Socket for an electronic device testing apparatus
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The part represented by solid lines is a part of the claimed design. The dot-dash broken lines (the alternate long and short dash lines) represent only a border between the part of the claimed design and other part. The dashed broken lines (the broken lines) are for illustrative purposes only and form no part of the claimed design.
The broken lines connecting the arrows in
Claims
The ornamental design for a socket for an electronic device testing apparatus, as shown and described.
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Type: Grant
Filed: Nov 24, 2014
Date of Patent: Jun 6, 2017
Assignee: ADVANTEST CORPORATION (Tokyo)
Inventors: Takeshi Okushi (Tokyo), Mitsunori Aizawa (Tokyo), Masanori Nagashima (Tokyo), Takashi Kawashima (Tokyo)
Primary Examiner: Elizabeth J Oswecki
Application Number: 29/509,962