulation signal. The selection circuit is configured to invert the modulation signal and selectively output one of the modulation signal and an inverted modulation signal in response to a selection signal corresponding to an operation phase. The accumulation circuit is configured to generate a first accumulation result by performing an accumulation process on one of the modulation signal and the inverted modulation signal in a first operation phase, and generate a second accumulation result by performing the accumulation process on the first accumulation result and the other one of the modulation signal and the inverted modulation signal in a second operation phase.

Abstract: An amplifier is provided. The amplifier includes a differential amplifier including a tail, a current mirror connected between output terminals of the differential amplifier and a power line receiving a supply voltage, and a first switching circuit for connecting and disconnecting one of the output terminals of the differential amplifier to and from the tail in response to a first switching signal.

Abstract: Example embodiments are directed to an analog-to-digital converter (ADC) that controls a gain by changing a system parameter, an image sensor including the ADC and a method of operating the ADC. The ADC includes a sigma-delta modulator which receives an input signal and a clock signal and sigma-delta modulates the input signal into a digital output signal based on the clock signal and an accumulation unit which accumulates the digital output signal at each cycle of the clock signal according to an analog-to-digital conversion time and outputs an accumulation result. A system parameter is varied during the analog-to-digital conversion time to control a gain of the ADC.

Abstract: A correlated double sampling (CDS) circuit is provided. The CDS circuit is configured to perform a CDS on a reset signal and an image signal during a CDS phase respectively. The CDS circuit includes a sampling circuit configured to output a difference between a correlated double sampled reset signal and a correlated double sampled image signal, and a feedback unit configured to feedback the difference output from the sampling circuit during a PGA phase to an input of the sampling circuit.

Abstract: An analog-digital converter (ADC) includes a correlated double sampling (CDS) circuit configured to perform CDS on each of a reset signal and an image signal output from a pixel to generate a correlated double sampled reset signal and a correlated double sampled image signal, respectively. A delta sigma (??) ADC, also included in the ADC, is configured to output a difference between a first digital code that is generated by performing ?? analog-digital conversion on the correlated double sampled reset signal and a second digital code that is generated by performing ?? analog-digital conversion on the correlated double sampled image signal.

Abstract: In one embodiment, the ADC includes a modulator configured to generate a symbol sequence, an operand generator configured to generate operands, and a selector configured to selectively output at least one of (1) a reference value and (2) at least one of the operands based on the symbol sequence. The ADC further includes an accumulator configured to accumulate output from the selector.

Abstract: A two-path sigma-delta analog-to-digital converter and an image sensor including the same are provided. The two-path sigma-delta analog-to-digital converter includes at least one integrator configured to integrate a first integrator input signal during a second half cycle of a clock signal and integrate a second integrator input signal during a first half cycle of the clock signal by using a single operational amplifier; a quantizer configured to quantize integrated signals from the at least one integrator and output a first digital signal and a second digital signal; and a feedback loop configured to feed back the first and second digital signals to an input of the at least one integrator. A first analog signal and a second analog signal respectively input from two input paths are respectively converted to the first and second digital signals using the single operational amplifier, thereby increasing power efficiency and reducing an area.

Abstract: An image sensor comprises a plurality of pixel units connected to a column line, a signal process circuit configured to process a signal output from the column line according to a switching operation, and a kick-back noise blocking circuit configured to reduce kick-back noise caused by the switching operation. Each of the pixel units includes a photoelectric conversion element. The kick-back noise blocking circuit is connected between the column line and the signal process circuit.

Abstract: The analog-digital converter (ADC) includes a modulator and a digital integrator. The modulator is configured to modulate an input signal and output a modulated signal. The digital integrator includes a plurality of accumulators serially connected to one another. The digital integrator is configured to integrate the modulated signal to output an integration result.

Abstract: Provided are a pixel sensor array and a complementary metal-oxide semiconductor (CMOS) image sensor including the same. The pixel sensor array includes a photoelectric transformation element configured to generate electric charges in response to incident light. A signal transmitting circuit is configured to output the electric charges accumulated in the photoelectric transformation element to a first node based on a first control signal, change an electric potential of the first node to an electric potential of a second signal line based on a second control signal, and output a signal sensed in the first node to a first signal line based on a third control signal. A switch element is configured to connect a supply power terminal to the second signal line based on a fourth control signal. A comparator connected to the first signal line and the second signal line and configured to compare a voltage of the signal and a voltage of a reference signal.

Abstract: Provided are a storage node, phase change memory device and methods of manufacturing and operating the same. The storage node may include an electrode, a phase change layer, and an anti-diffusion layer between the electrode and the phase change layer and including a silicide compound. The phase change memory device may include the storage node and a switching device connected to the storage node.

Abstract: A time-interleaved bandpass delta-sigma modulator is developed which includes a first adder and a second adder and a comparator. An input signal is transmitted to the first adder according to the clock frequency of each channel block, and an n channel block output un of the first adder is transmitted to the first adder and the second adder of an n+2 channel block, and an n block output vn of the second adder is transmitted to the second adder of an n+2 block, and an output yn that passes through an n block comparator is transmitted to the first adder and the second adder of an n+2 block. Therefore, a modulator sequentially receives output from the comparator of each block for generating the final output y.

Abstract: A time-interleaved bandpass delta-sigma modulator is developed which includes a first adder and a second adder and a comparator. An input signal is transmitted to the first adder according to the clock frequency of each channel block, and an n channel block output un of the first adder is transmitted to the first adder and the second adder of an n+2 channel block, and an n block output vn of the second adder is transmitted to the second adder of an n+2 block, and an output yn that passes through an n block comparator is transmitted to the first adder and the second adder of an n+2 block. Therefore, a modulator sequentially receives output from the comparator of each block for generating the final output y.