Patents by Inventor Minoru Yamazaki

Minoru Yamazaki has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10384381
    Abstract: When a plurality of striped molded products are molded at a time, the molded products having a striped pattern and an outstanding design property are obtained by preventing part of molten resins from being unevenly distributed in an inappropriate manner when being fed into a cavity of a metal mold. A hot runner nozzle is provided with a first resin flow path and a plurality of second resin flow paths. The first flow path has a funnel section which continues with a nozzle gate at a centripetal position and which allows a first molten resin to be gathered at the centripetal position of the funnel section so as to feed the resin into the nozzle gate. The second resin flow paths have a plurality of corresponding discharge ports facing and communicating with the funnel section of the first resin flow path, each of the discharge ports being disposed around the centripetal position, so that the second molten resin different from the first molten resin is fed into the funnel section.
    Type: Grant
    Filed: September 17, 2014
    Date of Patent: August 20, 2019
    Assignee: Nissei Plastic Industrial Co., Ltd.
    Inventors: Yasuhiko Takeuchi, Minoru Yamazaki, Yoshiharu Yanagimachi, Kouichi Shimizu
  • Publication number: 20190172676
    Abstract: A charged particle beam apparatus with reduced frequency of lens resetting operations and thus with improved throughput. The apparatus includes an electron source configured to generate an electron beam, an objective lens to which coil current is adapted to be applied to converge the electron beam on a sample, a focal position adjustment device configured to adjust the focal position of the electron beam, a detector configured to detect electrons from the sample, a display unit configured to display an image of the sample in accordance with a signal from the detector, a storage unit configured to store information on the hysteresis characteristics of the objective lens, and an estimation unit configured to estimate a magnetic field generated by the objective lens on the basis of the coil current, the amount of adjustment of the focal position by the focal position adjustment device, and the information on the hysteresis characteristics.
    Type: Application
    Filed: November 8, 2018
    Publication date: June 6, 2019
    Inventors: Tomohito NAKANO, Toshiyuki YOKOSUKA, Yuko SASAKI, Minoru YAMAZAKI, Yuzuru MOCHIZUKI
  • Publication number: 20190157667
    Abstract: The present invention relates to lithium composite oxide particles which can be produced by mixing nickel-cobalt-manganese-based compound particles, a zirconium raw material and a lithium raw material with each other and then calcining the resulting mixture, and comprise a Zr compound that is allowed to be present on a surface thereof, in which the Zr compound is represented by the chemical formula: Lix(Zr1-yAy)Oz wherein x, y and z are 2.0?x?8.0; 0?y?1.0; and 2.0?z?6.0, respectively, and a content of Zr in the lithium composite oxide particles is 0.05 to 1.0% by weight. By using the lithium composite oxide particles as a positive electrode active substance, it is possible to produce a lithium ion secondary battery that has a low electric resistance at a high temperature, and is excellent in cycle characteristic at a high temperature as well as high-temperature rate characteristic.
    Type: Application
    Filed: December 18, 2018
    Publication date: May 23, 2019
    Inventors: Minoru Yamazaki, Osamu Sasaki, Shoichi Fujino, Hideharu Mitsui, Takayuki Yamamura, Kunihiro Uramatsu, Akihisa Kajiyama, Ryuta Masaki
  • Publication number: 20180269026
    Abstract: The objective of the present invention is to provide a charged particle beam device wherein scanning is performed through a scanning pattern that may suppress the influence from charge accumulation without having to perform blanking. In order to achieve this objective, a charged particle beam device is proposed wherein a first scan line is scanned by deflecting a charged particle beam in a first direction. The charged particle beam is deflected in a manner where the ending point of the first scan line is connected to the scan starting point of a second scan line which is arranged to be parallel to the first scan line so as to draw a scanning trajectory, thereby modifying the scan line position. The second scan line is scanned by scanning the charged particle beam from the scan starting point of the second scan line toward a second direction that is opposite to the first direction.
    Type: Application
    Filed: September 29, 2015
    Publication date: September 20, 2018
    Inventors: Shahedul HOQUE, Hajime KAWANO, Yoshinori MOMONOI, Hideki ITAI, Minoru YAMAZAKI, Hiroshi NISHIHAMA
  • Patent number: 10046493
    Abstract: A thin multilayer container having favorable gas barrier properties is provided using a technique applicable to the molding of the thin multilayer container, by means of ensuring the gas barrier properties at a joint of ends of a film, when the container is molded with disposing the film having the gas barrier properties in a portion to be a container trunk portion. When molding the container with disposing in advance the film having the gas barrier properties in the portion to be the container trunk portion, while a container surface resin is fed from an injection molding nozzle into a container trunk forming portion of a mold, a gas barrier resin is fed into a position corresponding the joint of the label film as an intermediate layer between a portion of the container surface resin being spread along a core mold and a portion of the container surface resin being spread along a cavity mold.
    Type: Grant
    Filed: May 10, 2016
    Date of Patent: August 14, 2018
    Assignee: NISSEI PLASTIC INDUSTRIAL CO., LTD.
    Inventors: Minoru Yamazaki, Yasuhiko Takeuchi, Hiromitsu Miyajima
  • Patent number: 9640366
    Abstract: The present invention has for its object to provide a charged particle beam irradiation method and a charged particle beam apparatus which can suppress unevenness of electrification even when a plurality of different kinds of materials are contained in a pre-dosing area or degrees of density of patterns inside the pre-dosing area differs with positions. To accomplish the above object, a charged particle beam irradiation method and a charged particle beam apparatus are provided according to which the pre-dosing area is divided into a plurality of divisional areas and electrifications are deposited to the plural divisional areas by using a beam under different beam irradiation conditions.
    Type: Grant
    Filed: February 9, 2011
    Date of Patent: May 2, 2017
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Toshiyuki Yokosuka, Minoru Yamazaki, Hideyuki Kazumi, Kazutami Tago
  • Patent number: 9627171
    Abstract: An objective of the present invention is to provide a charged particle beam device with which information based on a charged particle which is discharged from a bottom part of high-aspect structure is revealed more than with previous technology. To achieve the objective, proposed is a charged particle beam device comprising: a first orthogonal electromagnetic field generator which deflects charged particles which are discharged from a material; a second orthogonal electromagnetic field generator which further deflects the charged particles which are deflected by the first orthogonal electromagnetic field generator; an aperture forming member having a charged particle beam pass-through aperture; and a third orthogonal electromagnetic field generator which deflects the charged particles which have passed through the aperture forming member.
    Type: Grant
    Filed: June 10, 2013
    Date of Patent: April 18, 2017
    Assignee: HITACHI HIGH-TECHNOLOGIES CORPORATION
    Inventors: Hiroshi Makino, Hideyuki Kazumi, Minoru Yamazaki, Yuzuru Mizuhara, Miki Isawa
  • Publication number: 20160339617
    Abstract: A thin multilayer container having favorable gas barrier properties is provided using a technique applicable to the molding of the thin multilayer container, by means of ensuring the gas barrier properties at a joint of ends of a film, when the container is molded with disposing the film having the gas barrier properties in a portion to be a container trunk portion. When molding the container with disposing in advance the film having the gas barrier properties in the portion to be the container trunk portion, while a container surface resin is fed from an injection molding nozzle into a container trunk forming portion of a mold, a gas barrier resin is fed into a position corresponding the joint of the label film as an intermediate layer between a portion of the container surface resin being spread along a core mold and a portion of the container surface resin being spread along a cavity mold.
    Type: Application
    Filed: May 10, 2016
    Publication date: November 24, 2016
    Inventors: Minoru YAMAZAKI, Yasuhiko TAKEUCHI, Hiromitsu MIYAJIMA
  • Patent number: 9502212
    Abstract: An object of the present invention is to provide a method and an apparatus capable of measuring a potential of a sample surface by using a charged particle beam, or of detecting a compensation value of a variation in an apparatus condition which changes due to sample charging, by measuring a sample potential caused by irradiation with the charged particle beam. In order to achieve the object, a method and an apparatus are provided in which charged particle beams (2(a), 2(b)) emitted from a sample (23) are deflected by a charged particle deflector (33) in a state in which the sample (23) is irradiated with a charged particle beam (1), and information regarding a sample potential is detected by using a signal obtained at that time.
    Type: Grant
    Filed: January 22, 2014
    Date of Patent: November 22, 2016
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Yuzuru Mizuhara, Miki Isawa, Minoru Yamazaki, Hitoshi Tamura, Hideyuki Kazumi
  • Patent number: 9381689
    Abstract: At a filling termination stage when performing multi-layer molding by means of a hot runner nozzle, an intermediate layer in a multi-layer molded article is prevented from being formed in a shape causing the intermediate layer to enter into a sprue in a portion of a mold cavity in a mold corresponding to the sprue. The multi-layer molded article with no intermediate layer being exposed in a sprue cut portion can be therefore obtained. In this manner, a diameter of a discharge port opening and closing mechanism part for opening and closing the resin discharge ports in the shut pin is made different from a diameter of a nozzle gate opening and closing mechanism part configured of the projection for pushing out the molten resin in the nozzle gate.
    Type: Grant
    Filed: June 27, 2014
    Date of Patent: July 5, 2016
    Assignee: Nissei Plastic Industrial Co., Ltd.
    Inventors: Yasuhiko Takeuchi, Minoru Yamazaki, Kouichi Shimizu
  • Publication number: 20150357153
    Abstract: An objective of the present invention is to provide a charged particle beam device with which information based on a charged particle which is discharged from a bottom part of high-aspect structure is revealed more than with previous technology. To achieve the objective, proposed is a charged particle beam device comprising: a first orthogonal electromagnetic field generator which deflects charged particles which are discharged from a material; a second orthogonal electromagnetic field generator which further deflects the charged particles which are deflected by the first orthogonal electromagnetic field generator; an aperture forming member having a charged particle beam pass-through aperture; and a third orthogonal electromagnetic field generator which deflects the charged particles which have passed through the aperture forming member.
    Type: Application
    Filed: June 10, 2013
    Publication date: December 10, 2015
    Inventors: Hiroshi MAKINO, Hideyuki KAZUMI, Minoru YAMAZAKI, Yuzuru MIZUHARA, Miki ISAWA
  • Publication number: 20150348748
    Abstract: An object of the present invention is to provide a method and an apparatus capable of measuring a potential of a sample surface by using a charged particle beam, or of detecting a compensation value of a variation in an apparatus condition which changes due to sample charging, by measuring a sample potential caused by irradiation with the charged particle beam. In order to achieve the object, a method and an apparatus are provided in which charged particle beams (2(a), 2(b)) emitted from a sample (23) are deflected by a charged particle deflector (33) in a state in which the sample (23) is irradiated with a charged particle beam (1), and information regarding a sample potential is detected by using a signal obtained at that time.
    Type: Application
    Filed: January 22, 2014
    Publication date: December 3, 2015
    Inventors: Yuzuru MIZUHARA, Miki ISAWA, Minoru YAMAZAKI, Hitoshi TAMURA, Hideyuki KAZUMI
  • Patent number: 9159529
    Abstract: It is an object of the present invention to provide a scanning electron microscope for discriminating an angle of an electron ejected from a sample without providing an opening for restricting the angle at outside of an axis. In order to achieve the object described above, there is proposed a scanning electron microscope which includes a deflector to deflect an irradiating position of an electron beam, and a control unit to control the deflector, and further includes a detector to detecting an electron provided by irradiating a sample with the electron beam, an opening configuring member arranged between the detector and the deflector and having an opening for passing the electron beam, and a secondary signal deflector to deflect an electron ejected from the sample, in which the secondary signal deflector is controlled to deflect the electron ejected from the sample toward an opening of passing the electron beam in accordance with a deflection control of the deflector.
    Type: Grant
    Filed: February 18, 2013
    Date of Patent: October 13, 2015
    Assignee: HITACHI HIGH-TECHNOLOGIES CORPORATION
    Inventors: Minoru Yamazaki, Hideyuki Kazumi, Yuko Sasaki, Makoto Suzuki
  • Publication number: 20150079321
    Abstract: When a plurality of striped molded products are molded at a time, the molded products having a striped pattern and an outstanding design property are obtained by preventing part of molten resins from being unevenly distributed in an inappropriate manner when being fed into a cavity of a metal mold. A hot runner nozzle is provided with a first resin flow path and a plurality of second resin flow paths. The first flow path has a funnel section which continues with a nozzle gate at a centripetal position and which allows a first molten resin to be gathered at the centripetal position of the funnel section so as to feed the resin into the nozzle gate. The second resin flow paths have a plurality of corresponding discharge ports facing and communicating with the funnel section of the first resin flow path, each of the discharge ports being disposed around the centripetal position, so that the second molten resin different from the first molten resin is fed into the funnel section.
    Type: Application
    Filed: September 17, 2014
    Publication date: March 19, 2015
    Inventors: Yasuhiko TAKEUCHI, Minoru YAMAZAKI, Yoshiharu YANAGIMACHI, Kouichi SHIMIZU
  • Publication number: 20150024273
    Abstract: The present invention relates to lithium composite oxide particles which can be produced by mixing nickel-cobalt-manganese-based compound particles, a zirconium raw material and a lithium raw material with each other and then calcining the resulting mixture, and comprise a Zr compound that is allowed to be present on a surface thereof, in which the Zr compound is represented by the chemical formula: Lix(Zr1-yAy)Oz wherein x, y and z are 2.0?x?8.0; 0?y?1.0; and 2.0?z?6.0, respectively, and a content of Zr in the lithium composite oxide particles is 0.05 to 1.0% by weight. By using the lithium composite oxide particles as a positive electrode active substance, it is possible to produce a lithium ion secondary battery that has a low electric resistance at a high temperature, and is excellent in cycle characteristic at a high temperature as well as high-temperature rate characteristic.
    Type: Application
    Filed: March 14, 2013
    Publication date: January 22, 2015
    Inventors: Minoru Yamazaki, Osamu Sasaki, Shoichi Fujino, Hideharu Mitsui, Takayuki Yamamura, Kunihiro Uramatsu, Akihisa Kajiyama, Ryuta Masaki
  • Publication number: 20150014878
    Abstract: At a filling termination stage when performing multi-layer molding by means of a hot runner nozzle, an intermediate layer in a multi-layer molded article is prevented from being formed in a shape causing the intermediate layer to enter into a sprue in a portion of a mold cavity in a mold corresponding to the sprue. The multi-layer molded article with no intermediate layer being exposed in a sprue cut portion can be therefore obtained. In this manner, a diameter of a discharge port opening and closing mechanism part for opening and closing the resin discharge ports in the shut pin is made different from a diameter of a nozzle gate opening and closing mechanism part configured of the projection for pushing out the molten resin in the nozzle gate.
    Type: Application
    Filed: June 27, 2014
    Publication date: January 15, 2015
    Inventors: Yasuhiko TAKEUCHI, Minoru YAMAZAKI, Kouichi SHIMIZU
  • Publication number: 20150014531
    Abstract: It is an object of the present invention to provide a scanning electron microscope for discriminating an angle of an electron ejected from a sample without providing an opening for restricting the angle at outside of an axis. In order to achieve the object described above, there is proposed a scanning electron microscope which includes a deflector to deflect an irradiating position of an electron beam, and a control unit to control the deflector, and further includes a detector to detecting an electron provided by irradiating a sample with the electron beam, an opening configuring member arranged between the detector and the deflector and having an opening for passing the electron beam, and a secondary signal deflector to deflect an electron ejected from the sample, in which the secondary signal deflector is controlled to deflect the electron ejected from the sample toward an opening of passing the electron beam in accordance with a deflection control of the deflector.
    Type: Application
    Filed: February 18, 2013
    Publication date: January 15, 2015
    Inventors: Minoru Yamazaki, Hideyuki Kazumi, Yuko Sasaki, Makoto Suzuki
  • Patent number: 8827675
    Abstract: A mold assembly includes a product cavity for producing an insert-molded product and a projection-forming cavity for, if an insert of the product is irregularly deformed or disposed in wrong orientation, forming a projection on the insert-molded product. The projection, if present on the product, blocks most of the light emitted from a light-emitting element. A photodetector detects the intensity of the received light and when the detected light intensity is less than a predetermined value due to the presence of the projection, the product is judged to be rejected. Visual inspection or optical sensors judge the product to be rejected if the product has a through-hole closed and to be acceptable if the through-hole of the product is open. This judgment does not require an X-ray inspection device or radiologists.
    Type: Grant
    Filed: March 29, 2012
    Date of Patent: September 9, 2014
    Assignee: Nissei Plastic Industrial Co., Ltd.
    Inventors: Minoru Yamazaki, Tetsuo Kurasawa
  • Patent number: 8766182
    Abstract: An object of the present invention is to provide a method and apparatus for measuring a potential on a surface of a sample using a charged particle beam while restraining a change in the potential on the sample induced by the charged particle beam application, or detecting a compensation value for a change in a condition for the apparatus caused by the sample being electrically charged. In order to achieve the above object, the present invention provides a method and apparatus for applying a voltage to a sample so that a charged particle beam does not reach the sample (hereinafter, this may be referred to as “mirror state”) in a state in which the charged particle beam is applied toward the sample, and detecting information relating to a potential on the sample using signals obtained by that voltage application.
    Type: Grant
    Filed: June 21, 2013
    Date of Patent: July 1, 2014
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Minoru Yamazaki, Akira Ikegami, Hideyuki Kazumi, Osamu Nasu
  • Patent number: 8648300
    Abstract: The charged particle beam apparatus having an opening formation member formed with an opening for passage of a charged particle beam emitted from a charged particle source, and either a detector adapted to detect charged particles having passed through the passage opening or a detector adapted to detect charged particles resulting from bombardment on another member of the charged particles having passed through the opening, comprises an aligner for aligning charged particles discharged from the sample and a control unit for controlling the aligner, wherein the control unit controls the aligner to cause it to shift trajectories of the charged particles discharged from the sample so that length measurement may be executed on the basis of detection signals before and after the alignment by the aligner.
    Type: Grant
    Filed: July 11, 2013
    Date of Patent: February 11, 2014
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Miki Isawa, Minoru Yamazaki, Yuzuru Mizuhara, Hiroshi Makino, Hideyuki Kazumi