Socket for electronic device testing apparatus
Latest ADVANTEST CORPORATION Patents:
- INDUCTOR
- Optical testing apparatus
- Testing apparatus for high-rate transmission and reception of signals between device under test and semiconductor testing apparatus
- Signal processing apparatus for generating a plurality of output samples using combiner logic based on a hiearchical tree structure
- Device handling apparatus and device testing apparatus
The even dashed broken lines shown in the drawings represent portions of the socket for an electronic testing apparatus, that form no part of the claimed design.
The dashed-dot line shown on the top and bottom of the socket for an electronic testing apparatus represents the boundary line between the claimed and unclaimed surface areas.
The outer boarder of the center broken line circles in
Claims
The ornamental design for a socket for an electronic device testing apparatus, as shown and described.
| D358806 | May 30, 1995 | Siegel |
| D359028 | June 6, 1995 | Siegel |
| D522977 | June 13, 2006 | Sato |
| 7230830 | June 12, 2007 | Ujike |
| 7335030 | February 26, 2008 | Kunioka |
| 7568918 | August 4, 2009 | Uratsuji |
| 7819686 | October 26, 2010 | Chen |
| 7887355 | February 15, 2011 | Watanabe |
| D633877 | March 8, 2011 | Heng |
| D633878 | March 8, 2011 | Heng |
| D633879 | March 8, 2011 | Heng |
| D633880 | March 8, 2011 | Heng |
| D645426 | September 20, 2011 | Heng |
| D648688 | November 15, 2011 | Heng |
| D661667 | June 12, 2012 | Heng |
| D788722 | June 6, 2017 | Okushi |
| 9755387 | September 5, 2017 | Hachuda |
| 20030032322 | February 13, 2003 | Nakamura |
| 20040063241 | April 1, 2004 | Nakano |
| 20040212382 | October 28, 2004 | Cram |
| 20040248435 | December 9, 2004 | Sato |
| 20050136721 | June 23, 2005 | Sato |
| 20050231919 | October 20, 2005 | Ujiki |
| 20050250363 | November 10, 2005 | Suzuki |
| 20050287837 | December 29, 2005 | Trobough |
| 20070173081 | July 26, 2007 | Yu |
| 20100062623 | March 11, 2010 | Chen |
- Office Action issued in Taiwan Counterpart Patent Appl. No. 10420942510, dated Jul. 20, 2015.
- Office Action issued in Taiwan Counterpart Patent Appl. No. 103306664, dated Jul. 20, 2015.
Type: Grant
Filed: Apr 21, 2017
Date of Patent: Jun 5, 2018
Assignee: ADVANTEST CORPORATION (Tokyo)
Inventors: Takeshi Okushi (Tokyo), Mitsunori Aizawa (Tokyo), Masanori Nagashima (Saitama), Takashi Kawashima (Tokyo)
Primary Examiner: Elizabeth J Oswecki
Application Number: 29/601,371