Socket for an electronic device testing apparatus
Latest ADVANTEST CORPORATION Patents:
- INDUCTOR
- Optical testing apparatus
- Testing apparatus for high-rate transmission and reception of signals between device under test and semiconductor testing apparatus
- Signal processing apparatus for generating a plurality of output samples using combiner logic based on a hiearchical tree structure
- Device handling apparatus and device testing apparatus
The part represented by solid lines is a part of the claimed design. The dot-dash broken lines (the alternate long and short dash lines) represent only a border between the part of the claimed design and other part. The dashed broken lines (the broken lines) are for illustrative purposes only and form no part of the claimed design.
The broken lines connecting the arrows in
Claims
The ornamental design for a socket for an electronic device testing apparatus, as shown and described.
| D358806 | May 30, 1995 | Siegel |
| D359028 | June 6, 1995 | Siegel |
| D522977 | June 13, 2006 | Sato |
| D633877 | March 8, 2011 | Heng |
| D633878 | March 8, 2011 | Heng |
| D633879 | March 8, 2011 | Heng |
| D633880 | March 8, 2011 | Heng |
| D645426 | September 20, 2011 | Heng |
| D648688 | November 15, 2011 | Heng |
| D661667 | June 12, 2012 | Heng |
| 20030032322 | February 13, 2003 | Nakamura |
| 20040063241 | April 1, 2004 | Nakano |
| 20040212382 | October 28, 2004 | Cram |
| 20050136721 | June 23, 2005 | Sato |
| 20050231919 | October 20, 2005 | Ujike |
| 20050250363 | November 10, 2005 | Suzuki |
| 20050287837 | December 29, 2005 | Trobough |
| 20070173081 | July 26, 2007 | Yu |
| 20100062623 | March 11, 2010 | Chen |
- Office Action issued in Taiwan Counterpart Patent Appl. No. 10420942510, dated Jul. 20, 2015.
- Office Action issued in Taiwan Counterpart Patent Appl. No. 103306664, dated Jul. 20, 2015.
Type: Grant
Filed: Nov 24, 2014
Date of Patent: Jun 6, 2017
Assignee: ADVANTEST CORPORATION (Tokyo)
Inventors: Takeshi Okushi (Tokyo), Mitsunori Aizawa (Tokyo), Masanori Nagashima (Tokyo), Takashi Kawashima (Tokyo)
Primary Examiner: Elizabeth J Oswecki
Application Number: 29/509,962