Patents by Inventor Mitsunori Aizawa
Mitsunori Aizawa has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11353502Abstract: An electronic component handling apparatus handles a device under test (DUT). The electronic component handling apparatus includes: a set plate that holds a DUT container including a plurality of pockets each of which accommodates the DUT; a sensor that acquires three-dimensional shape data of the DUT container; and a processor that corrects the shape data based on an inclination of the set plate, extracts a height and an inclination of a predetermined region corresponding to the DUT in a first pocket among the pockets, from the shape data corrected by the processor, and determines an accommodation state of the DUT in the first pocket based on an extraction result obtained by the processor.Type: GrantFiled: February 26, 2021Date of Patent: June 7, 2022Assignee: ADVANTEST CorporationInventors: Masataka Onozawa, Mitsunori Aizawa, Aritomo Kikuchi
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Publication number: 20210285999Abstract: An electronic component handling apparatus handles a device under test (DUT). The electronic component handling apparatus includes: a set plate that holds a DUT container including a plurality of pockets each of which accommodates the DUT; a sensor that acquires three-dimensional shape data of the DUT container; and a processor that corrects the shape data based on an inclination of the set plate, extracts a height and an inclination of a predetermined region corresponding to the DUT in a first pocket among the pockets, from the shape data corrected by the processor, and determines an accommodation state of the DUT in the first pocket based on an extraction result obtained by the processor.Type: ApplicationFiled: February 26, 2021Publication date: September 16, 2021Applicant: ADVANTEST CorporationInventors: Masataka Onozawa, Mitsunori Aizawa, Aritomo Kikuchi
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Patent number: 9874605Abstract: To electrically connect a device under test mounted on a device holder and a socket of a test apparatus with accuracy. Provided is a device holder that retains a device, the device holder including: an inner unit that mounts the device; and an outer unit that retains the inner unit such that the inner unit is relatively movable, wherein the inner unit switches whether to lock the outer unit relative to the inner unit or to release the lock. Also, the inner unit and the outer unit of the device holder are provided.Type: GrantFiled: March 16, 2015Date of Patent: January 23, 2018Assignee: ADVANTEST CORPORATIONInventors: Mitsunori Aizawa, Yuya Yamada
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Patent number: 9784789Abstract: Provided is a handler apparatus that conveys a device under test to a test socket, including: a socket for adjustment which, prior to fitting of a device holder holding the device under test to the test socket, fits the device holder; a socket-for-adjustment position detecting section that detects a relative position of the device under test with respect to the socket for adjustment, in a state in which the device holder fits the socket for adjustment; an actuator that adjusts a position of the device under test on the device holder, based on the detected relative position of the device under test; and a conveyer that conveys the device holder, in which a position of the device under test has been adjusted, to fit the test socket.Type: GrantFiled: August 29, 2014Date of Patent: October 10, 2017Assignee: ADVANTEST CORPORATIONInventors: Aritomo Kikuchi, Tsuyoshi Yamashita, Mitsunori Aizawa, Hiromitsu Horino, Yuya Yamada, Masataka Onozawa
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Patent number: 9772373Abstract: Provided is a handler apparatus that conveys a device under test to a test socket, including: an actuator that, prior to fitting of a device holder to the test socket, fits the device holder, and adjusts a position of the device under test on the device holder; and a conveyer that conveys the device holder in which a position of the device under test has been adjusted, to fit the test socket, where the device holder includes: an inner unit to mount the device under test; an outer unit to retain the inner unit to be movable; and a release button to release a lock of movement of the inner unit, in response to being pressed from a side to which the device under test is mounted, and the actuator sets the inner unit to be movable by pressing the release button and adjusts a position of the inner unit.Type: GrantFiled: August 29, 2014Date of Patent: September 26, 2017Assignee: ADVANTEST CORPORATIONInventors: Mitsunori Aizawa, Yuya Yamada
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Patent number: 9658287Abstract: A handler apparatus adjusts a position of an actuator and enhances positional accuracy of a device under test. Provided is a handler apparatus that conveys a device under test to a test socket, including: an actuator that, prior to fitting of a device holder holding the device under test to the test socket, fits the device holder, and adjusts a position of the device under test on the device holder; and an actuator adjusting section that adjusts an amount of driving of the actuator by causing the actuator to fit an actuator fitting unit.Type: GrantFiled: August 29, 2014Date of Patent: May 23, 2017Assignee: ADVANTEST CORPORATIONInventors: Tsuyoshi Yamashita, Mitsunori Aizawa, Hiromitsu Horino, Yuya Yamada, Masataka Onozawa
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Patent number: 9606170Abstract: Provided is a handler apparatus that conveys a device under test to a test socket, including: a socket fitting unit which the test socket fits, prior to fitting of a device holder holding the device under test to the test socket; a test-socket position detecting section that detects a relative position of the socket fitting unit with respect to the test socket in a state in which the socket fitting unit fits the test socket; an actuator that adjusts a position of the device under test on the device holder, based on the detected relative position of the socket fitting unit; and a conveyer that conveys the device holder in which the position of the device under test has been adjusted, to fit the test socket.Type: GrantFiled: August 29, 2014Date of Patent: March 28, 2017Assignee: ADVANTEST CORPORATIONInventors: Tsuyoshi Yamashita, Mitsunori Aizawa, Hiromitsu Horino, Yuya Yamada, Masataka Onozawa
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Patent number: 9506948Abstract: A fixture unit assuredly fits a fixed unit including a gap portion including a first wall surface and a second wall surface opposing each other. Provided are a fixture unit and a fixture apparatus including a fitting pin fitting a gap portion of a fixed unit, the gap portion including a first wall surface and a second wall surface opposing each other, where the fitting pin includes: a fixed pin inserted to the gap portion to contact the first wall surface; a moving pin inserted to the gap portion to be pressed on the second wall surface; and a base to which the fixed pin is fixed, and the moving pin includes a bottom portion in an arc form with a center being a central axis of movement, and the bottom portion fitting slidably with respect to a concave portion provided for the base.Type: GrantFiled: August 29, 2014Date of Patent: November 29, 2016Assignee: ADVANTEST CORPORATIONInventors: Yuya Yamada, Mitsunori Aizawa
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Patent number: 9285393Abstract: Provided is a handler apparatus which can connect devices under test to sockets of a test apparatus quickly and with low power consumption. The handler apparatus for conveying and connecting a plurality of devices under test to a plurality of sockets provided on a test head of a test apparatus, includes a position adjusting section that moves each of the plurality of devices under test on the test tray and adjusts the position thereof to a corresponding one of the plurality of sockets; and a device mounting section that mounts the plurality of devices under test whose positions have been adjusted by the position adjusting section, to the plurality of sockets.Type: GrantFiled: November 14, 2012Date of Patent: March 15, 2016Assignee: ADVANTEST CORPORATIONInventors: Hiroyuki Kikuchi, Mitsunori Aizawa
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Publication number: 20150276862Abstract: Provided is a handler apparatus that conveys a device under test to a test socket, including: a socket for adjustment which, prior to fitting of a device holder holding the device under test to the test socket, fits the device holder; a socket-for-adjustment position detecting section that detects a relative position of the device under test with respect to the socket for adjustment, in a state in which the device holder fits the socket for adjustment; an actuator that adjusts a position of the device under test on the device holder, based on the detected relative position of the device under test; and a conveyer that conveys the device holder, in which a position of the device under test has been adjusted, to fit the test socket.Type: ApplicationFiled: August 29, 2014Publication date: October 1, 2015Applicant: ADVANTEST CORPORATIONInventors: Aritomo KIKUCHI, Tsuyoshi YAMASHITA, Mitsunori AIZAWA, Hiromitsu HORINO, Yuya YAMADA, Masataka ONOZAWA
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Publication number: 20150276860Abstract: Provided is a handler apparatus that conveys a device under test to a test socket, including: an actuator that, prior to fitting of a device holder to the test socket, fits the device holder, and adjusts a position of the device under test on the device holder; and a conveyer that conveys the device holder in which a position of the device under test has been adjusted, to fit the test socket, where the device holder includes: an inner unit to mount the device under test; an outer unit to retain the inner unit to be movable; and a release button to release a lock of movement of the inner unit, in response to being pressed from a side to which the device under test is mounted, and the actuator sets the inner unit to be movable by pressing the release button and adjusts a position of the inner unit.Type: ApplicationFiled: August 29, 2014Publication date: October 1, 2015Inventors: Mitsunori AIZAWA, Yuya YAMADA
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Publication number: 20150276863Abstract: Provided is a handler apparatus that conveys a device under test to a test socket, including: a socket fitting unit which the test socket fits, prior to fitting of a device holder holding the device under test to the test socket; a test-socket position detecting section that detects a relative position of the socket fitting unit with respect to the test socket in a state in which the socket fitting unit fits the test socket; an actuator that adjusts a position of the device under test on the device holder, based on the detected relative position of the socket fitting unit; and a conveyer that conveys the device holder in which the position of the device under test has been adjusted, to fit the test socket.Type: ApplicationFiled: August 29, 2014Publication date: October 1, 2015Inventors: Tsuyoshi YAMASHITA, Mitsunori AIZAWA, Hiromitsu HORINO, Yuya YAMADA, Masataka ONOZAWA
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Publication number: 20150276859Abstract: To electrically connect a device under test mounted on a device holder and a socket of a test apparatus with accuracy. Provided is a device holder that retains a device, the device holder including: an inner unit that mounts the device; and an outer unit that retains the inner unit such that the inner unit is relatively movable, wherein the inner unit switches whether to lock the outer unit relative to the inner unit or to release the lock. Also, the inner unit and the outer unit of the device holder are provided.Type: ApplicationFiled: March 16, 2015Publication date: October 1, 2015Inventors: Mitsunori AIZAWA, Yuya YAMADA
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Publication number: 20150276801Abstract: A fixture unit assuredly fits a fixed unit including a gap portion including a first wall surface and a second wall surface opposing each other. Provided are a fixture unit and a fixture apparatus including a fitting pin fitting a gap portion of a fixed unit, the gap portion including a first wall surface and a second wall surface opposing each other, where the fitting pin includes: a fixed pin inserted to the gap portion to contact the first wall surface; a moving pin inserted to the gap portion to be pressed on the second wall surface; and a base to which the fixed pin is fixed, and the moving pin includes a bottom portion in an arc form with a center being a central axis of movement, and the bottom portion fitting slidably with respect to a concave portion provided for the base.Type: ApplicationFiled: August 29, 2014Publication date: October 1, 2015Inventors: Yuya YAMADA, Mitsunori AIZAWA
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Publication number: 20150276861Abstract: A handler apparatus adjusts a position of an actuator and enhances positional accuracy of a device under test. Provided is a handler apparatus that conveys a device under test to a test socket, including: an actuator that, prior to fitting of a device holder holding the device under test to the test socket, fits the device holder, and adjusts a position of the device under test on the device holder; and an actuator adjusting section that adjusts an amount of driving of the actuator by causing the actuator to fit an actuator fitting unit.Type: ApplicationFiled: August 29, 2014Publication date: October 1, 2015Inventors: Tsuyoshi YAMASHITA, Mitsunori AIZAWA, Hiromitsu HORINO, Yuya YAMADA, Masataka ONOZAWA
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Publication number: 20150137844Abstract: Provided is a handler apparatus which can connect devices under test to sockets of a test apparatus quickly and with low power consumption. The handler apparatus for conveying and connecting a plurality of devices under test to a plurality of sockets provided on a test head of a test apparatus, includes a position adjusting section that moves each of the plurality of devices under test on the test tray and adjusts the position thereof to a corresponding one of the plurality of sockets; and a device mounting section that mounts the plurality of devices under test whose positions have been adjusted by the position adjusting section, to the plurality of sockets.Type: ApplicationFiled: January 30, 2015Publication date: May 21, 2015Inventors: Hiroyuki KIKUCHI, Mitsunori AIZAWA
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Publication number: 20120112777Abstract: An electronic device pushing apparatus includes a pushing unit which has: a plurality of pushers which contact DUTs; and base plate on which the plurality of pushers are provided. A rigidity of the base plate is set to a rigidity which is lower relative to the rigidity of a spacing frame of the HIFIX.Type: ApplicationFiled: July 14, 2009Publication date: May 10, 2012Applicant: ADVANTEST CORPORATIONInventors: Mitsunori Aizawa, Akihiko Ito, Noboru Masuda
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Publication number: 20070296419Abstract: Two electronic device holding portions 19 are formed on an insert to be attached to a test tray TST of an electronic device handling apparatus 1, and the two electronic device holding portions 19 are arranged at positions sandwiching a standard hole 20a used as a positional standard when aligning. When using an insert having a plurality of electronic device holding portions 19, the number of IC devices 2 to be held per a unit area on the test tray TST increases and the throughput improves. Also, when arranging the two electronic device holding portions 19 at positions sandwiching the standard hole 20a, both of the electronic device holding portions 19 can be close to the standard hole 20a, so that positional deviation of the IC devices 2 caused by thermal expansion or thermal contraction of the insert 16 can be suppressed and arising of contact mistakes caused by positional deviation is suppressed.Type: ApplicationFiled: November 22, 2005Publication date: December 27, 2007Applicant: ADVANTEST CORPORATIONInventors: Mitsunori Aizawa, Akihiko Ito
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Patent number: D788722Type: GrantFiled: November 24, 2014Date of Patent: June 6, 2017Assignee: ADVANTEST CORPORATIONInventors: Takeshi Okushi, Mitsunori Aizawa, Masanori Nagashima, Takashi Kawashima
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Patent number: D819581Type: GrantFiled: April 21, 2017Date of Patent: June 5, 2018Assignee: ADVANTEST CORPORATIONInventors: Takeshi Okushi, Mitsunori Aizawa, Masanori Nagashima, Takashi Kawashima