Socket for electronic device testing apparatus
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The even dashed broken lines shown in the drawings represent portions of the socket for an electronic testing apparatus, that form no part of the claimed design.
The dashed-dot line shown on the top and bottom of the socket for an electronic testing apparatus represents the boundary line between the claimed and unclaimed surface areas.
The outer boarder of the center broken line circles in
Claims
The ornamental design for a socket for an electronic device testing apparatus, as shown and described.
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Type: Grant
Filed: Apr 21, 2017
Date of Patent: Jun 5, 2018
Assignee: ADVANTEST CORPORATION (Tokyo)
Inventors: Takeshi Okushi (Tokyo), Mitsunori Aizawa (Tokyo), Masanori Nagashima (Saitama), Takashi Kawashima (Tokyo)
Primary Examiner: Elizabeth J Oswecki
Application Number: 29/601,371