Abstract: A system for quantifying x-ray backscatter system performance is disclosed. The system includes one or more x-ray backscatter detectors, an x-ray tube, a support, and a plurality of rods mounted on the support and arranged in groups. Each group of rods includes at least two rods having the same width. The system also includes a user interface configured to connect to the x-ray backscatter detectors to receive a backscatter signal from the x-ray backscatter detectors associated with the x-ray tube, where the user interface plots a modulation transfer function representing x-ray backscatter for each rod of the plurality of rods from x-rays transmitted by the x-ray tube.

Abstract: Disclosed herein is a system for x-ray backscatter inspection. The system comprises an interior cavity. The system also comprises a non-conductive fluid contained within the interior cavity. The system additionally comprises a power source within the interior cavity and submerged in the non-conductive fluid. The system further comprises an x-ray cathode within the interior cavity, submerged in the non-conductive fluid, and coupled to the power source. The system also comprises an x-ray anode within the interior cavity, submerged in the non-conductive fluid, and positioned to receive an electron emission from the x-ray cathode to generate an x-ray emission. The system additionally comprises a thermoelectric cooler surrounding the interior cavity and operable to draw heat from the non-conductive fluid.

Abstract: Disclosed herein is an apparatus for forming an x-ray beam. The apparatus comprises a plurality of links pivotably coupled together, in an end-to-end manner, to form a continuous loop. The plurality of links comprises two or more links configured to block a transmission of an x-ray emission. The plurality of links also comprises at least one link comprising an aperture that is configured to allow only a portion of the x-ray emission to pass through the aperture.

Abstract: An example system includes a sensor housing defining a plurality of horizontal layers and a controller. The sensor housing includes a plurality of light-emitted diode (LED) light sources, a plurality of cameras, and a plurality of optical devices. Each camera of the plurality of cameras is positioned within a respective horizontal layer of the plurality of horizontal layers and configured to detect a respective range of wavelengths of light. The plurality of optical devices is configured to receive light reflected by the surface through a common input lens and direct the light to one of the cameras of the plurality of cameras depending on a wavelength of the light. The controller is configured to receive signals from the plurality of cameras indicative of the light reflected by the surface and determine whether there is any foreign object debris material on the surface using the signals from the plurality of cameras.

Abstract: An automatic component fabrication system, for use in fabricating a component, includes a control system having a memory that includes a computerized model of the component to be fabricated. A first monitoring system including a first illumination device and at least one camera is communicatively coupled to the control system and is configured to determine a position of the material at a first location. A cutting system is communicatively coupled to the control system and is configured to cut the component from a sheet of material based on the determined position and the computerized model. The automatic component fabrication system also includes a second monitoring system including a second illumination device and at least one camera. The second monitoring system is communicatively coupled to the control system and is configured to compare the fabricated component to the computerized model.

Abstract: A method and system for scanning an elongate structure. A scanner in a scanning system is moved axially along the elongate structure using a translating structure in the scanning system. The elongate member is scanned axially as the scanner moves axially along the elongate structure. The scanner is moved rotationally around the elongate structure at a location in which an inconsistency is detected at the location during an axial scan. The elongate structure is scanned rotationally at the location while the scanner moves rotationally around the elongate structure.

Abstract: An inspection system for detecting defects in a workpiece can include an illumination source for illuminating a first section of the workpiece with a patterned light, wherein the illumination source does not illuminate a second section of the workpiece. The inspection system further includes a feedback camera for imaging the first section and producing a first output, and a background camera for imaging the second section and producing a second output. A processor compares the first output with the second output, and a controller alters the patterned light that is output by the illumination source based on the comparison. This feedback control continues until the background is suitably homogeneous or camouflaged compared to the defect, such that the visibility and/or detectability of the defect is increased.

Abstract: According to various examples, techniques for detecting an off specification void in an item produced by an additive manufacturing process are presented. The techniques can utilize a system that includes cameras positioned to capture images of deposition of material in an additive manufacturing receptacle from multiple angles. The system can include at least one hardware electronic feature detector hard coded to detect features of elements of the material in image data derived from images. The system can further includes at least one electronic processor configured to perform a method of receiving feature data from the at least one hardware electronic feature detector, generating an electronic three-dimensional representation of the material in the additive manufacturing receptacle from the feature data, determining from the electronic three-dimensional representation of the material in the additive manufacturing receptacle that an off specification void exists, and providing an alert.

Abstract: Apparatus and methods for shot peening evaluation are disclosed herein. An example apparatus for evaluating a surface that has undergone a shot peening process includes a camera to generate first image data of a first portion of the surface. The example apparatus includes a processor to determine an impact coverage value for the first portion based on the first image data and determine an effectiveness of the shot peening process for the surface based on the impact coverage value.

Abstract: Defined herein is a borescope, including a tube and a tip. The tube includes a first end and a second end, opposite the first end. The tip is fixed to the first end of the tube and comprises a housing and an image acquisition system. The image acquisition system is within the housing and comprises a light emitting diode ring, a micro-lens array, a main lens, and a photodetector array. The light emitting diode ring includes a plurality of light emitting diodes. The micro-lens array includes a plurality of micro-lenses. The main lens is between the light emitting diode ring and the micro-lens array. The photodetector array includes a plurality of photodetectors. The micro-lens array is between the main lens and the photodetector array.

Abstract: An example laser system includes a laser, a plurality of pulse stretchers coupled together in series, a feedback module, and a lens assembly. The plurality of pulse stretchers is configured to stretch pulse widths of laser pulses provided by the laser and to output stretched laser pulses. The feedback module includes a pulse delay comparator that is configured to compare a first laser pulse of the laser pulses to a corresponding first stretched laser pulse of the stretched laser pulses. The feedback module also includes a computing device that is configured to determine, based on a result of the comparing by the pulse delay comparator, an adjustment to a pulse stretcher of the plurality of pulse stretchers, and apply the adjustment to the pulse stretcher so as to modify a shape of a second stretched laser pulse of the stretched laser pulses.

Abstract: An example laser system includes a laser, a plurality of pulse stretchers coupled together in series, a pulse amplifier, a feedback module, and a lens assembly. The plurality of pulse stretchers is configured to stretch pulse widths of the laser pulses and output stretched laser pulses. The pulse amplifier is positioned between a first pulse stretcher and a second pulse stretch of the plurality of pulse stretchers, and is configured to amplify the laser pulses. The feedback module includes a pulse delay comparator configured to compare a first laser pulse of the laser pulses to a corresponding first stretched laser pulse of the stretched laser pulses. The feedback module also includes a computing device configured to determine an adjustment to a pulse stretcher of the plurality of pulse stretchers, and apply the adjustment to the pulse stretcher so as to modify a shape of a second stretched laser pulse.

Abstract: Described herein is a method of inspecting a part for defects. The method includes applying an electromagnetic field to the part using a defect detection coil and one or more noise cancelation coils. The method also includes detecting feedback received in response to applying the electromagnetic field. The method includes adjusting settings corresponding to the one or more noise cancelation coils, in response to the feedback, to reduce electromagnetic noise.

Abstract: A method including ultrasonically scanning a structure with a laser ultrasound testing system where the structure is provided with an array of nanoscopic structures, the nanoscopic structures having a predetermined directional orientation, the nanoscopic structures disposed on a scanned surface of the structure, and determining if the structure meets a predetermined threshold. Aspects of this invention apply certain high emissivity coatings to structures for the purpose of significant improvement laser ultrasound inspection of those structures. The nanotechnology-based material in the coatings rapidly draws heat away, for maximum laser energy absorption while preventing surface heat damage to the composite surface from the laser beam.

Abstract: Described herein is an x-ray backscatter apparatus for non-destructive inspection of a part. The apparatus includes an x-ray emitter and a zone plate. The x-ray emitter includes an x-ray shield, a vacuum tube, a cathode, and an anode. The x-ray shield has an emission aperture. The vacuum tube is within the x-ray shield. The cathode and anode are enclosed within the vacuum tube. The cathode generates an electron emission. The anode is located relative to the cathode to receive the electron emission and convert the electron emission to a hard x-ray emission and is located relative to the emission aperture to direct at least a portion of the hard x-ray emission through the emission aperture. The zone plate is external to the x-ray shield and located relative to the emission aperture to receive the portion of the hard x-ray emission and focus the portion into a focused hard x-ray emission.

Abstract: A system for quantifying x-ray backscatter system performance is disclosed. The system includes one or more x-ray backscatter detectors, an x-ray tube, a support, and a plurality of rods mounted on the support and arranged in groups. Each group of rods includes at least two rods having the same width. The system also includes a user interface configured to connect to the x-ray backscatter detectors to receive a backscatter signal from the x-ray backscatter detectors associated with the x-ray tube, where the user interface plots a modulation transfer function representing x-ray backscatter for each rod of the plurality of rods from x-rays transmitted by the x-ray tube.

Abstract: A micro electromechanical (mem) device includes a first electrode, a second electrode, and a shaped carbon nanotube with a first end and a second end. The first end of the shaped carbon nanotube is conductively connected to the first electrode and the second end is conductively connected to the second electrode. A system for making the device includes a plurality of electrodes placed outside the growth region of a furnace to produce a controlled, time-varying electric field. A controller for the system is connected to a power supply to deliver controlled voltages to the electrodes to produce the electric field. A mixture of gases is passed through the furnace with the temperature raised to cause chemical vapor deposition (CVD) of carbon on a catalyst. The sequentially time-varying electric field parameterizes a growing nanotube into a predetermined shape.

Abstract: According to various examples, techniques for detecting an off specification void in an item produced by an additive manufacturing process are presented. The techniques can utilize a system that includes cameras positioned to capture images of deposition of material in an additive manufacturing receptacle from multiple angles. The system can include at least one hardware electronic feature detector hard coded to detect features of elements of the material in image data derived from images. The system can further includes at least one electronic processor configured to perform a method of receiving feature data from the at least one hardware electronic feature detector, generating an electronic three-dimensional representation of the material in the additive manufacturing receptacle from the feature data, determining from the electronic three-dimensional representation of the material in the additive manufacturing receptacle that an off specification void exists, and providing an alert.

Abstract: An inspection system for detecting defects in a workpiece can include an illumination source for illuminating a first section of the workpiece with a patterned light, wherein the illumination source does not illuminate a second section of the workpiece. The inspection system further includes a feedback camera for imaging the first section and producing a first output, and a background camera for imaging the second section and producing a second output. A processor compares the first output with the second output, and a controller alters the patterned light that is output by the illumination source based on the comparison. This feedback control continues until the background is suitably homogeneous or camouflaged compared to the defect, such that the visibility and/or detectability of the defect is increased.

Abstract: A method, apparatus, and system for scanning an elongate structure. A scanner in a scanning system is moved axially along the elongate structure using a translating structure in the scanning system. The elongate structure is scanned axially using an x-ray beam emitted by the scanner as the scanner moves axially along the elongate structure to perform an axial scan. The x-ray beam has a first orientation. A location on the elongate structure having an inconsistency is detected while scanning the elongate structure axially. The elongate structure is scanned at the location with the x-ray beam in a second orientation.