Abstract: The invention provides a cyclobutanetetracarboxylate compound of general formula (I) and a preparation method thereof: in which R and R1 are as defined in the specification.

Abstract: The invention provides a cyclobutanetetracarboxylate compound of general formula (I) and a preparation method thereof: in which R and R1 are as defined in the specification.

Abstract: A computer system has an input system and an output system. Program code to be debugged has a plurality of program code statements. The input system is utilized to indicate an error variable in the program code. The error variable has an error value that differs from a desired value. An error set of the error variable is obtained, which is a subset of the statements in the computer readable code. Each statement in the error set is relationally connected to the error variable. A priority value is given to each statement in the error set. The priority values indicate a computed probability that the associated statement is an error source of the error variable. Finally, the output system is used to present each statement in the error set in an ordered manner according to the priority values.

Abstract: A computer system has an input system and an output system. Program code to be debugged has a plurality of program code statements. The input system is utilized to indicate an error variable in the program code. The error variable has an error value that differs from a desired value. An error set of the error variable is obtained, which is a subset of the statements in the computer readable code. Each statement in the error set is relationally connected to the error variable. A priority value is given to each statement in the error set. The priority values indicate a computed probability that the associated statement is an error source of the error variable. Finally, the output system is used to present each statement in the error set in an ordered manner according to the priority values.

Abstract: A method for determining test coverage of an original high level language description which represents an electrical circuit by the data of at least one dump file exported by a simulation program, the original high level description having at least one executable assignment statement which models the circuit, the at least one executable assignment statement having a left side and a right side separated by an assignment operator, the left side being a variable, and the right side being an expression which has a set of at least one variable and at least one logic operator, the expression on the right side, when evaluated, determining a value to be assigned to the variable on the left side, the data of the dump file consisting of the values of all the variables of the originals high level language description between a simulation start time instant and a simulation end time instant the method comprising: a description importing step for importing the original high level language description to form a design data

Abstract: Start and stop signals are obtained from a user, with associated start and stop times, as well as circuit simulation results. The simulation results are utilized to determine which of the components in the circuit are active components, which are any components that have an active output signal. Active output signals obtain a state between the start and stop times in response to a state change of the start signal. The user output equipment is utilized to provide the active components and the active output signals to the user. Signal activity is presented in a graphical form that shows the active path circuit, and active value changes that cause output signals to become active. The user may select time values at which signals become active to see in a graphical manner the propagation of a start signal state change through the circuit.

Abstract: HDL code is used to describe a circuit in an HDL code debugger on a computer system. Circuit simulation data is obtained for the circuit, the simulation data being generated according to the HDL code. A circuit execution time is selected, and the simulation data should at least span the circuit execution time. A debugging element is selected, which is a circuit element in the circuit having a debugging state at the circuit execution time according to the simulation data. A target line of HDL code is then presented to a user. The target line of HDL code is the line of code responsible for setting the debugging element into the debugging state at the circuit execution time.

Abstract: HDL code is used to describe a circuit in an HDL code debugger on a computer system. Circuit simulation data is obtained for the circuit, the simulation data being generated according to the HDL code. A circuit execution time is selected, and the simulation data should at least span the circuit execution time. A debugging element is selected, which is a circuit element in the circuit having a debugging state at the circuit execution time according to the simulation data. A target line of HDL code is then presented to a user. The target line of HDL code is the line of code responsible for setting the debugging element into the debugging state at the circuit execution time.

Abstract: A method for preparing a superconductor sputtering target is disclosed in which sputtering targets for coating superconductor films can be prepared essentially by mixing oxides (carbonates or fluorides) of metals such as Y, Ba, Cu (Bi, Pb), Sr, Ca,Cu) with the atomic ratio of individual elements be controlled in a specific range, an oxide superconductor paste being prepared by blending an organic binder and an organic solvent according to a specific solid percentage, and a metal such as aluminum being used as the substrate; by scraping with a squeegee and adjusting the distance between a stencil and the substrate such that the superconductor paste seeps through a mesh to be printed on the substrate and then dried; after scraping, screen-printing and drying having been repeated several times, the substrate being placed into an oven and heated to a temperature of 400.degree.-450.degree. C., at a rate of less than 5.degree. C.