Abstract: A memory device includes: (1) multiple magnetic random access memory (“MRAM”) cells each including a first end and a second end; (2) a bit line electrically coupled to the first end of at least one of the MRAM cells; and (3) a strap electrically coupled to the second end of each one of the MRAM cells. During a write operation, the bit line is configured to apply a first heating current, and the strap is configured to apply a second heating current, such that at least one of the MRAM cells is heated to at least a threshold temperature according to the first heating current and the second heating current.

Abstract: A magnetic random access memory (MRAM) cell includes a storage layer, a sense layer, and a spacer layer between the storage layer and the sense layer. A field line is magnetically coupled to the MRAM cell to induce a magnetic field along a magnetic field axis, and at least one of the storage layer and the sense layer has a magnetic anisotropy axis that is tilted relative to the magnetic field axis. During a write operation, a storage magnetization direction is switchable between m directions to store data corresponding to one of m logic states, with m>2, where at least one of the m directions is aligned relative to the magnetic anisotropy axis, and at least another one of the m directions is aligned relative to the magnetic field axis. During a read operation, a sense magnetization direction is varied, relative to the storage magnetization direction, to determine the data stored by the storage layer.

Abstract: A magnetic random access memory (“MRAM”) cell includes: (1) a first magnetic layer having a first magnetization direction and a magnetic anisotropy axis; (2) a second magnetic layer having a second magnetization direction; and (3) a spacer layer disposed between the first magnetic layer and the second magnetic layer. The MRAM cell also includes a field line magnetically coupled to the MRAM cell and configured to induce a write magnetic field along a magnetic field axis, and the magnetic anisotropy axis is tilted relative to the magnetic field axis. During a write operation, the first magnetization direction is switchable between m directions to store data corresponding to one of m logic states, with m>2, at least one of the m directions is aligned relative to the magnetic anisotropy axis, and at least another one of the m directions is aligned relative to the magnetic field axis.

Abstract: A magnetic random access memory (MRAM) cell with a thermally assisted writing procedure comprising a magnetic tunnel junction formed from a magnetic storage layer, a reference layer, and an insulating layer inserted between the reference layer and the storage layer; and a first strap portion laterally connecting one end of the magnetic tunnel junction to a first selection transistor; wherein the cell further comprises a second strap portion extending opposite to the first strap portion and connecting laterally said one end of the magnetic tunnel junction to a second selection transistor, and in that said first and second strap portions being adapted for passing a portion of current via the first and second selection transistors. The disclosed cell has lower power consumption than conventional MRAM cells.

Abstract: A magnetic random access memory cell includes a sense layer, a storage layer, and a spacer layer disposed between the sense layer and the storage layer. During a write operation, the storage layer has a magnetization direction that is switchable between m directions to store data corresponding to one of m logic states, with m>2. During a read operation, the sense layer has a magnetization direction that is varied, relative to the magnetization direction of the storage layer, to determine the data stored by the storage layer.

Abstract: A memory device includes magnetic random access memory (“MRAM”) cells that are electrically connected in series, each one of the MRAM cells having a storage magnetization direction and a sense magnetization direction. During a write operation, multiple ones of the MRAM cells are written in parallel by switching the storage magnetization directions of the MRAM cells. During a read operation, a particular one of the MRAM cells is read by varying the sense magnetization direction of the particular one of the MRAM cells, relative to the storage magnetization direction of the particular one of the MRAM cells.

Abstract: The present disclosure concerns a magnetic random access memory-based ternary content addressable memory cell, comprising a first and second magnetic tunnel junction respectively connected to a first and second straps extending on each side of the first and second magnetic tunnel junctions, respectively; a first and second selection transistors, respectively connected to one extremity of the first and second straps; a first and second current lines; and a conductive line electrically connecting in series the first and second magnetic tunnel junctions at their ends opposed to the ones connecting the first and second straps. The cell disclosed herein has smaller size and can be advantageously used in memory devices having a high cell density array.

Abstract: A method for writing a magnetic random access memory-based ternary content addressable memory cell comprising a first magnetic tunnel junction being formed from a storage layer, a sense layer having a magnetization direction adjustable relative to the magnetization of the storage layer, and an insulating layer between the storage and sense layers; a sense line coupled with the storage layer; a first field line and a second field line, and the first field line being orthogonal to the second field line; comprising: providing a first write data to said storage layer via the second field line to store a first stored data with a high or low logic state; characterized in that, the method further comprises providing the first write data to said storage layer via the first field line to store the first stored data with a masked logic state.

Abstract: The present disclosures concerns a register cell comprising a differential amplifying portion containing a first inverter coupled to a second inverter such as to form an unbalanced flip-flop circuit; a first and second bit line connected to one end of the first and second inverter, respectively; and a first and second source line connected to the other end of the first and second inverter, respectively; characterized by the register cell further comprising a first and second magnetic tunnel junction electrically connected to the other end of the first and second inverter, respectively. The shift register disclosed herein can be made smaller than conventional shift registers and power consumption during the write and read operation of the shift registers can be low. The shift register disclosed herein can be made smaller than conventional shift registers and power consumption during the write and read operation of the shift registers can be low.

Abstract: A check engine includes a plurality of comparators, each including a plurality of flash cells, where each of the plurality of comparators is configured to store at least one reference bit included in a set of reference bits, and includes an input for presenting at least one target bit included in a set of target bits. Each of the plurality of comparators is configured to produce an output representing a level of matching between the at least one target bit and the at least one reference bit. The check engine is configured such that the outputs of the plurality of comparators are combined to produce a combined output. The check engine is configured to determine that the set of target bits matches the set of reference bits based on the combined output of the plurality of comparators.

Abstract: A check engine includes a plurality of comparators each including a first directional characteristic aligned to store at least one reference bit included in a set of reference bits, and a second directional characteristic aligned to present at least one target bit included in a set of target bits. Each of the plurality of comparators is configured to produce an output representing a level of matching between the at least one target bit and the at least one reference bit, based on a relative alignment between the first directional characteristic and the second directional characteristic. The check engine is configured such that the outputs of the plurality of comparators are combined to produce a combined output. The check engine is configured to determine that the set of target bits matches the set of reference bits based on the combined output of the plurality of comparators.

Abstract: A method of writing in a memory device comprising a plurality of MRAM cells, each cell including a magnetic tunnel junction having a resistance that can be varied during a write operation when heated at a high threshold temperature; a plurality of word lines connecting cells along a row; and a plurality of bit lines connecting cells along a column; the method comprising supplying a bit line voltage to one of the bit lines and a word line voltage to one of the word lines for passing a heating current through the magnetic tunnel junction of a selected cell; said word line voltage is a word line overdrive voltage being higher than the core operating voltage of the cells such that the heating current has a magnitude that is high enough for heating the magnetic tunnel junction at the predetermined high threshold temperature. The memory device can be written with low power consumption.

Abstract: A memory device comprising: a plurality of magnetoresistive random access memory (MRAM) cells arranged in rows and columns, each MRAM cell comprising a magnetic tunnel junction and a select transistor, one end of the magnetic tunnel junction being electrically coupled to the source of the select transistor; a plurality of word lines, each word line connecting MRAM cells along a row via the gate of their select transistor; a plurality of bit lines, each bit line connecting MRAM cells along a column, each bit line connecting the MRAM cells via the drain of their select transistor; wherein the memory device further comprises a plurality of source lines, each source line connecting MRAM cells along a row; and wherein each source line connecting the MRAM cells via the other end of the magnetic tunnel junction.

Abstract: Controllable readout circuit for performing a self-referenced read operation on a memory device comprising a plurality of magnetic random access memory (MRAM) cells comprising a selecting device for selecting one of the MRAM cells, and a sense circuit for sourcing a sense current to measure the first and second resistance value; the sense circuit comprising a sample and hold circuit for performing said storing said first resistance value, and a differential amplifier circuit for performing said comparing the second resistance value to the stored first resistance value; wherein the controllable readout circuit further comprises a control circuit adapted to provide a pulse-shaped timing signal with a pulse duration controlling the duration of the first read cycle and the second read cycle. The controllable readout circuit allows for controlling the duration of the first and second read cycles after completion of the MRAM cell and readout circuit fabrication.

Abstract: The present disclosure concerns a magnetic random access memory-based ternary content addressable memory cell, comprising a first and second magnetic tunnel junction respectively connected to a first and second straps extending on each side of the first and second magnetic tunnel junctions, respectively; a first and second selection transistors, respectively connected to one extremity of the first and second straps; a first and second current lines; and a conductive line electrically connecting in series the first and second magnetic tunnel junctions at their ends opposed to the ones connecting the first and second straps. The cell disclosed herein has smaller size and can be advantageously used in memory devices having a high cell density array.

Abstract: The present disclosures concerns a register cell comprising a differential amplifying portion containing a first inverter coupled to a second inverter such as to form an unbalanced flip-flop circuit; a first and second bit line connected to one end of the first and second inverter, respectively; and a first and second source line connected to the other end of the first and second inverter, respectively; characterized by the register cell further comprising a first and second magnetic tunnel junction electrically connected to the other end of the first and second inverter, respectively. The shift register disclosed herein can be made smaller than conventional shift registers and power consumption during the write and read operation of the shift registers can be low. The shift register disclosed herein can be made smaller than conventional shift registers and power consumption during the write and read operation of the shift registers can be low.

Abstract: A magnetic random access memory (MRAM) cell with a thermally assisted writing procedure comprising a magnetic tunnel junction formed from a magnetic storage layer, a reference layer, and an insulating layer inserted between the reference layer and the storage layer; and a first strap portion laterally connecting one end of the magnetic tunnel junction to a first selection transistor; wherein the cell further comprises a second strap portion extending opposite to the first strap portion and connecting laterally said one end of the magnetic tunnel junction to a second selection transistor, and in that said first and second strap portions being adapted for passing a portion of current via the first and second selection transistors. The disclosed cell has lower power consumption than conventional MRAM cells.

Abstract: A method for writing a magnetic random access memory-based ternary content addressable memory cell comprising a first magnetic tunnel junction being formed from a storage layer, a sense layer having a magnetization direction adjustable relative to the magnetization of the storage layer, and an insulating layer between the storage and sense layers; a sense line coupled with the storage layer; a first field line and a second field line, and the first field line being orthogonal to the second field line; comprising: providing a first write data to said storage layer via the second field line to store a first stored data with a high or low logic state; characterized in that, the method further comprises providing the first write data to said storage layer via the first field line to store the first stored data with a masked logic state.